CEN ISO/TS 21432:2005

SLOVENSKI STANDARD
01-november-2005
Neporušitveno preskušanje – Standardizirane preskusne metode za ugotavljanje
zaostalih napetosti z uklonom nevtronskih žarkov (ISO 21432:2005)
Non-destructive testing - Standards test method for determining residual stresses by
neutron diffraction (ISO 21432:2005)
Zerstörungsfreie Prüfung - Standardprüfverfahren zur Bestimmung von
Eigenspannungen durch Neutronenbeugung (ISO/TS 21432:2005)
Essais non destructifs - Méthode normalisée de détermination des contraintes
résiduelles par diffraction de neutrons (ISO 21432:2005)
Ta slovenski standard je istoveten z: CEN ISO/TS 21432:2005
ICS:
19.100 Neporušitveno preskušanje Non-destructive testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

TECHNICAL SPECIFICATION
CEN ISO/TS 21432
SPÉCIFICATION TECHNIQUE
TECHNISCHE SPEZIFIKATION
July 2005
ICS 19.100
English Version
Non-destructive testing - Standards test method for determining
residual stresses by neutron diffraction (ISO 21432:2005)
Essais non destructifs - Méthode normalisée de Zerstörungsfreie Prüfung - Standardprüfverfahren zur
détermination des contraintes résiduelles par diffraction de Bestimmung von Eigenspannungen durch
neutrons (ISO 21432:2005) Neutronenbeugung (ISO 21432:2005)
This Technical Specification (CEN/TS) was approved by CEN on 26 March 2005 for provisional application.
The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to submit their
comments, particularly on the question whether the CEN/TS can be converted into a European Standard.
CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available
promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS)
until the final decision about the possible conversion of the CEN/TS into an EN is reached.
CEN members are the national standards bodies of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France,
Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia,
Slovenia, Spain, Sweden, Switzerland and United Kingdom.
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© 2005 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN ISO/TS 21432:2005: E
worldwide for CEN national Members.

Foreword
This document (CEN ISO/TS 21432:2005) has been prepared by Technical Committee CEN/TC
138 "Non-destructive testing", the secretariat of which is held by AFNOR, in collaboration with
Technical Committee ISO/TC 135 "Non-destructive testing”.

According to the CEN/CENELEC Internal Regulations, the national standards organizations of
the following countries are bound to announce this CEN Technical Specification: Austria,
Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece,
Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.

TECHNICAL ISO/TS
SPECIFICATION 21432
First edition
2005-07-15
Non-destructive testing — Standard test
method for determining residual stresses
by neutron diffraction
Essais non destructifs — Méthode normalisée de détermination des
contraintes résiduelles par diffraction de neutrons

Reference number
ISO/TS 21432:2005(E)
©
ISO 2005
ISO/TS 21432:2005(E)
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ii © ISO 2005 – All rights reserved

