ISO/IEC 29109-7:2011
(Main)Information technology - Conformance testing methodology for biometric data interchange formats defined in ISO/IEC 19794 - Part 7: Signature/sign time series data
Information technology - Conformance testing methodology for biometric data interchange formats defined in ISO/IEC 19794 - Part 7: Signature/sign time series data
ISO/IEC 29109-7:2011 specifies elements of conformance testing methodology, test assertions, and test procedures as applicable to ISO/IEC 19794-7. ISO/IEC 19794-7 defines two data interchange formats for signature/sign time series data, one for general use and one compact format for use with smart cards and other tokens. ISO/IEC 29109-7:2011 establishes test assertions of the structure of both signature/sign time series data formats as specified in ISO/IEC 19794-7 (Type A Level 1 as defined in ISO/IEC 29109-1), test assertions of internal consistency by checking the types of values that may be contained within each field (Type A Level 2 as defined in ISO/IEC 29109-1), and test assertions on the contents of data records in the signature/sign time series data formats as specified in ISO/IEC 19794-7 (Type A Level 3 as defined in ISO/IEC 29109-1). ISO/IEC 29109-7:2011 does not establish tests of other characteristics of biometric products or other types of testing of biometric products (e.g. acceptance, performance, robustness, security), and tests of conformance of systems that do not produce ISO/IEC 19794-7 records.
Technologies de l'information — Méthodologie d'essai de conformité pour les formats d'interéchange de données biométriques définis dans l'ISO/CEI 19794 — Partie 7: Données de série chronologique de signature/signe
General Information
Overview
ISO/IEC 29109-7:2011 specifies a conformance testing methodology for signature/sign time series biometric data recorded in the ISO/IEC 19794-7 interchange formats. It defines how to verify binary signature/time-series records for both the full and compact formats (the compact format is intended for smart cards and other tokens). The document builds on the generalized methodology of ISO/IEC 29109-1 and establishes the test assertions and procedures required to claim conformance to ISO/IEC 19794-7.
Key topics
- Conformance scope: Tests focus on the correctness of ISO/IEC 19794-7 data records (structure, internal consistency, and content). It does not cover product performance, robustness, security, or acceptance testing.
- Test levels (Type A):
- Level 1 (Structure): Verify record structure and mandatory fields (Type A Level 1).
- Level 2 (Internal consistency): Check value types and field consistency (Type A Level 2).
- Level 3 (Content): Validate contents of data records against ISO/IEC 19794-7 requirements (Type A Level 3).
- Biometric Data Block (BDB): Tests include BDB header/body organization, identifiers (e.g., “SDI” signature block marker), version encoding, and reserved octets.
- Channel descriptions and values: Conformance checks cover channel inclusion fields, channel description preambles, channel attributes (scaling, constant channels, removed linear component), and encoding of scaling/exponent/fraction fields.
- Numeric encoding rules: The standard defines encoded ranges and integer encoding conventions for channels (examples include X, Y, Z, VX, VY, TX, TY, F, Az, El, R), plus rules for mean, minimum, maximum, and standard deviation fields.
- Methodology basis: Testing procedures reference Clauses 6–8 of ISO/IEC 29109-1 and require an Implementation Conformance Statement (ICS) to declare supported options.
Applications
- Ensures interoperability between biometric capture devices, biometric service providers, and storage/transmission systems that use ISO/IEC 19794-7 signature/time-series data.
- Used by testing laboratories to build conformance test suites and by developers to validate implementations before deployment.
- Relevant for vendors of signature capture devices, smart card/token integrators (compact format), system integrators, and organizations issuing conformance claims.
Related standards
- ISO/IEC 19794-7:2007 - Biometric data interchange formats - Part 7: Signature/sign time series data (base format specification).
- ISO/IEC 29109-1:2009 - Generalized conformance testing methodology (methodology foundation).
Keywords: ISO/IEC 29109-7:2011, conformance testing, biometric data interchange formats, ISO/IEC 19794-7, signature time series, full format, compact format, smart card, test assertions, BDB, channel scaling.
Frequently Asked Questions
ISO/IEC 29109-7:2011 is a standard published by the International Organization for Standardization (ISO). Its full title is "Information technology - Conformance testing methodology for biometric data interchange formats defined in ISO/IEC 19794 - Part 7: Signature/sign time series data". This standard covers: ISO/IEC 29109-7:2011 specifies elements of conformance testing methodology, test assertions, and test procedures as applicable to ISO/IEC 19794-7. ISO/IEC 19794-7 defines two data interchange formats for signature/sign time series data, one for general use and one compact format for use with smart cards and other tokens. ISO/IEC 29109-7:2011 establishes test assertions of the structure of both signature/sign time series data formats as specified in ISO/IEC 19794-7 (Type A Level 1 as defined in ISO/IEC 29109-1), test assertions of internal consistency by checking the types of values that may be contained within each field (Type A Level 2 as defined in ISO/IEC 29109-1), and test assertions on the contents of data records in the signature/sign time series data formats as specified in ISO/IEC 19794-7 (Type A Level 3 as defined in ISO/IEC 29109-1). ISO/IEC 29109-7:2011 does not establish tests of other characteristics of biometric products or other types of testing of biometric products (e.g. acceptance, performance, robustness, security), and tests of conformance of systems that do not produce ISO/IEC 19794-7 records.
