IEC 63171-1:2020

IEC 63171-1 ®
Edition 1.0 2020-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electrical and electronic equipment –
Part 1: Detail specification for two-way, shielded or unshielded, free and fixed
connectors – Mechanical mating information, pin assignment and additional
requirements for Type 1 copper LC style

Connecteurs pour équipements électriques et électroniques –
Partie 1: Spécification particulière pour les fiches et les embases
bidirectionnelles, écrantées ou non écrantées – Informations sur l’accouplement
mécanique, brochage et exigences supplémentaires pour connecteur LC de type
1 à doigts de guidage en cuivre
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
A propos de l'IEC
La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC
Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la
plus récente, un corrigendum ou amendement peut avoir été publié.

Recherche de publications IEC - Electropedia - www.electropedia.org
webstore.iec.ch/advsearchform Le premier dictionnaire d'électrotechnologie en ligne au
La recherche avancée permet de trouver des publications IEC monde, avec plus de 22 000 articles terminologiques en
en utilisant différents critères (numéro de référence, texte, anglais et en français, ainsi que les termes équivalents dans
comité d’études,…). Elle donne aussi des informations sur les 16 langues additionnelles. Egalement appelé Vocabulaire
projets et les publications remplacées ou retirées. Electrotechnique International (IEV) en ligne.

IEC Just Published - webstore.iec.ch/justpublished Glossaire IEC - std.iec.ch/glossary
Restez informé sur les nouvelles publications IEC. Just 67 000 entrées terminologiques électrotechniques, en anglais
Published détaille les nouvelles publications parues. et en français, extraites des articles Termes et Définitions des
Disponible en ligne et une fois par mois par email. publications IEC parues depuis 2002. Plus certaines entrées
antérieures extraites des publications des CE 37, 77, 86 et
Service Clients - webstore.iec.ch/csc CISPR de l'IEC.

Si vous désirez nous donner des commentaires sur cette
publication ou si vous avez des questions contactez-nous:
sales@iec.ch.
IEC 63171-1 ®
Edition 1.0 2020-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Connectors for electrical and electronic equipment –

Part 1: Detail specification for two-way, shielded or unshielded, free and fixed

connectors – Mechanical mating information, pin assignment and additional

requirements for Type 1 copper LC style

Connecteurs pour équipements électriques et électroniques –

Partie 1: Spécification particulière pour les fiches et les embases

bidirectionnelles, écrantées ou non écrantées – Informations sur l’accouplement

mécanique, brochage et exigences supplémentaires pour connecteur LC de type

1 à doigts de guidage en cuivre

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.220.10 ISBN 978-2-8322-8076-8

– 2 – IEC 63171-1:2020 © IEC 2020
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 9
4 Technical information . 10
4.1 Compatibility level – Interoperability . 10
4.2 Unshielded connectors . 10
4.3 Use of UTP cable . 10
5 Common features and typical connector pair . 10
5.1 Mating information . 10
5.1.1 General . 10
5.1.2 Contacts – Mating conditions . 11
5.1.3 Fixed connector . 12
5.1.4 Free connector . 15
6 Characteristics . 16
6.1 General . 16
6.2 Classification into climatic category . 16
6.3 Electrical characteristics . 17
6.3.1 General . 17
6.3.2 Creepage and clearance distances . 17
6.3.3 Contact resistance – Interface only (separable fixed and free contact) . 17
6.3.4 Input to output DC resistance . 18
6.3.5 Input to output DC resistance unbalanced. 18
6.3.6 Voltage proof . 18
6.3.7 Current-temperature derating . 18
6.3.8 Initial insulation resistance . 18
6.4 Transmission characteristics . 18
6.4.1 General . 18
6.4.2 Insertion loss (IL) . 19
6.4.3 Return loss (RL) . 19
6.4.4 Transverse conversion loss (TCL) . 19
6.4.5 Transfer conversion transfer loss (TCTL) . 19
6.4.6 Power sum alien near-end crosstalk loss (PS ANEXT) . 19
6.4.7 Power sum alien far-end crosstalk loss (PS AFEXT) . 20
6.4.8 Transfer impedance (shielded only) . 20
6.4.9 Coupling attenuation . 20
6.5 Mechanical characteristics . 20
6.5.1 Mechanical operation . 20
6.5.2 Effectiveness of connector coupling devices . 20
6.5.3 Insertion and withdrawal forces . 20
7 Tests and test schedule . 21
7.1 General . 21
7.2 Arrangement for contact resistance measurement . 21
7.3 Arrangement for vibration test (test phase CP1) . 22
7.4 Test procedures and measuring methods . 22

