ISO/TR 18196:2016
(Main)Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
General Information
- Abstract
ISO/TR 18196:2016 provides a matrix that guides users to commercially available techniques relevant to the measurements of common physiochemical parameters for nano-objects. Some techniques are also applicable to nanostructured materials.
- Status
- Published
- Publication Date
- 07-Nov-2016
- Technical Committee
- ISO/TC 229 - Nanotechnologies
- Drafting Committee
- ISO/TC 229 - Nanotechnologies
- Current Stage
- 9092 - International Standard to be revised
- Start Date
- 18-May-2023
- Completion Date
- 29-Aug-2026
Buy Documents
ISO/TR 18196:2016 - Nanotechnologies -- Measurement technique matrix for the characterization of nano-objects
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ISO/TR 18196:2016 - Nanotechnologies -- Matrice de méthodes de mesure pour les nano-objets manufacturés
ISO/TR 18196:2016 - Nanotechnologies — Matrice de méthodes de mesure pour les nano-objets manufacturés/21/2017
Overview
ISO/TR 18196:2016 - Nanotechnologies - Measurement technique matrix for the characterization of nano-objects - is a technical report that helps users choose commercially available measurement techniques for common physicochemical parameters of nano-objects (and some nanostructured materials). The report presents a structured matrix and individual technique entries that summarize what each method measures, its advantages and limitations, the primary measurands and references to relevant standards.
Key Topics
- Measurement technique matrix that maps techniques to nano-object parameters (e.g., particle size, surface area, composition, thermal properties).
- Detailed technique entries including:
- Description of the method
- Nano-object parameters the method can characterize
- Advantages and limitations
- Measurands (what is actually measured)
- Relevant standards and references
- Coverage of a wide range of analytical methods such as:
- Dynamic light scattering (DLS)
- Brunauer–Emmett–Teller (BET) surface area
- Differential scanning calorimetry (DSC)
- Electron and X‑ray techniques (EELS, EDS/EDX, AES)
- Aerosol and particle counting techniques (CPC, DMAS, AMS)
- Electrophoresis, analytical centrifugation and other separation/sizing methods
- Emphasis on practical selection criteria rather than prescriptive test procedures (report format).
Applications
- Instrument selection and method planning - Use the matrix to identify which commercially available techniques are suitable for specific nano-object parameters (size, shape, surface area, composition, thermal behavior).
- Laboratory workflow design - Inform sample preparation choices and multi-technique characterization strategies for research and quality control.
- Regulatory and safety dossiers - Support selection of appropriate measurement methods for material declarations, safety assessments and compliance reporting.
- Procurement and vendor assessment - Compare capabilities and limitations of analytical technologies when specifying equipment or services.
- Standards development and harmonization - Provides an overview useful to standards bodies and working groups aligning measurement practices.
Who uses it: research laboratories, nanomaterial manufacturers, quality assurance teams, regulatory authorities, instrument manufacturers, and standards developers.
Related standards
- ISO/TR 18196:2016 is a Technical Report summarizing methods and pointing to instrument-specific and standards documents for detailed procedures. Users should consult the referenced standards within each technique entry for normative measurement protocols and calibration requirements.
Keywords: ISO TR 18196, nanotechnologies, measurement technique matrix, nano-objects characterization, physicochemical parameters, particle size, surface area, DLS, BET, spectroscopy.
Relations
- Effective Date
- 06-Jun-2022
Buy Documents
ISO/TR 18196:2016 - Nanotechnologies -- Measurement technique matrix for the characterization of nano-objects
ISO/TR 18196:2016 - Nanotechnologies — Measurement technique matrix for the characterization of nano-objects/8/2016
ISO/TR 18196:2016 - Nanotechnologies -- Matrice de méthodes de mesure pour les nano-objets manufacturés
ISO/TR 18196:2016 - Nanotechnologies — Matrice de méthodes de mesure pour les nano-objets manufacturés/21/2017
Frequently Asked Questions
ISO/TR 18196:2016 is a technical report published by the International Organization for Standardization (ISO). Its full title is "Nanotechnologies — Measurement technique matrix for the characterization of nano-objects". This standard covers: ISO/TR 18196:2016 provides a matrix that guides users to commercially available techniques relevant to the measurements of common physiochemical parameters for nano-objects. Some techniques are also applicable to nanostructured materials.
ISO/TR 18196:2016 provides a matrix that guides users to commercially available techniques relevant to the measurements of common physiochemical parameters for nano-objects. Some techniques are also applicable to nanostructured materials.
ISO/TR 18196:2016 is classified under the following ICS (International Classification for Standards) categories: 07.030 - Physics. Chemistry; 07.120 - Nanotechnologies. The ICS classification helps identify the subject area and facilitates finding related standards.
