CEN/TS 16794-2:2015

SLOVENSKI STANDARD
01-september-2015
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Public transport - Communication between contactless readers and fare media - Part 2:
Test plan for ISO/IEC 14443
Öffentlicher Verkehr - Kommunikation zwischen berührungslosen Lesegeräten und
Fahrschein Medien - Teil 2: Prüfplan zur ISO/IEC 14443
Transport Public - Système billettique interopérable - Communication entre terminaux et
objets sans contact - Partie 2 : Plan de test pour l’ISO/IEC 14443
Ta slovenski standard je istoveten z: CEN/TS 16794-2:2015
ICS:
03.220.01 Transport na splošno Transport in general
35.240.60 Uporabniške rešitve IT v IT applications in transport
transportu in trgovini and trade
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

TECHNICAL SPECIFICATION
CEN/TS 16794-2
SPÉCIFICATION TECHNIQUE
TECHNISCHE SPEZIFIKATION
April 2015
ICS 35.240.15
English Version
Public transport - Communication between contactless readers
and fare media - Part 2: Test plan for ISO/IEC 14443
Transport Public - Système billettique interopérable - Öffentlicher Verkehr - Kommunikation zwischen
Communication entre terminaux et objets sans contact - berührungslosen Ladegeräten und Fahrscheinmedien - Teil
Partie 2: Plan de test pour l'ISO/IEC 14443 2: Prüfplan zur ISO/IEC 14443
This Technical Specification (CEN/TS) was approved by CEN on 24 February 2015 for provisional application.

The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to submit their
comments, particularly on the question whether the CEN/TS can be converted into a European Standard.

CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available
promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS)
until the final decision about the possible conversion of the CEN/TS into an EN is reached.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United
Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN/TS 16794-2:2015 E
worldwide for CEN national Members.

Contents Page
Foreword .3
Introduction .4
1 Scope .5
2 Normative references .5
3 Terms and definitions .7
4 Symbols and abbreviations .7
5 Description of the test environment .7
5.1 Test bench .7
5.2 Tolerances applicable to ambient-environment tests.7
5.3 PCD or PICC test conditions .7
5.4 Positional tolerance .8
5.5 Admissible tolerances on the measurements .8
6 PCD – Analog test plan .8
6.1 PCD general test conditions .8
6.2 Conformance of the PCD field strength .8
6.3 Conformance of the PCD modulation waveform . 10
6.4 Conformance of the PCD load modulation reception . 11
6.5 Conformance of the PCD sensitivity to electromagnetic disturbance . 12
7 PICC – Analog test plan . 15
7.1 PICC general test conditions . 15
7.2 Conformance of the PICC characteristics . 16
8 PCD – Protocol and digital test plan . 21
8.1 PCD general test conditions . 21
8.2 PCD Digital conformance to ISO/IEC 14443- series . 21
8.3 Conformance of the PCD characteristics . 21
9 PICC – Protocol and digital test plan . 26
9.1 PICC general test conditions . 26
9.2 PICC Digital conformance to ISO/IEC 14443- series . 26
9.3 Conformance of the PICC characteristics . 26
Annex A (informative) Test report templates . 31
A.1 PCD – Test results summary . 31
A.2 PCD – Analog test results (detailed) . 33
A.3 PCD – Protocol and digital test results (detailed) . 40
A.4 PICC – Test results summary . 41
A.5 PICC – Analog test results (detailed) . 42
A.6 PICC – Protocol and digital test results (detailed) . 45

Foreword
This document (CEN/TS 16794-2:2015) has been prepared by Technical Committee CEN/TC 278 “Intelligent
transport systems”, the secretariat of which is held by NEN.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CEN [and/or CENELEC] shall not be held responsible for identifying any or all such patent rights.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following
countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria, Croatia, Cyprus,
Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Introduction
This test plan represents a necessary step in a process designed to ensure contactless communications
interoperability between fare management system terminals and any fare media liable to be accepted by
them. The end-purpose of this document is to provide the test conformance plan that needs to be performed
to ensure compliancy of fare management system terminals and any fare media in accordance to
CEN/TS 16794-1, Public transport - Communication between contactless readers and fare media - Part 1:
Implementation requirements for ISO/IEC 14443.
This test plan is not designed to repeat or duplicate the referenced specifications and associated test method
(essentially ISO/IEC 14443 and ISO/IEC 10373-6 standards) but to list the test conditions to be performed in
addition to the ones already described in the ISO/IEC 10373-6 standard and to define their testing and use
conditions.
