CEN/TS 16794-2:2017

SLOVENSKI STANDARD
01-oktober-2017
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Public transport - Communication between contactless readers and fare media - Part 2:
Test plan for ISO/IEC 14443
Öffentlicher Verkehr - Kommunikation zwischen berührungslosen Lesegeräten und
Fahrscheinmedien - Teil 2: Prüfplan zur ISO/IEC 14443
Ta slovenski standard je istoveten z: CEN/TS 16794-2:2017
ICS:
03.220.01 Transport na splošno Transport in general
35.240.60 Uporabniške rešitve IT v IT applications in transport
prometu
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

CEN/TS 16794-2
TECHNICAL SPECIFICATION
SPÉCIFICATION TECHNIQUE
July 2017
TECHNISCHE SPEZIFIKATION
ICS 35.240.15 Supersedes CEN/TS 16794-2:2015
English Version
Public transport - Communication between contactless
readers and fare media - Part 2: Test plan for ISO/IEC
Transport Public - Communication entre terminaux et Öffentlicher Verkehr - Kommunikation zwischen
objets sans contact - Partie 2 : Plan de test pour berührungslosen Lesegeräten und Fahrscheinmedien -
l'ISO/IEC 14443 Teil 2: Prüfplan zur ISO/IEC 14443
This Technical Specification (CEN/TS) was approved by CEN on 17 April 2017 for provisional application.

The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to
submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard.

CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS
available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in
parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN/TS 16794-2:2017 E
worldwide for CEN national Members.

Contents Page
European foreword . 3
1 Scope . 4
2 Normative references . 4
3 Terms and definitions . 5
4 Symbols and abbreviated terms . 5
5 Description of the test environment . 5
5.1 Test bench . 5
5.2 Tolerances applicable to ambient-environment tests . 5
5.3 PCD or PICC test conditions . 6
5.4 Positional tolerance . 6
5.5 Admissible tolerances on the measurements . 6
6 PCD – Analog test plan . 6
6.1 PCD general test conditions . 6
6.2 Conformance of the PCD field strength . 6
6.3 Conformance of the PCD modulation waveform . 8
6.4 Conformance of the PCD load modulation reception . 10
6.5 Conformance of the PCD sensitivity to electromagnetic disturbance . 11
6.6 TC_PCD_A_ALF: Alternating magnetic field . 13
7 PICC – Analog test plan . 14
7.1 PICC general test conditions . 14
7.2 Conformance of the PICC characteristics . 14
8 PCD – Protocol and digital test plan . 20
8.1 PCD general test conditions . 20
8.2 PCD Digital conformance to ISO/IEC 14443 standard series . 20
8.3 Conformance of the PCD characteristics . 21
9 PICC – Protocol and digital test plan . 27
9.1 PICC general test conditions . 27
9.2 PICC Digital conformance to ISO/IEC 14443 standard series . 27
9.3 Conformance of the PICC characteristics . 28
Annex A (informative) Test report templates. 31
Annex B (informative) Traceability between requirements stated in CEN/TS 16794-1 and
test cases stated in this document . 44

European foreword
This document (CEN/TS 16794-2:2017) has been prepared by Technical Committee CEN/TC 278
“Intelligent transport systems”, the secretariat of which is held by NEN.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN [and/or CENELEC] shall not be held responsible for identifying any or all such patent
rights.
This document will supersede CEN/TS 16794-2:2015.
This version updates the test plan to verify the requirements expressed within CEN/TS 16794-1:2017
and relies on the test method described in ISO/IEC 10373-6:2016.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia,
France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta,
Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
1 Scope
This Technical Specification comes as a complement to the technical requirements expressed in
CEN/TS 16794-1, for ensuring contactless communication interoperability between Public Transport
(PT) devices or between PT devices compliant to CEN/TS 16794-1 and NFC mobiles devices compliant
to NFC Forum specifications.
This document lists all the test conditions to be performed on a PT reader or a PT object in order to
ensure that all the requirements specified in CEN/TS 16794-1 are met for the PT device under test.
This document applies to PT devices only:
— PT readers which are contactless fare management system terminals acting as a PCD contactless
reader based on ISO/IEC 14443 standard series;
— PT objects which are contactless fare media acting as a PICC contactless object based on
ISO/IEC 14443 standard series.
This document applies solely to the contactless communication layers described in parts 1 to 4 of the
ISO/IEC 14443 standard series. Application-to-application exchanges executed once contactless
communication has been established at RF level fall outside the scope of this document. However, a
transport ticketing application will need to be used so as to make end-to-end transactions during tests
on the RF communication layer.
