PT 61000-1-3 - TC 77/SC 77C/PT 61000-1-3
TC 77/SC 77C/PT 61000-1-3
General Information
Frequently Asked Questions
PT 61000-1-3 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 77/SC 77C/PT 61000-1-3". This committee has published 1 standards.
PT 61000-1-3 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.
The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.
A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.
The purpose of this Technical Report is to describe the effects that have occurred during actual and simulated electromagnetic pulse testing throughout the world. These effects include those observed during the high-altitude nuclear tests conducted by the United States and the Soviet Union in 1962, and the HEMP simulator tests conducted by many countries during the years after atmospheric testing ended. In addition to direct effects, this technical report also contains information on HEMP coupling to "long lines" as it is important to verify that particular levels of currents and voltages can be induced by HEMP on these lines; this provides a basis for direct injection testing of electronic equipment. It should be noted that, in most cases, the electrical equipment tested or exposed did not contain the sensitive electronics in use today. Also it should be emphasized that all tests and exposures did not produce failure of the equipment; factors such as the geometry of the HEMP interaction and the electromagnetic shielding of the equipment are variables that can produce differing results. The description of these effects is intended to illustrate the seriousness of the possible effects of HEMP on modern electronic systems.
- Technical report46 pagesEnglish languagesale 15% off