7.5 Preconditioning . 22
8 Test schedules . 23
8.1 Basic (minimum) test schedule. 23
8.2 Full test schedule . 23
8.2.1 General . 23
8.2.2 Test group P – Preliminary . 23
8.2.3 Test group AP – Climatic . 24
8.2.4 Test group BP – Mechanical . 25
8.2.5 Test group CP – Vibration. 26
8.2.6 Test group DP – Electrical load . 27
8.2.7 Test group EP – Electrical transmission . 27
8.2.8 Test group GP – Transfer Impedance and Coupling Attenuation . 28
Annex A (normative) Locking-device mechanical operation . 29
A.1 Object . 29
A.2 Preparation of the specimen . 29
A.3 Test method . 29
A.4 Final measurements . 29
Bibliography . 30

Figure 1 – Relationships between the IEC 63171 series and its related references . 7
Figure 2 – Connector overview . 7
Figure 3 – Mated fixed and free connectors . 11
Figure 4 – Fixed connector . 13
Figure 5 – Fixed connector pin detail (detail A from Figure 4c) section D-D) . 14
Figure 6 – Free connector . 15
Figure 7 – Arrangement for contact resistance measurement . 21
Figure 8 – Arrangement for vibration test . 22

Table 1 – Dimensions for Figure 4a), Figure 4b) and Figure 4c) . 13
Table 2 – Dimensions for Figure 5 . 14
Table 3 – Dimensions for Figure 6a) and Figure 6b) . 16
Table 4 – Creepage and clearance distances . 17
Table 5 – Test group P . 23
Table 6 – Test group AP . 24
Table 7 – Test group BP . 25
Table 8 – Test group CP . 26
Table 9 – Test group DP . 27
Table 10 – Test Group EP. 27
Table 11 – Test Group GP . 28

– 4 – IEC 63171-1:2020 © IEC 2020
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –

Part 1: Detail specification for two-way, shielded or unshielded, free and
fixed connectors – Mechanical mating information, pin assignment and
additional requirements for Type 1 copper LC style

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 63171-1 has been prepared by subcommittee 48B: Electrical
connectors of IEC technical committee 48: Electrical connectors and mechanical structures for
electrical and electronic equipment.
The text of this International Standard is based on the following documents:
FDIS Report on voting
48B/2783/FDIS 48B/2799/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts in the IEC 63171 series, published under the general title Connectors for
electrical and electronic components, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – IEC 63171-1:2020 © IEC 2020
INTRODUCTION
The International Electrotechnical Commission (IEC) draws attention to the fact that it is
claimed that compliance with this document may involve the use of a patent concerning
contact mating surface dimensions given in 5.1.
The IEC takes no position concerning the evidence, validity and scope of this patent right.
The holder of the patent right on contact mating surface dimensions in 5.1 has assured the
IEC that they are willing to give free licences to applicants throughout the world. In this
respect, the statement of the holder of this patent right is registered with the IEC
Information may be obtained from:
CommScope Technologies, LLC
501 Shenandoah Drive
Shakopee, Minnesota
USA 55379
Attention is drawn to the possibility that some of the elements of this International Standard
may be the subject of patent rights other than those identified above. IEC shall not be held
responsible for identifying any or all such patent rights.
ISO (www.iso.org/patents) and IEC (http://patents.iec.ch) maintain on-line data bases of
patents relevant to their standards. Users are encouraged to consult the data bases for the
most up to date information concerning patents.
IEC 63171 is the base specification of the whole series. Subsequent specifications do not
duplicate information given in the base document, but list only additional requirements. For
complete specification regarding a component of a higher number document the base
numbered documents should be considered as well. The following diagram (see Figure 1)
shows the interrelation of the documents:

