IEC 61701:2011
(Main)Salt mist corrosion testing of photovoltaic (PV) modules
Salt mist corrosion testing of photovoltaic (PV) modules
IEC 61701:2011 describes test sequences useful to determine the resistance of different PV modules to corrosion from salt mist containing Cl- (NaCl, MgCl2, etc.). All tests included in the sequences, except the bypass diode functionality test, are fully described in IEC 61215, IEC 61646, IEC 62108, IEC 61730-2 and IEC 60068-2-52. This Standard can be applied to both flat plate PV modules and concentrator PV modules and assemblies. Salt mist test is based on IEC 60068-2-52 rather than IEC 60068-2-11 as in edition 1 since the former standard is much more widely used in the electronic component field. According to this change the new edition 2 includes a cycling testing sequence that combines in each cycle a salt fog exposure followed by humidity storage under controlled temperature and relative humidity conditions. This testing sequence is more suitable to reflect the corrosion processes that happen in PV modules subjected to permanent or temporary corrosive atmospheres.
Essai de corrosion au brouillard salin des modules photovoltaïques (PV)
La CEI 61701:2011 décrit des séquences d'essai pour déterminer la résistance de différents modules photovoltaïques à la corrosion due au brouillard salin contenant du Cl- (NaCl, MgCl2, etc.). Tous les essais inclus dans les séquences, à l'exception de l'essai de fonctionnalité des diodes de dérivation, sont décrits de façon détaillée dans les normes CEI 61215, CEI 61646, CEI 62108, CEI 61730-2 et CEI 60068-2-52. La présente Norme peut être appliquée à des modules photovoltaïques plans et à des modules et ensembles photovoltaïques à concentration. L'essai au brouillard salin est basé sur la CEI 60068-2-52 plutôt que sur la CEI 60068-2-11 comme dans l'édition 1 puisque l'ancienne norme est plus largement utilisée dans le domaine des composants électroniques. Conformément à ce changement, la nouvelle édition 2 inclut une séquence d'essai cyclique qui combine dans chaque cycle une exposition au brouillard salin suivie d'un stockage en milieu humide dans des conditions de température et d'humidité relative contrôlées. Cette séquence d'essai reflète mieux les processus de corrosion rencontrés par les modules photovoltaïques soumis à des atmosphères corrosives permanentes ou temporaires (NaCl).
General Information
- Status
- Published
- Publication Date
- 14-Dec-2011
- Technical Committee
- TC 82 - Solar photovoltaic energy systems
- Drafting Committee
- WG 2 - TC 82/WG 2
- Current Stage
- DELPUB - Deleted Publication
- Start Date
- 11-Jun-2020
- Completion Date
- 28-Apr-2017
Relations
- Effective Date
- 05-Sep-2023
Overview
IEC 61701:2011 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies test sequences for salt mist corrosion testing of photovoltaic (PV) modules. This standard is critical for assessing the corrosion resistance of PV modules exposed to salt mist environments, particularly in marine or coastal locations where chloride salts like sodium chloride (NaCl) and magnesium chloride (MgCl₂) are prevalent.
Its primary objective is to evaluate the durability and reliability of different types of PV modules-including flat plate and concentrator photovoltaic (CPV) modules-under corrosive salt mist conditions. The standardized testing ensures PV modules maintain their electrical performance and integrity throughout their operational lifetime in harsh environments.
Key Topics
Scope and Purpose
Designed to simulate the effects of salt-laden wet atmospheres on PV modules, this standard is applicable to both permanent marine exposure and temporary corrosive atmospheres (such as deicing salts on roads). It evaluates corrosion on metallic parts and deterioration of non-metallic materials like coatings and plastics.Test Basis and Procedures
IEC 61701:2011 bases its salt mist testing on IEC 60068-2-52 (salt mist, cyclic sodium chloride solution), which involves cycles of salt fog exposure followed by humidity storage under controlled temperature and relative humidity conditions. This cyclic test sequence more accurately reflects real-world corrosion mechanisms compared to previous editions relying on single exposure salt fog tests.PV Module Types Covered
- Crystalline silicon PV modules
- Thin-film PV modules
- Concentrator photovoltaic (CPV) modules and assemblies
Testing Components
The standard integrates tests from IEC 61215, IEC 61646, IEC 62108, IEC 61730-2, and IEC 60068-2-52, covering aspects such as:- Bypass diode functionality
- Electrical performance before and after testing
- Visual and mechanical inspections
- Corrosion effects on metallic and non-metallic materials
Sample Requirements
Three identical samples of the PV module model are used, with one serving as a control for comparison. For CPV modules, tests include primary and secondary optics when applicable. Smaller representative samples may be used if full-size modules cannot fit test chambers.