ISO/TS 21432:2005(E)
Contents Page
Foreword. v
Introduction . vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions. 2
4 Symbols and abbreviated terms . 5
4.1 Symbols . 5
4.2 Subscripts . 6
4.3 Abbreviated terms . 7
5 Summary of method . 7
5.1 Preamble. 7
5.2 Outline of principle — Bragg’s law . 7
5.3 Neutron sources . 7
5.4 Strain measurement . 7
5.5 Neutron diffractometers. 8
5.6 Stress determination . 9
6 Preparations for measurements. 12
6.1 Preamble. 12
6.2 Alignment and calibration of the instrument . 12
6.3 Choice of diffraction conditions. 12
6.3.1 Monochromatic instruments . 12
6.3.2 TOF instruments . 15
6.4 Positioning procedures. 15
6.5 Gauge volumes . 15
6.6 Determination of a strain free or reference lattice spacing. 16
7 Material characterization. 18
7.1 Preamble. 18
7.2 Composition . 18
7.3 Thermal/mechanical history . 18
7.4 Phases and crystal structures. 18
7.5 Homogeneity . 18
7.6 Microstructure. 18
7.7 Texture . 18
8 Recording requirements and measurement procedure. 19
8.1 Preamble. 19
8.2 Recording requirements . 19
8.2.1 General information — instrument . 19
8.2.2 General information — specimen . 20
8.2.3 Specific information required for each strain measurement . 20
8.3 Specimen co-ordinates . 21
8.4 Positioning of the specimen. 21
8.5 Measurement directions . 21
8.6 Number and location of measuring positions . 21
8.7 Gauge volume . 21
8.8 Gauge volume centroid considerations . 21
8.9 Temperature . 22
ISO/TS 21432:2005(E)
9 Calculation of stress. 22
9.1 Preamble . 22
9.2 Normal stress determinations . 22
9.3 Stress state determinations. 23
9.3.1 The sin ψ method . 23
9.4 Choice of elasticity constants . 23
9.5 Data analysis . 24
9.5.1 Peak fitting function. 24
9.5.2 Background function . 24
9.5.3 Peak to background ratio . 24
9.5.4 Distorted peak profiles . 24
10 Reliability of results . 25
11 Reporting . 25
11.1 Preamble . 25
11.2 Strain or stress values. 25
11.2.1 Stress free or reference lattice spacing. 26
11.2.2 Conversion of strain to stress . 26
11.2.3 Elasticity constants . 26
11.2.4 Positioning. 26
11.3 Neutron source and instrument. 26
11.4 General measurement procedures. 26
11.5 Specimens/materials properties. 26
11.6 Original data . 27
Annex A (informative) Measurement procedures. 28
Annex B (informative) Determination of uncertainties in a measurand. 36
Bibliography . 39

iv © ISO 2005 – All rights reserved

ISO/TS 21432:2005(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
In other circumstances, particularly when there is an urgent market requirement for such documents, a
technical committee may decide to publish other types of normative document:
— an ISO Publicly Available Specification (ISO/PAS) represents an agreement between technical experts in
an ISO working group and is accepted for publication if it is approved by more than 50 % of the members
of the parent committee casting a vote;
— an ISO Technical Specification (ISO/TS) represents an agreement between the members of a technical
committee and is accepted for publication if it is approved by 2/3 of the members of the committee casting
a vote.
An ISO/PAS or ISO/TS is reviewed after three years with a view to deciding whether it should be confirmed for
a further three years, revised to become an International Standard, or withdrawn. In the case of a confirmed
ISO/PAS or ISO/TS, it is reviewed again after six years at which time it has to be either transposed into an
International Standard or withdrawn.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO/TS 21432 was prepared by the European Committee for Standardization (CEN) Technical Committee
CEN/TC 138, Non-destructive testing, in collaboration with Technical Committee ISO/TC 135, Non-destructive
testing, Subcommittee SC 5, Radiation methods, in accordance with the Agreement on technical cooperation
between ISO and CEN (Vienna Agreement).

ISO/TS 21432:2005(E)
Introduction
Neutron diffraction is a non-destructive method that can be employed for determining residual stresses in
crystalline materials. It can also be used for establishing applied stresses. The procedure can be employed for
determining stresses within the interior of materials and adjacent to surfaces. It requires specimens or
engineering components to be transported to a neutron source. Measurements of elastic strain are obtained
which are then converted to stress. The purpose of this document is to provide the technical specification for
reliably determining stresses that are relevant to engineering applications.
vi © ISO 2005 – All rights reserved

TECHNICAL SPECIFICATION ISO/TS 21432:2005(E)

