IEC 60794-1-1:2011/COR1:2012
(Corrigendum)Corrigendum 1 - Optical fibre cables - Part 1-1: Generic specification - General
Corrigendum 1 - Optical fibre cables - Part 1-1: Generic specification - General
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Standards Content (Sample)
IEC 60794-1-1
rd
(3 edition – 2011)
Optical fibre cables –
Part 1-1: Generic specification – General
CORRIGENDUM 1
Replace items b) and c) of the Foreword with the following:
b) the informative Annexes A “Guide to the installation of optical fibre cables” and B
“Guide to hydrogen effect
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a) direct far-field (DFF);
b) variable aperture in the far-field (VAMFF);
c) near-field (NF).
The reference method, used to resolve disputes, is method A, direct far-field.
Effective area is an optical attribute that is specified for single-mode fibres and used in system designs probably affected by the non-linear refractive index coefficient, n2. There is agreement in both national and international standards bodies concerning the definition used in this document. Methods A, B, and C have been recognised as providing equivalent results, provided that good engineering is used in implementation.
The direct far-field is the reference method because it is the most direct method and is named as the reference method for mode field diameter in IEC 60793-1-45 and ITU-T Recommendation G.650.1.
A mapping function is a formula by which the measured results of one attribute are used to predict the value of another attribute on a given fibre. For a given fibre type and design, the mode field diameter (MFD) (IEC 60793-1-45) can be used to predict the effective area with a mapping function. A mapping function is specific to a particular fibre type and design. Mapping functions are generated by doing an experiment in which a sample of fibre is chosen to represent the spectrum of values of MFD and in which the fibres in the sample are measured for both MFD and Aeff. Linear regression can be used to determine the fitting coefficient, k, as defined by the following:
NOTE 1 Other mathematical models can be used if they are generally more accurate.
NOTE 2 See Annex E for more information.
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NOTE See IEC 60794‑1‑2 for a reference guide to test methods of all types and for general requirements and definitions.
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