ISO 10934-2:2007

INTERNATIONAL ISO
STANDARD 10934-2
First edition
2007-03-01


Optics and optical instruments —
Vocabulary for microscopy —
Part 2:
Advanced techniques in light microscopy
Optique et instruments d'optique — Vocabulaire relatif à la
microscopie —
Partie 2: Techniques avancées en microscopie optique




Reference number
ISO 10934-2:2007(E)
©
ISO 2007

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ISO 10934-2:2007(E)
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ISO 10934-2:2007(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
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established has the right to be represented on that committee. International organizations, governmental and
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International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 10934-2 was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 5,
Microscopes and endoscopes.
ISO 10934 consists of the following parts, under the general title Optics and optical instruments — Vocabulary
for microscopy:
⎯ Part 1: Light microscopy
⎯ Part 2: Advanced techniques in light microscopy
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INTERNATIONAL STANDARD ISO 10934-2:2007(E)

Optics and optical instruments — Vocabulary for microscopy —
Part 2:
Advanced techniques in light microscopy
1 Scope
This part of ISO 10934 specifies terms and definitions to be used in the field of advanced light microscopy.
2 Terms and definitions
NOTE Terms shown in bold within a definition or a note are defined elsewhere within this part of ISO 10934.
2.1
acousto-optical modulator
electronically-tunable device used to control the direction and/or intensity of a laser by an acoustically-induced
diffraction grating in a crystal
2.2
acousto-optical tunable filter
AOTF
electronically-tunable filter for selection of wavelengths by an acoustically-induced diffraction grating in a
crystal
2.3
aliasing
phenomenon caused by sampling at too low a frequency (i.e. lower than the Nyquist frequency) resulting in
the loss of information and/or the creation of spurious information
2.4
auto-focus
method of bringing an object automatically into focus, controlled by an imaging software algorithm and/or a
hardware device that detects the object position
2.5
axial resolution
resolution in the direction of the optical axis
2.6
background subtraction
removal of that part of the signal that is present in the absence of the object, to reveal underlying image
information
2.7
binning
mode of operation of an image sensor where the charge of adjacent pixels is accumulated and is read out as
a single value
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ISO 10934-2:2007(E)
2.8
confocal
microscopy state in which, ideally, a point in the object field is illuminated by a diffraction-limited spot of light,
and light emanating from this point is focused upon and detected from an area smaller than the central area of
the diffraction disc situated in the corresponding position in a subsequent field plane
2.9
channel
particular signal path containing one type of image information
2.10
co-localization
overlay of images with coincidence of pixels corresponding to the same object points
2.11
confocal microscope
microscope in which, ideally, a point in the object plane is illuminated by a diffraction-limited spot of light, and
light emanating from this point is focused upon and detected from an area smaller than the central area of the
diffraction disc situated in the corresponding position in a subsequent field plane
NOTE 1 An image of an extended area is formed either by scanning the object, or by scanning the illuminated and
detected spots simultaneously.
NOTE 2 The confocal principle leads to improved axial resolution by suppression of light from out-of-focus planes.
2.11.1
laser-scanning confocal microscope
confocal microscope (2.11) in which the light source is a laser
2.11.2
multiple-beam confocal microscope
confocal microscope (2.11) using more than one illuminated and detected spot simultaneously
2.11.3
Nipkow disc confocal microscope
confocal microscope (2.11) in which the scanning of the illuminated and detected spots is performed using a
Nipkow disc (2.11.3.1)
2.11.3.1
Nipkow disc
opaque disc with many ideally identical small holes arranged in Archimedean spirals
2.11.3.2
Tandem-scanning confocal microscope
Nipkow disc confocal microscope (2.11.3) in which the illuminating light and the detected light pass through
separate holes
2.11.4
spectral confocal microscope
confocal microscope (2.11) in which a spectrum is recorded corresponding to spatial positions in an object
2.11.5
theta confocal microscope
confocal microscope (2.11) in which two objectives positioned at an angle, θ, with respect to one another,
and with focal points coincident in the object, are used for excitation and collection respectively
2.11.6
white-light confocal microscope
confocal microscope (2.11) using an illumination source and a detector operating throughout the visible
spectrum
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ISO 10934-2:2007(E)
2.11.7
confocal point spread function
product of the point spread functions (2.35) of the illuminating and detecting optical systems in a confocal
microscope (2.11)
2.11.8
confocal volume
effective volume around each point in the object which gives rise to the image in a confocal microscope
(2.11)
2.11.9
4 Pi confocal microscope
confocal microscope (2.11) in which two opposing objective lenses with focal points coincident in the object
are used to produce interference in the focal region from which an image signal is derived, and with further
processing produces an image with enhanced axial resolution (2.5)
2.12
deconvolution
〈microscopy〉 mathematical method for reducing blur, performed either in the spatial domain, or in the
frequency domain by inverse filtering techniques
NOTE If the deconvolution is based solely on theoretical as opposed to measured values it is known as blind
deconvolutio
...