This document does not duplicate the contents of ISO/IEC 14443 standard series or ISO/IEC 10373-6
standard. It makes reference to the ISO/IEC 10373-6 applicable test methods, specifies the test
conditions to be used and describes the additional specific test conditions that may be run.
The list of test conditions applicable to the PT device under test will be conditioned by the Information
Conformance Statement (ICS) declaration made by the device manufacturer. For each test case, the test
conditions are clearly specified in order to determine the pertinence to run or not the test case in
accordance with the device capabilities or in accordance with the device manufacturer’s choice.
In order to facilitate the test report issuance, a test report template is included in Annex A of this
document.
Although this document aims at becoming the primary basis for certification of contactless
communication protocol applicable to PT readers and PT objects, it does not describe any certification
or qualification processes as such processes should be defined between local or global transit industry
stakeholders.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
CEN/TS 16794-1:2017, Public transport — Communication between contactless readers and fare media
— Part 1: Implementation requirements for ISO/IEC 14443
ISO/IEC 10373-6:2016, Identification cards — Test methods — Part 6: Proximity cards
ISO/IEC 14443-1:2016, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 1: Physical characteristics
ISO/IEC 14443-2:2016, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 2: Radio frequency power and signal interface
ISO/IEC 14443-3:2016, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 3: Initialization and anticollision
ISO/IEC 14443-4:2016, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 4: Transmission protocol
ISO/IEC 15693-2, Identification cards — Contactless integrated circuit cards — Vicinity cards — Part 2:
Air interface and initialization
ISO/IEC 18092, Information technology — Telecommunications and information exchange between
systems — Near Field Communication — Interface and Protocol (NFCIP-1)
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
PT device
PT reader or PT object
3.2
PT object
ISO/IEC 14443 PICC specifically designed for the use in PT systems
3.3
PT reader
ISO/IEC 14443 PCD specifically designed for the use in PT systems
3.4
Reference PICC
Reference PICC card as defined in test method ISO/IEC 10373-6:2016
4 Symbols and abbreviated terms
For the purposes of this document, the symbols and abbreviated terms given in CEN/TS 16794-1,
ISO/IEC 14443, ISO/IEC 10373-6 and the following apply.
t Maximum Reference PICC time-to-detection
detect
5 Description of the test environment
5.1 Test bench
The test bench shall conform to the specifications set out in ISO/IEC 10373-6:2016, Clause 5.
5.2 Tolerances applicable to ambient-environment tests
Parameter Unit Absolute tolerance
Temperature Degrees Celsius (°C) ± 3 °C
Relative humidity Percentage (%) ± 5 %
5.3 PCD or PICC test conditions
Parameter Unit Value
Temperature Degrees Celsius (°C) Minimum Temperature,
Ambient Temperature and
Maximum Temperature
5.4 Positional tolerance
Parameter Unit Tolerance
PICC-to-PCD distance Millimetres (mm) ± 1 mm, except at 0
5.5 Admissible tolerances on the measurements
Tolerances specified in ISO/IEC 10373-6:2016 shall be applied.
6 PCD – Analog test plan
6.1 PCD general test conditions
Unless otherwise specified, each test shall be executed:
— with Reference PICCs 1, 2 and 3 at every position of range A (positions A1 to A5),
— with Reference PICC 3 at every position of range B (positions B1 to B3),
which makes a total of 18 test conditions.
For Common Readers (see CEN/TS 16794-1), the range A is limited to positions A1 to A2 and the
range B is limited to positions B1 to B2. Consequently, for common readers, tests specified in several
positions of range A and of range B shall be done only in positions A1, A2, B1 and B2.
As specified in CEN/TS 16794-1:2017, 9.2.3.3, if the measurements cannot be taken from position A1
then the measurements shall be taken from position A1' where the Reference PICC is in contact with the
PCD device under test.
As specified in CEN/TS 16794-1:2017, 9.2.3.5, if the measurements cannot be taken from position B1
then the measurements shall be taken from position B1' where the Reference PICC is in contact with the
PCD device under test.
6.2 Conformance of the PCD field strength
6.2.1 General
The maximum and minimum PCD field strength tests shall be done during an interval of time when the
PCD produces a field. One possibility is to use an oscilloscope and measure the field strength during the
interval of time preceding a request or wake-up command. Another possibility is to activate the
"continuous unmodulated field" functionality of the PCD test mode, and to use a voltmeter.
6.2.2 TC_PCD_A_MaxFS: PCD maximum field strength
6.2.2.1 Scope / purpose
This test verifies the maximum magnetic field strength in the PCD operating volume (range A and range
B).