Applications
Marine and Coastal PV Installations
Provides essential assessment for PV modules intended for installation near seas and oceans, where continuous exposure to salt mist can cause rapid degradation.Roadside and Winter Salt Exposure
Suitable for PV systems located near roadways treated with deicing salts, which create temporary corrosive conditions affecting module longevity.Quality Assurance and Certification
Helps manufacturers meet rigorous type approval and design qualification requirements ensuring modules withstand environmental corrosion stresses.Product Development and Improvement
Assists R&D teams in understanding corrosion resistance of different PV materials and designs to innovate more durable photovoltaic products.Comparison of PV Technologies
Enables standardized evaluation across crystalline silicon, thin-film, and CPV technologies to select appropriate solutions based on environmental exposure risks.
Related Standards
- IEC 60068-2-52 – Environmental testing for salt mist, cyclic (sodium chloride solution)
- IEC 61215 – Design qualification for crystalline silicon terrestrial PV modules
- IEC 61646 – Design qualification for thin-film terrestrial PV modules
- IEC 61730-2 – PV module safety qualification and testing requirements
- IEC 62108 – Design qualification for concentrator photovoltaic modules and assemblies
- ISO/IEC 17025 – General requirements for the competence of testing and calibration laboratories
These normative references support IEC 61701 by providing detailed test methods or complementary criteria used during the salt mist corrosion testing sequences.
By adhering to IEC 61701:2011, stakeholders in the photovoltaic industry-including manufacturers, testing labs, and system designers-can ensure that PV modules meet internationally recognized standards for resistance to salt mist corrosion. This standard plays a vital role in enhancing the longevity, safety, and performance of solar power installations operating in corrosive environments worldwide.
Frequently Asked Questions
IEC 61701:2011 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Salt mist corrosion testing of photovoltaic (PV) modules". This standard covers: IEC 61701:2011 describes test sequences useful to determine the resistance of different PV modules to corrosion from salt mist containing Cl- (NaCl, MgCl2, etc.). All tests included in the sequences, except the bypass diode functionality test, are fully described in IEC 61215, IEC 61646, IEC 62108, IEC 61730-2 and IEC 60068-2-52. This Standard can be applied to both flat plate PV modules and concentrator PV modules and assemblies. Salt mist test is based on IEC 60068-2-52 rather than IEC 60068-2-11 as in edition 1 since the former standard is much more widely used in the electronic component field. According to this change the new edition 2 includes a cycling testing sequence that combines in each cycle a salt fog exposure followed by humidity storage under controlled temperature and relative humidity conditions. This testing sequence is more suitable to reflect the corrosion processes that happen in PV modules subjected to permanent or temporary corrosive atmospheres.
IEC 61701:2011 describes test sequences useful to determine the resistance of different PV modules to corrosion from salt mist containing Cl- (NaCl, MgCl2, etc.). All tests included in the sequences, except the bypass diode functionality test, are fully described in IEC 61215, IEC 61646, IEC 62108, IEC 61730-2 and IEC 60068-2-52. This Standard can be applied to both flat plate PV modules and concentrator PV modules and assemblies. Salt mist test is based on IEC 60068-2-52 rather than IEC 60068-2-11 as in edition 1 since the former standard is much more widely used in the electronic component field. According to this change the new edition 2 includes a cycling testing sequence that combines in each cycle a salt fog exposure followed by humidity storage under controlled temperature and relative humidity conditions. This testing sequence is more suitable to reflect the corrosion processes that happen in PV modules subjected to permanent or temporary corrosive atmospheres.
