CEN/TS 17010:2016

SLOVENSKI STANDARD
01-februar-2017
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Nanotechnologies - Guidance on measurands for characterising nano-objects and
materials that contain them
Nanotechnologien - Leitfaden über Messgrößen zur Charakterisierung von Nanoobjekten
und von Werkstoffen, die welche enthalten
Nanotechnologies - Guide sur les mesurandes pour la caractérisation de nano-objects et
des matériaux les contenant
Ta slovenski standard je istoveten z: CEN/TS 17010:2016
ICS:
07.120 Nanotehnologije Nanotechnologies
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

CEN/TS 17010
TECHNICAL SPECIFICATION
SPÉCIFICATION TECHNIQUE
December 2016
TECHNISCHE SPEZIFIKATION
ICS 07.120
English Version
Nanotechnologies - Guidance on measurands for
characterising nano-objects and materials that contain
them
Nanotechnologies - Guide sur les mesurandes pour la Nanotechnologien - Leitfaden über Messgrößen zur
caractérisation de nano-objects et des matériaux les Charakterisierung von Nanoobjekten und von
contenant Werkstoffen, die welche enthalten
This Technical Specification (CEN/TS) was approved by CEN on 12 October 2016 for provisional application.

The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to
submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard.

CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS
available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in
parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2016 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN/TS 17010:2016 E
worldwide for CEN national Members.

Contents Page
European foreword . 7
Introduction . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
3.1 General core terms . 10
3.2 Measurand terms . 10
4 Symbols and abbreviations . 15
5 Approaches to identify measurands to characterize nano-objects and their agglomerates
and aggregates, and materials containing nano-objects . 17
5.1 Method . 17
5.2 Types of measurands . 17
5.3 State of nano-objects . 18
Table 1 —Different states of Nano-objects . 18
6 Measurands related to size and shape measurement of nano-objects and their
agglomerates and aggregates . 18
6.1 Introduction . 18
6.2 Measurands related to size and shape measurement . 19
6.3 Measurands related to size and shape measurement in aerosols . 19
6.3.1 Overview . 19
Table 2 — Measurands related to the size and shape measurement in aerosols . 20
6.3.2 General relevant standard . 21
6.3.3 Electrical low-pressure impaction (ELPI) . 21
6.3.4 Cascade impactors . 22
6.3.5 Differential mobility analysing system (DMAS) . 22
6.3.6 Relevant standards . 22
6.3.7 Optical Particulate Counters (OPC) . 23
6.3.8 Relevant standards . 23
6.3.9 Aerodynamic Particle Sizing (APS) . 23
6.3.10 Transmission electron microscopy (TEM) combined with TEM grid samplers . 23
6.3.11 Relevant standards . 24
6.3.12 Scanning electron microscopy (SEM). 24
6.3.13 Relevant standards . 24
6.4 Measurands related to size and shape measurement in powders . 25
6.4.1 Overview . 25
Table 3 — Measurands related to the size and shape measurement in powders . 25
6.4.2 Relevant standards . 26
6.4.3 Scanning electron microscopy (SEM). 26
6.4.4 Relevant standards . 26
6.4.5 Gas adsorption, the BET method . 26
6.4.6 Relevant standards . 26
6.4.7 Laser diffraction (LD) . 26
6.4.8 Relevant standards . 27
6.4.9 X-ray diffraction (XRD) . 27
6.4.10 Relevant standards . 27
6.4.11 Raman spectroscopy . 27
6.5 Measurands related to size and shape measurements of nano-objects in liquid dispersions
............................................................................................................................................................................. 27