Non-destructive testing — Standard test method for
determining residual stresses by neutron diffraction
WARNING — This Technical Specification does not purport to address the safety concerns, if any,
associated with its use. It is the responsibility of the user of this Technical Specification to establish
appropriate safety and health practices and determine the applicability of regulatory limitations prior
to use.
1 Scope
This Technical Specification gives the standard test method for determining residual stresses in polycrystalline
materials by neutron diffraction. It is applicable to homogeneous and inhomogeneous materials and to test
pieces containing distinct phases.
The principles of the neutron diffraction technique are outlined. Advice is provided on the diffracting lattice
planes on which measurements should be made for different categories of materials. Guidance is provided
about the directions in which the measurements should be obtained and of the volume of material, which
should be examined, in relation to material grain size and the stress state envisaged, when making
measurements.
Procedures are described for accurately positioning and aligning test pieces in a neutron beam and for
precisely defining the volume of material that is sampled when individual measurements are being made.
The precautions needed for calibrating neutron diffraction instruments are described. Techniques for obtaining
a stress free reference are presented.
The methods of making individual elastic strain measurements by neutron diffraction are described in detail.
Procedures for analysing the results and for determining their statistical relevance are presented. Advice is
provided on how to determine reliable estimates of residual (or applied) stress from the strain data and of how
to estimate the uncertainty in the results.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
EN 13925-3, Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials —
1)
Part 3: Instruments
1) To be published.
ISO/TS 21432:2005(E)
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
absorption
neutron capture by an atomic nucleus
NOTE Tables of nuclear capture cross sections can be found under e.g. http://www.webelements.com and links.
3.2
alignment
adjustment of position and orientation of the specimen and all components of the instrument such that reliable
strain measurements by neutron diffraction can be performed at the desired location in the specimen
3.3
anisotropy
dependence of material properties on orientation
3.4
attenuation
reduction of neutron intensity
NOTE Attenuation can be calculated by using the so called “total neutron cross section”, which comprises absorption
and different nuclear scattering processes. The attenuation length is the distance within the material for which the primary
neutron intensity is reduced by 1/e.
3.5
background
intensity considered not belonging to the diffraction signal
NOTE Background dependence on scattering angle or time-of-flight is not uncommon and can have an influence on
the peak position resulting from data analysis.
3.6
beam defining optics
arrangement of devices used to determine the properties of a neutron beam such as the wavelength and
intensity distributions, divergence and shape
NOTE These include devices such as apertures, slits, collimators, monochromators and mirrors.
3.7
Bragg edge
sudden change in neutron intensity as a function of wavelength or diffraction angle corresponding to
λ=2d where h′k′l′ indicates a diffracting lattice plane
h′ k′ l′
3.8
Bragg peak
intensity distribution of the diffracted beam for a specific hkl lattice plane
3.9
peak height
maximum intensity of the Bragg peak above the background
3.10
peak function
analytical expression to describe the shape of the diffraction line
2 © ISO 2005 – All rights reserved