6.2.2.2 Test conditions
At ambient temperature, Reference PICCs 1, 2 and 3 within range A and Reference PICC 3 within range
B.
6.2.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.1.2.1 by moving the Reference PICCs
in all the positions of the PCD operating volume defined in 6.2.2.2.
6.2.2.4 Test report
The test report shall give the maximum DC voltage measured at CON3 under the conditions applied.
Fill the TC_PCD_A_MaxFS row of test plan summary in accordance with Table 1.
Table 1 — Result criteria for maximum PCD field strength test
Explanation Test result
Only when the DC voltages at CON3 do not exceed 3 V in all test conditions PASS
When the DC voltages at CON3 exceed 3 V in at least one of the test conditions FAIL
6.2.3 TC_PCD_A_ MinFS: PCD minimum field strength
6.2.3.1 Scope / purpose
This test verifies the minimum magnetic field strength in the PCD operating volume (range A and range
B).
6.2.3.2 Test conditions
At ambient temperature, Reference PICCs 1, 2 and 3 within range A and Reference PICC 3 within range
B.
6.2.3.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.1.2.2 by moving the Reference PICCs
in all the positions of the PCD operating volume defined in 6.2.3.2.
If future editions of ISO/IEC 10373-6 specify a lower V voltage for Class 1, this test procedure shall
load
still be performed with a V of 6 V for Reference PICC 1 until 2020.
load
In addition, perform the previous procedure, using the minimum field strength specified for range B
instead of H , by moving the Reference PICC 3 in all the positions of range B.
min
6.2.3.4 Test report
The test report shall give the minimum DC voltage measured at CON3 under the conditions applied.
If future editions of ISO/IEC 10373-6 specify a lower V voltage for Class 1, the two results for
load
Reference PICC 1 (with 6 V and with this lower V voltage) shall be given in the test result until 2020.
load
Fill the TC_PCD_A_ MinFS row of test plan summary in accordance with Table 2.
Table 2 — Result criteria for minimum PCD field strength test
Explanation Test result
Only when the DC voltages at CON3 exceed V as defined in
load
PASS
ISO/IEC 10373-6:2016, Table 3 in all test conditions
When the DC voltages at CON3 do not exceed Vload as defined in
ISO/IEC 10373-6:2016, Table 3 in at least one of the test FAIL
conditions
6.2.4 TC_PCD_A_ALF: Alternating magnetic field
6.2.4.1 Scope / purpose
This test determines that the PCD generates a field strength not higher than the average value specified
in ISO/IEC 14443-1, in any possible PICC position.
6.2.4.2 Test conditions
At ambient temperature, only Reference PICC 1.
6.2.4.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 6.1.1.2.
6.2.4.4 Test report
The test report shall give the DC voltage measured at CON3.
Fill the TC_PCD_A_ALF row of test plan summary in accordance with Table 3.
Table 3 — Result criteria for PCD alternating magnetic field test
Explanation Test result
The DC voltage at CON3 does not exceed 3 V PASS
The DC voltage at CON3 exceeds 3 V FAIL
6.3 Conformance of the PCD modulation waveform
6.3.1 TC_PCD_A_TAMW: Type A modulation waveform
6.3.1.1 Scope / purpose
This test verifies the Type A modulation waveform in the PCD operating volume (range A and range B).
6.3.1.2 Test conditions
At ambient temperature, Reference PICCs 1 and 2 in position A1, Reference PICC 3 in position B1 and
the calibration coil at an arbitrary position.
6.3.1.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.4.2 or K.2.1.1.2 for all the positions of
the PCD operating volume defined in 6.3.1.2 and for all supported PCD to PICC bit rates.
6.3.1.4 Test report
The test report shall give the measured Type A modulation pulse, rise and fall times and overshoot
values or the PR, ISI , ISI and the normalized differential phase noise values under the conditions
m d
applied.
Fill the TC_PCD_A_TAMW row of test plan summary in accordance with Table 4 for all supported PCD to
PICC bit rates.
Table 4 — Result criteria for Type A modulation waveform test
Explanation Test result
Only when the Type A modulation pulse, rise and fall times and
overshoot values or the PR, ISI , ISI and the normalized differential PASS
m d
phase noise values are compliant in all test conditions
When at least one value is not compliant in at least one of the test
FAIL
conditions
6.3.2 TC_PCD_A_TBMW: Type B modulation index and waveform
6.3.2.1 Scope / purpose
This test verifies the Type B modulation index and the waveform in the PCD operating volume (range A
and range B).