IEC 61701:2011 is classified under the following ICS (International Classification for Standards) categories: 27.160 - Solar energy engineering. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 61701:2011 has the following relationships with other standards: It is inter standard links to IEC 61701:2020. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 61701:2011 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
IEC 61701 ®
Edition 2.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Salt mist corrosion testing of photovoltaic (PV) modules
Essai de corrosion au brouillard salin des modules photovoltaïques (PV)
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IEC 61701 ®
Edition 2.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Salt mist corrosion testing of photovoltaic (PV) modules
Essai de corrosion au brouillard salin des modules photovoltaïques (PV)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX N
ICS 27.160 ISBN 978-2-88912-840-2
– 2 – 61701 © IEC:2011
CONTENTS
FOREWORD . 3
1 Scope and object . 5
2 Normative references . 5
3 Samples . 6
4 Test procedures . 6
4.1 General . 6
4.2 Bypass diode functionality test . 6
4.2.1 Purpose . 6
4.2.2 Apparatus . 6
4.2.3 Procedure . 7
4.2.4 Requirements . 7
5 Preconditioning . 7
6 Initial measurements . 7
7 Salt mist test procedure . 8
8 Cleaning and recovery . 8
9 Final measurements . 9
10 Requirements . 10
10.1 General . 10
10.2 Crystalline silicon . 10
10.3 Thin-film technologies . 10
10.4 Concentrator photovoltaic (CPV) modules . 10
11 Test report. 11
Figure 1 – Salt mist corrosion testing sequence for crystalline silicon PV modules . 12
Figure 2 – Salt mist corrosion testing sequence for thin-film PV modules . 13
Figure 3 – Salt mist corrosion testing sequence for concentrator photovoltaic (CPV)
modules . 14
61701 © IEC:2011 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SALT MIST CORROSION TESTING OF PHOTOVOLTAIC (PV) MODULES
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61701 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.
This second edition cancels and replaces the first edition issued in 1995. This edition
constitutes a technical revision.
The main technical changes with respect to the previous edition are as follows:
The scope has been updated to better reflect the applicability of the Standard.
Salt mist test is based on IEC 60068-2-52 rather than IEC 60068-2-11 as in edition 1 since
the former Standard is much more widely used in the electronic component field. According to
this change the new edition 2 includes a cycling testing sequence that combines in each cycle
a salt fog exposure followed by humidity storage under controlled temperature and relative
humidity conditions. This testing sequence is more suitable to reflect the corrosion processes
that happen in PV modules subjected to permanent or temporary corrosive atmospheres
(NaCl). In edition 1 only a salt fog exposure was considered.
– 4 – 61701 © IEC:2011
Additional tests have also been included to verify the effect of the salt mist test not only in the
PV module output but also in some of its components.
Different testing sequences are considered depending on the PV module technology involved:
crystalline silicon, thin-film and concentrator photovoltaic (CPV) modules.
A test report clause has also been included.
The text of this standard is based on the following documents:
FDIS Report on voting
82/667/FDIS 82/681/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
61701 © IEC:2011 – 5 –
SALT MIST CORROSION TESTING OF PHOTOVOLTAIC (PV) MODULES
1 Scope and object
Photovoltaic (PV) modules are electrical devices intended for continuous outdoor exposure
during their lifetime. Highly corrosive wet atmospheres, such as marine environments, could
eventually degrade some of the PV module components (corrosion of metallic parts,
deterioration of the properties of some non-metallic materials - such as protective coatings
and plastics - by assimilation of salts, etc.) causing permanent damages that could impair
their functioning. Temporary corrosive atmospheres are also present in places where salt is
used in winter periods to melt ice formations on streets and roads.
This Standard describes test sequences useful to determine the resistance of different PV
-
modules to corrosion from salt mist containing Cl (NaCl, MgCl , etc.). All tests included in the
sequences, except the bypass diode functionality test, are fully described in IEC 61215,
IEC 61646, IEC 62108, IEC 61730-2 and IEC 60068-2-52. They are combined in this Standard
to provide means to evaluate possible faults caused in PV modules when operating under wet
atmospheres having high concentration of dissolved salt (NaCl). Depending on the specific
nature of the surrounding atmosphere to which the module is exposed in real operation
several testing severities can be applied, as defined in IEC 60068-2-52. For example severity
(1) is intended to be used for PV modules used in a marine environment, or in close proximity
to the sea. Severities (3) to (6) are intended for PV modules operating in locations where
there could be a change between salt-laden and dry atmospheres, for examples in places
where salt is used to melt ice formations. Severity (2) is not suitable for PV modules as
testing conditions are too weak (this severity is originally intended for products exposed to
corrosive environments from time to time that are normally protected by an enclosure) and
should be avoided when applying this Standard.
