oSIST prEN ISO 12179:2025

SLOVENSKI STANDARD
01-april-2025
Specifikacija geometrijskih veličin izdelka (GPS) - Tekstura površine: profilna -
Umerjanje kontaktnih (s tipalom) instrumentov (ISO/DIS 12179:2025)
Geometrical product specifications (GPS) - Surface texture: Profile - Calibration of
contact (stylus) instruments (ISO/DIS 12179:2025)
Geometrische Produktspezifikation (GPS) - Oberflächenbeschaffenheit: Profil -
Kalibrierung von Tastschnittgeräten (ISO/DIS 12179:2025)
Spécification géométrique des produits (GPS) - État de surface: Profil - Étalonnage des
instruments à contact (palpeur) (ISO/DIS 12179:2025)
Ta slovenski standard je istoveten z: prEN ISO 12179
ICS:
17.040.30 Merila Measuring instruments
17.040.40 Specifikacija geometrijskih Geometrical Product
veličin izdelka (GPS) Specification (GPS)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

DRAFT
International
Standard
ISO/DIS 12179
ISO/TC 213
Geometrical product specifications
Secretariat: BSI
(GPS) — Surface texture: Profile
Voting begins on:
— Calibration of contact (stylus)
2025-02-14
instruments
Voting terminates on:
2025-05-09
Spécification géométrique des produits (GPS) — État de surface:
Profil — Étalonnage des instruments à contact (palpeur)
ICS: 17.040.30; 17.040.40
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENTS AND APPROVAL. IT
IS THEREFORE SUBJECT TO CHANGE
AND MAY NOT BE REFERRED TO AS AN
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This document is circulated as received from the committee secretariat.
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NOTIFICATION OF ANY RELEVANT PATENT
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Reference number
ISO/DIS 12179:2025(en)
DRAFT
ISO/DIS 12179:2025(en)
International
Standard
ISO/DIS 12179
ISO/TC 213
Geometrical product specifications
Secretariat: BSI
(GPS) — Surface texture: Profile
Voting begins on:
— Calibration of contact (stylus)
instruments
Voting terminates on:
Spécification géométrique des produits (GPS) — État de surface:
Profil — Étalonnage des instruments à contact (palpeur)
ICS: 17.040.30; 17.040.40
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENTS AND APPROVAL. IT
IS THEREFORE SUBJECT TO CHANGE
AND MAY NOT BE REFERRED TO AS AN
INTERNATIONAL STANDARD UNTIL
PUBLISHED AS SUCH.
This document is circulated as received from the committee secretariat.
IN ADDITION TO THEIR EVALUATION AS
BEING ACCEPTABLE FOR INDUSTRIAL,
© ISO 2025
TECHNOLOGICAL, COMMERCIAL AND
USER PURPOSES, DRAFT INTERNATIONAL
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
STANDARDS MAY ON OCCASION HAVE TO
ISO/CEN PARALLEL PROCESSING
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Published in Switzerland Reference number
ISO/DIS 12179:2025(en)
ii
ISO/DIS 12179:2025(en)
Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Conditions of use . 3
4.1 Components and configurations of the contact (stylus) instrument .3
4.2 Calibration of a configuration .3
4.3 Place of calibration .3
4.4 Defects .3
5 Measurement standards . . 3
6 Contact (stylus) instrument metrological characteristics . 6
6.1 General .6
6.2 Residual profile calibration .6
6.3 Vertical profile component calibration .6
6.4 Horizontal profile component calibration .6
6.5 Profile coordinate system calibration .6
6.6 Total contact (stylus) instrument calibration .6
7 Calibration . 7
7.1 Preparation for calibration .7
7.2 Evaluation of the residual profile .7
7.3 Calibration of the vertical profile component .7
7.3.1 Overall objective .7
7.3.2 Procedure .7
7.4 Calibration of the horizontal profile component . .8
7.4.1 Overall objective .8
7.4.2 Procedure .8
7.5 Calibration of the profile coordinate system .8
7.5.1 Overall objective .8
7.5.2 Procedure .8
7.6 Calibration of the total contact (stylus) instrument .8
7.6.1 Overall objective .8
7.6.2 Procedure .9
7.7 Other calibrations .9
8 Measurement uncertainty . 9
8.1 Information from the calibration certificate for a measurement standard .9
8.2 Uncertainty of the values measured during calibration of a measuring instrument
using a measurement standard .9
9 Contact (stylus) instrument calibration certificate . 10
10 General information . 10
Annex A (normative) Calibration of instruments measuring parameters of the motifs method .11
Annex B (normative) Calibration of simplified operator instruments for the measurements of
surface texture.13
Annex C (informative) Example — Roughness measurement standard parameter Ra . 14
Annex D (informative) Concept diagram . 17
Annex E (informative) Overview of profile and areal standards in the GPS matrix model .18
Annex F (informative) Relation to the GPS matrix model . 19