ISO/IEC 29109-7:2011 specifies elements of conformance testing methodology, test assertions, and test procedures as applicable to ISO/IEC 19794-7. ISO/IEC 19794-7 defines two data interchange formats for signature/sign time series data, one for general use and one compact format for use with smart cards and other tokens. ISO/IEC 29109-7:2011 establishes test assertions of the structure of both signature/sign time series data formats as specified in ISO/IEC 19794-7 (Type A Level 1 as defined in ISO/IEC 29109-1), test assertions of internal consistency by checking the types of values that may be contained within each field (Type A Level 2 as defined in ISO/IEC 29109-1), and test assertions on the contents of data records in the signature/sign time series data formats as specified in ISO/IEC 19794-7 (Type A Level 3 as defined in ISO/IEC 29109-1). ISO/IEC 29109-7:2011 does not establish tests of other characteristics of biometric products or other types of testing of biometric products (e.g. acceptance, performance, robustness, security), and tests of conformance of systems that do not produce ISO/IEC 19794-7 records.
ISO/IEC 29109-7:2011 is classified under the following ICS (International Classification for Standards) categories: 35.040 - Information coding; 35.240.15 - Identification cards. Chip cards. Biometrics. The ICS classification helps identify the subject area and facilitates finding related standards.
You can purchase ISO/IEC 29109-7:2011 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of ISO standards.
Standards Content (Sample)
INTERNATIONAL ISO/IEC
STANDARD 29109-7
First edition
2011-10-01
Information technology — Conformance
testing methodology for biometric data
interchange formats defined in
ISO/IEC 19794 —
Part 7:
Signature/sign time series data
Technologies de l'information — Méthodologie d'essai de conformité
pour les formats d'interéchange de données biométriques définis dans
l'ISO/CEI 19794 —
Partie 7: Données de série chronologique de signature/signe
Reference number
©
ISO/IEC 2011
© ISO/IEC 2011
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means,
electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or
ISO's member body in the country of the requester.
ISO copyright office
Case postale 56 CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.org
Web www.iso.org
Published in Switzerland
ii © ISO/IEC 2011 – All rights reserved
Contents Page
Foreword . iv
Introduction . v
1 Scope . 1
2 Conformance . 1
3 Normative references . 2
4 Terms and definitions . 2
5 Symbols and abbreviated terms . 2
6 Conformance testing methodology . 2
6.1 General . 2
6.2 Table of requirements in the base standard . 2
6.3 Table of Test Assertions – Full Format . 10
6.4 Table of Test Assertions – Compact Format . 21
© ISO/IEC 2011 – All rights reserved iii
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
ISO/IEC 29109-7 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 37, Biometrics.
ISO/IEC 29109 consists of the following parts, under the general title Information technology — Conformance
testing methodology for biometric data interchange formats defined in ISO/IEC 19794:
Part 1: Generalized conformance testing methodology
Part 2: Finger minutiae data
Part 3: Finger pattern spectral data
Part 4: Finger image data
Part 5: Face image data
Part 6: Iris image data
Part 7: Signature/sign time series data
Part 8: Finger pattern skeletal data
Part 9: Vascular image data
Part 10: Hand geometry silhouette data
Part 11: Signature/sign processed dynamic data
Part 13: Voice data
Part 14: DNA data
iv © ISO/IEC 2011 – All rights reserved
Introduction
ISO/IEC 19794-7 specifies two data interchange formats for storing, recording, and transmitting signature/sign
time series data records. This part of ISO/IEC 29109 establishes tests for checking the correctness of the
binary records.
Without standardized methods for conducting conformance tests of commercial products that claim to support
ISO/IEC 19794-7, application developers and implementers of Biometric Service Providers can interpret the
ISO/IEC 19794-7 specification differently and this can compromise interoperability. This possibility rests on the
assertion that conformance to ISO/IEC 19794-7 is a necessary prerequisite for achieving interoperability
among implementations. This is the motivation for development of this conformance testing methodology.
This part of ISO/IEC 29109 supports those applications that require use of signature/sign time series data
according to ISO/IEC 19794-7. It defines a testing methodology to assure conformance of a vendor's
application or service to the base ISO/IEC 19794-7 specification. Thus this document is intended to
establish elements of the conformance testing methodology framework that are specific to the signature/
sign time series-based data record requirements of ISO/IEC 19794-7,
define requirements and guidelines for specifying conformance test suites and related test methods for
measuring conformity of products and services to the signature/sign time series-based data record
requirements of ISO/IEC 19794-7, and
define test procedures to be followed before, during, and after conformance testing.
This part of ISO/IEC 29109 is applicable to the development and use of conformity test method specifications,
conformity test suites for ISO/IEC 19794-7 records, and conformance testing programs for ISO/IEC 19794-7
conformant products. It is intended primarily for use by testing organizations, but can be applied by developers
and users of test method specifications and test method implementations.
The tables of test assertions in Clause 6 specify levels of testing for the conformance requirements of
ISO/IEC 19794-7.
© ISO/IEC 2011 – All rights reserved v
INTERNATIONAL STANDARD ISO/IEC 29109-7:2011(E)
Information technology — Conformance testing methodology
for biometric data interchange formats defined in
ISO/IEC 19794 —
Part 7:
Signature/sign time series data
1 Scope
This part of ISO/IEC 29109 specifies elements of conformance testing methodology, test assertions, and test
procedures as applicable to ISO/IEC 19794-7. ISO/IEC 19794-7 defines two data interchange formats for
signature/sign time series data, one for general use and one compact format for use with smart cards and
other tokens.