This test plan includes the following key clauses:
— Clause 5 describes the test environment;
— Clause 6 sets out the analog test plan for fare management system terminals;
— Clause 7 sets out the analog test plan for contactless fare media;
— Clause 8 sets out the protocol and digital test plan for fare management system terminals;
— Clause 9 sets out the protocol and digital test plan for contactless fare media.
1 Scope
This Technical Specification comes as a complement to the technical requirements expressed in
CEN/TS 16794-1, Public transport - Communication between contactless readers and fare media - Part 1:
Implementation requirements for ISO/IEC 14443, for ensuring contactless communication interoperability
between contactless fare management system terminals and contactless fare media hosting a transport
ticketing application.
This test plan lists all the test conditions to be performed on a contactless reader or a contactless fare media
in order to ensure that all the requirements specified in CEN/TS 16794-1 are met for the device under test.
This Technical Specification is then applicable to:
— any contactless fare management system terminals acting as a PCD contactless reader based on
ISO/IEC 14443-series standards;
— any contactless fare media acting as a PICC contactless object based on ISO/IEC 14443-series
standards.
This test plan applies solely to the contactless communication layers described in parts 1 to 4 of the
ISO/IEC 14443- series of standards. Application-to-application exchanges executed once contactless
communication has been established at RF level fall outside the scope of this test plan. However, a transport
ticketing application will need to be used so as to make end-to-end transactions during tests on the RF
communication layer.
This test plan does not duplicate the contents of ISO/IEC 14443- series or ISO/IEC 10373-6 standards. It
makes reference to the ISO/IEC 10373-6 applicable tests methods, specifies the test conditions to be used
and describes the additional specific test conditions that may be run.
The list of test conditions applicable to the device under test will be conditioned by the Information
Conformance Statement (ICS) declaration made by the device manufacturer. For each test case, the test
conditions are clearly specified in order to determine the pertinence to run or not the test case in accordance
with the device capabilities or in accordance with the device manufacturer’s choice.
In order to facilitate the test report issuance, a test report template is included in Annex A of the present test
plan.
Although the present test plan aims at becoming the primary basis for certification of contactless
communication protocol between contactless reader and contactless object, it does not describe any
certification or qualification processes as such processes should be defined between local or global transit
industry stakeholders and not within this CEN work group.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO/IEC 10373-6:2011, Identification cards — Test methods — Part 6: Proximity cards
ISO/IEC 10373-6:2011/Amd.1:2012, Identification cards — Test methods — Part 6: Proximity cards /
Amendment 1: Additional PICC classes
ISO/IEC 10373-6:2011/Amd.2:2012, Identification cards — Test methods — Part 6: Proximity cards /
Amendment 2: Test methods for electromagnetic disturbance
ISO/IEC 10373-6:2011/Amd.3:2012, Identification cards — Test methods — Part 6: Proximity cards /
Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2
ISO/IEC 10373-6:2011/Amd.4:2012, Identification cards — Test methods — Part 6: Proximity cards /
Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes
ISO/IEC 10373-6:2011/Cor:2013, Identification cards — Test methods — Part 6: Proximity cards / R2 value
range, start of PICC transmission and program for EMD level measurement
ISO/IEC 14443-1:2008, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 1: Physical characteristics
ISO/IEC 14443-1:2008/Amd.1:2012, Identification cards — Contactless integrated circuit cards — Proximity
cards — Part 1: Physical characteristics / Amendment 1: Additional PICC classes
ISO/IEC 14443-2:2010, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 2: Radio frequency power and signal interface
ISO/IEC 14443-2:2010/Amd.1:2011, Identification cards — Contactless integrated circuit cards — Proximity
cards — Part 2: Radio frequency power and signal interface / Amendment 1: Limits of electromagnetic
disturbance levels parasitically generated by the PICC
ISO/IEC 14443-2:2010/Amd.2:2012, Identification cards — Contactless integrated circuit cards — Proximity
cards — Part 2: Radio frequency power and signal interface / Amendment 2: Additional PICC classes
ISO/IEC 14443-2/Amd.3:2012, Identification cards — Contactless integrated circuit cards — Proximity cards
— Part 2: Radio frequency power and signal interface / Amendment 3: Bits rates of fc/8, fc/4 and fc/2
ISO/IEC 14443-3:2011, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 3: Initialization and anticollision
ISO/IEC 14443-3:2011/Amd.1:2011, Identification cards — Contactless integrated circuit cards — Proximity
cards — Part 3: Initialization and anticollision / Amendment 1: Electromagnetic disturbance handling and
single-size unique identifier
ISO/IEC 14443-3:2011/Amd.2:2012, Identification cards — Contactless integrated circuit cards — Proximity
cards — Part 3: Initialization and anticollision / Amendment 2: Bit rates of fc/8, fc/4 and fc/2, frame size from
512 bytes to 4 096 bytes and minimum TR0
ISO/IEC 14443-4:2008, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 4: Transmission protocol
ISO/IEC 14443-4:2008/Amd.1:2012, Identification cards — Contactless integrated circuit cards — Proximity
cards — Part 4: Transmission protocol / Amendment 1: Exchange of additional parameters
ISO/IEC 14443-4:2008/Amd.2:2012, Identification cards — Contactless integrated circuit cards — Proximity
cards — Part 4: Transmission protocol / Amendment 2: Bit rates of fc/8, fc/4 and fc/2, protocol activation of
PICC Type A and frame size from 512 bytes to 4 096 bytes
CEN/TS 16794-1:2015, Public transport — Communication between contactless readers and fare media —
Part 1: Implementation requirements for ISO/IEC 14443
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
Reference PICC
Reference PICC card as defined in test method ISO/IEC 10373-6:2011
4 Symbols and abbreviations
The following abbreviated terms are used in this document.