ISO/TR 18196:2016 has the following relationships with other standards: It is inter standard links to ISO/TS 18196. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
ISO/TR 18196:2016 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
TECHNICAL ISO/TR
REPORT 18196
First edition
2016-11-15
Nanotechnologies — Measurement
technique matrix for the
characterization of nano-objects
Nanotechnologies — Matrice de méthodes de mesure pour les nano-
objets manufacturés
Reference number
©
ISO 2016
© ISO 2016, Published in Switzerland
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org
ii © ISO 2016 – All rights reserved
Contents Page
Foreword .viii
Introduction .ix
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
3.1 General terms . 1
3.2 Nano-object parameters . 2
4 Parameters included in the matrix . 3
5 Measurement techniques included in the matrix . 5
5.1 General . 5
5.2 Acoustic spectroscopy . 5
5.2.1 Description . . . 5
5.2.2 Nano-object parameters . . 6
5.2.3 Advantages . 6
5.2.4 Limitations . 6
5.2.5 Measurand . 6
5.2.6 Relevant standards. 6
5.3 Analytical centrifugation (AC) . 6
5.3.1 Description . . . 6
5.3.2 Nano-object parameters . . 7
5.3.3 Advantages . 7
5.3.4 Limitations . 7
5.3.5 Measurand . 7
5.3.6 Relevant standards. 7
5.4 Electroacoustic spectroscopy . 7
5.4.1 Description . . . 7
5.4.2 Nano-object parameters . . 7
5.4.3 Advantages . 8
5.4.4 Limitations . 8
5.4.5 Measurand . 8
5.4.6 Relevant standards. 8
5.5 Aerosol particle mass analyser (AMS) . 8
5.5.1 Description . . . 8
5.5.2 Nano-object parameters . . 9
5.5.3 Advantages . 9
5.5.4 Limitations . 9
5.5.5 Measurand . 9
5.5.6 Relevant standards. 9
5.6 Auger electron spectroscopy (AES) . 9
5.6.1 Description . . . 9
5.6.2 Nano-object parameters . . 9
5.6.3 Advantages .10
5.6.4 Limitations .10
5.6.5 Measurand .10
5.6.6 Relevant standards.10
5.7 Brunauer-Emmett-Teller (BET) method for physical adsorption — Surface
area determination .10
5.7.1 Description . . .10
5.7.2 Nano-object parameters .11
5.7.3 Advantages .11
5.7.4 Limitations .11
5.7.5 Measurand .11
5.7.6 Relevant standards.11
5.8 Condensation particle counter (CPC) .11
5.8.1 Description . . .11
5.8.2 Nano-object parameters .12
5.8.3 Advantages .12
5.8.4 Limitations .12
5.8.5 Measurand .12
5.8.6 Relevant standards.12
5.9 Differential mobility analysis system (DMAS) .12
5.9.1 Description . . .12
5.9.2 Nano-object parameters .13
5.9.3 Advantages .13
5.9.4 Limitations .13
5.9.5 Measurand .13
5.9.6 Relevant standards.13
5.10 Differential scanning calorimetry (DSC) .13
5.10.1 Description . . .13
5.10.2 Nano-object parameters .13
5.10.3 Advantages .13
5.10.4 Limitations .14
5.10.5 Measurand .14
5.10.6 Relevant standards.14
5.11 Dynamic light scattering (DLS) .14
5.11.1 Description . . .14
5.11.2 Nano-object parameters .15
5.11.3 Advantages .15
5.11.4 Limitations .15
5.11.5 Measurand .15
5.11.6 Relevant standards.15
5.12 Electron energy loss spectroscopy (transmission EELS) .16
5.12.1 Description . . .16
5.12.2 Nano-object parameters .16
5.12.3 Advantages .16
5.12.4 Limitations .16
5.12.5 Measurand .16
5.12.6 Relevant standards.16
5.13 Electrophoresis/capillary electrophoresis .16
5.13.1 Description . . .16
5.13.2 Nano-object parameters .18
5.13.3 Advantages .18
5.13.4 Limitations .18
5.13.5 Measurands .18
5.13.6 Relevant standards.18
5.14 Energy dispersive X-ray spectrometry (EDS/EDX and WDS) .18
5.14.1 Description . . .18
5.14.2 Nano-object parameters .18
5.14.3 Advantages .19
5.14.4 Limitations .19
5.14.5 Measurand .19
5.14.6 Relevant standards.19
5.15 Field flow fractionation (FFF) .19
5.15.1 Description . . .19
5.15.2 Nano-object parameters .19
5.15.3 Advantages .20
5.15.4 Limitations .20
5.15.5 Measurand .20
5.15.6 Relevant standards.20
5.16 Fluorescence spectroscopy .20
iv © ISO 2016 – All rights reserved
5.16.1 Description . . .20
5.16.2 Nano-object parameters .20
