ISO/TC 163/SC 1/WG 20 - Test methods at cryogenic temperature
Méthodes d’essais à température cryogénique
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ISO/TC 163/SC 1/WG 20 is a Subcommittee within the International Organization for Standardization (ISO). It is named "Test methods at cryogenic temperature". This committee has published 1 standards.
ISO/TC 163/SC 1/WG 20 develops ISO standards in the area of Information technology. Currently, there are 1 published standards from this subcommittee.
The International Organization for Standardization (ISO) is an independent, non-governmental international organization that develops and publishes international standards. Founded in 1947 and headquartered in Geneva, Switzerland, ISO brings together experts from 170+ member countries to share knowledge and develop voluntary, consensus-based standards that support innovation and provide solutions to global challenges.
A Subcommittee (SC) in ISO operates under a Technical Committee and focuses on a specific subset of the TC's scope. Subcommittees develop standards and technical specifications in their specialized area, reporting to their parent Technical Committee. They may also have working groups for detailed technical work.
This document specifies the equipment and procedures for determining the coefficient of linear thermal expansion at sub-ambient temperatures (−196 °C to 25 °C), subject to the possible temperature limitation of the test specimens. It is not applicable to products which experience dimensional changes during the test due to the loss of hydration water or which undergo other phase changes.
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