AFI Application Family Identifier, Type B
ATQA Answer To Request, Type A
ATQB Answer To Request, Type B
FWI Frame Waiting time Integer
FSCI Frame Size for proximity Card Integer
PCD Proximity Coupling Device
PICC Proximity IC Card
PUPI Pseudo-Unique PICC Identifier, Type B
REQA Request Command, Type A
REQB Request Command, Type B
RF Radio Frequency
SFGT Start-up Frame Guard Time
UID Unique Identifier, Type A
WUPA Wake-UP Command, Type A
WUPB Wake-UP Command, Type B
5 Description of the test environment
5.1 Test bench
The test bench shall conform to the specifications set out in Clause 5 of ISO/IEC 10373-6:2011 and
ISO/IEC 10373-6:2011/Amd.2:2012.
5.2 Tolerances applicable to ambient-environment tests
Parameter Unit Absolute tolerance
Temperature Degrees Celsius (°C) ± 3 °C
Relative humidity Percentage (%) ± 5 %
5.3 PCD or PICC test conditions
Parameter Unit Value
Temperature Degrees Celsius (°C) Minimum Temperature and
Ambient Temperature and
Maximum Temperature
5.4 Positional tolerance
Parameter Unit Tolerance
PICC-to-PCD distance Millimetres (mm) ± 1 mm, except at 0
5.5 Admissible tolerances on the measurements
Tolerances specified in ISO/IEC 10373-6:2011 shall be applied.
NOTE Different tolerances for some parameters are being standardized in a draft amendment to
ISO/IEC 10373-6:2011.
6 PCD – Analog test plan
6.1 PCD general test conditions
Unless otherwise specified, each test shall be executed:
— with Reference PICCs 1, 2 and 3 at every position of range A (Position A1 to A5),
— with Reference PICC 3 at every position of range B (Position B1 to B3),
which makes a total of 18 test conditions.
For Common Readers, the range A is limited from position A1 to A2 and the range B is limited from position
B1 to B2. Consequently, for common readers, tests specified in several positions of range A and of range B
shall be done only in positions A1, A2, B1 and B2.
As specified in CEN/TS 16794-1:2015, 9.2.3.2, if the measurements cannot be taken from Position A1 then
the measurements shall be taken from Position A1' where the Reference PICC is in contact with the PCD
device under test.
As specified in CEN/TS 16794-1:2015, 9.2.3.4, if the measurements cannot be taken from Position B1 then
the measurements shall be taken from Position B1' where the Reference PICC is in contact with the PCD
device under test.
6.2 Conformance of the PCD field strength
6.2.1 General
The maximum and minimum PCD field strength tests shall be done during an interval of time when the PCD
produces a field. One possibility is to use an oscilloscope and measure the field strength during the interval of
time preceding a request or wake-up command. If the PCD under test provides a specific "continuous
unmodulated field" mode, another possibility is to use a voltmeter.
6.2.2 TC_PCD_A_MaxFS: PCD maximum field strength
6.2.2.1 Scope / purpose
This test verifies the maximum magnetic field strength in the PCD operating volume (range A and range B).
6.2.2.2 Test conditions
At ambient, minimum and maximum temperatures, Reference PICCs 1, 2 and 3 within range A and Reference
PICC 3 within range B.