5.16.3 Advantages .20
5.16.4 Limitations .21
5.16.5 Measurand .21
5.16.6 Relevant standards.21
5.17 Fourier transform infrared (FT-IR) spectroscopy and FT-IR imaging .21
5.17.1 Description . . .21
5.17.2 Nano-object parameters .21
5.17.3 Advantages .21
5.17.4 Limitations .22
5.17.5 Measurand .22
5.17.6 Relevant standards for FT-IR .22
5.18 Induced grating method (IG) .22
5.18.1 Description . . .22
5.18.2 Nano-object parameters .22
5.18.3 Advantages .22
5.18.4 Limitations .22
5.18.5 Measurand .23
5.18.6 Relevant standards.23
5.19 Inductively coupled plasma–mass spectrometry (ICP-MS) and single particle
inductively coupled plasma–mass spectrometry (SP-ICP-MS) .23
5.19.1 Description . . .23
5.19.2 Nano-object parameters .23
5.19.3 Advantages .23
5.19.4 Limitations .23
5.19.5 Measurand .24
5.19.6 Relevant standards.24
5.19.7 Nano-hyphenated ICP/MS techniques .24
5.20 Laser diffraction .25
5.20.1 Description . . .25
5.20.2 Nano-object parameters .25
5.20.3 Advantages .25
5.20.4 Limitations .25
5.20.5 Measurand .25
5.20.6 Relevant standards.25
5.21 Liquid chromatography–mass spectrometry (LC-MS) .26
5.21.1 Description . . .26
5.21.2 Nano-object parameters .26
5.21.3 Advantages .26
5.21.4 Limitations .26
5.21.5 Measurand .26
5.21.6 Relevant standards.26
5.22 Particle tracking analysis (PTA) .26
5.22.1 Description . . .26
5.22.2 Nano-object parameters .27
5.22.3 Advantages .27
5.22.4 Limitations .27
5.22.5 Measurand .27
5.22.6 Relevant standards.28
5.23 Optical absorption spectroscopy (UV/Vis/NIR) .28
5.23.1 Description . . .28
5.23.2 Nano-object parameters .28
5.23.3 Advantages .28
5.23.4 Limitations .28
5.23.5 Measurand .29
5.23.6 Relevant standards for .29
5.24 Quartz crystal microbalance (QCM) .29
5.24.1 Description . . .29
5.24.2 Nano-object parameters .29
5.24.3 Advantages .29
5.24.4 Limitations .29
5.24.5 Measurand .29
5.24.6 Relevant standards.29
5.25 Raman spectroscopy/Raman imaging .30
5.25.1 Description . . .30
5.25.2 Nano-object parameters .30
5.25.3 Advantages .30
5.25.4 Limitations .30
5.25.5 Measurand .30
5.25.6 Relevant standards for Raman .30
5.26 Resonant mass measurement (RMM) .31
5.26.1 Description . . .31
5.26.2 Nano-object parameters .31
5.26.3 Advantages .31
5.26.4 Limitations .31
5.26.5 Measurand .31
5.26.6 Relevant standards.31
5.27 Scanning electron microscopy (SEM) .31
5.27.1 Description . . .31
5.27.2 Nano-objects parameters .32
5.27.3 Advantages .32
5.27.4 Limitations .32
5.27.5 Measurand .33
5.27.6 Relevant standards.33
5.28 Scanning probe microscopy (SPM).33
5.28.1 Description . . .33
5.28.2 Nano-object parameters .34
5.28.3 Advantages .34
5.28.4 Limitations .34
5.28.5 Measurand(s) .35
5.28.6 Relevant standards.35
5.29 Secondary ion mass spectrometry (SIMS) and Time of Flight SIMS (TOF-SIMS) .35
5.29.1 Description . . .35
5.29.2 Nano-object parameters .35
5.29.3 Advantages .35
5.29.4 Limitations .36
5.29.5 Measurand .36
5.29.6 Relevant standards.36
5.30 Small angle X-ray scattering (SAXS) .36
5.30.1 Description . . .36
5.30.2 Nano-object parameters .36
5.30.3 Advantages .37
5.30.4 Limitations .37
5.30.5 Measurand .37
5.30.6 Relevant standards.38
5.31 Static light scattering (SLS) and static multiple light scattering (SMLS) .38
5.31.1 Description . . .38
5.31.2 Nano-object parameters .38
5.31.3 Advantages .38
5.31.4 Limitations .39
5.31.5 Measurands (SLS) .39
5.31.6 Measurands (SMLS) .39
5.31.7 Relevant standards.39
5.32 Single particle light interaction methods .39
5.32.1 Description . . .39
vi © ISO 2016 – All rights reserved
5.32.2 Nano-object parameters .40
5.32.3 Advantages .40
5.32.4 Limitations .40
5.32.5 Measurand .40
5.32.6 Relevant standards.40
5.33 Thermogravimetric analysis (TGA) .40
5.33.1 Description . . .40
5.33.2 Nano-object parameters .40
5.33.3 Advantages .40
5.33.4 Limitations .41
5.33.5 Measurand .41
5.33.6 Relevant standards.
...
