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IEC

MT 60393-2 - TC 40/MT 60393-2

TC 40/MT 60393-2

General Information

Status
Active
Work Field
Information technology
Parent
TC 40 - Capacitors and resistors for electronic equipment

Frequently Asked Questions

MT 60393-2 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 40/MT 60393-2". This committee has published 1 standards.

MT 60393-2 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.

The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.

A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.

Standardization Organization
ICS
Directive
Mandate
50
IEC
IEC 60393-2:2015(Main)
Potentiometers for use in electronic equipment - Part 2: Sectional specification - Lead-screw actuated and rotary preset potentiometers

IEC 60393-2:2015 applies to lead-screw actuated and rotary preset potentiometers, wirewound and non-wirewound for use in electronic equipment. These potentiometers are primarily intended for use in circuits for trimming purposes which require infrequent adjustments. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1 the appropriate quality assessment procedures, tests and measuring methods. It provides general performance requirements for this type of potentiometer. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition:
a) revision of the information on the assessment level EZ and FZ (zero nonconforming);
b) complete editorial revision.
This publication is to be read in conjunction with IEC 60393-1:2008.

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