6.2.2.3 Test procedure
test defined in ISO/IEC 10373-6:2011, 7.1.1.2 by moving the Reference PICCs
Perform the procedure for H
max
in all the positions of the PCD operating volume defined in 6.2.2.2.
6.2.2.4 Test report
The test report shall give the maximum DC voltage measured at CON3 under the conditions applied.
Fill the TC_PCD_A_MaxFS row of test plan summary in accordance with the following table:
Table 1 — Result criteria for maximum PCD field strength test
Explanation Test result
Only when the DC voltages at CON3 does not
PASS
exceed 3 V in all 12 test conditions
When the DC voltages at CON3 exceeds 3 V in
FAIL
at least one of the 12 test conditions
6.2.3 TC_PCD_A_ MinFS : PCD minimum field strength
6.2.3.1 Scope / purpose
This test verifies the minimum magnetic field strength in the PCD operating volume (range A and range B).
6.2.3.2 Test conditions
At ambient, minimum and maximum temperatures, Reference PICCs 1, 2 and 3 within range A and Reference
PICC 3 within range B.
6.2.3.3 Test procedure
Perform the procedure for H test defined in ISO/IEC 10373-6:2011, 7.1.1.2 (amended by
min
ISO/IEC 10373-6:2011/Amd.1:2012) by moving the Reference PICCs in all the positions of the PCD operating
volume defined in 6.2.3.2.
In addition, perform the previous procedure, using the minimum field strength specified for range B instead of
H , by moving the Reference PICC 3 in all the positions of range B.
min
6.2.3.4 Test report
The test report shall give the minimum DC voltage measured at CON3 under the conditions applied.
Fill the TC_PCD_A_ MinFS row of test plan summary in accordance with the following table:
Table 2 — Result criteria for minimum PCD field strength test
Explanation Test result
Only when the DC voltages at CON3 exceeds
V as defined in
load
PASS
ISO/IEC 10373-6:2011/Amd.1:2012, Table 3 in
all 12 test conditions
When the DC voltages at CON3 does not
exceed V as defined in
load
FAIL
ISO/IEC 10373-6:2011/Amd.1:2012, Table 3 in
at least one of the 12 test conditions
6.3 Conformance of the PCD modulation waveform
6.3.1 TC_PCD_A_TAMW: Type A modulation waveform
6.3.1.1 Scope / purpose
This test verifies the Type A modulation waveform in the PCD operating volume (range A and range B).
6.3.1.2 Test conditions
At ambient, minimum and maximum temperatures, Reference PICCs 1 and 2 in Position A1, Reference PICC
3 in Position B1 and the calibration coil at an arbitrary position.
6.3.1.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011, 7.1.4.2 (amended by
ISO/IEC 10373-6:2011/Amd.1:2012) for all the positions of the PCD operating volume defined in 6.3.1.2 and
for all supported PCD to PICC bit rates.
6.3.1.4 Test report
The test report shall give the measured Type A modulation pulse, rise and fall times and overshoot values
under the conditions applied.
Fill the TC_PCD_A_TAMW row of test plan summary in accordance with the following table for all supported
PCD to PICC bit rates.
Table 3 — Result criteria for Type A modulation waveform test
Explanation Test result
Only when the Type A modulation pulse, rise
and fall times and overshoot values are PASS
compliant in all 12 test conditions
When at least one value is not compliant in at
FAIL
least one of the 12 test conditions
6.3.2 TC_PCD_A_TBMW: Type B modulation index and waveform
6.3.2.1 Scope / purpose
This test verifies the Type B modulation index and the waveform in the PCD operating volume (range A and
range B).
6.3.2.2 Test conditions
At ambient, minimum and maximum temperatures, Reference PICCs 1 and 2 in Position A1, Reference PICC
3 in Position B1 and the calibration coil at an arbitrary position.
6.3.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011, 7.1.4.2 (amended by
ISO/IEC 10373-6:2011/Amd.1:2012) for all the positions of the PCD operating volume defined in 6.3.2.2 and
for all supported PCD to PICC bit rates.
6.3.2.4 Test report
The test report shall give the measured type B modulation index, rise and fall times and overshoot values
under the conditions applied.
Fill the TC_PCD_A_TBMW row of test plan summary in accordance with the following table for all supported
PCD to PICC bit rates.
Table 4 — Result criteria for Type B modulation index and waveform test
Explanation Test result
Only when the Type B modulation index, rise
and fall times and overshoot values are PASS
compliant in all 12 test conditions
When at least one value is not compliant in at
FAIL
least one of the 12 test conditions
6.4 Conformance of the PCD load modulation reception
6.4.1 TC_PCD_A_TALMR: Type A load modulation reception
6.4.1.1 Scope / purpose
This test verifies the Type A load modulation reception in the PCD operating volume (range A and range B).