ISO/TS 21432:2005(E)
3.11
peak position
single value describing the position of a Bragg peak
NOTE The peak position is the determining quantity to calculate strain.
3.12
diffraction
scattering based on interference phenomena
3.13
diffraction elasticity constants
elasticity constants associated with individual (hkl) lattice planes for a polycrystalline material
NOTE They are often called elastic constants and can be denoted as E (diffraction elastic modulus) and ν
hkl hkl
(diffraction Poisson’s ratio).
3.14
diffraction pattern
distribution of scattered neutrons over the available range of wavelengths or times of flight and/or scattering
angles
3.15
full width at half maximum
FWHM
width of the diffraction line at half the maximum height above the background
3.16
full pattern analysis
determination of crystallographic structure and/or microstructure from a measured diffraction pattern of a
polycrystalline material
NOTE In general the full pattern analysis is termed after the method used (e.g. Rietveld refinement) See also single
peak analysis.
3.17
gauge volume
volume from which diffraction data are obtained
NOTE This volume is determined by the intersection of the incident and diffracted neutron beams.
3.18
lattice parameters
linear and angular dimensions of the crystallographic unit cell
NOTE Most engineering materials have either cubic or hexagonal crystal structures. Hence the lattice parameters
usually only refer to the lengths of the unit cell edges.
3.19
lattice spacing
d-spacing
spacing between adjacent crystallographic lattice planes
3.20
macrostress
type I stress
mean stress in a volume containing a large number of grains
NOTE Also called stress of type I.
ISO/TS 21432:2005(E)
3.21
microstress
mean stress deviation in a restricted volume from the macrostress level
NOTE There are two classes of microstress:
⎯ the mean deviation from the macrostress determined over a grain or phase dimension (also called type II);
⎯ the mean deviation from the type II stress determined over a volume of several atomic dimensions (also called
type III).
3.22
monochromatic instrument
neutron instrument employing a narrow band of neutron energies (wavelengths)
3.23
monochromatic neutron beam
neutron beam with narrow band of neutron energies (wavelengths)
3.24
orientation distribution function
quantitative description of the crystallographic texture
NOTE The orientation distribution function is necessary to calculate the elasticity constants of textured materials.
3.25
polychromatic neutron beam
neutron beam containing a continuous range of neutron energies (wavelengths)
3.26
reference point
centroid of the instrumental gauge volume
NOTE See 6.5.
3.27
reproducibility
closeness of the agreement between the results of measurements of the same measurand carried out under
changed conditions of measurements
[VIM: 1993]
NOTE 1 A valid statement of reproducibility requires specification of the conditions changed. These can include
principle of measurements, method of measurements, observer, measuring instrument, reference standard, location,
conditions of use and time.
NOTE 2 Reproducibility can be expressed quantitatively in terms of the dispersion characteristics of the results.
NOTE 3 Results are here usually understood to be corrected results.
3.28
scattering
coherent scattering
scattering of neutrons from ordered scattering centres producing constructive and destructive interference of
the particle waves
3.29
incoherent scattering
scattering of neutrons in an uncorrelated way
4 © ISO 2005 – All rights reserved

ISO/TS 21432:2005(E)
3.30
single peak analysis
statistical procedure to determine the characteristics of a peak and the background from the measured
diffraction data
3.31
texture
preferred orientation of crystallites (crystallographic texture) or reinforcements (morphological texture) within a
specimen
3.32
through surface scan
procedure to determine the position of a specimen surface or interface
NOTE Sometimes also termed surface scan or intensity scan while its result is often called an entering curve.
3.33
time-of-flight
time needed by a neutron of a given speed (i.e. energy or wavelength) to cover the distance from a defined
starting point to the detector
3.34
uncertainty of measurement
parameter, associated with the result of a measurement, that characterises the dispersion of the values that
could reasonably be attributed to the measurand
[VIM: 1993]
NOTE 1 The parameter may be, for example, a standard deviation (or a given multiple of it), or the half-width of an
interval having a stated level of confidence.
NOTE 2 Uncertainty of measurement comprises, in general, many components. Some of these components may be
evaluated from the statistical distribution of the results of a series of measurements and can be characterized by
experimental standard deviations. The other components, which also can be characterized by standard deviations, are
evaluated from assumed probability distributions based on experience or other information.
NOTE 3 It is understood that the result of the measurement is the best estimate of the value of the measured, and that
all components of uncertainty, including those arising from systematic effects, such as components associated with
corrections and reference standards, contribute to the dispersion.
NOTE 4 Uncertainty needs to be distinguished from accuracy of a measurement, which can be influenced by a
systematic bias.
3.35
wall scan
see-through surface scan
4 Symbols and abbreviated terms
4.1 Symbols
a,b,c Lengths of the edges of a unit cell, here referred to as lattice parameters nm
B Background at peak position —
d Lattice spacing nm
e energy
E Elasticity modulus GPa
ISO/TS 21432:2005(E)
E Elasticity modulus associated with the (hkl) diffracting lattice planes GPa
hkl
−1
g strain gradient mm
h Planck’s constant Js
hkl Indices of a crystallographic lattice plane
hkil Alternative indices of a crystallographic lattice plane for hexagonal structures
H Peak height —
I Integrated neutron intensity of a Bragg peak above background