Figure 1 – Relationships between the IEC 63171 series and its related references
International Electrotechnical Commission IEC 63171-1 Ed1
Subcommittee 48B: Electrical connectors
Two-way, free and fixed
connectors for data transmission
up to 600 MHz (and with current
carrying capacity up to 2,0 A at
60° C.)
Fixed connectors are mounted
on printed circuit board or bulk
head, the free connector is
terminated on shielded or
unshielded wire.
View showing typical fixed and free connectors
Figure 2 – Connector overview
– 8 – IEC 63171-1:2020 © IEC 2020
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –

Part 1: Detail specification for two-way, shielded or unshielded, free and
fixed connectors – Mechanical mating information, pin assignment and
additional requirements for Type 1 copper LC style

1 Scope
This part of IEC 63171 covers two-way, shielded or unshielded, free and fixed connectors for
data transmission with frequencies up to 600 MHz and with current carrying capacity up
to 2,0 A at 60 °C. It is intended to specify the common dimensions, mechanical, electrical,
signal integrity, environmental characteristics, reliability specifications and corresponding
tests for these connectors.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the reference document (including
any amendments) applies.
IEC 60050-581, International Electrotechnical Vocabulary (IEV) – Chapter 581:
Electromechanical components for electronic equipment
IEC 60068-1, Environmental testing – Part 1: General and guidance
IEC 60512-1, Connectors for electrical and electronic equipment – Tests and measurements –
Part 1: Generic specification
IEC 60512-1-1, Connectors for electronic equipment – Tests and measurements – Part 1-1:
General examination – Test 1a: Visual examination
IEC 60512-1-2, Connectors for electronic equipment – Tests and measurements – Part 1-2:
General examination – Test 1b: Examination of dimension and mass
IEC 60512-2-1, Connectors for electronic equipment – Tests and measurements – Part 2-1:
Electrical continuity and contact resistance tests – Test 2a: Contact resistance – Millivolt level
method
IEC 60512-2-5, Connectors for electronic equipment – Tests and measurements – Part 2-5:
Electrical continuity and contact resistance tests – Test 2e: Contact disturbance
IEC 60512-3-1, Connectors for electronic equipment – Tests and measurements – Part 3-1:
Insulation tests – Test 3a: Insulation resistance
IEC 60512-4-1, Connectors for electronic equipment – Tests and measurements – Part 4-1:
Voltage stress tests – Test 4a: Voltage proof
IEC 60512-5-2, Connectors for electronic equipment – Tests and measurements – Part 5-2:
Current-carrying capacity tests – Test 5b: Current-temperature derating

IEC 60512-6-4, Connectors for electronic equipment – Tests and measurements – Part 6:
Dynamic stress tests – Section 5: Test 6d: Vibration (sinusoidal)
IEC 60512-9-1, Connectors for electronic equipment – Tests and measurements – Part 9-1:
Endurance tests – Test 9a: Mechanical operation
IEC 60512-11-7, Connectors for electronic equipment – Tests and measurements – Part 11-7:
Climatic tests – Test 11g: Flowing mixed gas corrosion test
IEC 60512-11-12, Connectors for electronic equipment – Tests and measurements – Part 11-
12: Climatic tests – Test 11m: Damp heat, cyclic
IEC 60512-13-2, Connectors for electronic equipment – Tests and measurements – Part 13-2:
Mechanical operation tests – Test 13b: Insertion and withdrawal forces
IEC 60512-15-6, Connectors for electronic equipment – Tests and measurements – Part 15-6:
Connector tests (mechanical) – Test 15f: Effectiveness of connector coupling devices
IEC 60512-25-9, Connectors for electronic equipment – Tests and measurements – Part 25-9:
Signal integrity tests – Test 25i: Alien crosstalk
IEC 60512-26-100, Connectors for electronic equipment – Tests and measurements – Part
26-100: Measurement setup, test and reference arrangements and measurements for
connectors according to IEC 60603-7 – Tests 26a to 26g
IEC 60512-28-100, Connectors for electrical and electronic equipment – Tests and
measurements – Part 28-100: Signal integrity tests up to 2 000 MHz – Tests 28a to 28g
IEC 60664-1, Insulation coordination for equipment within low-voltage systems – Part 1:
Principles, requirements and tests
IEC 62153-4-12, Metallic communication cable test methods – Part 4-12: Electromagnetic
compatibility (EMC) – Coupling attenuation or screening attenuation of connecting hardware –
Absorbing clamp method
IEC 62153-4-15, Metallic communication cable test methods – Part 4-15: Electromagnetic
compatibility (EMC) – Test method for measuring transfer impedance and screening
attenuation – or coupling attenuation with triaxial cell
ISO/IEC 11801-1, Information technology – Generic cabling for customer premises – Part 1:
General requirements
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-581 and
IEC 60512-1 apply.
ISO and IEC maintain terminology databases for use in the standardization at the following
addresses:
• IEC Electropedia: available at http://www.electopedia.org
• ISO Online browsing platform: available at http://www.iso.org/obp