6.4.1.2 Test conditions
At ambient temperature, see 6.1.
At minimum and maximum temperatures, only Reference PICC 1 in Position A2 and Reference PICC 3 in
Position B2.
6.4.1.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011, 7.1.5.2 (amended by
ISO/IEC 10373-6:2011/Amd.1:2012) in all the defined positions of the PCD operating volume and for all
supported PICC to PCD bit rates, except bit rates of fc/64 (~212 kbit/s), fc/32 (~424 kbit/s) and fc/16 (~848
kbit/s).
6.4.1.4 Test report
The test report shall give the PCD Type A load modulation sensitivity under the conditions applied.
Fill the TC_PCD_A_TALMR row of test plan summary in accordance with the following table for all supported
PICC to PCD bit rates.
Table 5 — Result criteria for Type A load modulation reception test
Explanation Test result
Only when the PCD Type A load modulation
sensitivity is below the standard limit in all 44 PASS
test conditions
When the PCD Type A load modulation
sensitivity is above the standard limit in at least FAIL
one of the 44 test conditions
6.4.2 TC_PCD_A_TBLMR: Type B load modulation reception
6.4.2.1 Scope / purpose
This test verifies the Type B load modulation reception in the PCD operating volume (range A and range B).
6.4.2.2 Test conditions
At ambient temperature, see 6.1.
At minimum and maximum temperatures, only Reference PICC 1 in Position A2 and Reference PICC 3 in
Position B2.
6.4.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011, 7.1.5.2 (amended by
ISO/IEC 10373-6:2011/Amd.1:2012) in all the defined positions of the PCD operating volume and for all
supported PICC to PCD bit rates, except bit rates of fc/64 (~212 kbit/s), fc/32 (~424 kbit/s) and fc/16 (~848
kbit/s).
6.4.2.4 Test report
The test report shall give the PCD Type B load modulation sensitivity under the conditions applied.
Fill the TC_PCD_A_TBLMR row of test plan summary in accordance with the following table for all supported
PICC to PCD bit rates.
Table 6 — Result criteria for Type B load modulation reception test
Explanation Test result
Only when the PCD Type B load modulation
sensitivity is below the standard limit in all 44 PASS
test conditions
When the PCD Type B load modulation
sensitivity is above the standard limit in at least FAIL
one of the 44 test conditions
6.5 Conformance of the PCD sensitivity to electromagnetic disturbance
6.5.1 General
The following tests shall be performed on the first applicative command sent by the PCD.
6.5.2 TC_PCD_A_TAEI: Type A EMD immunity
6.5.2.1 Scope / purpose
This test verifies that the PCD is insensitive to any Type A load modulation amplitude below V .
E,PCD
6.5.2.2 Test conditions
At ambient temperature, only Reference PICC 1 in Position A1 and Position A2 of range A.
6.5.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011/Amd.2:2012, 7.1.6.2 for all the defined positions
of the PCD operating volume defined in 6.5.2.2 and for all supported PICC to PCD bit rates.
6.5.2.4 Test report
The test report shall state whether the PCD was insensitive to any Type A load modulation amplitude below
under the conditions applied.
V
E,PCD
The test report shall indicate the VEMD as obtained in accordance with step f) of
ISO/IEC 10373-6:2011/Amd.2:2012, 7.1.6.2 for all the defined positions of the PCD operating volume defined
in 6.5.2.2 and for all supported PICC to PCD bit rates.
Fill the TC_PCD_A_TAEI row of test plan summary in accordance with the following table for all supported
PICC to PCD bit rates.
Table 7 — Result criteria for Type A EMD immunity test
Explanation Test result
Only when the PCD is insensitive to any Type A
load modulation amplitude below V in all 2 PASS
E,PCD
test conditions
When the PCD is not insensitive to any Type A
load modulation amplitude below V in at FAIL
E,PCD
least one of the 2 test conditions
6.5.3 TC_PCD_A_TBEI: Type B EMD immunity
6.5.3.1 Scope / purpose
This test verifies that the PCD is insensitive to any Type B load modulation amplitude below V .
E,PCD
6.5.3.2 Test conditions
At ambient temperature, only Reference PICC 1 in Position A1 and Position A2 of range A.
6.5.3.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011/Amd.2:2012, 7.1.6.2 for all the positions of the
PCD operating volume defined in 6.5.3.2 and for all supported PICC to PCD bit rates.