TECHNICAL ISO/TR
REPORT 18196
First edition
2016-11-15
Nanotechnologies — Measurement
technique matrix for the
characterization of nano-objects
Nanotechnologies — Matrice de méthodes de mesure pour les nano-
objets manufacturés
Reference number
©
ISO 2016
© ISO 2016, Published in Switzerland
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org
ii © ISO 2016 – All rights reserved
Contents Page
Foreword .viii
Introduction .ix
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
3.1 General terms . 1
3.2 Nano-object parameters . 2
4 Parameters included in the matrix . 3
5 Measurement techniques included in the matrix . 5
5.1 General . 5
5.2 Acoustic spectroscopy . 5
5.2.1 Description . . . 5
5.2.2 Nano-object parameters . . 6
5.2.3 Advantages . 6
5.2.4 Limitations . 6
5.2.5 Measurand . 6
5.2.6 Relevant standards. 6
5.3 Analytical centrifugation (AC) . 6
5.3.1 Description . . . 6
5.3.2 Nano-object parameters . . 7
5.3.3 Advantages . 7
5.3.4 Limitations . 7
5.3.5 Measurand . 7
5.3.6 Relevant standards. 7
5.4 Electroacoustic spectroscopy . 7
5.4.1 Description . . . 7
5.4.2 Nano-object parameters . . 7
5.4.3 Advantages . 8
5.4.4 Limitations . 8
5.4.5 Measurand . 8
5.4.6 Relevant standards. 8
5.5 Aerosol particle mass analyser (AMS) . 8
5.5.1 Description . . . 8
5.5.2 Nano-object parameters . . 9
5.5.3 Advantages . 9
5.5.4 Limitations . 9
5.5.5 Measurand . 9
5.5.6 Relevant standards. 9
5.6 Auger electron spectroscopy (AES) . 9
5.6.1 Description . . . 9
5.6.2 Nano-object parameters . . 9
5.6.3 Advantages .10
5.6.4 Limitations .10
5.6.5 Measurand .10
5.6.6 Relevant standards.10
5.7 Brunauer-Emmett-Teller (BET) method for physical adsorption — Surface
area determination .10
5.7.1 Description . . .10
5.7.2 Nano-object parameters .11
5.7.3 Advantages .11
5.7.4 Limitations .11
5.7.5 Measurand .11
5.7.6 Relevant standards.11
5.8 Condensation particle counter (CPC) .11
5.8.1 Description . . .11
5.8.2 Nano-object parameters .12
5.8.3 Advantages .12
5.8.4 Limitations .12
5.8.5 Measurand .12
5.8.6 Relevant standards.12
5.9 Differential mobility analysis system (DMAS) .12
5.9.1 Description . . .12
5.9.2 Nano-object parameters .13
5.9.3 Advantages .13
5.9.4 Limitations .13
5.9.5 Measurand .13
5.9.6 Relevant standards.13
5.10 Differential scanning calorimetry (DSC) .13
5.10.1 Description . . .13
5.10.2 Nano-object parameters .13
5.10.3 Advantages .13
5.10.4 Limitations .14
5.10.5 Measurand .14
5.10.6 Relevant standards.14
5.11 Dynamic light scattering (DLS) .14
5.11.1 Description . . .14
5.11.2 Nano-object parameters .15
5.11.3 Advantages .15
5.11.4 Limitations .15
5.11.5 Measurand .15
5.11.6 Relevant standards.15
5.12 Electron energy loss spectroscopy (transmission EELS) .16
5.12.1 Description . . .16
5.12.2 Nano-object parameters .16
5.12.3 Advantages .16
5.12.4 Limitations .16
5.12.5 Measurand .16
5.12.6 Relevant standards.16
5.13 Electrophoresis/capillary electrophoresis .16
5.13.1 Description . . .16
5.13.2 Nano-object parameters .18
5.13.3 Advantages .18
5.13.4 Limitations .18
5.13.5 Measurands .18
5.13.6 Relevant standards.18
5.14 Energy dispersive X-ray spectrometry (EDS/EDX and WDS) .18
5.14.1 Description . . .18
5.14.2 Nano-object parameters .18
5.14.3 Advantages .19
5.14.4 Limitations .19
5.14.5 Measurand .19
5.14.6 Relevant standards.19
5.15 Field flow fractionation (FFF) .19
5.15.1 Description . . .19
5.15.2 Nano-object parameters .19
5.15.3 Advantages .20
5.15.4 Limitations .20
5.15.5 Measurand .20
5.15.6 Relevant standards.20
5.16 Fluorescence spectroscopy .20
iv © ISO 2016 – All rights reserved
5.16.1 Description . . .20
5.16.2 Nano-object parameters .20
5.16.3 Advantages .20
5.16.4 Limitations .21
5.16.5 Measurand .21
5.16.6 Relevant standards.21
5.17 Fourier transform infrared (FT-IR) spectroscopy and FT-IR imaging .21
5.17.1 Description . . .21
5.17.2 Nano-object parameters .21
5.17.3 Advantages .21
5.17.4 Limitations .22
5.17.5 Measurand .22
5.17.6 Relevant standards for FT-IR .22
5.18 Induced grating method (IG) .22
5.18.1 Description . . .22
5.18.2 Nano-object parameters .22
5.18.3 Advantages .22
5.18.4 Limitations .22
5.18.5 Measurand .23
5.18.6 Relevant standards.23
5.19 Inductively coupled plasma–mass spectrometry (ICP-MS) and single particle
inductively coupled plasma–mass spectrometry (SP-ICP-MS) .23
5.19.1 Description . . .23
5.19.2 Nano-object parameters .23
5.19.3 Advantages .23
5.19.4 Limitations .23
5.19.5 Measurand .24
5.19.6 Relevant standards.24
5.19.7 Nano-hyphenated ICP/MS techniques .24
5.20 Laser diffraction .25
5.20.1 Description . . .25
5.20.2 Nano-object parameters .25
5.20.3 Advantages .25
5.20.4 Limitations .25
5.20.5 Measurand .25
5.20.6 Relevant standards.25
5.21 Liquid chromatography–mass spectrometry (LC-MS) .26
5.21.1 Description . . .26
5.21.2 Nano-object parameters .26
5.21.3 Advantages .26
5.21.4 Limitations .26
5.21.5 Measurand .26
5.21.6 Relevant standards.26
5.22 Particle tracking analysis (PTA) .26
5.22.1 Description . . .26
5.22.2 Nano-object parameters .27
5.22.3 Advantages .27
5.22.4 Limitations .27
5.22.5 Measurand .27
5.22.6 Relevant standards.28
5.23 Optical absorption spectroscopy (UV/Vis/NIR) .28
5.23.1 Description . . .28
5.23.2 Nano-object parameters .28
5.23.3 Advantages .28
5.23.4 Limitations .28
