IEC 60269-4:2009/AMD2:2016
(Amendment)Amendment 2 - Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
Amendment 2 - Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
Amendement 2 - Fusibles basse tension - Partie 4: Exigences supplémentaires concernant les éléments de remplacement utilisés pour la protection des dispositifs à semiconducteurs
General Information
- Status
- Published
- Publication Date
- 11-Aug-2016
- Technical Committee
- SC 32B - Low-voltage fuses
- Drafting Committee
- MT 9 - TC 32/SC 32B/MT 9
- Current Stage
- DELPUB - Deleted Publication
- Start Date
- 09-Aug-2024
- Completion Date
- 26-Oct-2025
Relations
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Jul-2024
Overview
The IEC 60269-4:2009/AMD2:2016 is an important amendment to the international standard focusing on low-voltage fuses specifically designed for the protection of semiconductor devices. Published by the International Electrotechnical Commission (IEC), this amendment provides supplementary requirements for fuse-links used in low-voltage electrical systems to ensure the safety and reliability of semiconductor devices under electrical fault conditions.
This amendment addresses the latest technical adjustments needed to harmonize fuse performance with standardized electrical voltages specified in IEC 60038, adapting test methods and specifications for fuse-links protecting semiconductor components like voltage source inverters (VSI) and other sensitive equipment.
Key Topics
Supplementary Requirements for Semiconductor Protection Fuse-Links
Defines additional criteria beyond the base IEC 60269 series for fuse-links safeguarding semiconductors, ensuring enhanced performance against short-circuit and overload conditions typical in modern electrical systems.Voltage and Current Ratings
Aligns fuse-links with standardized voltages and tolerances following IEC 60038, providing clarity on rated current, rated voltage, and breaking capacity for AC and DC applications.Test Methods and Performance
- Power dissipation tests at 50% and 100% of rated current, applicable in both AC and DC settings.
- Defined cross-sectional areas for copper conductors in high current testing, ensuring consistent and reliable evaluations.
- Updated breaking capacity test values for VSI fuse-links, considering very low inductance and resistance circuits.
- Clarification on time constant and di/dt parameters relevant to fuse operation under short-circuit situations, where rapid current rises occur.
Fuse-Link Types and Presentation
Enhances technical data availability and presentation formats, with new annexes introduced for detailed information on fuse-link systems like the North American type B fuse-links with flush end connections.Operational Characteristics
Adjustments to operational descriptions to improve clarity about fuse element functioning and indicator device actions during overload and fault conditions.
Applications
IEC 60269-4:2009/AMD2:2016 is essential for:
Semiconductor Device Protection
Critical in industries where semiconductor components such as power transistors, diodes, and voltage source inverters require precise and reliable overcurrent protection to prevent damage and ensure stable operation.Low-Voltage Electrical Systems
Applies to systems operating at standard IEC voltages, including industrial automation, renewable energy setups (solar photovoltaic), and electronic control panels handling sensitive semiconductor elements.Manufacturer and Tester Guidance
Serves as a reference for fuse manufacturers and testing laboratories to design and validate fuse-links that meet enhanced safety and performance criteria for semiconductor protection.Electrical Designers and Engineers
Assists engineers in selecting fuse-links compliant with international safety standards for protecting low-voltage semiconductor circuits, reducing operational risks due to electrical faults.
Related Standards
This amendment integrates and references several key IEC standards, forming a cohesive framework for low-voltage fuse technology:
- IEC 60269-1: Low-voltage fuses – Part 1: General requirements
- IEC 60269-2: Low-voltage fuses – Part 2: Fuse use by authorized persons (industrial applications)
- IEC 60269-3: Related supplementary requirements
- IEC TR 60269-5: Guidance for the application of low-voltage fuses
- IEC 60269-6: Supplementary requirements for fuse-links protecting photovoltaic energy systems
- IEC 60664-1: Insulation coordination for low-voltage equipment – principles and tests
- IEC 60038: Standard voltages
These interconnected standards together ensure comprehensive coverage for fuse design, testing, and application in modern electrical and electronic systems requiring semiconductor protection.
By adhering to IEC 60269-4:2009/AMD2:2016, industries can achieve improved reliability, safety, and performance in the protection of semiconductor devices, supporting the stability and durability of critical low-voltage electrical installations worldwide.