6.5.3.4 Test report
The test report shall state whether the PCD was insensitive to any Type B load modulation amplitude below
V under the conditions applied.
E,PCD
The test report shall indicate the VEMD as obtained in accordance with step f) of
ISO/IEC 10373-6:2011/Amd.2:2012, 7.1.6.2 for all the positions of the PCD operating volume defined in
6.5.3.2 and for all supported PICC to PCD bit rates.
Fill the TC_PCD_A_TBEI row of test plan summary in accordance with the following table for all supported
PICC to PCD bit rates.
Table 8 — Result criteria for Type B EMD immunity test
Explanation Test result
Only when the PCD is insensitive to any Type B
load modulation amplitude below V in all 2 PASS
E,PCD
test conditions
When the PCD is not insensitive to any Type B
load modulation amplitude below V in at FAIL
E,PCD
least one of the 2 test conditions
6.5.4 TC_PCD_A_TAER: Type A EMD handling timing constraints
6.5.4.1 Scope / purpose
This test verifies that the PCD is not disturbed by a Type A test pattern sent t before the Type A PICC
E,PCD
answer.
6.5.4.2 Test conditions
At ambient temperature, only Reference PICC 1 in Position A2.
No test at minimum and maximum temperatures.
6.5.4.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011/Amd.2:2012, 7.1.7.2 for all the positions of the
PCD operating volume defined in 6.5.4.2 and only for initial PICC to PCD bit rate (106 kbit/s).
If the PCD is disturbed by a Type A test pattern sent t before the Type A PICC answer, repeat the test
E,PCD
procedure replacing t with longer times, to determine if an EMD recovery algorithm is implemented and its
E,PCD
recovery time (longer than the low EMD time t ).
E,PCD
6.5.4.4 Test report
The test report shall state whether the PCD was not disturbed by a Type A test pattern sent t before the
E,PCD
PICC answer (or was able to recover from the test pattern) under the conditions applied.
In case, the PCD is disturbed by a Type A test pattern sent t before the Type A PICC answer, the support
E,PCD
of an EMD recovery algorithm and the recovery time shall be indicated in the test report.
Fill the TC TC_PCD_A_TAER row of test plan summary in accordance with the following table for all
supported PICC to PCD bit rates.
Table 9 — Result criteria for Type A EMD recovery test
Explanation Test result
Only when the PCD is not disturbed by a Type A
test pattern sent t before the Type A PICC PASS
E,PCD
answer
When the PCD is disturbed by a Type A test
pattern sent t before the Type A PICC
FAIL
E,PCD
answer
6.5.5 TC_PCD_A_TBER: Type B EMD handling timing constraints
6.5.5.1 Scope / purpose
This test verifies that the PCD is not disturbed by a Type B test pattern sent t before the Type B PICC
E,PCD
answer.
6.5.5.2 Test conditions
At ambient temperature, only Reference PICC 1 in Position A2.
No test at minimum and maximum temperatures.
6.5.5.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011/Amd.2:2012, 7.1.7.2 for all the positions of the
PCD operating volume defined in 6.5.5.2 and only for initial PICC to PCD bit rate (106 kbit/s).
If the PCD is disturbed by a Type B test pattern sent t before the Type B PICC answer, repeat the test
E,PCD
procedure replacing t with longer times, to determine if an EMD recovery algorithm is implemented and its
E,PCD
recovery time (longer than the low EMD time t ).
E,PCD
6.5.5.4 Test report
The test report shall report whether the PCD was not disturbed by a Type B test pattern sent t before the
E,PCD
PICC answer (or was able to recover from the test pattern) under the conditions applied.
In case, the PCD is disturbed by a Type B test pattern sent t before the Type B PICC answer, the support
E,PCD
of an EMD recovery algorithm and the recovery time shall be indicated in the test report.
Fill the TC_PCD_A_TBER row of test plan summary in accordance with the following table for all supported
PICC to PCD bit rates.
Table 10 — Result criteria for Type B EMD recovery test
Explanation Test result
Only when the PCD is not disturbed by a Type B
test pattern sent t before the Type B PICC PASS
E,PCD
answer
When the PCD is disturbed by a Type B test
pattern sent t before the Type B PICC
FAIL
E,PCD
answer
7 PICC – Analog test plan
7.1 PICC general test conditions
Unless otherwise specified, each test shall be executed:
, 2 A/m, 2,5 A/m, 3,5 A/m, 4,5 A/m, 6 A/m and H (in
— at ambient temperature with field strengths of H
min max
accordance with PICC class),
and H (in accordance with PICC
— at minimum and maximum temperatures with field strengths of H
min max
class),
which makes a total of 11 test conditions (7 at ambient temperature, 2 at minimum temperature and 2 at
maximum temperature).
