prEN ISO 14880-3

SLOVENSKI STANDARD
01-junij-2023
Optika in fotonska tehnologija - Vrste mikroleč - 3. del: Preskusne metode za
optične lastnosti, razen odstopanja valovne fronte (ISO/DIS 14880-3:2023)
Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties
other than wavefront aberrations (ISO/DIS 14880-3:2023)
Optik und Photonik - Mikrolinsenarrays - Teil 3: Prüfverfahren für optische Eigenschaften
außer Wellenfrontaberrationen (ISO/DIS 14880-3:2023)
Optique et photonique - Réseaux de microlentilles - Partie 3: Méthodes d'essai pour les
propriétés optiques autres que les aberrations du front d'onde (ISO/DIS 14880-3:2023)
Ta slovenski standard je istoveten z: prEN ISO 14880-3
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

DRAFT INTERNATIONAL STANDARD
ISO/DIS 14880-3
ISO/TC 172/SC 9 Secretariat: DIN
Voting begins on: Voting terminates on:
2023-04-11 2023-07-04
Optics and photonics — Microlens arrays —
Part 3:
Test methods for optical properties other than wavefront
aberrations
Optique et photonique — Réseaux de microlentilles —
Partie 3: Méthodes d'essai pour les propriétés optiques autres que les aberrations du front d'onde
ICS: 31.260
This document is circulated as received from the committee secretariat.
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENT AND APPROVAL. IT IS
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THEREFORE SUBJECT TO CHANGE AND MAY
NOT BE REFERRED TO AS AN INTERNATIONAL
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Reference number
NATIONAL REGULATIONS.
ISO/DIS 14880-3:2023(E)
RECIPIENTS OF THIS DRAFT ARE INVITED
TO SUBMIT, WITH THEIR COMMENTS,
NOTIFICATION OF ANY RELEVANT PATENT
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PROVIDE SUPPORTING DOCUMENTATION. © ISO 2023

ISO/DIS 14880-3:2023(E)
DRAFT INTERNATIONAL STANDARD
ISO/DIS 14880-3
ISO/TC 172/SC 9 Secretariat: DIN
Voting begins on: Voting terminates on:

Optics and photonics — Microlens arrays —
Part 3:
Test methods for optical properties other than wavefront
aberrations
Optique et photonique — Réseaux de microlentilles —
Partie 3: Méthodes d'essai pour les propriétés optiques autres que les aberrations du front d'onde
ICS: 31.260
This document is circulated as received from the committee secretariat.
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENT AND APPROVAL. IT IS
© ISO 2023
ISO/CEN PARALLEL PROCESSING
THEREFORE SUBJECT TO CHANGE AND MAY
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
NOT BE REFERRED TO AS AN INTERNATIONAL
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on STANDARD UNTIL PUBLISHED AS SUCH.
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
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Reference number
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NATIONAL REGULATIONS.
Website: www.iso.org ISO/DIS 14880-3:2023(E)
RECIPIENTS OF THIS DRAFT ARE INVITED
Published in Switzerland
TO SUBMIT, WITH THEIR COMMENTS,
NOTIFICATION OF ANY RELEVANT PATENT
RIGHTS OF WHICH THEY ARE AWARE AND TO
ii
PROVIDE SUPPORTING DOCUMENTATION. © ISO 2023

ISO/DIS 14880-3:2023(E)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Substrate test . 1
5 Microscope test method .1
5.1 Principle . 1
5.2 Measurement arrangement and test equipment . 2
5.2.1 General . 2
5.2.2 Test system . 3
6 Procedure .4
6.1 General . 4
6.2 Measurement of effective back or front focal length . 4
6.3 Measurement of chromatic aberration . 4
6.4 Measurement of the uniformity of the focal spot positions . 5
7 Results and uncertainties . 5
8 Coupling efficiency, imaging quality.6
9 Test report . 6
Annex A (informative) Measurements with wavefront measuring systems .8
Annex B (informative) Confocal measurement of effective backor front focal length of lens
array .10
Annex C (informative) Coupling efficiency, imaging quality .12
Annex D (normative) Measurement of the uniformity of the focal spot positionsof a
microlens array .13
Bibliography .14
iii
ISO/DIS 14880-3:2023(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to
the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 172, Optics and Photonics, Subcommittee
SC 09, Laser and electro-optical systems.
This second edition cancels and replaces the first edition (ISO 14880-3:2006), which has been
technically revised.
The main changes are as follows:
— Introduction revised.
— Reference documents and numbering updated.
A list of all parts in the ISO 14880 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
ISO/DIS 14880-3:2023(E)
Introduction
This document specifies methods of testing optical properties, other than wavefront aberrations, of
microlens arrays. Examples of applications for microlens arrays include three-dimensional displays,
coupling optics associated with arrayed light sources and photo-detectors, enhanced optics for liquid
[12][13][15][16]
crystal displays, and optical parallel processor elements .
The testing of microlenses is in principle similar to testing any other lens. The same parameters need
to be measured and similar techniques used. However, in many cases the measurement of very small
lenses presents practical problems which make it difficult to use the standard equipment that is
[15][16]
available for testing normal size lenses .
The market in microlens arrays has generated a need for agreement on basic terminology and test
methods. Standard terminology and clear definitions are needed not only to promote applications
but also to encourage scientists and engineers to exchange ideas and new concepts based on common
understanding.
This document contributes to the purpose of the series of ISO 14880 standards which is to improve the
compatibility and interchangeability of lens arrays from different suppliers and to enhance development
of the technology using microlens arrays.
Characteristic parameters are defined and examples of applications given in ISO 14880-1, Vocabulary.
It has been completed by a set of three other International Standards, i.e. Part 2, Test methods for
wavefront aberrations, Part 3, Test methods for optical properties other than wavefront aberrations and
Part 4, Test methods for geometrical properties.
This document describes the measurement of 1) focal length, 2) coupling efficiency, 3) imaging quality
and 4) focal spot positions.
The focal length of the microlens is defined more precisely in 14880-1 as effective back (front) focal
length.
The measurement of effective back (front) focal length is described in the body of this part of ISO 14880
and the use of an alternative technique, interferometry, is described in Annex A.
Measurement of the focal length of an array of microlenses, using a confocal technique, is described in
the main body and Annex B.
Coupling efficiency and imaging quality are discussed in Annex C.
Measurement of the focal spot positions of an array of microlenses in parallel, using the Shack-Hartmann
technique, is described in Annex D.
Wavefront aberrations and characteristics other than optical properties are specified in ISO 14880-2
and ISO 14880-4 and ISO/TR 14880-5.
v
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