This Standard can be applied to both flat plate PV modules and concentrator PV modules and
assemblies.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60068-2-52, Environmental testing – Part 2-52: Tests – Test Kb: Salt mist, cyclic (sodium
chloride solution)
IEC 61215:2005, Crystalline silicon terrestrial photovoltaic (PV) modules – Design
qualification and type approval
IEC 61646:2008, Thin-film terrestrial photovoltaic (PV) modules – Design qualification and
type approval
IEC 61730-2:2004, Photovoltaic (PV) module safety qualification – Part 2: Requirements for
testing
IEC 62108:2007, Concentrator photovoltaic (CPV) modules and assemblies – Design
qualification and type approval
– 6 – 61701 © IEC:2011
ISO/IEC 17025, General requirements for the competence of testing and calibration
laboratories
3 Samples
Three identical samples of the model of PV module or assembly of interest shall be subjected
to any of the testing sequences included in Figures 1, 2 or 3, depending on the PV technology
considered, namely crystalline silicon, thin-film or concentrator photovoltaic (CPV)
respectively. As the figures indicate one of these samples should be used as a control. The
control sample should be used as a check every time the test samples are measured to
evaluate the effect of the salt mist test.
In the case of CPV different situations for choosing the sample may occur. For non-field-
adjustable focus-point CPV systems or modules, 3 modules are required to complete the
testing sequence included in Figure 3. For field-adjustable focus-point CPV systems or
assemblies, 3 receivers (including secondary optics sections, if applicable) and 3 primary
optics sections are required to complete the testing sequence included in Figure 3. A
complete description of the different types and components of CPV modules and assemblies
can be found in IEC 62108.
If a full-size sample is too large to fit into the environmental chambers required for the salt
mist test then a smaller representative sample may be specially designed and manufactured
for this test. The representative sample should be carefully designed so that it can reveal
similar failure mechanisms as the full-size one, and the fabrication process of the
representative sample should be as identical as possible to the process of the full-size ones.
The fact that the test has been made on representative samples and not on the full-size
samples has to be indicated and reported in the test report under item g), see Clause 11.
If the PV module is provided with means for grounding then they constitute a part of the test
sample.
4 Test procedures
4.1 General
All tests included in Figures 1, 2 or 3, except the bypass diode functionality test, are fully
described (including purpose, apparatus, procedure and requirements) in the IEC Standards
from where the specific tests are taken (see notes in the Figures). Tests included in Figures
1, 2 or 3 shall be performed in the specified order. In the case of CPV if some test procedures
included in this Standard are not applicable to a specific design configuration, the
manufacturer should discuss this with the testing agency to develop a comparable test
program, based on the principles described in this Standard. Any changes and deviations
shall be recorded and reported in detail, as required in Clause 11, item l).
4.2 Bypass diode functionality test
4.2.1 Purpose
To verify that the bypass diode(s) of the test samples remains functional following the salt fog
exposure.
NOTE If in the test sample there are no bypass diodes or the bypass diodes do not have any metallic parts then
this test is omitted.
4.2.2 Apparatus
a) DC power source capable of applying a current up to 1,25 times the standard test
conditions (STC) short-circuit current of the sample under test and means for monitoring
the flow of current through the test sample during the test period.
61701 © IEC:2011 – 7 –
b) Equipment for measuring the voltage drop across the test sample at an accuracy of
± 0,5 % of reading.
c) Equipment for measuring test current at an accuracy of ± 0,5 % of reading.
4.2.3 Procedure
This procedure can be conducted in any ambient within 25 °C ± 10 °C. During the test the
sample shall not be subjected to illumination.
a) Electrically short any blocking diodes incorporated to the test sample.
b) Determine the rated STC short-circuit current of the test sample from its label or
instruction sheet.
c) Connect the DC power source’s positive output to the test sample negative lead, and the
DC power source’s negative output to the test sample positive lead by using wires of the
manufacturer’s minimum recommended wire gauge. Follow the manufacturer’s
recommendations for wire entry into the wiring compartment. With this configuration the
current shall pass through the cells in the reverse direction and through the diode(s) in the
forward direction.
NOTE Some modules have overlapping bypass diode circuits. In this case it may be necessary to install a jumper
cable to ensure that all of the current is flowing through one bypass diode.
d) Apply a current equal to of 1,25 times (± 5 %) the STC short-circuit current of the test
sample for a period of 1 h.