This part of ISO/IEC 29109 establishes
test assertions of the structure of both signature/sign time series data formats as specified in
ISO/IEC 19794-7 (Type A Level 1 as defined in ISO/IEC 29109-1),
test assertions of internal consistency by checking the types of values that may be contained within each
field (Type A Level 2 as defined in ISO/IEC 29109-1), and
test assertions on the contents of data records in the signature/sign time series data formats as specified
in ISO/IEC 19794-7 (Type A Level 3 as defined in ISO/IEC 29109-1).
This part of ISO/IEC 29109 does not establish
tests of other characteristics of biometric products or other types of testing of biometric products (e.g.
acceptance, performance, robustness, security), and
tests of conformance of systems that do not produce ISO/IEC 19794-7 records.
2 Conformance
Biometric data interchange format conformance tests conform to this part of ISO/IEC 29109 if they satisfy all
of the normative requirements related to Clause 6. Specifically, they shall use the test methodology specified
in Clauses 6, 7 and 8 of ISO/IEC 29109-1:2009, and all tests shall use the assertions defined in Table 2 to
Table 4.
Implementations of ISO/IEC 19794-7 tested according to the methodology specified shall be able to claim
conformance only to those requirements specified in ISO/IEC 19794-7 that are tested by the test methods
established by this methodology.
Implementations of ISO/IEC 19794-7 do not necessarily need to conform to all possible aspects of
ISO/IEC 19794-7, but only to those ISO/IEC 19794-7 requirements that are claimed to be supported by the
implementation in an Implementation Conformance Statement, filled out in accordance with Clause 8 of
ISO/IEC 29109-1:2009 and Table 1 of this part of ISO/IEC 29109.
© ISO/IEC 2011 – All rights reserved 1
3 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO/IEC 19794-7:2007, Information technology — Biometric data interchange formats — Part 7:
Signature/sign time series data
ISO/IEC 29109-1:2009, Information technology — Conformance testing methodology for biometric data
interchange formats defined in ISO/IEC 19794 — Part 1: Generalized conformance testing methodology
4 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO/IEC 19794-7 and ISO/IEC 29109-1
apply.
5 Symbols and abbreviated terms
For the purposes of this document, the symbols and abbreviated terms given in ISO/IEC 19794-7 and
ISO/IEC 29109-1 apply.
6 Conformance testing methodology
6.1 General
The testing methodology specified in Clauses 6, 7 and 8 of ISO/IEC 29109-1:2009 shall apply. The content of
the tables below is based on the conformance testing methodology outlined in ISO/IEC 29109-1 and shall only
be used in the context of that testing methodology.
6.2 Table of requirements in the base standard
The normative requirements of ISO/IEC 19794-7:2007 signature/sign time series data formats are listed in
Table 1. Under subformat applicability the columns labelled F and C indicate the Full and Compact Formats. The
supplier of the IUT can explain which optional components of the standard are supported and the testing
laboratory can note the results of the test.
Table 1 — Requirements of the base standard, ISO/IEC 19794-7:2007
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-1 5.1 The coordinate system used to express 3B M Y Y
the pen position shall be a three-
dimensional Cartesian coordinate
system.
R-2 5.1 The x-axis shall be the horizontal axis of 3B M Y Y
the writing plane, with x coordinates
increasing to the right.
R-3 5.1 The y-axis shall be the vertical axis of 3B M Y Y
the writing plane, with y coordinates
increasing upwards.
2 © ISO/IEC 2011 – All rights reserved
Table 1 (continued)
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-4 5.1 The z-axis shall be the axis 3C O Y Y
perpendicular to the writing plane, with z
coordinates increasing upwards out of
the writing plane starting from 0.
R-5 5.2 The more significant octets of any 1 M Y Y
multioctet quantity are stored at lower
addresses in memory than (and are
transmitted before) less significant
octets.
R-6 7.2 The organisation of the BDB shall be as 2 M Y N
follows:
R-7 1. mandatory variable-length BDB 2 M Y N
header containing information about the
overall BDB,
R-8 2. mandatory variable-length BDB body. 2 M Y N
R-9 7.3.1 The BDB header shall contain infor- 2 M Y N
mation about the overall signature/ sign
time series data block.
R-10 7.3.2 The signature/sign time series data 1 M Y N
block shall begin with the three ASCII
characters “SDI” to identify the data
block as following the full format defined
in ISO/IEC 19794-7:2007, followed by a
zero octet as a string terminator (5344
4900 ).
Hex
R-11 7.3.3 The version number for the version of 1 M Y N
ISO/IEC 19794-7:2007 used in
constructing the signature/sign time
series data block shall be placed in four
octets. This version number shall
consist of three ASCII characters
followed by a zero octet as a string
terminator. The first and second
character shall represent the major
revision number and the third character
will represent the minor revision
number. The version number shall be
“10” (203130 , an ASCII space
Hex
followed by an ASCII ‘1’ and an ASCII
‘0’).
R-12 7.3.4.1 The channel descriptions field shall 1 M Y N
begin with a channel inclusion field
indicating the presence or absence of
channels. The channel inclusion field
shall consist of 2 octets. Each bit shall
correspond to a channel as shown in
Table 4 of ISO/IEC 19794-7:2007. A bit
value of 1 shall encode the presence of
the corresponding channel; a bit value
of 0 shall encode the absence of the
corresponding channel.
© ISO/IEC 2011 – All rights reserved 3
Table 1 (continued)
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-13 7.3.4.2 The channel inclusion field shall be 2 M Y N
followed by a sequence of channel
descriptions for the channels indicated
as present in the channel inclusion
field. The order of the channel
descriptions is determined by the order
of indicated inclusion within the
channel inclusion field (Table 4 of
ISO/IEC 19794-7:2007) starting with
the X channel. The channel
descriptions are mandatory for all
channels present in the signature/sign
time series data block.