Frequently Asked Questions
IEC 60269-4:2009/AMD2:2016 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Amendment 2 - Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices". This standard covers: Amendment 2 - Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
Amendment 2 - Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
IEC 60269-4:2009/AMD2:2016 is classified under the following ICS (International Classification for Standards) categories: 29.120.50 - Fuses and other overcurrent protection devices. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60269-4:2009/AMD2:2016 has the following relationships with other standards: It is inter standard links to IEC 60269-4:2009, IEC 60269-4:2024. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 60269-4:2009/AMD2:2016 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
IEC 60269-4 ®
Edition 5.0 2016-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AM ENDMENT 2
AM ENDEMENT 2
Low-voltage fuses –
Part 4: Supplementary requirements for fuse-links for the protection of
semiconductor devices
Fusibles basse tension –
Partie 4: Exigences supplémentaires concernant les éléments de remplacement
utilisés pour la protection des dispositifs à semiconducteurs
IEC 60269-4:2009-05/AMD2:2016-08(en-fr)
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IEC 60269-4 ®
Edition 5.0 2016-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AM ENDMENT 2
AM ENDEMENT 2
Low-voltage fuses –
Part 4: Supplementary requirements for fuse-links for the protection of
semiconductor devices
Fusibles basse tension –
Partie 4: Exigences supplémentaires concernant les éléments de remplacement
utilisés pour la protection des dispositifs à semiconducteurs
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.120.50 ISBN 978-2-8322-3562-1
– 2 – IEC 60269-4:2009/AMD2:2016
© IEC 2016
FOREWORD
This amendment has been prepared by subcommittee SC 32B: Low voltage fuses, of IEC
technical committee TC 32: Fuses.
The text of this amendment is based on the following documents:
FDIS Report on voting
32B/651/FDIS 32B/663/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
1.1 Scope and object
Insert, after existing Note 3, the following new Note 4:
NOTE 4 These fuse-links are intended for use on systems employing the standardized voltages and tolerances of
IEC 60038. Tests carried out on fuse-links in accordance with previous editions of this standard shall remain valid
until such time as complimentary equipment has evolved to the standardized voltages and tolerances of IEC 60038.
Replace
d) availability and presentation of technical data (see Annex B).
with the following new text:
d) availability and presentation of technical data (see Annex BB).
1.2 Normative references
Replace the first two references with the following new references:
IEC 60269-1, Low-voltage fuses – Part 1: General requirements
IEC 60269-2, Low-voltage fuses – Part 2: Supplementary requirements for fuses for use by
authorized persons (fuses mainly for industrial application) – Examples of standardized
systems of fuses A to K
Add, after IEC 60269-3:
IEC TR 60269-5, Low-voltage fuses – Part 5: Guidance for the application of low-voltage
fuses
© IEC 2016
IEC 60269-6, Low-voltage fuses – Part 6: Supplementary requirements for fuse-links for the
protection of solar photovoltaic energy systems
Add, after IEC 60417:
IEC 60664-1:2000, Insulation coordination for equipment within low-voltage systems – Part 1:
Principles, requirements and tests
2.2.105
voltage source inverter fuse-link
VSI fuse-link
Replace the second sentence of NOTE 2 with the following new text:
This short circuit condition leads to a very high rate of rise of current equivalent to a very low value of time
constant, typically 3 ms or less.
3.6.3 Time constant (τ)
Add, after Note 2, the following new NOTE 3:
NOTE 3 Instead of time constant di/dt can be used in case of short circuit condition
di/dt = E/L.
E= voltage value of the DC power source,
L = total inductance of the capacitor discharge circuit.
5.1.2 Fuse-links
Replace the order of the letters:
j)
k)
l)
by the following:
i)
j)
k)
Table 101 – Conventional times and currents for “gR” and “gS” fuse-links
In the third column, replace "1,13 I " by "1,1 I ".
n n
Replace, in the NOTE a:
In Annex C, some examples ….
by the following new text:
In Annex CC, some examples ….
5.7.2 Rated breaking capacity
Add, before the NOTE:
For VSI the rated breaking capacity is based on type tests performed in a circuit containing
very low inductance and resistance with d.c. or capacitor discharged applied voltage.
– 4 – IEC 60269-4:2009/AMD2:2016
© IEC 2016
7.4 Operation
Delete, in the 1st sentence of Subclause 7.4, "(see 8.4.3.4)".
Replace, at the beginning of the first indent, "its fuse-element"
by
"it"
8.3.3 Measurement of power dissipation of the fuse-link
Replace the first sentence of 8.3.3 with the following new text:
In addition to 8.3.3 of IEC 60269-1, the following applies: the power dissipation test shall be
made successively at least at 50 % and at 100 % of rated current. This test may be performed
with either ac or dc.
Add, after Subclause 8.3.3, the following new subclause and table:
8.3.4 Test method
The cross-sectional area of copper conductors for high current ratings tests corresponding to
Subclauses 8.3 and 8.4 is defined in Table 107.
...




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