6.5.1 Overview . 27
Table 4 — Measurands related to the size and shape measurement in liquids . 28
6.5.2 Centrifugal liquid sedimentation (CLS) . 29
6.5.3 Relevant standards . 29
6.5.4 Dynamic light scattering (DLS) . 30
6.5.5 Relevant standards . 30
6.5.6 Laser diffraction (LD) . 30
6.5.7 Relevant standards . 30
6.5.8 Small angle X-ray scattering (SAXS) . 30
6.5.9 Relevant standards . 31
6.5.10 Particle tracking analysis (PTA) . 31
6.5.11 Relevant standards . 31
6.5.12 Electron microscopy . 31
6.6 Measurands related to size and shape measurement on surfaces (microscopy techniques)
............................................................................................................................................................................. 31
6.6.1 Overview . 31
Table 5 — Measurands related to the size and shape measurement on surfaces . 32
6.6.2 Scanning electron microscopy (SEM) . 32
6.6.3 Atomic force microscopy (AFM) . 32
6.6.4 Relevant standards . 33
7 Measurands related to chemical analysis of nano-objects and their agglomerates and
aggregates . 33
7.1 Introduction . 33
7.2 Measurands related to surface chemical analysis of nano-objects and their agglomerates
and aggregates . 34
7.2.1 Measurands . 34
Table 6 — Measurands related to the surface chemical analysis of nano-objects and their
agglomerates and aggregates . 34
7.2.2 Auger electron spectroscopy (AES) . 35
7.2.3 Relevant standards . 35
7.2.4 Electron energy loss spectroscopy (EELS) . 36
7.2.5 Relevant standards . 36
7.2.6 Secondary ion mass spectroscopy (SIMS) . 36
7.2.7 Relevant standards . 36
7.2.8 X-ray fluorescence spectroscopy (XRF) . 36
7.2.9 Relevant standards . 37
7.2.10 X-ray diffraction (XRD) . 37
7.2.11 Relevant standards . 37
7.2.12 X-ray photoelectron spectroscopy (XPS) . 38
7.2.13 Relevant standards . 38
7.2.14 Energy dispersive X-ray spectroscopy (EDS or EDX) . 38
7.3 Measurands related to the chemical analysis of nano-objects as bulk samples . 39
7.3.1 Measurands . 39
Table 7 — Measurands related to the chemical analysis of nano-objects and their agglomerates
and aggregates . 39
7.3.2 Differential scanning calorimetry (DSC) . 41
7.3.3 Relevant standards . 41
7.3.4 Fourier transform infrared spectroscopy (FTIR) . 41
7.3.5 Relevant standards . 42
7.3.6 Thermal analysis with evolved gas analyser (EGA) plus FTIR or QMS . 42
7.3.7 Relevant standards . 42
7.3.8 Ultraviolet–visible spectroscopy (UV-Vis) . 42
7.3.9 Relevant standards . 43
7.3.10 Raman spectroscopy . 43
7.3.11 Inductively coupled plasma (ICP) techniques . 43
7.3.12 Contact Angle . 43
8 Measurands related to mass and density . 43
8.1 Introduction . 43
8.2 Aerosols . 44
8.2.1 Measurands . 44
Table 8 — Measurands associated with mass and density measurement of nano-objects in an
aerosol . 44
8.2.2 Relevant standards . 44
8.2.3 Aerosol particle mass analyser (APM) . 44
8.2.4 Time of flight mass spectrometry . 44
8.3 Powders . 45
8.3.1 Measurands . 45
Table 9 — Measurands associated with mass and density measurement of nano-objects in
powder form . 45
8.3.2 Pycnometry . 45
8.3.3 Relevant standards . 45
8.4 Liquid dispersions . 45
8.4.1 Measurands . 45
Table 10 — Measurands related to mass and density for nano-objects in liquid dispersions. 46
8.4.2 Relevant standards . 46
8.4.3 Centrifugal liquid sedimentation (Isopycnic method) . 46
8.4.4 Static light scattering (SLS) . 47
8.4.5 Resonant mass measurement (RMM) . 47
9 Measurands related to charge - Liquid dispersions . 47
9.1 Measurands . 47
Table 11 — Measurands related to charge . 47
9.2 Relevant standards . 48