5.23.5 Measurand .29
5.23.6 Relevant standards for .29
5.24 Quartz crystal microbalance (QCM) .29
5.24.1 Description . . .29
5.24.2 Nano-object parameters .29
5.24.3 Advantages .29
5.24.4 Limitations .29
5.24.5 Measurand .29
5.24.6 Relevant standards.29
5.25 Raman spectroscopy/Raman imaging .30
5.25.1 Description . . .30
5.25.2 Nano-object parameters .30
5.25.3 Advantages .30
5.25.4 Limitations .30
5.25.5 Measurand .30
5.25.6 Relevant standards for Raman .30
5.26 Resonant mass measurement (RMM) .31
5.26.1 Description . . .31
5.26.2 Nano-object parameters .31
5.26.3 Advantages .31
5.26.4 Limitations .31
5.26.5 Measurand .31
5.26.6 Relevant standards.31
5.27 Scanning electron microscopy (SEM) .31
5.27.1 Description . . .31
5.27.2 Nano-objects parameters .32
5.27.3 Advantages .32
5.27.4 Limitations .32
5.27.5 Measurand .33
5.27.6 Relevant standards.33
5.28 Scanning probe microscopy (SPM).33
5.28.1 Description . . .33
5.28.2 Nano-object parameters .34
5.28.3 Advantages .34
5.28.4 Limitations .34
5.28.5 Measurand(s) .35
5.28.6 Relevant standards.35
5.29 Secondary ion mass spectrometry (SIMS) and Time of Flight SIMS (TOF-SIMS) .35
5.29.1 Description . . .35
5.29.2 Nano-object parameters .35
5.29.3 Advantages .35
5.29.4 Limitations .36
5.29.5 Measurand .36
5.29.6 Relevant standards.36
5.30 Small angle X-ray scattering (SAXS) .36
5.30.1 Description . . .36
5.30.2 Nano-object parameters .36
5.30.3 Advantages .37
5.30.4 Limitations .37
5.30.5 Measurand .37
5.30.6 Relevant standards.38
5.31 Static light scattering (SLS) and static multiple light scattering (SMLS) .38
5.31.1 Description . . .38
5.31.2 Nano-object parameters .38
5.31.3 Advantages .38
5.31.4 Limitations .39
5.31.5 Measurands (SLS) .39
5.31.6 Measurands (SMLS) .39
5.31.7 Relevant standards.39
5.32 Single particle light interaction methods .39
5.32.1 Description . . .39
vi © ISO 2016 – All rights reserved
5.32.2 Nano-object parameters .40
5.32.3 Advantages .40
5.32.4 Limitations .40
5.32.5 Measurand .40
5.32.6 Relevant standards.40
5.33 Thermogravimetric analysis (TGA) .40
5.33.1 Description . . .40
5.33.2 Nano-object parameters .40
5.33.3 Advantages .40
5.33.4 Limitations .41
5.33.5 Measurand .41
5.33.6 Relevant standards.
...
RAPPORT ISO/TR
TECHNIQUE 18196
Première édition
2016-11-15
Nanotechnologies — Matrice de
méthodes de mesure pour les nano-
objets manufacturés
Nanotechnologies — Measurement technique matrix for the
characterization of nano-objects
Numéro de référence
©
ISO 2016
DOCUMENT PROTÉGÉ PAR COPYRIGHT
© ISO 2016, Publié en Suisse
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni utilisée
sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie, l’affichage sur
l’internet ou sur un Intranet, sans autorisation écrite préalable. Les demandes d’autorisation peuvent être adressées à l’ISO à
l’adresse ci-après ou au comité membre de l’ISO dans le pays du demandeur.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org
ii © ISO 2016 – Tous droits réservés
Sommaire Page
Avant-propos .viii
Introduction .ix
1 Domaine d’application . 1
2 Références normatives . 1
3 Termes et définitions . 1
3.1 Termes généraux . 1
3.2 Paramètres des nano-objets . 2
4 Paramètres inclus dans la matrice . 3
5 Méthodes de mesure incluses dans la matrice. 5
5.1 Généralités . 5
5.2 Spectroscopie acoustique . 6
5.2.1 Description . . . 6
5.2.2 Paramètres des nano-objets . 6
5.2.3 Avantages . 6
5.2.4 Limitations . 6
5.2.5 Mesurande . 7
5.2.6 Normes pertinentes . 7
5.3 Centrifugation analytique (AC) . 7
5.3.1 Description . . . 7
5.3.2 Paramètres des nano-objets . 7
5.3.3 Avantages . 7
5.3.4 Limitations . 7
5.3.5 Mesurande . 7
5.3.6 Normes pertinentes . 7
5.4 Spectroscopie électroacoustique . 8
5.4.1 Description . . . 8
5.4.2 Paramètres des nano-objets . 8
5.4.3 Avantages . 8
5.4.4 Limitations . 8
5.4.5 Mesurande . 9
5.4.6 Normes pertinentes . 9
5.5 Analyseur de la masse des particules d’aérosol (AMS) . 9
5.5.1 Description . . . 9
5.5.2 Paramètres des nano-objets . 9
5.5.3 Avantages . 9
5.5.4 Limitations . 9
5.5.5 Mesurande .10
5.5.6 Normes pertinentes .10
5.6 Spectroscopie d’électrons Auger (AES) .10
5.6.1 Description . . .10
5.6.2 Paramètres des nano-objets .10
5.6.3 Avantages .10
5.6.4 Limitations .10
5.6.5 Mesurande .10
5.6.6 Normes pertinentes .11
5.7 Méthode BET (Brunauer-Emmett-Teller) pour l’adsorption physique —
Détermination de la surface spécifique .11
5.7.1 Description . . .11
5.7.2 Paramètres des nano-objets .11
5.7.3 Avantages .11
5.7.4 Limitations .11
5.7.5 Mesurande .12
5.7.6 Normes pertinentes .12
5.8 Compteur de particules à condensation (CPC) .12
5.8.1 Description . . .12
5.8.2 Paramètres des nano-objets .12
5.8.3 Avantages .12
5.8.4 Limitations .13
5.8.5 Mesurande .13
5.8.6 Normes pertinentes .13
5.9 Système d’analyse différentielle de mobilité (DMAS) .13
5.9.1 Description . . .13
5.9.2 Paramètres des nano-objets .13
5.9.3 Avantages .14
5.9.4 Limitations .14
5.9.5 Mesurande .14
5.9.6 Normes pertinentes .14
5.10 Analyse calorimétrique différentielle (DSC) .14
5.10.1 Description . . .14
5.10.2 Paramètres des nano-objets .14
5.10.3 Avantages .14
5.10.4 Limitations .15
5.10.5 Mesurande .15
5.10.6 Normes pertinentes .15
5.11 Diffusion dynamique de la lumière (DLS) .15
5.11.1 Description . . .15