6.3.2.2 Test conditions
At ambient temperature, Reference PICCs 1 and 2 in position A1, Reference PICC 3 in position B1 and
the calibration coil at an arbitrary position.
6.3.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.4.2 or K.2.1.1.2 for all the positions of
the PCD operating volume defined in 6.3.2.2 and for all supported PCD to PICC bit rates.
6.3.2.4 Test report
The test report shall give the measured type B modulation index, rise and fall times and overshoot
values under the conditions applied.
Fill the TC_PCD_A_TBMW row of test plan summary in accordance with Table 5 for all supported PCD to
PICC bit rates.
Table 5 — Result criteria for Type B modulation index and waveform test
Explanation Test result
Only when the Type B modulation index, rise and fall times and
PASS
overshoot values are compliant in all test conditions
When at least one value is not compliant in at least one of the test
FAIL
conditions
6.4 Conformance of the PCD load modulation reception
6.4.1 TC_PCD_A_TALMR: Type A load modulation reception
6.4.1.1 Scope / purpose
This test verifies the Type A load modulation reception in the PCD operating volume (range A and range
B).
6.4.1.2 Test conditions
At ambient temperature, see 6.1.
At minimum and maximum temperatures, only Reference PICC 1 in Position A2 and Reference PICC 3 in
Position B2.
6.4.1.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.5.2 in all the defined positions of the
PCD operating volume and for all supported PICC to PCD bit rates, except bit rates of fc/64
(~212 kbit/s), fc/32 (~424 kbit/s) and fc/16 (~848 kbit/s).
6.4.1.4 Test report
The test report shall give the PCD Type A load modulation sensitivity under the conditions applied.
Fill the TC_PCD_A_TALMR row of test plan summary in accordance with Table 6 for all supported PICC
to PCD bit rates.
Table 6 — Result criteria for Type A load modulation reception test
Explanation Test result
Only when the PCD Type A load modulation sensitivity is below
PASS
the standard limit in all test conditions
When the PCD Type A load modulation sensitivity is above the
FAIL
standard limit in at least one of the test conditions
6.4.2 TC_PCD_A_TBLMR: Type B load modulation reception
6.4.2.1 Scope / purpose
This test verifies the Type B load modulation reception in the PCD operating volume (range A and range
B).
6.4.2.2 Test conditions
At ambient temperature, see 6.1.
At minimum and maximum temperatures, only Reference PICC 1 in Position A2 and Reference PICC 3 in
Position B2.
6.4.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.5.2 in all the defined positions of the
PCD operating volume and for all supported PICC to PCD bit rates, except bit rates of fc/64
(~212 kbit/s), fc/32 (~424 kbit/s) and fc/16 (~848 kbit/s).
6.4.2.4 Test report
The test report shall give the PCD Type B load modulation sensitivity under the conditions applied.
Fill the TC_PCD_A_TBLMR row of test plan summary in accordance with Table 7 for all supported PICC
to PCD bit rates.
Table 7 — Result criteria for Type B load modulation reception test
Explanation Test result
Only when the PCD Type B load modulation sensitivity is below the
PASS
standard limit in all test conditions
When the PCD Type B load modulation sensitivity is above the
FAIL
standard limit in at least one of the test conditions
6.5 Conformance of the PCD sensitivity to electromagnetic disturbance
6.5.1 General
The following tests shall be performed on the first applicative command sent by the PCD.
6.5.2 TC_PCD_A_TAEI: Type A EMD immunity
6.5.2.1 Scope / purpose
This test verifies that the PCD is insensitive to any Type A load modulation amplitude below V .
E,PCD
6.5.2.2 Test conditions
At ambient temperature, only Reference PICC 1 in positions A1 and A2 of range A.
6.5.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.6.2 for all the positions of the PCD
operating volume defined in 6.5.2.2 and for all supported PICC to PCD bit rates.
6.5.2.4 Test report
The test report shall state whether the PCD was insensitive to any Type A load modulation amplitude
below V under the conditions applied.
E,PCD
The test report shall indicate the V as obtained in accordance with step f) of ISO/IEC 10373-6:2016,
EMD
7.1.6.2 for all the positions of the PCD operating volume defined in 6.5.2.2 and for all supported PICC to
PCD bit rates.
Fill the TC_PCD_A_TAEI row of test plan summary in accordance with Table 8 for all supported PICC to
PCD bit rates.