iii
ISO/DIS 12179:2025(en)
Bibliography .20

iv
ISO/DIS 12179:2025(en)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 213, Dimensional and geometrical product
specifications and verification.
This third edition cancels and replaces the second edition (ISO 12179:2021), which has been technically
revised.
The main changes to the previous edition are as follows:
— Annex C has been amended and 8.2 has been modified accordingly.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.

v
ISO/DIS 12179:2025(en)
Introduction
This document is a geometrical product specification (GPS) standard and is to be regarded as a general GPS
standard (see ISO 14638). It influences chain link G of the chain of standards on profile surface texture.
The ISO GPS matrix model is given in ISO 14638, For more detailed information on the relationship of this
document to the GPS matrix model, see Annex F. An overview of standards on profiles and areal surface
texture is given in Annex E.
This document introduces calibration of contact (stylus) instruments as defined in ISO 25178-601. The
calibration is carried out with the aid of measurement standards.

vi
DRAFT International Standard ISO/DIS 12179:2025(en)
Geometrical product specifications (GPS) — Surface texture:
Profile — Calibration of contact (stylus) instruments
1 Scope
This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus)
instruments for the measurement of surface texture by the profile method as defined in ISO 25178-601. The
calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator
contact (stylus) instruments which do not conform with ISO 25178-601.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO 10012, Measurement management systems — Requirements for measurement processes and measuring
equipment
ISO 14253-2, Geometrical product specifications (GPS) — Inspection by measurement of workpieces and
measuring equipment — Part 2: Guidance for the estimation of uncertainty in GPS measurement, in calibration
of measuring equipment and in product verification
ISO 25178-73:2019, Geometrical product specifications (GPS) — Surface texture: Areal — Part 73: Terms and
definitions for surface defects on material measures
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 25178-601, ISO 14253-1,
ISO 21920-2, ISO/IEC Guide 98-3 and ISO/IEC Guide 99 and the following apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
3.1
calibration
operation that, under specified conditions:
a) in a first step, establishes a relation between the quantity values with measurement uncertainties
provided by measurement standards and corresponding indications with associated measurement
uncertainties; and
b) in a second step, uses this information to establish a relation for obtaining a measurement result from
an indication
[SOURCE: ISO/IEC Guide 99:2007, 2.39, modified — Notes to entry removed.]

ISO/DIS 12179:2025(en)
3.2
task-related calibration
set of operations which establish, under specified conditions, the relationship between values of quantities
indicated by a measuring instrument and the corresponding known values of a limited family of precisely
defined measurands which constitute a subset of the measuring capabilities of the measuring instrument
3.3
adjustment
adjustment of a measuring system
set of operations carried out on a measuring system so that it provides prescribed indications corresponding
to given values of a quantity to be measured
[SOURCE: ISO/IEC Guide 99:2007, 3.11, modified — Notes to entry removed.]
3.4
measurement standard
etalon
realization of the definition of a given quantity, with stated quantity value and associated measurement
uncertainty, used as a reference
Note 1 to entry: Measurement standards are also referred to as “calibration specimens”.
[SOURCE: ISO/IEC Guide 99:2007, 5.1, modified — Examples and Notes to entry removed.]
3.5
measurement uncertainty
uncertainty of measurement
uncertainty
non-negative parameter characterizing the dispersion of the quantity values being attributed to a
measurand, based on the information used
[SOURCE: ISO/IEC Guide 99:2007, 2.26, modified — Notes to entry removed.]
3.6
metrological traceability
property of a measurement result whereby the result can be related to a reference through a documented
unbroken chain of calibrations, each contributing to the measurement uncertainty
[SOURCE: ISO/IEC Guide 99:2007, 2.41, modified — Notes to entry removed.]
3.7
defect
part of the measurement standard’s geometrical feature (non-ideal surface) on
which the geometrical shape and geometrical dimensions deviate from those on the nominal feature (ideal
surface) either by an amount greater than some agreed or stated maximum value, or, in the absence of any
such agreed or stated maximum value, by an amount greater than what is typical or characteristic for the
processes used in manufacturing the measurement standard
[SOURCE: ISO 25178-73:2019, 3.1.2, modified — Notes to entry removed.]
3.8
residual profile
primary profile obtained by tracing an ideally smooth and flat surface (optical flat)
Note 1 to entry: The residual profile is composed of the deviations of the guide, external and internal disturbances, as
well as deviations in profile transmission. The determination of the causes of the deviations is not normally possible
without special equipment and a suitable environment.