– 10 – IEC 63171-1:2020 © IEC 2020
4 Technical information
4.1 Compatibility level – Interoperability
Interoperability of connectors from different sources that are in compliance to this document is
assured as a pre-requisite by compliance with the specified interface dimensions
(intermateability) and by the relevant signal integrity tests specified.
The design of this copper LC style connector contains features in both the free and fixed
connectors that prevent intermateability with a standard LC fibre optic connector according to
IEC 61754-20. The key feature in the fixed connector, as shown in Figure 4c), prevents the
insertion of an LC fibre optic connector. The height of the free connector, shown in Figure 6b)
(dimension AY) prevents insertion into an LC fibre optic outlet.
4.2 Unshielded connectors
This document is focused on shielded connectors to cover a broad set of use cases and
environments. Unshielded connectors can be qualified using this document for use cases
where the requirements for alien crosstalk or external noise mitigation is not as stringent.
Such unshielded connectors shall conform to the specified fixed and free connector mating
dimensions of shielded connectors in Figure 4 and Figure 6 (except for dimensions R, S, T
and AN from Figure 4, and AU, AV, and AW from Figure 6 as they are related only to shield
features). Unshielded connectors shall comply with IL, RL, TCL, and TCTL transmission
requirements in Clause 6 and indicate in their data sheets specific requirements of
IEC 63171-1 to which they comply.
4.3 Use of UTP cable
Shielded connectors can be used with UTP cables for those use cases where channel/link
alien crosstalk requirements are less stringent, complying with application specific
(e.g. IEEE 802.3) or generic cabling standards (e.g. ISO 11801 series).
5 Common features and typical connector pair
5.1 Mating information
5.1.1 General
Dimensions are given in millimeters. Drawings are shown in third-angle projection. The shape
of connectors may deviate from those given in Figure 2 to Figure 6 as long as the dimensions
specified are not changed (see also Table 1 to Table 3).

5.1.2 Contacts – Mating conditions

Figure 3 – Mated fixed and free connectors

– 12 – IEC 63171-1:2020 © IEC 2020
5.1.3 Fixed connector
Dimensions in mm
a) – Fixed connector
b) – Pin detail
c) – Section views of fixed connector
Figure 4 – Fixed connector
Table 1 – Dimensions for Figure 4a), Figure 4b) and Figure 4c)
Dimensions in mm
Dimensions
Reference Notes
Minimum Nominal Maximum
A 4,5 4,8 -
B 3,4 3,45 3,5
C 2,6 2,65 2,7
a
D
E 7,55 7,6 7,65
F 1,1 1,15 1,2
G 4,65 4,7 4,75
H 5,55 5,6 5,65
I 1,0 1,05 1,1 -
J 0,3 - - Radius
K 0,3 Radius
L 9,2 9,3 9,4
M 5,4 5,5 5,6
N 1,1 1,2 1,3
O 0,6 Basic dimension
P 1,35 Basic dimension
Q 13,85 13,95 14,05
R - 2.7 Shield contact area*
S 1,2 - Shield contact area*
T - - 10 Shield contact area*
– 14 – IEC 63171-1:2020 © IEC 2020
Dimensions
Reference Notes
Minimum Nominal Maximum
U 0,71 0,76 0,81 At base of pin
V 0,50 0,51 0,52 At base of pin
W 15,0°
X 11,9 12,0 12,1
Y 2,2 2,3 2,4 Radius
Z 1,05 Basic dimension
AA 0,65 0,7 0,75
AB 0,85 0,90 0,95
AN - - 15,0 *
AQ - - 0,2° Draft angle
NOTE * refers to shielded connectors only.
a
Care shall be taken that all shield contacts of the fixed connector always make contact with the shield
contacts of the free connector in the worst-case condition to ensure reliable performance.