R-14 7.3.4.2 Each channel description shall begin 2 M Y N
with a preamble. Each channel
description preamble shall consist of 1
octet. Each of the bits 4 through 8 of a
channel description preamble shall
correspond to a channel attribute as
shown in Table 5 of
ISO/IEC 19794-7:2007. A bit value of 1
shall encode the presence of the
corresponding channel attribute; a bit
value of 0 shall encode the absence of
the corresponding channel attribute. A
value of 1 for bit 3 of a channel
description preamble shall indicate that
the value of this channel is constant. If
bit 3 of a channel description preamble
is set to 1, then this channel shall be
absent in the BDB body even though
the BDB header indicates the presence
of the channel. If the channel
description contains a scaling value,
then the constant value of this channel
shall be 1 divided by the scaling value.
A value of 1 for bit 2 of a channel
description preamble shall indicate that
the linear component of the regression
line for this channel has been removed
from this channel. If any of the bits 4
through 8 of a channel description pre-
amble are set to 1, the preamble shall
be followed by a sequence of channel
attributes in the same order as
indicated in the preamble starting with
the scaling value.
R-15 7.3.4.3 If present, scaling values shall consist 2 M Y N
of 2 octets. The 5 most significant bits
of the first octet shall constitute the
exponent field and the remaining
11 bits shall constitute the fraction field.
These values should be encoded in 5
bits as an unsigned integer after
adding a value of 16.
4 © ISO/IEC 2011 – All rights reserved
Table 1 (continued)
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-16 7.3.4.3, The channel values in the BDB body 3B M Y Y N/A
8.2.2.3 as well as the minimum, maximum,
and mean channel values and the
standard deviation in the BDB header
are to be divided by the corresponding
scaling value to obtain their actual
values.
R-17 7.3.4.4 If present, the minimum and maximum 2 M Y N
possible channel values shall indicate
the scaled range of values that the
deployed capture device may deliver
for the corresponding channel.
R-18 For the minimum and maximum 2 M Y N
possible channel values of the Z, T,
DT, F, Az, El, and R channels, integer
values in the range from 0 to 65535 are
allowed. These values shall be
encoded in 2 octets as unsigned
integers.
R-19 For the minimum and maximum 2 M Y N
possible channel values of the X, Y,
VX, VY, AX, AY, TX, and TY channels,
integer values in the range from –
32768 to 32767 are allowed. These
values shall be encoded in 2 octets as
unsigned integers after adding 32768
to each value.
R-20 7.3.4.5 If present, the mean value of the 2 M Y N
channel values shall be the arithmetic
mean, rounded to the nearest integer,
of all values for the corresponding
channel within a signature/sign time
series data block. If present, the
standard deviation of the channel
values shall be the standard deviation,
rounded to the nearest integer, of all
values for the corresponding channel
within a signature/sign time series data
block.
R-21 7.3.4.5 For the mean values of the Z, T, DT, F, 2 M Y N
Az, El, and R channels as well as for
the standard deviations of all channels,
integer values in the range from 0 to
65535 are allowed. These values shall
be encoded in 2 octets as unsigned
integers. For the mean values of the X,
Y, VX, VY, AX, AY, TX, and TY
channels, integer values in the range
from -32768 to 32767 are allowed.
These values shall be encoded in 2
octets as unsigned integers after
adding 32768 to each value.
R-22 7.3.5 A single octet shall be reserved for 2 M Y N
future revisions of this specification.
For Version 1.0 of
ISO/IEC 19794-7:2007 this octet shall
be set to 00 .
Hex
© ISO/IEC 2011 – All rights reserved 5
Table 1 (continued)
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-23 7.4.1 The BDB body shall begin with a pre- 1 M Y N
amble indicating the presence or
absence of the optional extended data.
The preamble shall consist of 1 octet.
A value of 1 in bit 8 (MSB) of the
preamble shall encode the presence of
the extended data; a value of 0 in bit 8
(MSB) of the preamble shall encode
the absence of the extended data. The
trailing bits of the preamble shall have
the value 0.
R-24 7.4.2 The BDB body preamble shall be 1 M Y N
followed by a sequence of sample
points (cf. clause 7.4.2) and, as
indicated in the preamble, optional
extended data (cf. clause 7.4.3).
R-25 7.4.2 The sequence of sample points shall 2 M Y N
begin with a length field. The length
field indicates the number of sample
points. The length field shall consist of
3 octets, representing the number of
sample points as an unsigned integer.
R-26 7.4.2 The length field shall be followed by a 2 M Y N
sequence of fields for subsequent
sample points. For each sample point,
the field shall begin with a value for the
mandatory X channel, followed by a
value for the mandatory Y channel and
a sequence of optional channel values
as indicated by the channel inclusion
field in the BDB header.
R-27 7.4.2 For the Z, T, DT, F, Az, El, and R 2 M Y N
channels, integer values in the range
from 0 to 65535 are allowed. These
values shall be encoded in 2 octets as
unsigned integers.
R-28 7.4.2 For the X, Y, VX, VY, AX, AY, TX, and 2 M Y N
TY channels, integer values in the
range from –32768 to 32767 are
allowed. These values shall be
encoded in 2 octets as unsigned
integers, after adding 32768 to each
value. Hence, for non-negative num-
bers, bit 8 of the most significant octet
has the value 1; for negative numbers,
bit 8 of the most significant octet has
the value 0. For decoding these values,
32768 is to be subtracted from each
recorded value.