−1
k , k Wave vector of the incident and scattered neutrons nm
i f
L Path length from neutron source to detector m
l Neutron attenuation length mm
−27
m Neutron mass (1.67 × 10kg) kg
n
N Total number of neutrons counted
n
−1
Q Scattering vector (k – k) nm
f i
t Time of flight of neutrons from source to detectors
T Temperature °C or K
u Standard uncertainty —
x,y,z Axes of the specimen co-ordinate system
−1
α Coefficient of thermal expansion K
∆ Variation of, or change in, the parameter that follows
ε Elastic strain —
ε Components of elastic strain tensor —

ij
ε Normal elastic strain associated with the (hkl) diffracting lattice plane —

hkl
λ Wavelength of neutrons nm
v Poisson’s ratio
v Poisson’s ratio associated with the (hkl) diffracting lattice plane
hkl
σ Stress MPa
σ Components of stress tensor MPa
ij
σ Yield stress MPa
Y
2θ diffraction angle degrees
φ, ψ, ω Orientation angles degrees
4.2 Subscripts
hkl, hkil Indicate relevance to crystallographic lattice planes
x, y, z Indicate components along the x-, y-, z-axes of the quantity concerned
φ ψ Indicate the normal component, in the (φ ψ) − direction of the quantity concerned
0 (zero) Indicates strain free value of the quantity concerned
ref Indicates reference value of the quantity concerned
6 © ISO 2005 – All rights reserved