4.2.4 Requirements
After the 1 h of current flow check that the bypass diode(s) remains operational. A possible
method is to again pass a forward current through the diode(s) by passing a reverse current
through the cells and then monitor the temperature of the diode(s) with the aid of a thermal IR
camera. Diode(s) shall reach thermal equilibrium with the environment after step d) above
before applying this procedure. Another option is to shade a solar cell protected by each
diode (one per string, step by step) in the PV module and verify the characteristics of the
resulting I-V curve (under illumination close to STC) to check if the bypass diode(s) is(are)
working.
5 Preconditioning
All test samples shall be preconditioned with either global or direct normal sunlight (natural or
simulated) according to the specifications given in the applicable design qualification and type
approval IEC Standard applicable to the PV module technology considered, i.e., IEC 61215
for crystalline silicon, IEC 61646 for thin-film materials and IEC 62108 for concentrator
photovoltaic (CPV). At the time of writing this Standard no preconditioning is specified for
thin-film technologies in IEC 61646.
6 Initial measurements
6.1 The following initial measurements shall be performed on the selected samples
depending on the PV module technology being evaluated.
6.2 Crystalline silicon. The test order is included in Figure 1.
– Tests according to IEC 61215:
a) 10.2: Maximum power determination
b) 10.15: Wet leakage current test
– Tests according to IEC 61730-2
c) MST 01: Visual inspection
– 8 – 61701 © IEC:2011
d) MST 13: Ground continuity test
e) MST 16: Dielectric withstand test
NOTE The reference before each test corresponds to its identification in the relevant IEC Standard.
6.3 Thin-film technologies. The test order is included in Figure 2.
– Tests according to IEC 61646:
a) 10.2: Maximum power determination.
NOTE 1 The only purpose of this test is to verify that the PV module is operational before being subjected to the
subsequent tests of the sequence.
b) 10.15: Wet leakage current test
– Tests according to IEC 61730-2
c) MST 01: Visual inspection
d) MST 13: Ground continuity test
e) MST 16: Dielectric withstand test
NOTE 2 The reference before each test corresponds to its identification in the relevant IEC Standard.
6.4 Concentrator photovoltaic (CPV) modules. The test order is included in Figure 3.
– Tests according to IEC 62108:
a) 10.1: Visual inspection
b) 10.2: Electrical performance measurement
c) 10.3: Ground path continuity test
d) 10.4: Electrical insulation test
e) 10.5: Wet insulation test
NOTE The reference before each test correspond to its identification in IEC 62108.
7 Salt mist test procedure
Apply to the test samples under study the salt mist test as described in IEC 60068-2-52
following the general conditions, apparatus, characteristics of the salt solution, severities and
other specifications included. The severity of the salt mist test shall be chosen according to
the atmospheric conditions prevailing in the place where the installation of the PV modules is
intended. Severity (2) is not suitable for PV modules as testing conditions are too weak (it is
intended for products exposed to corrosive environments from time to time that are normally
protected by an enclosure) and should be avoided when applying this Standard. During
testing the face of the PV module normally exposed to solar irradiance shall be inclined 15° to
30° from vertical inside the salt fog chamber. The module can be placed vertically in the
humidity chamber used for the humidity storage portion of the test.
8 Cleaning and recovery
After the salt mist test all samples shall be washed to remove the adherent salt using running
tap water (not artificially pressurised) for a maximum time of 5 min per square metre of area
of the sample. Once the washing is finished distilled or demineralized water shall be used to
rinse the samples, followed by complete drying at room temperature. To accelerate drying it is
allowed to shake the test sample by hand or to use air blasts with the aid of a fan. The
temperature of the water used for washing shall not exceed 35 °C. During cleaning or drying
the use of cloths, gauzes or any other woven material shall be avoided and no scraping is
allowed. After drying, the recovery time shall be minimised and the applicable testing
sequence shall be continued as soon as possible to avoid further damage produced by salt
depositions.
61701 © IEC:2011 – 9 –
9 Final measurements
9.1 After the salt mist test the test samples shall be subjected to the following tests
depending on the PV module technology.
9.2 Crystalline silicon. The test order is included in Figure 1.
– Tests according to IEC 61215:
a) 10.2: Maximum power determination
b) 10.15: Wet leakage current test
– Tests according to IEC 61730-2:
c) MST 01: Visual inspection
d) MST 13: Ground continuity test
e) MST 16: Dielectric withstand test
NOTE The reference before each test corresponds to its identification in the relevant IEC Standard.