9.3 Electrophoretic light scattering . 48
9.4 Electroaccoustic phenomena measurements . 48
10 Measurands related to crystallinity . 48
10.1 Measurands . 48
Table 12 — Measurands related to crystallinity . 49
10.2 Small-angle/wide-angle X-ray scattering (SAXS/WAXS) . 50
10.3 X-ray diffraction (XRD) . 50
10.4 Scanning/ electron microscopy (SEM) . 50
10.5 High-resolution transmission electron microscopy (HRTEM) . 51
10.6 Electron diffraction . 51
10.7 Neutron diffraction . 51
10.8 Electron backscatter diffraction (EBSD) . 51
10.9 Reflection high-energy electron diffraction (RHEED) and low-energy electron diffraction
(LEED). 51
10.10 Differential scanning calorimetry (DSC) . 52
10.11 Nuclear magnetic resonance (NMR) crystallography . 52
10.12 Raman crystallography . 52
10.13 Relevant standards . 52
11 Optical properties measurands . 52
11.1 Introduction . 52
11.2 Measurands . 52
Table 13 — Measurands for optical properties . 53
11.3 Spectroscopy techniques. 53
11.4 Relevant standards . 54
12 Electrical and electronic measurands . 54
12.1 Measurands . 54
Table 14 — Measurands related to electrical and electronic measurements. 55
12.2 Techniques . 56
12.2.1 2 or 4 point conductance measurements . 56
12.2.2 Angle-resolved ultraviolet photoemission spectroscopy (ARPES) . 56
12.2.3 Scanning tunnelling microscopy (STM) . 56
12.2.4 Conductive atomic force microscopy . 56
12.2.5 Piezoforce microscopy (PFM) . 56
13 Magnetic measurands . 57
13.1 Introduction . 57
13.2 Measurands . 57
Table 15 —Measurands related to magnetic properties of solid nano-composite materials . 57
13.3 Techniques . 58
13.3.1 Superconducting quantum interference device (SQUID) . 58
13.3.2 Vibrating sample magnetometer (VSM) . 59
13.3.3 Mössbauer spectroscopy . 59
13.3.4 Electron paramagnetic resonance (EPR) spectroscopy . 59
13.3.5 Magneto-optical Kerr-effect (MOKE) . 59
13.3.6 Magnetic force microscopy (MFM) . 59
13.3.7 Scanning Hall effect microscopy . 59
13.3.8 Spin-polarized scanning tunnelling microscopy (SP-STM) . 60
13.3.9 Relevant standards . 60
14 Thermal measurands . 60
14.1 Measurands . 60
Table 16 — Measurands related to thermal properties . 61
14.2 Techniques . 61
14.2.1 Measurement of specific heat capacity . 61
14.2.2 Scanning thermal microscopy (SThM) . 61
15 Other performance related measurands. 62
15.1 Introduction . 62
15.2 Powders - Dustiness . 62
Table 17 — Measurands related to Dustiness . 62
15.3 Liquid dispersions . 63
15.3.1 Introduction . 63
Table 18 — Measurands related to properties of suspension of nano-objects in liquids . 63
15.3.2 Viscosity . 63
15.3.3 Dispersibility . 65
15.3.4 Relevant standards . 65
15.3.5 Solubility and rate of dissolution . 65
15.3.6 Relevant standards . 66
15.4 Mechanical properties . 66
15.4.1 Introduction . 66
Table 19 — Measurands related to mechanical properties of solid nano-composite materials . 67
15.4.2 Measurement of elastic constants by static methods. 68
15.4.3 Relevant standards . 68
15.4.4 Measurement of elastic constants by dynamic methods . 68
15.4.5 Relevant standards . 68
15.4.6 Measurement of elastic and plastic properties by instrumented indentation methods . 68
15.4.7 Relevant standards . 69
15.4.8 Measurement of surface properties and wear . 69
15.4.9 Relevant standards . 69
Bibliography . 70

European foreword
This document (CEN/TS 17010:2016) has been prepared by Technical Committee CEN/TC 352
“Nanotechnologies”, the secretariat of which is held by AFNOR.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document has been prepared under a mandate given to CEN by the European Commission and the
European Free Trade Association.