5.11.2 Paramètres des nano-objets .16
5.11.3 Avantages .16
5.11.4 Limitations .16
5.11.5 Mesurande .17
5.11.6 Normes pertinentes .17
5.12 Spectroscopie de perte d’énergie électronique (EELS à transmission) .17
5.12.1 Description . . .17
5.12.2 Paramètres des nano-objets .17
5.12.3 Avantages .17
5.12.4 Limitations .17
5.12.5 Mesurande .18
5.12.6 Normes pertinentes .18
5.13 Électrophorèse/électrophorèse capillaire .18
5.13.1 Description . . .18
5.13.2 Paramètres des nano-objets .18
5.13.3 Avantages .18
5.13.4 Limitations .18
5.13.5 Mesurandes .18
5.13.6 Normes pertinentes .18
5.14 Spectrométrie de rayons X à dispersion d’énergie (EDS/EDX et WDS) .19
5.14.1 Description . . .19
5.14.2 Paramètres des nano-objets .19
5.14.3 Avantages .19
5.14.4 Limitations .19
5.14.5 Mesurande .19
5.14.6 Normes pertinentes .19
5.15 Fractionnement par couplage flux-force (FFF) .20
5.15.1 Description . . .20
5.15.2 Paramètres des nano-objets .20
5.15.3 Avantages .20
5.15.4 Limitations .20
5.15.5 Mesurande .20
5.15.6 Normes pertinentes .21
5.16 Spectroscopie à fluorescence .21
iv © ISO 2016 – Tous droits réservés
5.16.1 Description . . .21
5.16.2 Paramètres des nano-objets .21
5.16.3 Avantages .21
5.16.4 Limitations .21
5.16.5 Mesurande .21
5.16.6 Normes pertinentes .21
5.17 Spectroscopie infrarouge à transformée de Fourier (FT-IR) et imagerie FT-IR .22
5.17.1 Description . . .22
5.17.2 Paramètres des nano-objets .22
5.17.3 Avantages .22
5.17.4 Limitations .22
5.17.5 Mesurande .22
5.17.6 Normes pertinentes aux méthodes FT-IR . .23
5.18 Méthode du réseau induit (IG) .23
5.18.1 Description . . .23
5.18.2 Paramètres des nano-objets .23
5.18.3 Avantages .23
5.18.4 Limitations .23
5.18.5 Mesurande .23
5.18.6 Normes pertinentes .23
5.19 Spectroscopie de masse à plasma induit (ICP-MS) et spectrométrie de masse à
plasma induit en mode particule unique (SP-ICP-MS) .24
5.19.1 Description . . .24
5.19.2 Paramètres des nano-objets .24
5.19.3 Avantages .24
5.19.4 Limitations .24
5.19.5 Mesurande .25
5.19.6 Normes pertinentes .25
5.19.7 Méthodes ICP/MS nano-couplées .25
5.20 Diffraction laser .26
5.20.1 Description . . .26
5.20.2 Paramètres des nano-objets .26
5.20.3 Avantages .26
5.20.4 Limitations .26
5.20.5 Mesurande .26
5.20.6 Normes pertinentes .26
5.21 Chromatographie en phase liquide – spectrométrie de masse (LC-MS) .27
5.21.1 Description . . .27
5.21.2 Paramètres des nano-objets .27
5.21.3 Avantages .27
5.21.4 Limitations .27
5.21.5 Mesurande .27
5.21.6 Normes pertinentes .27
5.22 Méthode d’analyse de suivi de particule (PTA) .28
5.22.1 Description . . .28
5.22.2 Paramètres des nano-objets .28
5.22.3 Avantages .28
5.22.4 Limitations .28
5.22.5 Mesurande .29
5.22.6 Normes pertinentes .29
5.23 Spectroscopie d’absorption optique (UV/Vis/NIR) .29
5.23.1 Description . . .29
5.23.2 Paramètres des nano-objets .29
5.23.3 Avantages .29
5.23.4 Limitations .30
5.23.5 Mesurande .30
5.23.6 Normes pertinentes .30
5.24 Microbalance à cristal de quartz (QCM) .30
5.24.1 Description . . .30
5.24.2 Paramètres des nano-objets .30
5.24.3 Avantages .30
5.24.4 Limitations .31
5.24.5 Mesurande .31
5.24.6 Normes pertinentes .31
5.25 Spectroscopie Raman/Imagerie Raman .31
5.25.1 Description . . .31
5.25.2 Paramètres des nano-objets .31
5.25.3 Avantages .31
5.25.4 Limitations .32
5.25.5 Mesurande .32
5.25.6 Normes pertinentes pour les techniques Raman .32
5.26 Mesure de masse résonante (RMM) .32
5.26.1 Description . . .32
5.26.2 Paramètres des nano-objets .32
5.26.3 Avantages .32
5.26.4 Limitations .33
5.26.5 Mesurande .33
5.26.6 Normes pertinentes .33
5.27 Microscopie électronique à balayage (MEB) .33
5.27.1 Description . . .33
5.27.2 Paramètres des nano-objets .33
5.27.3 Avantages .33
5.27.4 Limitations .34
5.27.5 Mesurande .35
5.27.6 Normes pertinentes .35
5.28 Microscopie par sonde à balayage (SPM) .35
5.28.1 Description . . .35
5.28.2 Paramètres des nano-objets .36
5.28.3 Avantages .36
5.28.4 Limitations .36
5.28.5 Mesurande(s) .37
5.28.6 Normes pertinentes .37
5.29 Spectrométrie de masse des ions secondaires (SMIS) et SMIS en temps de
vol (TOF-SIMS) .37
5.29.1 Description . . .37
5.29.2 Paramètres des nano-objets .37
5.29.3 Avantages .37
5.29.4 Limitations .38
5.29.5 Mesurande .38
5.29.6 Normes pertinentes .38
5.30 Diffusion des rayons X aux petits angles (SAXS) .38
5.30.1 Description . . .38
5.30.2 Paramètres des nano-objets .39
5.30.3 Avantages .39
5.30.4 Limitations .39
5.30.5 Mesurande .39
5.30.6 Normes pertinentes .40
5.31 Diffusion statique de la lumière (SLS) et diffusion statique multiple de la
lumière (SMLS) .40
5.31.1 Description . . .40
5.31.2 Paramètres des nano-objets .40
5.31.3 Avantages .41
5.31.4 Limitations .41
5.31.5 Mesurandes (SLS) .41
5.31.6 Mesurandes (SMLS) .41
5.31.7 Normes pertinentes .42
vi © ISO 2016 – Tous droits réservés
5.32 Méthodes d’interaction lumineuse de particules uniques .42
5.32.1 Description . . .42
5.32.2 Paramètres des nano-objets .42
5.32.3 Avantages .42
5.32.4 Limitations .42
5.32.5 Mesurande .42
5.32.6 Normes pertinentes .43
5.33 Analyse thermogravimétrique (TGA) .43
5.33.1 Description . . .43
5.33.2 Paramètres des nano-objets .43
5.33.3 Avantages .43
5.33.4 Limitations .43
5.33.5 Mesurande .43
5.33.6 Normes pertinentes .43
5.33.7 Techniques TGA couplées.43
5.34 Micr
...