R-29 7.4.2 For the S channel, integer values in the 2 M Y N
range from 0 to 1 are allowed. These
values shall be encoded in one octet
as unsigned integers.
6 © ISO/IEC 2011 – All rights reserved
Table 1 (continued)
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-30 7.4.2 The extended data field shall begin 2 M Y N
with a length field. The length field shall
indicate the number of contents octets
in the extended data field. The length
field shall consist of 2 octets,
representing the number of subsequent
contents octets as an unsigned integer.
R-31 8.2.1 If present, the matching algorithm 1 M N Y
parameters data object tag is B1 . Its
Hex
length shall be encoded following the
Distinguished Encoding Rules of
ASN.1 defined in ISO/IEC 8825-1.
R-32 8.2.2.1 If present, the sequence of channel 1 M N Y
descriptions shall begin with a channel
inclusion field as defined in clause
7.3.4.1 of ISO/IEC 19794-7:2007.
R-33 8.2.2.2 The channel inclusion field shall be 1 M N Y
followed by a sequence of channel
descriptions for the channels indicated
as present in the channel inclusion
field. The order of the channel
descriptions is determined by the order
of indicated inclusion within the
channel inclusion field (19794-7:2007
Table 4) starting with the X channel.
The channel descriptions are manda-
tory for all channels present in the
signature/sign time series data block.
R-34 Each channel description shall begin 1 M N Y
with a preamble as defined in clause
7.3.4.2 of ISO/IEC 19794-7:2007.
R-35 If any of the bits 4 through 8 of a 1 M N Y
channel description preamble are set
to 1, the preamble shall be followed by
a sequence of channel attributes in the
same order as indicated in the
preamble starting with the scaling
value.
R-36 8.2.2.3 If present, the meaning and encoding 2 M N Y
of the scaling values shall be as
defined in clause 7.3.4.3 of
ISO/IEC 19794-7:2007.
R-37 8.2.2.4 If present, the meaning of the minimum 2 M N Y
and maximum possible channel values
shall be as defined in clause 7.3.4.4 of
ISO/IEC 19794-7:2007.
R-38 For the minimum and maximum 2 M N Y
possible channel values of the Z, T,
DT, F, Az, El, and R channels, integer
values in the range from 0 to 255 are
allowed. These values shall be
encoded in 1 octet as unsigned
integers.
© ISO/IEC 2011 – All rights reserved 7
Table 1 (continued)
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-39 For the minimum and maximum 2 M N Y
possible channel values of the X, Y,
VX, VY, AX, AY, TX, and TY channels,
integer values in the range from –128
to 127 are allowed. These values shall
be encoded in 1 octet as un-signed
integers after adding 128 to each
value. Hence, for non-negative
numbers, bit 8 of the most significant
octet has the value 1; for negative
numbers, bit 8 of the most significant
octet has the value 0. For decoding
these values, 128 is to be subtracted
from each recorded value.
R-40 8.2.2.5 If present, the meaning of the mean 2 M N Y
value and of the standard deviation of
the channel values shall be as defined
in clause 19794-7:2007 7.3.4.5.
R-41 For the mean values of the Z, T, DT, F, 2 M N Y
Az, El, and R channels as well as for
the standard deviations of all channels,
integer values in the range from 0 to
255 are allowed. These values shall be
encoded in 1 octet as unsigned
integers.
R-42 For the mean values of the X, Y, VX, 2 M N Y
VY, AX, AY, TX, and TY channels,
integer values in the range from -128 to
127 are allowed. These values shall be
encoded in 1 octet as unsigned inte-
gers after adding 128 to each value.
Hence, for non-negative numbers, bit 8
of the most significant octet has the
value 1; for negative numbers, bit 8 of
the most significant octet has the value
0. For decoding these values, 128 is to
be subtracted from each recorded
value.
R-43 8.2.3 If there is an upper limit to the number 2 M N Y
of sample points, the maximum
number of sample points that the
comparison algorithm is able to
process may be indicated in the
matching algorithm parameters data
object. If present, the maximum
number of sample points shall be
encoded as an unsigned integer.
8 © ISO/IEC 2011 – All rights reserved
Table 1 (continued)
Subformat
Reference
Require- IUT Supported Test
Applicability
in Base Requirement Summary Level Status
ment ID Support Range Result
Standard
F C
R-44 8.4 The body of a signature/sign time 1 M N Y
series data block consists of a
sequence of fields, each of which
consists of a sequence of channel
values at a particular sample point, for
subsequent sample points. For each
sample point, the field shall begin with
a value for the mandatory X channel,
followed by a value for the mandatory
Y channel, and a sequence of optional
channel values as indicated by the
channel inclusion field in the matching
algorithm parameters data object.
R-45 8.4 For the Z, T, F, Az, El, and R channels, 2 M N Y
integer values in the range from 0 to
255 are allowed. These values shall be
encoded in 1 octet as unsigned
integers. In the compact format, the T
channel shall contain time data relative
to the preceding sample.
R-46 8.4 For the X, Y, VX, VY, AX, AY, TX, and 2 M N Y
TY channels, integer values in the
range from –128 to 127 are allowed.
These values shall be encoded in 1
octet as unsigned integers after adding
128 to each value. Hence, for non-
negative numbers, bit 8 has the value
1; for negative numbers, bit 8 has the
value 0. For decoding these values,
128 is to be subtracted from each
recorded value.