ISO/TS 21432:2005(E)
4.3 Abbreviated terms
PSD Position Sensitive Detector
TOF Time of flight
IGV Instrumental gauge volume
NGV Nominal gauge volume
SGV Sampled gauge volume
5 Summary of method
5.1 Preamble
This Technical Specification is concerned with the determination of residual and/or applied stresses that are
needed in engineering analysis. These are determined from neutron diffraction measurements of the lattice
spacing between crystallographic planes. From changes in these spacings, elastic strains can be derived,
from which stresses can be calculated. By translating a specimen or component through a neutron beam,
stresses at different locations can be determined, provided enough strain measurements are obtained. In this
clause the strain measurement process is summarized.
5.2 Outline of principle — Bragg’s law
When illuminated by radiation of wavelength similar to interplanar spacings crystalline materials diffract this
radiation as distinctive Bragg peaks. The angle at which a diffraction line occurs is given by Bragg’s law of
diffraction.
(1)
2.d sinθ = λ
hkl hkl
where λ is the wavelength of the radiation, d is the spacing of the hkl lattice planes responsible for the Bragg
hkl
peak and θ is the Bragg angle. The peak will be observed at an angle of 2θ from the incident beam, as
hkl
hkl
shown schematically in Figure 1.
5.3 Neutron sources
Neutron diffraction uses neutrons generated by fission or spallation; the former is predominantly employed in
steady-state nuclear reactors and the latter in pulsed spallation sources. In both cases the neutrons produced
are moderated to bring their energies to the thermal range, i.e. λ W 0.09 nm. At reactor sources, a
monochromatic beam of neutrons is usually produced by using a crystal monochromator to select a given
neutron wavelength from the polychromatic beam. At spallation sources, the neutron beam usually consists of
a series of short pulses each containing a spectrum of wavelengths The energy (and therefore wavelength) of
each neutron can be determined by measuring the distance it has travelled to the detector and the time it has
taken to travel this distance, called the time of flight (TOF). TOF measurements are, therefore, wavelength
dependent (sometimes termed energy dispersive), with the entire diffraction pattern being recorded at any
particular scattering angle. Short pulses of polychromatic neutrons can also be produced by one or more
choppers at continuous sources or from long pulses.
5.4 Strain measurement
When a specimen is illuminated by a monochromatic parallel beam of neutrons of known wavelength, its
lattice spacing can be determined from the observed Bragg angle using Bragg’s law (1). If the specimen
contains no strain, the lattice spacings correspond to the strain free (stress free) values for the material and
ISO/TS 21432:2005(E)
are denoted as d . In a stressed specimen lattice spacings are altered and a shift in each Bragg peak
0,hkl
occurs allowing the elastic strains to be given by:
dd− sinθ
∆d
hkl 0,hkl 0,hkl
hkl
ε== = − 1 (2)
hkl
dd sinθ
0,hkl 0,hkl hkl
At a TOF instrument, pulses, containing neutrons spanning a range of velocities, and therefore wavelengths,
are directed at the specimen. From the measured flight time t of detected neutrons, their wavelength is
calculated using the de Broglie relationship to give:
h
λ=⋅ t (3)
mL⋅
n
By substituting (3) into Bragg’s law (1), the time of flight for a particular wavelength and crystal plane
becomes :
m
n
tL=⋅2s⋅inθ⋅d (4)
hkl hkl
h
for a detector positioned at angle 2θ.
As the incident neutron beam is polychromatic, the reflections of all lattice planes normal to the direction in
which the strain is measured are recorded. Each reflection is produced from a different family of grains
oriented such that a specific hkl plane diffracts to the detector. The elastic strain can then be calculated from
the flight time shifts in any of the observed reflections in a manner analogous to that described in equation (2)
so that for a fixed angle 2θ:
tt−−λλ
∆d
hkl 0,hkl hkl 0,hkl
hkl
ε== = (5)
hkl
dt λ
0,hkl 0,hkl 0,hkl
It should be noted that simultaneous recording of reflections of various lattice planes can facilitate analysing
the data by multi-peak fitting or full pattern analysis (see 6.3.2).
For both monochromatic and TOF instruments, the direction in which strain is measured is along the
scattering vector, Q = k - k, which bisects the angle between incident and diffracted beams and is
i
f
perpendicular to the diffracting planes as shown in Figure 1.
5.5 Neutron diffractometers
A monochromatic instrument typically used for strain measurement at a steady state source is shown
schematically in Figure 2. The polychromatic neutron beam is first monochromated to a chosen wavelength by
diffraction from a suitable monochromator. This monochromatic beam is then given spatial definition by the
use of appropriate beam defining optics to produce a beam of controlled dimensions. This beam is then
diffracted from the specimen and captured by a neutron detector. An example of a diffraction peak from a
monochromatic instrument is shown in Figure 3.
At TOF-diffractometers typically used at pulsed sources, each pulse provides a diffraction profile across a
large range of lattice spacings. A typical TOF-diffractometer used for strain measurement in two directions
simultaneously at a pulsed source is shown in Figure 4. As a fixed scattering angle is used, most instruments
at spallation sources use radial (focussing) collimation. This allows neutrons to be detected over a wider solid
angle than would be possible using a slit, yet ensuring that most of the detected neutrons come from a defined
gauge volume (see 6.5). The signals from the individual elements of the detector array are combined taking
into account their different angular positions. Two or more detectors with radial collimators can be used to
enable more than one Q (strain) direction to be measured simultaneously. A typical diffraction pattern from
such an instrument is shown in Figure 5 which also shows the result of a Rietveld profile refinement where a
crystallographic model of the structure is fitted to the diffraction data using a least squares analysis (see 6.3.2).
8 © ISO 2005 – All rights reserved