Table 8 — Result criteria for Type A EMD immunity test
Test
Explanation
result
Only when the PCD is insensitive to any Type A load
PASS
modulation amplitude below V in all test conditions
E,PCD
When the PCD is not insensitive to any Type A load
modulation amplitude below V in at least one of the test FAIL
E,PCD
conditions
6.5.3 TC_PCD_A_TBEI: Type B EMD immunity
6.5.3.1 Scope / purpose
This test verifies that the PCD is insensitive to any Type B load modulation amplitude below V .
E,PCD
6.5.3.2 Test conditions
At ambient temperature, only Reference PICC 1 in positions A1 and A2 of range A.
6.5.3.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.6.2 for all the positions of the PCD
operating volume defined in 6.5.3.2 and for all supported PICC to PCD bit rates.
6.5.3.4 Test report
The test report shall state whether the PCD was insensitive to any Type B load modulation amplitude
below V under the conditions applied.
E,PCD
The test report shall indicate the V as obtained in accordance with step f) of ISO/IEC 10373-6:2016,
EMD
7.1.6.2 for all the positions of the PCD operating volume defined in 6.5.3.2 and for all supported PICC to
PCD bit rates.
Fill the TC_PCD_A_TBEI row of test plan summary in accordance with Table 9 for all supported PICC to
PCD bit rates.
Table 9 — Result criteria for Type B EMD immunity test
Explanation Test result
Only when the PCD is insensitive to any Type B load modulation
PASS
amplitude below V in all test conditions
E,PCD
When the PCD is not insensitive to any Type B load modulation
FAIL
amplitude below V in at least one of the test conditions
E,PCD
6.5.4 TC_PCD_A_TAER: Type A EMD handling timing constraints
6.5.4.1 Scope / purpose
This test verifies that the PCD is not disturbed by a Type A test pattern sent t before the Type A PICC
E,PCD
answer.
6.5.4.2 Test conditions
At ambient temperature, only Reference PICC 1 in Position A2.
6.5.4.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.7.2 for all the positions of the PCD
operating volume defined in 6.5.4.2 and only for mandatory fc/128 (~106 kbit/s) PICC to PCD bit rate.
6.5.4.4 Test report
The test report shall state whether the PCD was not disturbed by a Type A test pattern sent t before
E,PCD
the PICC answer (or was able to recover from the test pattern) under the conditions applied.
Fill the TC_PCD_A_TAER row of test plan summary in accordance with Table 10 for all supported PICC
to PCD bit rates.
Table 10 — Result criteria for Type A EMD recovery test
Explanation Test result
Only when the PCD is not disturbed by a Type A test pattern
PASS
sent t before the Type A PICC answer
E,PCD
When the PCD is disturbed by a Type A test pattern sent t
E,PCD
FAIL
before the Type A PICC answer
6.5.5 TC_PCD_A_TBER: Type B EMD handling timing constraints
6.5.5.1 Scope / purpose
This test verifies that the PCD is not disturbed by a Type B test pattern sent t before the Type B PICC
E,PCD
answer.
6.5.5.2 Test conditions
At ambient temperature, only Reference PICC 1 in Position A2.
6.5.5.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.1.7.2 for all the positions of the PCD
operating volume defined in 6.5.5.2 and only for mandatory fc/128 (~106 kbit/s) PICC to PCD bit rate.
6.5.5.4 Test report
The test report shall state whether the PCD was not disturbed by a Type B test pattern sent t before
E,PCD
the PICC answer (or was able to recover from the test pattern) under the conditions applied.
Fill the TC_PCD_A_TBER row of test plan summary in accordance with Table 11 for all supported PICC
to PCD bit rates.
Table 11 — Result criteria for Type B EMD recovery test
Explanation Test result
Only when the PCD is not disturbed by a Type B test
PASS
pattern sent t before the Type B PICC answer
E,PCD
When the PCD is disturbed by a Type B test pattern sent
FAIL
t before the Type B PICC answer
E,PCD
6.6 TC_PCD_A_ALF: Alternating magnetic field
6.6.1 Scope / purpose
6.6.1.1 General
This test determines that the PCD generates a field strength not higher than the average value specified
in ISO/IEC 14443-1, in any possible PICC position.
6.6.1.2 Test conditions
At ambient temperature, only Reference PICC 1.
6.6.1.3 Test procedure
Apply ISO/IEC 10373-6:2016, 6.1.1.2 test procedure.
6.6.1.4 Test report
The test report shall give the DC voltage measured at CON3.
Fill the TC_PCD_A_ALF row of test plan summary in accordance with Table 12.