R-47 8.4 For the S channel, integer values in the 2 M N Y
range from 0 to 1 are allowed. These
values shall be encoded in one octet
as unsigned integers.
R-48 8.3 The tag of a signature/sign time series 2 M N Y
data block shall be 5f2e if there is no
Hex
extended data and 7f2e if there is
Hex
also extended data.
R-49 8.3 The length of a signature/sign time 2 M N Y
series data block shall be encoded
following the Distinguished Encoding
Rules of ASN.1 defined in ISO/IEC
8825-1.
R-50 8.3 If there is extended data, the body of a 1 M N Y
signature/sign time series data block
shall be preceded by the tag 81 and
Hex
a length field.
R-51 8.3 If there is extended data, it shall follow 1 M N Y
the body of a signature/sign time series
data block and shall be preceded by
the tag 82 or A2 and a length
Hex Hex
field.
© ISO/IEC 2011 – All rights reserved 9
6.3 Table of Test Assertions – Full Format
The specific test assertions required for conformance testing of ISO/IEC 19794-7:2007 signature/sign time
series full format for data interchange are listed in Table 2.
The conformance test assertions are listed in the order in which the corresponding fields, if present, are
required to appear in a conforming data record.
Table 2 — ISO/IEC 19794-7:2007 full format test assertions
Op- IUT Sup- Test
Require- Test
Test Section Level Field era- Operands Status Sup- ported Re-
ment ID Note
tor port Range sult
1 BDB R-10 1 Format identifier EQ 53444900 M
Hex
Header
2 BDB R-11 1 Version EQ 20313000 M
Hex
Header
3.1 BDB R-12 1 xIncluded EQ 1 M
Bin
Header
3.2 BDB R-12 1 yIncluded EQ 1 M
Bin
Header
3.3 BDB R-12 1 zIncluded EQ 0 , 1 M
Bin Bin
Header
3.4 BDB R-12 1 vXIncluded EQ 0 , 1 M
Bin Bin
Header
3.5 BDB R-12 1 vYIncluded EQ 0 , 1 M
Bin Bin
Header
3.6 BDB R-12 1 aXIncluded EQ 0 , 1 M
Bin Bin
Header
3.7 BDB R-12 1 aYIncluded EQ 0 , 1 M
Bin Bin
Header
3.8 BDB R-12 1 tIncluded EQ 0 , 1 M
Bin Bin
Header
3.9 BDB R-12 1 dtIncluded EQ 0 , 1 M
Bin Bin
Header
3.10 BDB R-12 1 fIncluded EQ 0 , 1 M
Bin Bin
Header
3.11 BDB R-12 1 sIncluded EQ 0 , 1 M
Bin Bin
Header
3.12 BDB R-12 1 tXIncluded EQ 0 , 1 M
Bin Bin
Header
3.13 BDB R-12 1 tYIncluded EQ 0 , 1 M
Bin Bin
Header
3.14 BDB R-12 1 azIncluded EQ 0 , 1 M
Bin Bin
Header
3.15 BDB R-12 1 elIncluded EQ 0 , 1 M
Bin Bin
Header
3.16 BDB R-12 1 rIncluded EQ 0 , 1 M
Bin Bin
Header
3.17.1 X Channel R-14 2 xScalingValue- EQ 0 , 1 M
Bin Bin
Descriptor Included
3.17.2 X Channel R-14 2 xMinIncluded EQ 0 , 1 M
Bin Bin
Descriptor
3.17.3 X Channel R-14 2 xMaxIncluded EQ 0 , 1 M
Bin Bin
Descriptor
10 © ISO/IEC 2011 – All rights reserved
Table 2 (continued)
Op- IUT Sup- Test
Require- Test
Test Section Level Field era- Operands Status Sup- ported Re-
ment ID Note
tor port Range sult
3.17.4 X Channel R-14 2 xMeanIncluded EQ 0 , 1 M
Bin Bin
Descriptor
3.17.5 X Channel R-14 2 xStdIncluded EQ 0 , 1 M
Bin Bin
Descriptor
3.17.6 X Channel R-14 2 xIsConstant EQ 0 , 1 M
Bin Bin
Descriptor
3.17.7 X Channel R-14 2 xLinearComp- EQ 0 , 1 M
Bin Bin
Descriptor Removed
3.17.8 X Channel R-14 1 reserved EQ 0 M
Bin
Descriptor
3.17.9 X Channel R-15 2 xScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.17.10 X Channel R-15 2 xScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.17.11 X Channel R-16, 2 xMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.17.12 X Channel R-16, 2 xMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.17.13 X Channel R-16, 2 xMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.17.14 X Channel R-16, 2 xStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.18.1 Y Channel R-14 2 yScalingValue- EQ 0 , 1 M
Bin Bin
Descriptor Included
3.18.2 Y Channel R-14 2 yMinIncluded EQ 0 , 1 M
Bin Bin
Descriptor
3.18.3 Y Channel R-14 2 yMaxIncluded EQ 0 , 1 M
Bin Bin
Descriptor
3.18.4 Y Channel R-14 2 yMeanIncluded EQ 0 , 1 M
Bin Bin
Descriptor
3.18.5 Y Channel R-14 2 yStdIncluded EQ 0 , 1 M
Bin Bin
Descriptor
3.18.6 Y Channel R-14 2 yIsConstant EQ 0 , 1 M
Bin Bin
Descriptor
3.18.7 Y Channel R-14 2 yLinearComp- EQ 0 , 1 M
Bin Bin
Descriptor Removed
3.18.8 Y Channel R-14 1 reserved EQ 0 M
Bin
Descriptor
3.18.9 Y Channel R-15 2 yScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.18.10 Y Channel R-15 2 yScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.18.11 Y Channel R-16, 2 yMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.18.12 Y Channel R-16, 2 yMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.18.13 Y Channel R-16, 2 yMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.18.14 Y Channel R-16, 2 yStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
© ISO/IEC 2011 – All rights reserved 11
Table 2 (continued)
Op- IUT Sup- Test
Require- Test
Test Section Level Field era- Operands Status Sup- ported Re-
ment ID Note
tor port Range sult
3.19.1 Z Channel R-14 2 zScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.19.2 Z Channel R-14 2 zMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.19.3 Z Channel R-14 2 zMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.19.4 Z Channel R-14 2 zMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.19.5 Z Channel R-14 2 zStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.19.6 Z Channel R-14 2 zIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.19.7 Z Channel R-14 2 zLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