– Test according to this Standard:
f) Bypass diode functionality test
9.3 Thin-film technologies. The test order is included in Figure 2.
– Tests according to IEC 61646:
a) 10.6: Performance at STC (not NOCT)
b) 10.15: Wet leakage current test
c) 10.19: Light soaking
– Tests according to IEC 61730-2
d) MST 01: Visual inspection
e) MST 13: Ground continuity test
f) MST 16: Dielectric withstand test
NOTE The reference before each test corresponds to its identification in the relevant IEC Standard.
– Test according to this Standard:
g) Bypass diode functionality test
9.4 Concentrator photovoltaic (CPV) module. The test order is included in Figure 3.
– Tests according to IEC 62108:
a) 10.1: Visual inspection
b) 10.2: Electrical performance measurement
c) 10.3: Ground path continuity test
d) 10.4: Electrical insulation test
e) 10.5: Wet insulation test
NOTE The reference before each test corresponds to its identification in IEC 62108.
– Test according to this Standard:
f) Bypass diode functionality test
– 10 – 61701 © IEC:2011
10 Requirements
10.1 General
The following requirements shall be fulfilled by the two PV samples that undergo the testing
sequences included in Figures 1, 2 or 3:
10.2 Crystalline silicon
– After the salt mist test there shall be no evidence of major visual defects as described in
IEC 61730-2 including also no mechanical deterioration or corrosion of module
components which would significantly impair their function during their intended life.
– After the salt mist test the maximum power shall not decrease by more than 5 % of the
initial value.
NOTE The pass/fail criteria should consider the laboratory uncertainty of measurement.
– All pass fail criteria corresponding to tests 10.15, MST 13 and MST 16 shall be fulfilled
according to what is specified in IEC 61215 and IEC 61730-2 for these specific tests.
– The requirement for the bypass diode functionality test shall be also fulfilled.
10.3 Thin-film technologies
– After the salt mist test there shall be no evidence of major visual defects as described in
IEC 61730-2 including also no mechanical deterioration or corrosion of module
components which would significantly impair their function during their intended life.
– After the light soaking the maximum power at Standard Test Conditions (STC) shall not be
less than 90 % of the minimum value specified by the manufacturer in the marking of the
PV module.
NOTE 1 The pass/fail criteria should consider the laboratory uncertainty of measurement.
– All pass fail criteria corresponding to tests 10.15, 10.19, MST 13 and MST 16 shall be
fulfilled according to what is specified in IEC 61646 and IEC 61730-2 for these specific
tests.
NOTE 2 In the case of the requirements corresponding to test 10.19 (light soaking) MST 01 of IEC 61730-2
should be applied instead of test 10.1 of IEC 61646 and MST 16 of IEC 61730-2 should be applied instead of test
10.3 of IEC 61646.
– The requirement for the bypass diode functionality test shall be also fulfilled.
10.4 Concentrator photovoltaic (CPV) modules
– After the salt mist test there shall be no evidence of major visual defects as described in
IEC 62108 including also no mechanical deterioration or corrosion of test sample
components which would significantly impair their function during their intended life. No
significant amount of water should remain inside the test sample after the salt mist test
(the depth of the remaining water should not reach any electrically active parts in any
possible position).
– After the salt mist test the relative power degradation shall not exceed 7 % if the I-V
measurement is under outdoor natural sunlight, or 5 % if the I-V measurement is under
solar simulator.
NOTE The pass/fail criteria should consider the laboratory uncertainty of measurement.
– All pass fail criteria corresponding to tests 10.3, 10.4 and 10.5 shall be fulfilled according
to what is specified in IEC 62108 for these specific tests.
– The requirement for the bypass diode functionality test shall be also fulfilled.