Table 12 — Result criteria for PCD alternating magnetic field test
Explanation Test result
The DC voltage at CON3 doesn’t exceed 3 V PASS
The DC voltage at CON3 exceeds 3 V FAIL
7 PICC – Analog test plan
7.1 PICC general test conditions
Unless otherwise specified, each test shall be executed at ambient temperature with field strengths of
H , 2 A/m, 2,5 A/m, 3,5 A/m, 4,5 A/m, 6 A/m and H (in accordance with the PICC class), which
min max
makes a total of 7 test conditions.
7.2 Conformance of the PICC characteristics
7.2.1 TC_PICC_A_OFS: PICC operating field strength
7.2.1.1 Scope / purpose
This test verifies that the PICC operates as intended within H and H as defined in ISO/IEC 14443-2.
min max
7.2.1.2 Test conditions
7.2.1.2.1 General test conditions
See 7.1.
7.2.1.2.2 Timing and waveform test conditions
For PICC Type A:
— Use the timing and waveform test condition 1 defined in ISO/IEC 10373-6:2016, 7.2.3.2.1 for a PCD
to PICC bit rate of fc/128,
— Use the timing and waveform test condition 1 defined in ISO/IEC 10373-6:2016, 7.2.3.2.2 for PCD to
PICC bit rates of fc/64, fc/32 and fc/16,
— Use the timing and waveform test condition 1 with minimum modulation index m defined in
ISO/IEC 10373-6:2016, 7.2.3.4 for PCD to PICC bit rates of fc/8, fc/4 and fc/2,
— Use the timing and waveform test condition 4 defined in ISO/IEC 10373-6:2016, K.2.2.1.2 for PCD
to PICC bit rates of 3fc/4, fc, 3fc/2 and 2fc.
For PICC Type B:
— Use the timing and waveform test condition 1 with minimum modulation index m defined in
ISO/IEC 10373-6:2016, 7.2.3.3.1 for PCD to PICC bit rates of fc/128, fc/64, fc/32 and fc/16,
— Use the timing and waveform test condition 1 with minimum modulation index m defined in
ISO/IEC 10373-6:2016, 7.2.3.4 for PCD to PICC bit rates of fc/8, fc/4 and fc/2,
— Use the timing and waveform test condition 4 defined in ISO/IEC 10373-6:2016, K.2.2.1.2 for PCD
to PICC bit rates of 3fc/4, fc, 3fc/2 and 2fc.
7.2.1.3 Test procedure
For each test condition defined in 7.2.1.2 (i.e. each combination of a general test condition and a timing
and waveform test condition), perform the following test procedure using the PICC-test-apparatus:
a) With the PICC in the DUT position, adjust the RF power delivered by the signal generator to the test
PCD antenna to the required field strength as measured by the calibration coil.
b) Run the following sequence of commands:
1) For PICC Type A:
i) REQA command
ii) ANTICOLLISION and SELECT commands
iii) RATS command
iv) PPS command (*)
v) TEST_COMMAND_SEQUENCE
2) For PICC Type B:
i) REQB command
ii) ATTRIB command
iii) TEST_COMMAND_SEQUENCE
The definition of the TEST_COMMAND_SEQUENCE to apply is defined in the PICC ICS as indicated in
CEN/TS 16794-1.
NOTE S(PARAMETERS) blocks can be used to activate the supported PCD to PICC bit rates.
(*) Note that the PPS command is not applicable, if the default bit rate of fc/128 is used in both
directions.
7.2.1.4 Test report
The test report shall confirm the intended operation at the mandatory fc/128 (~106 kbit/s) bit rate.
For PICCs supporting one or more of the optional PCD to PICC bit rates the test report shall confirm the
intended operation at the supported PCD to PICC bit rates. Used test conditions shall be mentioned in
the test report.
Fill the TC_PICC_A_OFS row of test plan summary in accordance with Table 12 for all supported PCD to
PICC bit rates.
Table 12 — Result criteria for PICC operating field strength test for each PCD to PICC bit rate
supported by the PICC
Explanation Test result
Only when the PICC responds correctly to the test sequence transmitted at each
PASS
supported PCD to PICC bit rate in all test conditions
If the PICC does not respond correctly to at least one step of the test sequence
transmitted at at least one supported PCD to PICC bit rate in at least one of the test FAIL
conditions
7.2.2 TC_PICC_A_LMA: PICC transmission
7.2.2.1 Scope / purpose
This test verifies that the load modulation amplitude of the PICC within the operating field strength
range is as specified in ISO/IEC 14443-2.
7.2.2.2 Test conditions
7.2.2.2.1 General test conditions
Each test shall be executed:
— at ambient temperature with field strengths of H , 2 A/m, 2,5 A/m, 3,5 A/m, 4,5 A/m, 6 A/m and
min
H (in accordance with PICC class),
max
— at minimum and maximum temperatures with field strengths of H and H (in accordance with
min max
PICC class),
which makes a total of 11 test conditions (7 at ambient temperature, 2 at minimum temperature and 2
at maximum temperature).