3.19.8 Z Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.19.9 Z Channel R-15 2 zScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.19.10 Z Channel R-15 2 zScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.19.11 Z Channel R-16, 2 zMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.19.12 Z Channel R-16, 2 zMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.19.13 Z Channel R-16, 2 zMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.19.14 Z Channel R-16, 2 zStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.20.1 VX Channel R-14 2 vXScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.20.2 VX Channel R-14 2 vXMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.20.3 VX Channel R-14 2 vXMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.20.4 VX Channel R-14 2 vXMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.20.5 VX Channel R-14 2 vXStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.20.6 VX Channel R-14 2 vXIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.20.7 VX Channel R-14 2 vXLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
3.20.8 VX Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.20.9 VX Channel R-15 2 vXScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.20.10 VX Channel R-15 2 vXScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.20.11 VX Channel R-16, 2 vXMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
12 © ISO/IEC 2011 – All rights reserved
Table 2 (continued)
Op- IUT Sup- Test
Require- Test
Test Section Level Field era- Operands Status Sup- ported Re-
ment ID Note
tor port Range sult
3.20.12 VX Channel R-16, 2 vXMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.20.13 VX Channel R-16, 2 vXMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.20.14 VX Channel R-16, 2 vXStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.21.1 VY Channel R-14 2 vYScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.21.2 VY Channel R-14 2 vYMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.21.3 VY Channel R-14 2 vYMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.21.4 VY Channel R-14 2 vYMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.21.5 VY Channel R-14 2 vYStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.21.6 VY Channel R-14 2 vYIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.21.7 VY Channel R-14 2 vYLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
3.21.8 VY Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.21.9 VY Channel R-15 2 vYScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.21.10 VY Channel R-15 2 vYScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.21.11 VY Channel R-16, 2 vYMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.21.12 VY Channel R-16, 2 vYMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.21.13 VY Channel R-16, 2 vYMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.21.14 VY Channel R-16, 2 vYStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.22.1 AX Channel R-14 2 aXScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.22.2 AX Channel R-14 2 aXMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.22.3 AX Channel R-14 2 aXMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.22.4 AX Channel R-14 2 aXMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.22.5 AX Channel R-14 2 aXStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.22.6 AX Channel R-14 2 aXIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.22.7 AX Channel R-14 2 aXLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
3.22.8 AX Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.22.9 AX Channel R-15 2 aXScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
© ISO/IEC 2011 – All rights reserved 13
Table 2 (continued)
Op- IUT Sup- Test
Require- Test
Test Section Level Field era- Operands Status Sup- ported Re-
ment ID Note
tor port Range sult
3.22.10 AX Channel R-15 2 aXScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.22.11 AX Channel R-16, 2 aXMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.22.12 AX Channel R-16, 2 aXMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.22.13 AX Channel R-16, 2 aXMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.22.14 AX Channel R-16, 2 aXStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.23.1 AY Channel R-14 2 aYScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.23.2 AY Channel R-14 2 aYMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.23.3 AY Channel R-14 2 aYMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.23.4 AY Channel R-14 2 aYMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.23.5 AY Channel R-14 2 aYStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.23.6 AY Channel R-14 2 aYIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.23.7 AY Channel R-14 2 aYLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
3.23.8 AY Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.23.9 AY Channel R-15 2 aYScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.23.10 AY Channel R-15 2 aYScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.23.11 AY Channel R-16, 2 aYMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.23.12 AY Channel R-16, 2 aYMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-19 present
3.23.13 AY Channel R-16, 2 aYMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.23.14 AY Channel R-16, 2 aYStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.24.1 T Channel R-14 2 tScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.24.2 T Channel R-14 2 tMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.24.3 T Channel R-14 2 tMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.24.4 T Channel R-14 2 tMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.24.5 T Channel R-14 2 tStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.24.6 T Channel R-14 2 tIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.24.7 T Channel R-14 2 tLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
