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IEC

PT 62607-6-5 - TC 113/PT 62607-6-5

TC 113/PT 62607-6-5

General Information

Status
Active
Work Field
Information technology
Parent
TC 113 - Nanotechnology for electrotechnical products and systems

Frequently Asked Questions

PT 62607-6-5 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 113/PT 62607-6-5". This committee has published 1 standards.

PT 62607-6-5 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.

The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.

A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.

Standardization Organization
ICS
Directive
Mandate
50
IEC
IEC TS 62607-6-5:2022(Main)
Nanomanufacturing - Key control characteristics - Part 6-5: Graphene-based materials - Contact and sheet resistance: transmission line measurement

IEC TS 62607-6-5:2022(E) establishes a standardized method to determine the key control characteristics
contact resistance, and
sheet resistance  for graphene-based materials and other two-dimensional materials by a
transmission line measurement.  The method uses test structures applied to the 2D material by photolithographic methods consisting of several metal electrodes with increasing spacing between the electrodes. By a measurement of the voltage drop between different pairs of electrodes, sheet resistance and contact resistance can be calculated.
The method can be applied to any other two-dimensional materials which are subject to electrical metal contact on top of the materials.
The method provides accurate and reproducible results, if the electrical contact formed between the two-dimensional material and the metal electrodes provides ohmic contact property.

  • Technical specification
    23 pages
    English language
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