IEC 61300-3-30:2003

INTERNATIONAL IEC
STANDARD
61300-3-30
First edition
2003-01
Fibre optic interconnecting devices
and passive components –
Basic test and measurement procedures –
Part 3-30:
Examinations and measurements –
Polish angle and fibre position
on single ferrule multifibre connectors
Dispositifs d'interconnexion et composants passifs
à fibres optiques –
Méthodes fondamentales d'essais et de mesures –
Partie 3-30:
Examens et mesures –
Angle de la face polie et position de la fibre sur
l'embout des connecteurs multifibres

Reference number
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amendments 1 and 2.
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INTERNATIONAL IEC
STANDARD
61300-3-30
First edition
2003-01
Fibre optic interconnecting devices
and passive components –
Basic test and measurement procedures –
Part 3-30:
Examinations and measurements –
Polish angle and fibre position
on single ferrule multifibre connectors
Dispositifs d'interconnexion et composants passifs
à fibres optiques –
Méthodes fondamentales d'essais et de mesures –
Partie 3-30:
Examens et mesures –
Angle de la face polie et position de la fibre sur
l'embout des connecteurs multifibres

 IEC 2003  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
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P
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

– 2 – 61300-3-30  CEI:2003 (E)

CONTENTS
FOREWORD . 3

1 Scope . 5

2 Normative references . 5

3 General description . 5

4 Apparatus . 6

4.1 Ferrule holder . 6

4.2 Positioning stage. 6
4.3 Three-dimensional interferometry. 6
5 Procedure . 7
5.1 Measurement regions. 7
5.2 Method for analysis . 9
6 Details to be specified . 11
Annex A (informative) Formula for calculating end face geometry. 13
Annex B (normative) Surface angle sign convention (shown graphically) . 14
Annex C (normative) Fibre counting convention (shown graphically). 15
Bibliography . 16
Figure 1 – Three-dimensional interferometry analyser . 7
Figure 2 – Measurement regions on ferrule . 8
Figure 3 – Multimode fibre core dip regions. 8
Table 1 – Ferrule measurement areas . 12
Table 2 – Multimode core dip areas . 12

61300-3-30 © IEC:2003(E) – 3 –

INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
FIBRE OPTIC INTERCONNECTING DEVICES

AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 3-30: Examinations and measurements –

Polish angle and fibre position on single ferrule

multifibre connectors
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-30 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
The text of this standard is based on the following documents:

FDIS Report on voting
86B/1747/FDIS 86B/1773/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
IEC 61300 consists of the following parts, under the general title Fibre optic interconnecting
devices and passive components – Basic test and measurement procedures:
− Part 1: General and guidance
− Part 2: Tests
− Part 3: Examinations and measurements

– 4 – 61300-3-30  CEI:2003 (E)

The committee has decided that the contents of this publication will remain unchanged until 2007.

At this date, the publication will be

• reconfirmed;
• withdrawn;
• replaced by a revised edition, or

• amended.
61300-3-30 © IEC:2003(E) – 5 –

FIBRE OPTIC INTERCONNECTING DEVICES

AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 3-30: Examinations and measurements –

Polish angle and fibre position on single ferrule

multifibre connectors
1 Scope
This part of IEC 61300 describes a procedure to assess end face geometry in guide pin based
multifibre ferrules and connectors. The primary attributes are fibre position relative to the end
face, either undercut or protrusion, end face angle relative to the guide pin bores, and core dip
for multimode fibres.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
None.
3 General description
Guide pin based multifibre connectors typically have a rectangular end face with a long axis
and a short axis. Ideally a flat polish is desired on the end face with the fibres protruding
slightly and all in the same plane to assure physical contact of the fibre cores when two
connectors are intermated. In practice, the end face typically has two different curvatures
across the surface along the long and short axis. Since mated ferrules are aligned by pins in
the guide holes, the end face of the ferrule must be properly oriented (X and Y angle) with
respect to the guide holes to achieve positive contact. The end face angle in the X-axis and the
end face angle in the Y-axis are measured by finding the best fit plane based on a percentage
of the highest points in a specified region of interest. The highest points typically show the
greatest modulation from an interferometric standpoint. This allows for more robust
measurements and greater repeatability between different interferometers.

The angle of the best fit plane is calculated by comparing it to the reference plane which is
perpendicular to the axis of each guide hole. The fibre protrusion, (+p), or undercut, (–p), of the
fibres is a planar height defined as the distance between the fibre end face and the best fit
planar surface previously described. Core dip is specific to multimode fibres because the large
core is softer than the edge of the fibre and tends to polish away faster. Core dip is calculated
by subtracting the average height of the core area from the average height of an annular area
near the edge of the fibre.
One method is described for this procedure. Analysing the endface with a three-dimensional
interferometry type surface analyser.

– 6 – 61300-3-30  CEI:2003 (E)

4 Apparatus
Three-dimensional surface analysis by an interferometer system.

The apparatus shown in figure 1 consists of a suitable ferrule holder, a positioning stage and a

three-dimensional interferometry analyser capable of analyzing rough surfaces and step

heights.
4.1 Ferrule holder
The ferrule holder is a suitable device to hold the ferrule in a fixed position, either vertical or
horizontal, or in a tilted position in the case of an angled ferrule type. Some method must be
used to reference the axis of each guide hole and the average perpendicular angle to them,
which shall be considered the ideal end face angle. This will typically entail the use of guide
pins inserted into the guide holes or similar devices to transfer the axis of each guide hole to a
measurable surface angle.
4.2 Positioning stage
The ferrule holder is fixed to the positioning stage, which shall enable the ferrule holder to be
moved to the appropriate position. The stage shall have enough rigidity so as to allow
measurement of the ferrule end face with the required accuracy.
4.3 Three-dimensional interferometry
The three-dimensional interferometry analyser shall have the ability to measure the fibre
heights on the ferrule end face with an accuracy of better than ±50 nm. The analyser shall
consist of a microscope unit, a surface data processing unit and a monitor.
The microscope unit shall consist of an interference microscope, a phase shift actuator, an
image detector and a frame grabber. The interference microscope equipped with an objective
is arranged so as to view the end face of the ferrule.
The surface data processing unit shall be able to process the surface height information so as
to measure the radius of curvature in the X and Y axis, the angle of the end face in the X and Y
axis and the protrusion or undercut of the fibres from the best fit planar surface. A flatness
deviation shall be calculated to determine if the connector has too great a curvature to consider
the surface a plane.
The monitor shall display the measured and calculated surface profiles along each axi
...