14 © ISO/IEC 2011 – All rights reserved
Table 2 (continued)
Op- IUT Sup- Test
Require- Test
Test Section Level Field era- Operands Status Sup- ported Re-
ment ID Note
tor port Range sult
3.24.8 T Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.24.9 T Channel R-15 2 tScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.24.10 T Channel R-15 2 tScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.24.11 T Channel R-16, 2 tMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.24.12 T Channel R-16, 2 tMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.24.13 T Channel R-16, 2 tMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.24.14 T Channel R-16, 2 tStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.25.1 DT Channel R-14 2 dTScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.25.2 DT Channel R-14 2 dTMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.25.3 DT Channel R-14 2 dTMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.25.4 DT Channel R-14 2 dTMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.25.5 DT Channel R-14 2 dTStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.25.6 DT Channel R-14 2 dTIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.25.7 DT Channel R-14 2 dTLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
3.25.8 DT Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.25.9 DT Channel R-15 2 dTScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.25.10 DT Channel R-15 2 dTScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.25.11 DT Channel R-16, 2 dTMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.25.12 DT Channel R-16, 2 dTMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.25.13 DT Channel R-16, 2 dTMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.25.14 DT Channel R-16, 2 dTStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.26.1 F Channel R-14 2 fScalingValue- EQ 0 , 1 if present M
Bin Bin
Descriptor Included
3.26.2 F Channel R-14 2 fMinIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.26.3 F Channel R-14 2 fMaxIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.26.4 F Channel R-14 2 fMeanIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
3.26.5 F Channel R-14 2 fStdIncluded EQ 0 , 1 if present M
Bin Bin
Descriptor
© ISO/IEC 2011 – All rights reserved 15
Table 2 (continued)
Op- IUT Sup- Test
Require- Test
Test Section Level Field era- Operands Status Sup- ported Re-
ment ID Note
tor port Range sult
3.26.6 F Channel R-14 2 fIsConstant EQ 0 , 1 if present M
Bin Bin
Descriptor
3.26.7 F Channel R-14 2 fLinearComp- EQ 0 , 1 if present M
Bin Bin
Descriptor Removed
3.26.8 F Channel R-14 1 reserved EQ 0 if present M
Bin
Descriptor
3.26.9 F Channel R-15 2 fScalingValue- EQ 00 to 1f if M
Hex Hex
Descriptor Exponent present
3.26.10 F Channel R-15 2 fScalingValue- EQ 000 to 7ff if M
Hex Hex
Descriptor Fraction present
3.26.11 F Channel R-16, 2 fMin EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.26.12 F Channel R-16, 2 fMax EQ 0000 to ffff if M
Hex Hex
Descriptor R-17, R-18 present
3.26.13 F Channel R-16, 2 fMean EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.26.14 F Channel R-16, 2 fStd EQ 0000 to ffff if M
Hex Hex
Descriptor R-20, R-21 present
3.27.1 S Channel R-14 2 sScalingValue- EQ 0 , 1 if present M
Bin Bin
Descrip
...
The article discusses ISO/IEC 29109-7:2011, which is a standard that outlines the methodology for conformance testing of biometric data interchange formats defined in ISO/IEC 19794. Specifically, it focuses on signature/sign time series data formats, including a general use format and a compact format for use with smart cards and tokens. The standard establishes test assertions for the structure, internal consistency, and contents of these data formats. However, it does not cover other characteristics or types of testing for biometric products, and it does not apply to systems that do not generate ISO/IEC 19794-7 records.
記事タイトル:ISO/IEC 29109-7:2011 - 情報技術 - ISO/IEC 19794で定義された生体認証データ交換形式に対する適合テスト手法 - パート7:署名/署名時系列データ 記事内容:ISO/IEC 29109-7:2011は、ISO/IEC 19794-7に適用できる適合性テスト手法、テストアサーション、テスト手順の要素を規定しています。ISO/IEC 19794-7では、一般的な使用のためのデータ交換形式と、スマートカードや他のトークンとの使用に適したコンパクトな形式の2つの署名/署名時系列データ形式を定義しています。ISO/IEC 29109-7:2011は、ISO/IEC 19794-7で指定された署名/署名時系列データ形式の構造に関するテストアサーション、各フィールド内に含まれる可能性のある値の型に関する内部整合性のテストアサーション、およびISO/IEC 19794-7で指定された署名/署名時系列データ形式のデータレコード内容に関するテストアサーションを設定します。ISO/IEC 29109-7:2011は、生体認証製品の他の特性や他のタイプのテスト(受容性、パフォーマンス、堅牢性、セキュリティなど)についてのテストは設定せず、ISO/IEC 19794-7のレコードを生成しないシステムの適合テストも設定しません。
기사 제목: ISO/IEC 29109-7:2011 - 정보기술 - ISO/IEC 19794에서 정의된 생체 인식 데이터 교환 형식에 대한 준수 테스트 방법론 - 제 7 파트: 서명/서명 시계열 데이터 기사 내용: ISO/IEC 29109-7:2011은 ISO/IEC 19794-7에 적용 가능한 준수 테스트 방법론, 테스트 어설션 및 테스트 절차의 요소를 명시합니다. ISO/IEC 19794-7은 일반적으로 사용되는 데이터 교환 형식과 스마트 카드 및 기타 토큰과 함께 사용되는 간략한 형식을 정의합니다. ISO/IEC 29109-7:2011은 ISO/IEC 19794-7에 명시된 두 가지 서명/서명 시계열 데이터 형식의 구조에 대한 테스트 어설션, 각 필드 내에 포함될 수 있는 값의 유형을 검사하여 내부 일관성의 테스트 어설션, 및 ISO/IEC 19794-7에 명시된 서명/서명 시계열 데이터 형식의 데이터 레코드 내용에 대한 테스트 어설션을 설정합니다. ISO/IEC 29109-7:2011은 생체 인식 제품의 다른 특성이나 다른 유형의 테스트 (예: 수용, 성능, 견고성, 보안)을 설정하지 않으며, ISO/IEC 19794-7 레코드를 생성하지 않는 시스템의 준수 테스트도 설정하지 않습니다.








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