Pin side view
Pin bottom view
Figure 5 – Fixed connector pin detail (detail A from Figure 4c) section D-D)
Table 2 – Dimensions for Figure 5
Dimensions in mm
Dimensions
Reference Notes
Minimum Nominal Maximum
AC 0,03 - - Radius (typical)
AD 0,6 0,7 0,8
AE 0,4 Reference
AF 0,6 Reference
AG 9,5° 10° 10,5° Typical
5.1.4 Free connector
Dimensions in mm
a) – Free connector
b) – Section views of free connector
Figure 6 – Free connector
– 16 – IEC 63171-1:2020 © IEC 2020
Table 3 – Dimensions for Figure 6a) and Figure 6b)
Dimensions in mm
Dimensions
Reference Notes
Minimum Nominal Maximum
AH 4,2 4,3 4,4
AI 3,2 3,25 3,35
AJ 2,2 2,3 2,4
AK 8,5 8,6 8,7
AL 0,4 0,5 0,6 Radius
AM  0,3 Radius
AO 1,1 1,2 1,3
AP 2,7 2,8 2,9
Not used
Not used
Not used
AU - - 8,5 Shield contact area*
AV - - 0,8 Shield contact area*
AW 2,7 - - Shield contact area*

AX 4,42 4,47 4,52
AY 5,32 5,37 5,42
AZ 6,5 6,55 6,6
BA 0° 0,1° 0,2° Draft angle
BC 2,55 2,65 2,75 Contact resting point
BD 0,3 - - Radius
BE - 1,05 - Basic dimension
BF 0,95 1,0 1,05
BG 0,9 1,0 1,05
NOTE * refers to shielded connectors only.

6 Characteristics
6.1 General
Compliance to the test schedules is intended to ensure the reliability of all performance
parameters, including transmission parameters, over the range of operating climatic
conditions.
6.2 Classification into climatic category
The temperature range and climatic category shall be compatible with ISO/IEC 11801-1
classification of a M I C E environment. This is achieved by the climatic category 10/090/21
1 1 1 1
as defined in IEC 60068-1.
The damp heat, steady state test required by this climatic category is satisfied by either test
group AP (AP8) or test group GP (GP2).

The dry heat test at UCT 90 °C required by this climatic category is satisfied by test group DP
(DP1) at 70 °C with the electrical load likely to produce the UCT within the test specimens.
6.3 Electrical characteristics
6.3.1 General
The connector is designed for data transmission up to 600 MHz and has current carrying
capacity up to 2,0 A at 60 ° C.
6.3.2 Creepage and clearance distances
The permissible operating voltages depend on the application and on the specified safety
requirements.
Although insulation coordination is not required for safety aspects for these connectors, it is
still required for their electrical functional requirements.
In general, for minimum values of clearances and creepage distances IEC 60664-1 shall apply,
based on the assigned voltage rating 50 V AC and 60 V DC.
NOTE As indicated in IEC 60664-1, IEC 60664-5 (now withdrawn, replaced by IEC TR 63040) provides an
alternative and more precise dimensioning procedure for clearances equal to or less than 2 mm.
The creepage and clearance distances that cover performance requirements in IEC 60664-1
may be reduced, based on IEC TR 63040.
The creepage and clearance distances given in Table 4 apply as operating characteristics for
mated connectors according to this document.
Table 4 – Creepage and clearance distances
Dimensions in mm
Minimum distance between contacts and chassis Minimum distance between adjacent contacts
Creepage Clearance Creepage Clearance
1,40 0,51 0,40 0,40
6.3.3 Contact resistance – Interface only (separable fixed and free contact)
Conditions: IEC 60512-2-1, Test 2a
Arrange according to 7.2
Mated connectors
Connection points: as specified in Figure 7
Initial: 20 mΩ maximum
Change from initial: 20 mΩ maximum
Shield contact resistance:
Initial: 20 mΩ maximum (if applicable)
Change from initial: 20 mΩ maximum (if applicable)