According to the CEN/CENELEC Internal Regulations, the national standards organisations of the following
countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria, Croatia, Cyprus,
Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Introduction
The term “nano-object” applies to materials having one, two or three external dimensions in the nanoscale
(therefore in the range of approximately 1 to 100 nanometres). Specific properties of nano-objects are usually
exhibited in this size range, even if they do not disappear abruptly beyond these limits. Nano-objects, either
natural or manufactured, can then be found in the form of nanoplates (one dimension in the nanoscale),
nanofibres (two dimensions, or the diameter, in the nanoscale), and nanoparticles (three dimensions in the
nanoscale). Nano-objects exhibit higher specific surface areas than larger objects. They are particularly prone
to aggregation and agglomeration phenomena due to attractive interactions during their life cycle.
There is increasing use of nano-objects in research and development, industry and commercial applications.
Characterization of nano-objects, and their agglomerates and aggregates (sometimes referred to as NOAA)
plays an essential role in basic and applied research, through process and product quality control and
commercialization to health and environmental protection. Characterization of nano-objects is key to
determine their properties, performance and life-time. The methods available for characterization of larger
scale materials are often difficult to apply to nano-objects, sometimes due to restrictions of the test systems
(e.g. low sensitivity, inadequate resolution of equipment). This has resulted in new techniques and adapting
old methods.
One definition of “measurand” used in many ISO standards is the “quantity intended to be measured”. In
nanotechnologies measurement and characterization this “intended quantity” could be size, shape, chemical
composition, surface charge, etc. However, in reality, an instrument does not always directly measure this
fundamental characteristic but measures something else, which is ultimately related to the intended quantity.
This Technical Specification (TS) describes and defines the measurands, both the overarching intended
measurands and those actually measured by the instruments, in order to elucidate which measurements can
be compared with each other and under which conditions and assumptions. The Technical Specification is
split into ten main clauses covering:
— Size and shape (see Clause 6);
— Chemical analysis (see Clause 7);
— Mass and density (see Clause 8);
— Charge (see Clause 9);
— Crystallinity (see Clause 10);
— Optical (see Clause 11);
— Electrical and electronic (see Clause 12);
— Magnetic (see Clause 13);
— Thermal (see Clause 14);
— Other performance related measurands (see Clause 15).
1 Scope
This Technical Specification provides guidelines for the identification of measurands to characterize nano-
objects, and their agglomerates and aggregates and to assess specific properties relevant to the performance
of materials that contain them. It provides guidance for relevant and reliable measurement.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
EN 481:1993, Workplace atmospheres - Size fraction definitions for measurement of airborne particles
EN ISO 3219:1994, Plastics - Polymers/resins in the liquid state or as emulsions or dispersions - Determination
of viscosity using a rotational viscometer with defined shear rate (ISO 3219:1993)
EN ISO 6892-1:2016, Metallic materials - Tensile testing - Part 1: Method of test at room temperature (ISO
6892-1:2016)
CEN ISO/TS 12025:2015, Nanomaterials - Quantification of nano-object release from powders by generation of
aerosols (ISO/TS 12025:2012)
EN ISO 14577-1:2015, Metallic materials - Instrumented indentation test for hardness and materials
parameters - Part 1: Test method (ISO 14577-1:2015)
EN ISO 14577-2:2015, Metallic materials - Instrumented indentation test for hardness and materials
parameters - Part 2: Verification and calibration of testing machines (ISO 14577-2:2015)
EN ISO 14577-3:2015, Metallic materials - Instrumented indentation test for hardness and materials
parameters - Part 3: Calibration of reference blocks (ISO 14577-3:2015)
EN ISO 14577-4:2007, Metallic materials - Instrumented indentation test for hardness and materials
parameters - Part 4: Test method for metallic and non-metallic coatings (ISO 14577-4:2007)
EN 15051-1:2013, Workplace exposure - Measurement of the dustiness of bulk materials - Part 1: Requirements
and choice of test methods
EN 15051-2:2013, Workplace exposure - Measurement of the dustiness of bulk materials - Part 2: Rotating drum
method
EN 15051-3:2013, Workplace exposure - Measurement of the dustiness of bulk materials - Part 3: Continuous
drop method
CEN ISO/TS 80004-1:2015, Nanotechnologies - Vocabulary - Part 1: Core terms (ISO/TS 80004-1:2015)
ISO/TS 80004-2:2015, Nanotechnologies - Vocabulary - Part 2: Nano-objects
CEN ISO/TS 80004-6:2015, Nanotechnologies - Vocabulary - Part 6: Nano-object characterization (ISO/TS
80004-6:2013)
3 Terms and definitions
For the purposes of this document, the terms and definitions given in CEN ISO/TS 80004-1:2015,
ISO/TS 80004-2:2015 and CEN ISO/TS 80004-6:2015 and the following apply.