When the test condition is both H and maximum temperature, the PICC shall be put in horizontal
max
position and no ventilation shall be used during the test in order to limit the PICC's heat dissipation. The
test shall be preceded by a one-minute PICC exposition to a field strength of H without any field shut-
max
off and with no ventilation so that the PICC chip has reached its maximum temperature when the test
starts. The air temperature value during test execution shall remain within required tolerances.
If necessary, the thermal inertia of the chamber may be increased (e.g. by adding water bottles and
waiting for their thermal stabilisation) so that the air temperature value during test execution remain
within required tolerances despite a shut-off of the climatic chamber.
7.2.2.2.2 Timing and waveform test conditions
See 7.2.1.2.2.
7.2.2.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.2.1 in all test conditions defined in
7.2.2.2 and for all supported PICC to PCD bit rates, except bit rates of fc/64 (~212 kbit/s), fc/32
(~424 kbit/s) and fc/16 (~848 -kbit/s) at ambient, minimum and maximum temperatures as indicated
in 7.2.2.2.1.
7.2.2.4 Test report
The test report shall give the measured peak amplitudes of the upper and lower sidebands at fc + fs and
fc – fs under the conditions applied.
Fill the TC_PICC_A_LMA row of test plan summary in accordance with Table 13 for all supported PICC to
PCD bit rates, except bit rates of fc/64 (~212 kbit/s), fc/32 (~424 kbit/s) and fc/16 (~848 kbit/s).
Table 13 — Result criteria for PICC load modulation amplitude test
Explanation Test result
Only when the amplitudes of the upper and lower sidebands are
PASS
above the defined limit in all test conditions
If the amplitude of at least one sideband is below the defined limit
FAIL
in at least one of the test conditions
7.2.3 TC_PICC_A_RCPT: PICC reception
7.2.3.1 Scope / purpose
This test verifies that the PICC is able to receive PCD commands.
7.2.3.2 Test conditions
7.2.3.2.1 General test conditions
See 7.1.
7.2.3.2.2 Timing and waveform test conditions
For PICC Type A:
— 3 timing and waveform test conditions are defined in ISO/IEC 10373-6:2016, 7.2.3.2.1 for a PCD to
PICC bit rate of fc/128,
— 3 timing and waveform test conditions are defined in ISO/IEC 10373-6:2016, 7.2.3.2.2 for PCD to
PICC bit rates of fc/64, fc/32 and fc/16,
— 6 timing and waveform test conditions are defined in ISO/IEC 10373-6:2016, 7.2.3.4 for PCD to
PICC bit rates of fc/8, fc/4 and fc/2,
— 4 timing and waveform test conditions are defined in ISO/IEC 10373-6:2016, K.2.2.1.2 for PCD to
PICC bit rates of 3fc/4, fc, 3fc/2 and 2fc.
For PICC Type B:
— 6 timing and waveform test conditions are defined in ISO/IEC 10373-6:2016, 7.2.3.3.1 for PCD to
PICC bit rates of fc/128, fc/64, fc/32 and fc/16,
— 6 timing and waveform test conditions are defined in ISO/IEC 10373-6:2016, 7.2.3.4 for PCD to
PICC bit rates of fc/8, fc/4 and fc/2,
— 4 timing and waveform test conditions are defined in ISO/IEC 10373-6:2016, K.2.2.1.2 for PCD to
PICC bit rates of 3fc/4, fc, 3fc/2 and 2fc.
7.2.3.3 Test procedure
For PICC Type A, perform the test procedure defined in ISO/IEC 10373-6:2016, 7.2.3.2.3 or K.2.2.1.3 in
all test conditions defined in 7.2.3.2 (i.e. each combination of a general test condition and a timing and
waveform test condition) and for all supported PCD to PICC bit rates, using an I-block exchange at all
supported bit rates, including fc/128.
For PICC Type B, perform the test procedure defined in ISO/IEC 10373-6:2016, 7.2.3.3.2 or K.2.2.1.3 in
all test conditions defined in 7.2.3.2 (i.e. each combination of a general test condition and a timing and
waveform test condition) and for all supported PCD to PICC bit rates, using an I-block exchange at all
supported bit rates, including fc/128.
7.2.3.4 Test report
The test report shall confirm the intended operation at the mandatory fc/128 (~106 kbit/s) bit rate and
at all the supported PCD to PICC bit rates. Used test conditions shall be mentioned in the test report.