– 18 – IEC 63171-1:2020 © IEC 2020
6.3.4 Input to output DC resistance
Conditions: IEC 60512-2-1, Test 2a
Arrange according to 7.2
Mated connectors
Connection points: Cable termination to cable termination
50 mΩ maximum
6.3.5 Input to output DC resistance unbalanced
Conditions:
IEC 60512-2-1, Test 2a
Arrange according to 7.2
Mated connectors
Connection points: Cable termination to cable termination
Among all signal conductors, maximum difference between maximum and minimum
All types: 25 mΩ maximum
6.3.6 Voltage proof
Conditions: IEC 60512-4-1, Test 4a, Method A
Mated connectors
All variants:
1 000 V DC or AC peak; contact to contact
1 500 V DC or AC peak; contacts connected together to shield (if applicable)
6.3.7 Current-temperature derating
Conditions: IEC 60512-5-2, Test 5b
Both contacts connected in series
The current-carrying capacity of connectors in accordance with this specification shall
comply with the de-rating curve defined by the following formula:
0,5
T

temperature (T): I 3,5⋅−1
T


6.3.8 Initial insulation resistance
Conditions: IEC 60512-3-1, Test 3a
Method A
Mated connectors
Test voltage: 500 VDC.
All types: 500 MΩ minimum
6.4 Transmission characteristics
6.4.1 General
Compliance to this document, with respect to transmission characteristics, is determined
according to specific test methods described in test group EP.
=
All transmission performance requirements apply between the reference planes specified in
IEC 60512-28-100.
All transmission results shall be reported as worst-case overall result after testing all samples.
NOTE In the following subclauses f is the frequency, expressed in MHz.
6.4.2 Insertion loss (IL)
Conditions: IEC 60512-28-100, Test 28a
Mated connectors
IL ≥ 0,02x√ f dB from 0,1 MHz to 600 MHz
Whenever the formula results in a value less than 0,1 dB, the requirement shall revert
to 0,1 dB.
6.4.3 Return loss (RL)
Conditions: IEC 60512-28-100, Test 28b
Mated connectors
RL ≥ 74-20log (f) dB from 0,1 MHz to 600 MHz
Whenever the formula results in a value greater than 30 dB, the requirement shall revert to
30 dB.
6.4.4 Transverse conversion loss (TCL)
Conditions: IEC 60512-28-100, Test 28f
Mated connectors
TCL ≥ 68-20log (f) dB from 0,1 MHz to 600 MHz
Transfer conversion loss at frequencies that correspond to calculated values of greater
than 50 dB shall revert to a minimum requirement of 50 dB.
6.4.5 Transfer conversion transfer loss (TCTL)
Conditions: IEC 60512-28-100, Test 28g
Mated connectors
TCTL ≥ 68-20log (f) dB from 0,1 MHz to 600 MHz
Transfer conversion transfer loss at frequencies that correspond to calculated values of
greater than 50 dB shall revert to a minimum requirement of 50 dB.
6.4.6 Power sum alien near-end crosstalk loss (PS ANEXT)
Conditions: IEC 60512-25-9, Test 25i
Mated connectors
PS ANEXT ≥ 110-20log (f) dB from 0,1 MHz to 600 MHz (unshielded)
PS ANEXT ≥ 140-20log (f) dB from 0,1 MHz to 600 MHz (shielded)
Power sum alien near-end crosstalk loss at frequencies that correspond to calculated
values of greater than 84 dB shall revert to a minimum requirement of 84 dB.