ISO/DIS 12179:2025(en)
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
The contact (stylus) instrument comprises the basic equipment, a drive unit and a probe (see ISO 25178-601).
If the basic equipment is used with several drive units and probes, each of these instrumental combinations
(configurations) shall be calibrated separately.
4.2 Calibration of a configuration
The contact (stylus) instrument shall be calibrated when a change is made to the basic elements of the
system which intentionally or unintentionally modifies the measured profile or measuring result. Each
configuration of the contact (stylus) instrument shall be calibrated separately. For example, with a change of
probe, the contact (stylus) instrument is calibrated.
4.3 Place of calibration
The contact (stylus) instrument should be calibrated at the place of use with environmental conditions
similar to those present when in use for measurement to take into account external influence factors.
EXAMPLES Noise, temperature, vibration, air turbulence.
4.4 Defects
Geometrical defects that can be present on the surfaces of material measures (calibration specimens ) shall
be taken into consideration according to ISO 25178-73.
5 Measurement standards
The following measurement standards are applicable to the calibrations given in Clause 6:
— optical flat;
— depth measurement standard (see Figure 1): type A according to ISO 5436-1:2000;
— spacing measurement standard (see Figure 2): type C according to ISO 5436-1:2000;
— inclined optical flat (see Figure 3);
— profile coordinate measurement standard (consisting of a sphere or prism): type E according to
ISO 5436-1:2000;
— roughness measurement standard (see Figure 4): type D according to ISO 5436-1:2000.
A profile coordinate measurement standard should be used on contact (stylus) instruments where the stylus
rotates at least plus and minus one half of a degree when moving through its full range.
NOTE A type C periodic measurement standard is also useful for checking Ra as well as for checking Rsm.

ISO/DIS 12179:2025(en)
Dimensions in millimetres
Figure 1 — Example of a depth measurement standard (type A)
Dimensions in millimetres
Figure 2 — Example of a spacing measurement standard (type C)

ISO/DIS 12179:2025(en)
Dimensions in millimetres
Figure 3 — Example of an inclined optical flat and a measuring plan
Dimensions in millimetres
Figure 4 — Example of a roughness measurement standard (type D) and measuring plan

ISO/DIS 12179:2025(en)
6 Contact (stylus) instrument metrological characteristics
6.1 General
Only those task-related contact (stylus) instrument metrological characteristics which are relevant
for the intended measurements should be selected for calibration and adjustment. For example, for the
measurement of spacing parameters, the vertical profile component might not need to be calibrated.
Adjustment (if required) of the metrological characteristic shall be carried out after calibration of the
metrological characteristic according to the instrument manufacturer’s procedures.
6.2 Residual profile calibration
The scratch-free optical flat reproduces the residual profile. For task-related calibrations use the appropriate
profile and parameters (e.g. the roughness profile with Ra, Rq or Rt; the waviness profile with Wa, Wq or Wt,
see ISO 21920-2).
NOTE By using this approach the effects of external guide straightness, environmental conditions and instrument
noise can be established.
6.3 Vertical profile component calibration
The depth measurement standard establishes a profile depth in order to measure the error of indication of
the vertical profile component of an instrument.
If no depth measurement standards are available, gauge blocks steps may be used. Care should be taken
concerning the uncertainty of the height difference when using gauge blocks steps.
6.4 Horizontal profile component calibration
The spacing measurement standard reproduces the mean width of profile element, Psm, see ISO 21920-2, in
order to measure the error of indication of the horizontal profile component.
6.5 Profile coordinate system calibration
The inclined optical flat reproduces:
— the least-squares-best-fit angle in degrees;
— the total height of the primary profile, Pt, see ISO 21920-2, after removal of the least-squares-best-fit
straight line,
thus establishing the error of the linked horizontal and vertical coordinates (e.g. variation in traverse speed,
nonlinearities in scales).
The profile coordinate measurement standard provides calibration for the total height of the primary
profile, Pt, after removal of the least-squares-best-fit nominal form, thus establishing the coordinate system.
6.6 Total contact (stylus) instrument calibration
The roughness measurement standard reproduces:
— the arithmetic mean height,
...