61701 © IEC:2011 – 11 –
11 Test report
A test report with measured performance characteristics and test results shall be prepared by
the test agency in accordance with ISO/IEC 17025. The test report shall contain the following
data:
a) a title;
b) name and address of the test laboratory and location where the tests were carried out;
c) unique identification of the certification or report and of each page, and a clear
identification of the purpose of the test report;
d) name and address of client, where appropriate;
e) reference to sampling procedure, where relevant;
f) date of receipt of test items and date(s) of test, where appropriate;
g) description and identification of the items tested. If the test has been made on
representative samples and not on the full-size samples this has to be clearly indicated;
h) characterization and condition of the test items;
i) identification of test method used;
j) characteristics of the salt solution used;
k) severity applied for the salt mist test according to IEC 60068-2-52;
l) any deviations from, additions to or exclusions from the test method, and any other
information relevant to a specific test, such as environmental conditions;
m) measurements, examinations and derived results supported by tables, graphs, sketches
and photographs as appropriate including any failures observed;
n) a statement of the estimated uncertainty of the test results (where relevant);
o) a signature and title, or equivalent identification of the person(s) accepting responsibility
for the content of the certificate or report, and the date of issue;
p) where relevant, a statement to the effect that the results relate only to the items tested;
q) a statement that the report shall not be reproduced except in full, without the written
approval of the laboratory.
A copy of this report shall be kept by the laboratory and manufacturer for reference purposes.
– 12 – 61701 © IEC:2011
3 modules
Preconditioning
MST 01
Visual inspection
10.2
Maximum power determination
MST 16
Dielectric withstand test
10.15
Wet leakage current test
MST 13
Ground continuity test
2 modules
1 module
Salt mist test according to any one of the severities included in IEC 60068-2-52, except severity 2
Cleaning and recovery
MST 01
Visual inspection
10.2
Maximum power determination
C
o
MST 16
n
Dielectric withstand tes t
t
r
o
l
10.15
Wet leakage current test
MST 13
Ground continuity test
Bypass diode functionality test
IEC 2751/11
NOTE 1 Preconditioning and tests 10.2 and 10.15 are taken from IEC 61215. Tests MST 01, MST 13 and MST 16 are taken
from IEC 61730-2.
NOTE 2 The control module should be used as a check every time the test modules are measured to evaluate the effect of
the salt mist test.
Figure 1 – Salt mist corrosion testing sequence for crystalline silicon PV modules
61701 © IEC:2011 – 13 –
3 modules
MST 01
Visual inpection
10.2
Maximum power determination
MST 16
Dielectric withstand test
10.15
Wet leakage current test
MST 13
Ground continuity test
2 modules
Salt mist test according to any one of the severities included in IEC 60068-2-52, except severity 2
1 module
Cleaning and recovery
MST 01
Visual inspection
MST 16
Dielectric withstand test
10.15
C
Wet leakage current test
o
n
t
r
MST 13
o
Ground continuity test
l
Bypass diode functionality test
10.19
Light soaking
10.6
Performance at STC (not NOCT)
IEC 2752/11
NOTE 1 Tests 10.2, 10.6, 10.15 and 10.19 are taken from IEC 61646. Tests MST 01, MST 13 and MST 16 are taken from
IEC 61730-2.
NOTE 2 The control module should be used as check every time the test modules are measured to evaluate the effect of
the salt mist test.
NOTE 3 Maximum power determination after salt mist test according to test 10.2 of IEC 61646 could eventually be made
for diagnostic purpose only.
NOTE 4 Test 10.6 is performed as a part of the requirements corresponding to test 10.19 a described in IEC 61646. For
the remaining requirements use test MST 01 instead of 10.1 and MST 16 instead of 10.3.
Figure 2 – Salt mist corrosion testing sequence for thin-film PV modules
– 14 – 61701 © IEC:2011
3 modules (m) (for CPV modules)
3 receivers (r) + 3 mirrors (mir) (for CPV assemblies)
Preconditioning
10.1
3m
Visual inspection
3r + 3mir
10.2
3m
Electrical performance measurement
3r + 3mir
10.4 3m
Electrical insulation test 3r + 3mir
10.5 3m
Wet insulation test 3r + 3mir
10.3 3m
Ground path continuity test 3r + 3mir
1m (for CPV modules) 2m (for CPV modules)
1r + 1mir (for CPV assemblies) 2r + 2mir (for CPV assemblies)
2m
Salt mist test according to any one of the severities included in IEC 60068-2-52, except severity 2
2r + 2mir
Cleaning and recovery
10.1 2m
Visual inspection 2r + 2mir
10.2
2m
Electrical performance measurement
2r + 2mir
C
o
10.4
n 2m
t Electrical insulation test 2r + 2mir
r
o
10.5
l 2m
Wet insulation test
2r + 2mir
10.3
2m
Ground path continuity test
2r + 2mir
2m
Bypass diode functionality test
2r
IEC 2753/11
NOTE 1 Tests 10.1, 10.2, 10.3, 10.4 and 10.5 are taken from IEC 62108.
