EN 13925-1:2003

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Zerstörungsfreie Prüfung - Röntgendiffraktometrie von polykristallinen und amorphen Materialien - Teil 1: Allgemeine GrundlagenEssais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1: Principes générauxNon-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles19.100Neporušitveno preskušanjeNon-destructive testingICS:Ta slovenski standard je istoveten z:EN 13925-1:2003SIST EN 13925-1:2004en01-marec-2004SIST EN 13925-1:2004SLOVENSKI
STANDARD
EUROPEAN STANDARDNORME EUROPÉENNEEUROPÄISCHE NORMEN 13925-1March 2003ICS 19.100English versionNon-destructive testing - X-ray diffraction from polycrystallineand amorphous material - Part 1: General principlesEssais non destructifs - Diffraction des rayons X appliquéeaux matériaux polycristallins et amorphes - Partie 1:Principes générauxZerstörungsfreie Prüfung - Röntgendiffraktometrie vonpolykristallinen und amorphen Materialien - Teil 1:Allgemeine GrundlagenThis European Standard was approved by CEN on 14 November 2002.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such nationalstandards may be obtained on application to the Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A version in any other language made by translationunder the responsibility of a CEN member into its own language and notified to the Management Centre has the same status as the officialversions.CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece,Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and UnitedKingdom.EUROPEAN COMMITTEE FOR STANDARDIZATIONCOMITÉ EUROPÉEN DE NORMALISATIONEUROPÄISCHES KOMITEE FÜR NORMUNGManagement Centre: rue de Stassart, 36
B-1050 Brussels© 2003 CENAll rights of exploitation in any form and by any means reservedworldwide for CEN national Members.Ref. No. EN 13925-1:2003 ESIST EN 13925-1:2004

(informative)
Relationships between the XRPD standards.12Bibliography.13SIST EN 13925-1:2004

1)a draft of European Standard (WI 00138078 "Non-destructive testing - Terminology - X-ray powder diffraction") is inpreparation.SIST EN 13925-1:2004

the hkl lattice planes and half of the so called "diffraction angle", i.e. the anglebetween the directions of the incident beam and the diffracted beam (see Figure 1).n is the diffraction order (see hereafter):1) the equation (1) (Bragg equation), is satisfied if the path difference (AB+BC) between the rays scatteredfrom successive lattice planes of the same set is an exact multiple of l (see Figure 1).Keyd Separation between two successive lattice planes.q Angle between the incident beam and the lattice planes separated by a distance of d.A and C
Points on the incident beam (So) and the diffracted beam (S).B and D represent two of the point scatterers, one in each lattice plane.Figure 1 — Diffraction of X-rays from two successive lattice planes2) the diffraction of nth order from lattice plane hkl is equivalent to a diffraction of first order from the set oflattice planes nh, nk, nl. For most purposes in XRPD, n is taken as unity and equation (1) is more commonlyused in the form:2dhkl×sinqhkl = l(2)where the symbols are as in equation (1).SIST EN 13925-1:2004
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