7.2 Conformance of the PICC characteristics
7.2.1 TC_PICC_A_OFS: PICC operating field strength
7.2.1.1 Scope / purpose
and H as defined in ISO/IEC 14443-2.
This test verifies that the PICC operates as intended within H
min max
7.2.1.2 Test conditions
7.2.1.2.1 General test conditions
See 7.1.
and maximum temperature, the PICC shall be put in horizontal position
When the test condition is both H
max
and no ventilation shall be used during the test in order to limit the PICC's heat dissipation. The test shall be
without any field shut-off and with no
preceded by a one-minute PICC exposition to a field strength of H
max
ventilation so that the PICC chip has reached its maximum temperature when the test starts. The air
temperature value during test execution shall remain within required tolerances.
If necessary, the thermal inertia of the chamber may be increased (e.g. by adding water bottles and waiting for
their thermal stabilisation) so that the air temperature value during test execution remain within required
tolerances despite a shut-off of the climatic chamber.
7.2.1.2.2 Timing and waveform test conditions
For PICC Type A:
— Use the timing and waveform test condition 1 defined in ISO/IEC 10373-6:2011, 7.2.2.2.1 for a PCD to
PICC bit rate of fc/128,
— Use the timing and waveform test condition 1 defined in ISO/IEC 10373-6:2011, 7.2.2.2.2 for PCD to
PICC bit rates of fc/64, fc/32 and fc/16,
— Use the timing and waveform test condition 1 with minimum modulation index m defined in
ISO/IEC 10373-6:2011/Amd.4:2012, 7.2.2.4 for PCD to PICC bit rates of fc/8, fc/4 and fc/2.
For PICC Type B:
— Use the timing and waveform test condition 1 with minimum modulation index m defined in
ISO/IEC 10373-6:2011, 7.2.2.3 for PCD to PICC bit rates of fc/128, fc/64, fc/32 and fc/16,
— Use the timing and waveform test condition 1 with minimum modulation index m defined in
ISO/IEC 10373-6:2011/Amd.4:2012, 7.2.2.4 for PCD to PICC bit rates of fc/8, fc/4 and fc/2.
7.2.1.3 Test procedure
For each test condition defined in 7.2.1.2 (i.e. each combination of a general test condition and a timing and
waveform test condition), perform the following test procedure using the PICC-test-apparatus:
a) With the PICC in the DUT position, adjust the RF power delivered by the signal generator to the test PCD
antenna to the required field strength as measured by the calibration coil.
b) Run the following sequence of commands:
1) For PICC Type A:
i) REQA command
ii) ANTICOLLISION and SELECT commands
iii) RATS command
iv) PPS command (*)
v) TEST_COMMAND_SEQUENCE
2) For PICC Type B:
i) REQB command
ii) ATTRIB command
iii) TEST_COMMAND_SEQUENCE
The definition of the TEST_COMMAND_SEQUENCE to apply is defined in the PICC ICS as indicated in
CEN/TS 16794-1.
(*) Note that the PPS command is not applicable, if the default bit rate of fc/128 is used in both directions.
7.2.1.4 Test report
The test report shall confirm the intended operation at the mandatory fc/128 (~106 kbit/s) bit rate. For PICCs
supporting one or more of the optional PCD to PICC bit rates the test report shall confirm the intended
operation at the supported PCD to PICC bit rates. Used test conditions shall be mentioned in the test report.
Fill the TC_PICC_A_OFS row of test plan summary in accordance with the following table for all supported
PCD to PICC bit rates.
Table 11 — Result criteria for PICC operating field strength test for each PCD to PICC bit rate
supported by the PICC
Explanation Test result
Only when the PICC responds correctly to the test
sequence transmitted at each supported PCD to PICC PASS
bit rate in all 11 test conditions
If the PICC does not respond correctly to at least one
step of the test sequence transmitted at at least one
FAIL
supported PCD to PICC bit rate in at least one of the 11
test conditions
7.2.2 TC_PICC_A_LMA: PICC transmission
7.2.2.1 Scope / purpose
This test verifies that the load modulation amplitude of the PICC within the operating field range is as specified
in ISO/IEC 14443-2.
7.2.2.2 Test conditions
7.2.2.2.1 General test conditions
See 7.1.