3.1 General core terms
3.1.1
nanoscale
size range from approximately 1 nm to 100 nm
Note 1 to entry: Properties that are not extrapolations from a larger size will typically, but not exclusively, be
exhibited in this size range. For such properties the size limits are considered approximate.
Note 2 to entry: The lower limit in this definition (approximately 1 nm) is introduced to avoid single and small groups
of atoms from being designated as nano-objects (3.1.2) or elements of nanostructures, which might be implied by the
absence of a lower limit.
[SOURCE: CEN ISO/TS 80004-6:2015, 2.1]
3.1.2
nano-object
material with one, two or three external dimensions in the nanoscale (3.1.1)
Note 1 to entry: Generic term for all discrete nanoscale objects.
[SOURCE: CEN ISO/TS 80004-6:2015, 2.2]
3.1.3
agglomerate
collection of weakly bound particles (CEN ISO/TS 80004-6:2015, 2.9) or aggregates (3.1.4) or mixtures of the
two where the resulting external surface area is similar to the sum of the surface areas of the individual
components
Note 1 to entry: The forces holding an agglomerate together are weak forces, for example van der Waals forces, or
simple physical entanglement.
Note 2 to entry: Agglomerates are also termed secondary particles and the original source particles are termed
primary particles.
[SOURCE: CEN ISO/TS 80004-6:2015, 2.10]
3.1.4
aggregate
particle (CEN ISO/TS 80004-6:2015, 2.9) comprising strongly bonded or fused particles where the resulting
external surface area may be significantly smaller than the sum of calculated surface areas of the individual
components
Note 1 to entry: The forces holding an aggregate together are strong forces, for example covalent bonds, or those
resulting from sintering or complex physical entanglement.
Note 2 to entry: Aggregates are also termed secondary particles and the original source particles are termed primary
particles.
[SOURCE: CEN ISO/TS 80004-6:2015, 2.11]
3.2 Measurand terms
3.2.1
measurand
quantity intended to be measured
Note 1 to entry: The specification of a measurand requires knowledge of the kind of quantity, description of the state
of the phenomenon, body, or substance carrying the quantity, including any relevant component, and the chemical
entities involved.
Note 2 to entry: In the second edition of the VIM and in IEC 60050–300:2001, the measurand is defined as the
“particular quantity subject to measurement”.
Note 3 to entry: The measurement, including the measuring system and the conditions under which the measurement
is carried out, might change the phenomenon, body, or substance such that the quantity being measured may differ from
the measurand as defined. In this case, adequate correction is necessary.
EXAMPLE 1 The potential difference between the terminals of a battery may decrease when using a voltmeter with a
significant internal conductance to perform the measurement. The open-circuit potential difference can be calculated
from the internal resistances of the battery and the voltmeter.
EXAMPLE 2 The length of a steel rod in equilibrium with the ambient Celsius temperature of 23 °C will be different
from the length at the specified temperature of 20 °C, which is the measurand. In this case, a correction is necessary.
Note 4 to entry: In chemistry, “analyte”, or the name of a substance or compound, are terms sometimes used for
“measurand”. This usage is erroneous because these terms do not refer to quantities.
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