– 20 – IEC 63171-1:2020 © IEC 2020
6.4.7 Power sum alien far-end crosstalk loss (PS AFEXT)
Conditions according to IEC 60512-25-9, Test 25i
Mated connectors
PS AFEXT ≥ 107-20log (f) dB from 0,1 MHz to 600 MHz (unshielded)
PS AFEXT ≥ 120-20log (f) dB from 0,1 MHz to 600 MHz (shielded)
Power sum alien far-end crosstalk loss at frequencies that correspond to calculated values
of greater than 84 dB shall revert to a minimum requirement of 84 dB.
6.4.8 Transfer impedance (shielded only)
Conditions: IEC 60512-26-100, Test 26e
Mated connectors terminated with each cable construction intended to be allowed for
these connectors
0,3
All types: ≤0,05 f Ω from 0,1 MHz to 10 MHz
≤ 0,01 f Ω from 10 MHz to 80 MHz
where f is the frequency in MHz
6.4.9 Coupling attenuation
Conditions: IEC 62153-4-15 for coupling attenuation with triaxial cell
Mated connectors terminated with each cable construction type intended to be allowed for
these connectors
≥ 100 – 20 log(f ) dB from 0,1 MHz to 600 MHz.
Whenever the formula results in a value greater than 65 dB, the requirement shall revert to
65 dB.
6.5 Mechanical characteristics
6.5.1 Mechanical operation
Conditions: IEC 60512-9-1, Test 9a
Speed: 10 mm/s maximum
Rest: 1 s minimum (mated and unmated)
750 operations
NOTE One operation consisting of one insertion and one withdrawal.
6.5.2 Effectiveness of connector coupling devices
Conditions: IEC 60512-15-6, Test 15f
All types:50 N for 60 s ± 5 s
6.5.3 Insertion and withdrawal forces
Conditions: IEC 60512-13-2, Test 13b
Speed: 10 mm/s maximum
All types, insertion and withdrawal: 20 N maximum

7 Tests and test schedule
7.1 General
This document states the test sequence (in accordance with this document) and the number
of specimens for each test sequence.
Individual variants may be submitted to type tests for approval of those particular variants.
It is permissible to limit the number of variants tested to a selection representative of the
whole range for which approval is required (which may be less than the range covered by the
detail specification), but each feature and characteristic shall be validated against the
dimensional requirements and test sequences specified in this document.
Unless otherwise specified, mated sets of connectors shall be tested. For contact resistance
measurements, care shall be taken to keep a particular combination of connectors together
during the complete test sequence so that, when un-mating is necessary for a certain test, the
same connectors shall be mated for subsequent tests.
Wiring of these connectors shall take into account the wire and cable diameter of the cables
defined in IEC 61156 (all parts) as applicable to the manufacturer’s specification.
7.2 Arrangement for contact resistance measurement

Key
1 Fixed connector
2 Measurement point
3 Free connector
4 Contact point
5 Measurement point
6 As short as is practical
7 As short as is practical
8 Contact resistance measurement points
Figure 7 – Arrangement for contact resistance measurement
The measurement procedure is as follows.
a) Determine the resistance of the fixed connector between points 2 and 4 of Figure 7 by
calculation or by measurement. This resistance is noted and recorded as R .
A
b) Determine the resistance of the free connector between points 4 and 5 of Figure 7 by
calculation or by measurement. This resistance is noted and recorded as R .
B
Measure the total mated connector resistance between points 2 and 5 of Figure 7,
following the requirements and procedures of IEC 60512, Test 2a. This resistance is noted
and recorded as R .
C
– 22 – IEC 63171-1:2020 © IEC 2020
c) Calculate the contact resistance by subtracting the sum of the bulk resistance of the fixed
and free connectors from the total mated connector resistance:
Contact resistance = R − (R + R )
C A B
7.3 Arrangement for vibration test (test phase CP1)

Key
1 Fixed connector
2 Secure to the non-vibrating member
3 Free connector
4 Contact point
5 Secure to the non-vibrating member
6 Fixture for rigidly attaching the fixed connector to the vibration table.
7 Vibration table
8 Contact resistance measurement points.
Figure 8 – Arrangement for vibration test
7.4 Test procedures and measuring methods
The test methods specified and given in the relevant standards are the
...