7.2.2.2.2 Timing and waveform test conditions
See 7.2.1.2.2.
7.2.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011, 7.2.1 (amended by
ISO/IEC 10373-6:2011/Amd.1:2012 and by ISO/IEC 10373-6:2011/Amd.4:2012) in all test conditions defined
in 7.2.2.2 and for all supported PICC to PCD bit rates, except bit rates of fc/64 (~212 kbit/s), fc/32 (~424 kbit/s)
and fc/16 (~848 kbit/s).
7.2.2.4 Test report
The test report shall give the measured peak amplitudes of the upper and lower sidebands at fc + fs and fc –
fs under the conditions applied.
Fill the TC_PICC_A_LMA row of test plan summary in accordance with the following table for all supported
PICC to PCD bit rates, except bit rates of fc/64 (~212 kbit/s), fc/32 (~424 kbit/s) and fc/16 (~848 kbit/s).
Table 12 — Result criteria for PICC load modulation amplitude test
Explanation Test result
Only when the amplitudes of the upper and lower
sidebands are above the defined limit in all 11 test PASS
conditions
If the amplitude of at least one sideband is below the
FAIL
defined limit in at least one of the 11 test conditions
7.2.3 TC_PICC_A_Rec: PICC reception
7.2.3.1 Scope / purpose
This test verifies that the PICC is able to receive PCD commands.
7.2.3.2 Test conditions
7.2.3.2.1 General test conditions
See 7.1.
7.2.3.2.2 Timing and waveform test conditions
For PICC Type A:
— 3 timing and waveform test conditions are defined in ISO/IEC 10373-6:2011, 7.2.2.2.1 for a PCD to PICC
bit rate of fc/128,
— 3 timing and waveform test conditions are defined in ISO/IEC 10373-6:2011, 7.2.2.2.2 for PCD to PICC
bit rates of fc/64, fc/32 and fc/16,
— 6 timing and waveform test conditions are defined in ISO/IEC 10373-6:2011/Amd.4:2012, 7.2.2.4 for PCD
to PICC bit rates of fc/8, fc/4 and fc/2.
For PICC Type B:
— 6 timing and waveform test conditions are defined in ISO/IEC 10373-6:2011, 7.2.2.3 for PCD to PICC bit
rates of fc/128, fc/64, fc/32 and fc/16,
— 6 timing and waveform test conditions are defined in ISO/IEC 10373-6:2011/Amd.4:2012, 7.2.2.4 for PCD
to PICC bit rates of fc/8, fc/4 and fc/2.
7.2.3.3 Test procedure
For PICC Type A, perform the test procedure defined in ISO/IEC 10373-6:2011, 7.2.2.2.3 (amended by
ISO/IEC 10373-6:2011/Amd.4:2012) in all test conditions defined in 7.2.3.2 (i.e. each combination of a general
test condition and a timing and waveform test condition) and for all supported PCD to PICC bit rates, using an
I-block exchange at all supported bit rates, including fc/128.
For PICC Type B, perform the test procedure defined in ISO/IEC 10373-6:2011, 7.2.2.3.2 (amended by
ISO/IEC 10373-6:2011/Amd.4:2012) in all test conditions defined in 7.2.3.2 (i.e. each combination of a general
test condition and a timing and waveform test condition) and for all supported PCD to PICC bit rates, using an
I-block exchange at all supported bit rates, including fc/128.
7.2.3.4 Test report
The test report shall confirm the intended operation at the mandatory fc/128 (~106 kbit/s) bit rate and at all the
supported PCD to PICC bit rates. Used test conditions shall be mentioned in the test report.
Fill the TC_PICC_A_Rec row of test plan summary in accordance with the following table for all supported
PCD to PICC bit rates.
Table 13 — Result criteria for PICC reception test for each PCD to PICC bit rate supported by the PICC
Explanation Test result
Only when the PICC responds correctly to an I-Block
transmitted at each supported PCD to PICC bit rate in PASS
all 33 or 66 test conditions
If the PICC does not respond correctly to an I-Block
transmitted at each supported PCD to PICC bit rate in at FAIL
least one of the 33 or 66 test conditions
7.2.4 TC_PICC_A_LDE: PICC loading effect
7.2.4.1 Scope / purpose
This test verifies that the loading effect of the PICC is less than the loading effect of the corresponding
Reference PICC at H .
min
7.2.4.2 Test conditions
This test shall only be done at ambient temperature with the H field strength defined for the PICC class.
min
7.2.4.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2011/Amd.1:2012, 7.2.4.
7.2.4.4 Test report
The test
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