RAPPORT ISO/TR
TECHNIQUE 18196
Première édition
2016-11-15
Nanotechnologies — Matrice de
méthodes de mesure pour les nano-
objets manufacturés
Nanotechnologies — Measurement technique matrix for the
characterization of nano-objects
Numéro de référence
©
ISO 2016
DOCUMENT PROTÉGÉ PAR COPYRIGHT
© ISO 2016, Publié en Suisse
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni utilisée
sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie, l’affichage sur
l’internet ou sur un Intranet, sans autorisation écrite préalable. Les demandes d’autorisation peuvent être adressées à l’ISO à
l’adresse ci-après ou au comité membre de l’ISO dans le pays du demandeur.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org
ii © ISO 2016 – Tous droits réservés
Sommaire Page
Avant-propos .viii
Introduction .ix
1 Domaine d’application . 1
2 Références normatives . 1
3 Termes et définitions . 1
3.1 Termes généraux . 1
3.2 Paramètres des nano-objets . 2
4 Paramètres inclus dans la matrice . 3
5 Méthodes de mesure incluses dans la matrice. 5
5.1 Généralités . 5
5.2 Spectroscopie acoustique . 6
5.2.1 Description . . . 6
5.2.2 Paramètres des nano-objets . 6
5.2.3 Avantages . 6
5.2.4 Limitations . 6
5.2.5 Mesurande . 7
5.2.6 Normes pertinentes . 7
5.3 Centrifugation analytique (AC) . 7
5.3.1 Description . . . 7
5.3.2 Paramètres des nano-objets . 7
5.3.3 Avantages . 7
5.3.4 Limitations . 7
5.3.5 Mesurande . 7
5.3.6 Normes pertinentes . 7
5.4 Spectroscopie électroacoustique . 8
5.4.1 Description . . . 8
5.4.2 Paramètres des nano-objets . 8
5.4.3 Avantages . 8
5.4.4 Limitations . 8
5.4.5 Mesurande . 9
5.4.6 Normes pertinentes . 9
5.5 Analyseur de la masse des particules d’aérosol (AMS) . 9
5.5.1 Description . . . 9
5.5.2 Paramètres des nano-objets . 9
5.5.3 Avantages . 9
5.5.4 Limitations . 9
5.5.5 Mesurande .10
5.5.6 Normes pertinentes .10
5.6 Spectroscopie d’électrons Auger (AES) .10
5.6.1 Description . . .10
5.6.2 Paramètres des nano-objets .10
5.6.3 Avantages .10
5.6.4 Limitations .10
5.6.5 Mesurande .10
5.6.6 Normes pertinentes .11
5.7 Méthode BET (Brunauer-Emmett-Teller) pour l’adsorption physique —
Détermination de la surface spécifique .11
5.7.1 Description . . .11
5.7.2 Paramètres des nano-objets .11
5.7.3 Avantages .11
5.7.4 Limitations .11
5.7.5 Mesurande .12
5.7.6 Normes pertinentes .12
5.8 Compteur de particules à condensation (CPC) .12
5.8.1 Description . . .12
5.8.2 Paramètres des nano-objets .12
5.8.3 Avantages .12
5.8.4 Limitations .13
5.8.5 Mesurande .13
5.8.6 Normes pertinentes .13
5.9 Système d’analyse différentielle de mobilité (DMAS) .13
5.9.1 Description . . .13
5.9.2 Paramètres des nano-objets .13
5.9.3 Avantages .14
5.9.4 Limitations .14
5.9.5 Mesurande .14
5.9.6 Normes pertinentes .14
5.10 Analyse calorimétrique différentielle (DSC) .14
5.10.1 Description . . .14
5.10.2 Paramètres des nano-objets .14
5.10.3 Avantages .14
5.10.4 Limitations .15
5.10.5 Mesurande .15
5.10.6 Normes pertinentes .15
5.11 Diffusion dynamique de la lumière (DLS) .15
5.11.1 Description . . .15
5.11.2 Paramètres des nano-objets .16
5.11.3 Avantages .16
5.11.4 Limitations .16
5.11.5 Mesurande .17
5.11.6 Normes pertinentes .17
5.12 Spectroscopie de perte d’énergie électronique (EELS à transmission) .17
5.12.1 Description . . .17
5.12.2 Paramètres des nano-objets .17
5.12.3 Avantages .17
5.12.4 Limitations .17
5.12.5 Mesurande .18
5.12.6 Normes pertinentes .18
5.13 Électrophorèse/électrophorèse capillaire .18
5.13.1 Description . . .18
5.13.2 Paramètres des nano-objets .18
5.13.3 Avantages .18
5.13.4 Limitations .18
5.13.5 Mesurandes .18
5.13.6 Normes pertinentes .18
5.14 Spectrométrie de rayons X à dispersion d’énergie (EDS/EDX et WDS) .19
5.14.1 Description . . .19
5.14.2 Paramètres des nano-objets .19
5.14.3 Avantages .19
5.14.4 Limitations .19
5.14.5 Mesurande .19
5.14.6 Normes pertinentes .19
5.15 Fractionnement par couplage flux-force (FFF) .20
5.15.1 Description . . .20
5.15.2 Paramètres des nano-objets .20
5.15.3 Avantages .20
5.15.4 Limitations .20
5.15.5 Mesurande .20
5.15.6 Normes pertinentes .21
5.16 Spectroscopie à fluorescence .21
iv © ISO 2016 – Tous droits réservés