Fill the TC_PICC_A_RCPT row of test plan summary in accordance with Table 14 for all supported PCD to
PICC bit rates.
Table 14 — Result criteria for PICC reception test for each PCD to PICC bit rate supported by the
PICC
Explanation Test result
Only when the PICC responds correctly to an I-Block transmitted at each
PASS
supported PCD to PICC bit rate in all test conditions
If the PICC does not respond correctly to an I-Block transmitted at each
FAIL
supported PCD to PICC bit rate in at least one of the test conditions
7.2.4 TC_PICC_A_LDE: PICC maximum loading effect
7.2.4.1 Scope / purpose
This test is used to measure the PICC loading effect.
7.2.4.2 Test conditions
At ambient temperature.
7.2.4.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.2.5.2 using Test PCD assembly with
impedance matching network for a bit rate of fc/128.
If the claimed PICC class is Class 1, the V value used in the procedure shall be 4,5 V as for others
load
classes.
NOTE Until end of 2017, the Vload value of 6 V is allowed for Class 1 PICC.
7.2.4.4 Test report
The test report shall give the value of the measured field strength.
Fill the TC_PICC_A_LDE row of test plan summary in accordance with Table 15.
Table 15 — Result criteria for PICC loading effect test
Explanation Test result
Only when the value of the measured field strength is greater than H PASS
min
If the value of the measured field strength is equal to or lower than H FAIL
min
7.2.5 TC_PICC_A_EMD: PICC EMD level and low EMD time
7.2.5.1 Scope / purpose
This test verifies that the electromagnetic disturbance generated by the PICC complies with amplitude
and timing requirements defined in ISO/IEC 14443-2:2016.
7.2.5.2 Test conditions
7.2.5.2.1 General test conditions
See 7.1.
7.2.5.2.2 Timing and waveform test conditions
See 7.2.1.2.2.
7.2.5.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 7.2.2.4, in all test conditions and for all
commands of TEST_COMMAND_SEQUENCE as defined in CEN/TS 16794-1.
7.2.5.4 Test report
The test report shall state whether the electromagnetic disturbance generated by the PICC complies
with amplitude and timing requirements defined in ISO/IEC 14443-2:2016.
The test report shall indicate the maximum amplitude measured during t .
E,PICC
Fill the TC_PICC_A_EMD row of test plan summary in accordance with Table 16.
Table 16 — Result criteria for PICC EMD level and low EMD time test
Explanation Test result
Only when the electromagnetic disturbance amplitude V is lower than V during
EMD E,PICC
PASS
t (with exceptions defined in ISO/IEC 14443-2:2016) in all test conditions
E,PICC
If the electromagnetic disturbance amplitude V is not lower than V during t
EMD E,PICC E,PICC
FAIL
(with exceptions defined in ISO/IEC 14443-2:2016) in at least one of the test conditions
7.2.6 TC_PICC_A_ALF: Alternating magnetic field
7.2.6.1 Scope / purpose
The purpose of this test is to check the behaviour of the PICC in relation to alternating magnetic field
exposure at 13,56 MHz.
7.2.6.2 Test conditions
At ambient temperature.
7.2.6.3 Test procedure
Perform the test procedure defined in ISO/IEC 10373-6:2016, 6.2.1.3 using Test PCD assembly with
impedance matching network for a bit rate of fc/128.
To verify the PICC operates as intended, perform PICC operating field strength test using the timing and
waveform test condition 1 for a PCD to PICC bit rate of fc/128. For Type B, use the minimum
modulation index m defined in ISO/IEC 10373-6:2016, 7.2.3.3.1.
7.2.6.4 Test report
Fill the TC_PICC_A_ALF row of test plan summary in accordance with Table 17.
Table 17 — Result criteria for PICC alternating magnetic field test
Explanation Test result
Only when the PICC operates as intended PASS
If the PICC does not operate as intended FAIL
8 PCD – Protocol and digital test plan
8.1 PCD general test conditions
8.1.1 General
Each test shall be executed at ambient temperature with the PCD-test-apparatus and accessories
defined in ISO/IEC 10373-6:2016, H.1.
8.1.2 Test command sequences
The sequence described in Table 18 shall be applied for scenarios not needing PCD chaining.
Table 18 —Test command sequence for scenarios not needing PCD chaining
Step Command
1 INITIALIZE_PCD_TEST_MODE
2 INITIATE_ANTICOLLISION
3 UT_TEST_COMMAND1
4 UT_TEST_COMMAND1
The sequence described in Table 19 shall be applied for scenarios dealing wit
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