NOTE 2 The control sample should be used as a check every time the test sample are measured to evaluate the effect
of the salt mist test.
Figure 3 – Salt mist corrosion testing sequence
for concentrator photovoltaic (CPV) modules
____________
– 16 – 61701 © CEI:2011
SOMMAIRE
AVANT-PROPOS . 17
1 Domaine d’application et objet . 19
2 Références normatives . 19
3 Echantillons . 20
4 Procédures d’essai . 20
4.1 Généralités. 20
4.2 Essai de fonctionnalité des diodes de dérivation . 21
4.2.1 But . 21
4.2.2 Appareillage . 21
4.2.3 Procédure . 21
4.2.4 Exigences . 21
5 Préconditionnement . 21
6 Mesures initiales . 22
7 Procédure d’essai au brouillard salin . 22
8 Nettoyage et rétablissement . 23
9 Mesures finales . 23
10 Exigences . 24
10.1 Généralités. 24
10.2 Silicium cristallin . 24
10.3 Technologies de type couches minces . 24
10.4 Modules photovoltaïques à concentration . 25
11 Rapport d’essai . 25
Figure 1 – Séquence d'essais de corrosion au brouillard salin pour des modules
photovoltaïques (PV) au silicium cristallin . 27
Figure 2 – Séquence d'essais de corrosion au brouillard salin pour des modules
photovoltaïques (PV) en couches minces . 28
Figure 3 – Séquence d'essais de corrosion au brouillard salin pour des modules
photovoltaïques à concentration (CPV) . 29
61701 © CEI:2011 – 17 –
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
ESSAI DE CORROSION AU BROUILLARD SALIN
DES MODULES PHOTOVOLTAÏQUES (PV)
AVANT-PROPOS
1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation
composée de l'ensemble des comités électrotechniques nationaux (Comités nationaux de la CEI). La CEI a
pour objet de favoriser la coopération internationale pour toutes les questions de normalisation dans les
domaines de l'électricité et de l'électronique. A cet effet, la CEI – entre autres activités – publie des Normes
internationales, des Spécifications techniques, des Rapports techniques, des Spécifications accessibles au
public (PAS) et des Guides (ci-après dénommés "Publication(s) de la CEI"). Leur élaboration est confiée à des
comités d'études, aux travaux desquels tout Comité national intéressé par le sujet traité peut participer. Les
organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent
également aux travaux. La CEI collabore étroitement avec l'Organisation Internationale de Normalisation (ISO),
selon des conditions fixées par accord entre les deux organisations.
2) Les décisions ou accords officiels de la CEI concernant les questions techniques représentent, dans la mesure
du possible, un accord international sur les sujets étudiés, étant donné que les Comités nationaux de la CEI
intéressés sont représentés dans chaque comité d’études.
3) Les Publications de la CEI se présentent sous la forme de recommandations internationales et sont agréées
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5) La CEI elle-même ne fournit aucune attestation de conformité. Des organismes de certification indépendants
fournissent des services d'évaluation de conformité et, dans certains secteurs, accèdent aux marques de
conformité de la CEI. La CEI n'est responsable d'aucun des services effectués par les organismes de
certification indépendants.
6) Tous les utilisateurs doivent s'assurer qu'ils sont en possession de la dernière édition de cette publication.
7) Aucune responsabilité ne doit être imputée à la CEI, à ses administrateurs, employés, auxiliaires ou
mandataires, y compris ses experts particuliers et les membres de ses comités d'études et des Comités
nationaux de la CEI, pour tout préjudice causé en cas de dommages corporels et matériels, ou de tout autre
dommage de quelque nature que ce soit, directe ou indirecte, ou pour supporter les coûts (y compris les frais
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8) L'attention est attirée sur les références normatives citées dans cette publication. L'utilisation de publications
référencées est obligatoire pour une application correcte de la présente publication.
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l’objet de droits de brevet. La CEI ne saurait être tenue pour responsable de ne pas avoir identifié de tels droits
de brevets et de ne pas avoir signalé leur existence.
La Norme internationale CEI 61701 a été établie par le comité d'études 82 de la CEI:
Systèmes de conversion photovoltaïque de l'énergie solaire.
Cette deuxième édition annule et remplace la première édition publiée en 1995.
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