5.16.1 Description . . .21
5.16.2 Paramètres des nano-objets .21
5.16.3 Avantages .21
5.16.4 Limitations .21
5.16.5 Mesurande .21
5.16.6 Normes pertinentes .21
5.17 Spectroscopie infrarouge à transformée de Fourier (FT-IR) et imagerie FT-IR .22
5.17.1 Description . . .22
5.17.2 Paramètres des nano-objets .22
5.17.3 Avantages .22
5.17.4 Limitations .22
5.17.5 Mesurande .22
5.17.6 Normes pertinentes aux méthodes FT-IR . .23
5.18 Méthode du réseau induit (IG) .23
5.18.1 Description . . .23
5.18.2 Paramètres des nano-objets .23
5.18.3 Avantages .23
5.18.4 Limitations .23
5.18.5 Mesurande .23
5.18.6 Normes pertinentes .23
5.19 Spectroscopie de masse à plasma induit (ICP-MS) et spectrométrie de masse à
plasma induit en mode particule unique (SP-ICP-MS) .24
5.19.1 Description . . .24
5.19.2 Paramètres des nano-objets .24
5.19.3 Avantages .24
5.19.4 Limitations .24
5.19.5 Mesurande .25
5.19.6 Normes pertinentes .25
5.19.7 Méthodes ICP/MS nano-couplées .25
5.20 Diffraction laser .26
5.20.1 Description . . .26
5.20.2 Paramètres des nano-objets .26
5.20.3 Avantages .26
5.20.4 Limitations .26
5.20.5 Mesurande .26
5.20.6 Normes pertinentes .26
5.21 Chromatographie en phase liquide – spectrométrie de masse (LC-MS) .27
5.21.1 Description . . .27
5.21.2 Paramètres des nano-objets .27
5.21.3 Avantages .27
5.21.4 Limitations .27
5.21.5 Mesurande .27
5.21.6 Normes pertinentes .27
5.22 Méthode d’analyse de suivi de particule (PTA) .28
5.22.1 Description . . .28
5.22.2 Paramètres des nano-objets .28
5.22.3 Avantages .28
5.22.4 Limitations .28
5.22.5 Mesurande .29
5.22.6 Normes pertinentes .29
5.23 Spectroscopie d’absorption optique (UV/Vis/NIR) .29
5.23.1 Description . . .29
5.23.2 Paramètres des nano-objets .29
5.23.3 Avantages .29
5.23.4 Limitations .30
5.23.5 Mesurande .30
5.23.6 Normes pertinentes .30
5.24 Microbalance à cristal de quartz (QCM) .30
5.24.1 Description . . .30
5.24.2 Paramètres des nano-objets .30
5.24.3 Avantages .30
5.24.4 Limitations .31
5.24.5 Mesurande .31
5.24.6 Normes pertinentes .31
5.25 Spectroscopie Raman/Imagerie Raman .31
5.25.1 Description . . .31
5.25.2 Paramètres des nano-objets .31
5.25.3 Avantages .31
5.25.4 Limitations .32
5.25.5 Mesurande .32
5.25.6 Normes pertinentes pour les techniques Raman .32
5.26 Mesure de masse résonante (RMM) .32
5.26.1 Description . . .32
5.26.2 Paramètres des nano-objets .32
5.26.3 Avantages .32
5.26.4 Limitations .33
5.26.5 Mesurande .33
5.26.6 Normes pertinentes .33
5.27 Microscopie électronique à balayage (MEB) .33
5.27.1 Description . . .33
5.27.2 Paramètres des nano-objets .33
5.27.3 Avantages .33
5.27.4 Limitations .34
5.27.5 Mesurande .35
5.27.6 Normes pertinentes .35
5.28 Microscopie par sonde à balayage (SPM) .35
5.28.1 Description . . .35
5.28.2 Paramètres des nano-objets .36
5.28.3 Avantages .36
5.28.4 Limitations .36
5.28.5 Mesurande(s) .37
5.28.6 Normes pertinentes .37
5.29 Spectrométrie de masse des ions secondaires (SMIS) et SMIS en temps de
vol (TOF-SIMS) .37
5.29.1 Description . . .37
5.29.2 Paramètres des nano-objets .37
5.29.3 Avantages .37
5.29.4 Limitations .38
5.29.5 Mesurande .38
5.29.6 Normes pertinentes .38
5.30 Diffusion des rayons X aux petits angles (SAXS) .38
5.30.1 Description . . .38
5.30.2 Paramètres des nano-objets .39
5.30.3 Avantages .39
5.30.4 Limitations .39
5.30.5 Mesurande .39
5.30.6 Normes pertinentes .40
5.31 Diffusion statique de la lumière (SLS) et diffusion statique multiple de la
lumière (SMLS) .40
5.31.1 Description . . .40
5.31.2 Paramètres des nano-objets .40
5.31.3 Avantages .41
5.31.4 Limitations .41
5.31.5 Mesurandes (SLS) .41
5.31.6 Mesurandes (SMLS) .41
5.31.7 Normes pertinentes .42
vi © ISO 2016 – Tous droits réservés
5.32 Méthodes d’interaction lumineuse de particules uniques .42
5.32.1 Description . . .42
5.32.2 Paramètres des nano-objets .42
5.32.3 Avantages .42
5.32.4 Limitations .42
5.32.5 Mesurande .42
5.32.6 Normes pertinentes .43
5.33 Analyse thermogravimétrique (TGA) .43
5.33.1 Description . . .43
5.33.2 Paramètres des nano-objets .43
5.33.3 Avantages .43
5.33.4 Limitations .43
5.33.5 Mesurande .43
5.33.6 Normes pertinentes .43
5.33.7 Techniques TGA couplées.43
5.34 Micr
...