ISO/TS 21432:2005(E)
5.6 Stress determination
Stress and elastic strain are second rank tensors that are related through a solid’s elasticity constants. Since
neutron diffraction can measure the elastic strain within a defined volume in a crystalline solid, it is possible to
calculate the mean stress in that volume provided the relevant material elasticity constants are known. Full
determination of the strain tensor requires measurements of the elastic strain in at least six independent
directions. If the principal strain directions within the body are known, measurements along these three
directions are sufficient. For plane stress or plane strain conditions, a further reduction to two directions is
possible. Measurement along one direction only is needed in the case of uni-axial loading.
Stresses and strains in a specimen are usually direction and position dependent. This leads to the need to
measure strains at a number of locations in more than one direction. This in turn requires accurate positioning
of the specimen with respect to the collimated neutron beam and the detectors. This is usually accomplished
with linear translation and rotation tables, on which the specimen is mounted.
By sequentially moving the specimen through the volume (termed a gauge volume, see clause 6.5) in space
identified by the intersection of the incident and diffracted beams, the spatial variation in elastic strain and,
following measurement in other directions, stress can be mapped within a specimen or component.

Key
1 diffracted wave vector k 3 scattering vector Q
f
2 incident wave vector k 4 diffracting planes
i
Figure 1 — Schematic illustration of Bragg scattering geometry
ISO/TS 21432:2005(E)
Key
1 neutron beam from source
2 monochromator
3 beam defining optics for the incident beam and shielding
4 specimen
5 gauge volume
6 detector
7 beam defining optics for the diffracted beam and shielding
8 beam stop
Q scattering vector
a
Scattering angle.
Figure 2 — Schematic illustration of a steady state source based diffractometer for strain
measurement
Key
1 2θ, degrees
2 neutron counts
Figure 3 — Example of a Bragg peak from a reactor (steady state source) based diffractometer fitted
with a Gaussian distribution
10 © ISO 2005 – All rights reserved

ISO/TS 21432:2005(E)
Key
Q scattering vector, right detector
Q' scattering vector, left detector

1 beam from source
2 right detector
3 radial collimator
4 specimen
5 gauge volume
6 left detector
7 beam-stop
Figure 4 — Schematic illustration of a pulsed-source TOF diffractometer for strain measurement

Figure 5 — Example of a diffraction pattern from a pulsed source. The solid line is the result of a
Rietveld fit to the data as described in 6.3.2
ISO/TS 21432:2005(E)
6 Preparations for measurements
6.1 Preamble
Prior to an actual strain measurement it is necessary to align the instrument and/or verify its alignment. Then
appropriate conditions for the diffraction measurement have to be chosen and the specimen has to be
positioned accurately on the diffraction instrument. Also the size and shape of the volume from which
diffraction will be observed have to be determined, and the value has to be assessed of the d-spacing with
respect to which the strain will be determined.
6.2 Alignment and calibration of the instrument
It is necessary to align and calibrate the diffractometer being used (see A.4.2). When using a monochromatic
beam instrument, it is necessary to ensure that a constant wavelength is maintained throughout the entire set
2)
of measurements and that the detector angular response has been calibrated (see EN 13925-3:— Annex C).
At a TOF-diffractometer, both the flight path and detector angular response should be calibrated. In both
cases this is done using a standard stress free specimen typically silicon, ceria or alumina powders. Such
specimens are chosen because they diffract neutrons well, have known and well defined lattice parameters
and have small intrinsic peak widths. If intensity information is required at a TOF instrument it is necessary to
determine the incident neutron flux and the detector efficiency as a function of wavelength. One way of doing
this is to use an incoherent scatterer, such as vanadium.
6.3 Choice of diffraction conditions
6.3.1 Monochromatic instruments
6.3.1.1 Choice of wavelength
At monochromatic instruments the user shall choose the neutron wavelength for a particular experiment from
the range of wavelengths available. The wavelength and diffraction plane should be selected such that
efficient execution of the experiment is achieved for a diffraction angle near 90°. However, if the chosen
wavelength is close to twice the d–spacing of any diffraction plane in the specimen, “Bragg edge” related
spectrum distortion can occur which can cause artificial peak shifts. These ‘problematic’ wavelengths have
[1]
been tabulated in for several common metals over a range commonly used for st
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