IEC TS 63371-1:2026

IEC TS 63371-1 ®
Edition 1.0 2026-03
TECHNICAL
SPECIFICATION
Materials used in photovoltaic (PV) cells -
Part 1: Specifications for electrical characteristics of crystalline silicon wafers
ICS 27.160  ISBN 978-2-8327-1020-3

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CONTENTS
FOREWORD . 2
INTRODUCTION . 4
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Sampling . 5
4.1 Wafer measurement . 5
4.2 Bulk material measurement . 6
5 Test method and measurement. 6
5.1 Conductivity type . 6
5.1.1 Wafer measurement . 6
5.1.2 Bulk material measurement . 7
5.2 Resistivity . 7
5.2.1 Wafer measurement . 7
5.2.2 Bulk material measurement . 7
5.3 Minority carrier lifetime . 8
5.3.1 Bulk material measurement for multicrystalline silicon sample . 8
5.3.2 Bulk material measurement for monocrystalline silicon sample . 8
6 Report . 9
Annex A (informative) Widely accepted electrical characteristics values . 10

Figure 1 – Measurement point plan for bulk of resistivity . 8
Figure 2 – Measurement point plan for monocrystalline silicon bulk material of minority
carrier lifetime . 9

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Materials used in photovoltaic (PV) cells -
Part 1: Specifications for electrical characteristics
of crystalline silicon wafers
FOREWORD
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IEC TS 63371-1 has been prepared by IEC technical committee 82: Solar photovoltaic energy
systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
82/2523/DTS 82/2563/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 63371 series, published under the general title Materials used in
photovoltaic (PV) cells, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
INTRODUCTION
At the present time, while there are various test standards for each electrical characteristic,
there is no relevant standard defining which test methods are to be used to characterize silicon
wafers or bulk material. In most cases, the silicon wafer manufacturer decides what
characteristics to provide according to their experience or by negotiation between the supplier
and the customer. The purpose of this document is to establish a standardized specification for
crystalline silicon wafers, defining their electrical characteristics, the applicable test methods,
and the acceptable value ranges for those characteristics.

1 Scope
This part of IEC 63371 applies to crystalline silicon wafers for use as the substrates in making
photovoltaic cells. It describes the methods for measuring the electrical characteristics of these
silicon wafers. It does not provide mechanical information about these wafers. Annex A shows
the widely accepted electrical characteristics values.
2 Normative references
The following documents ar
...