FprEN ISO 14880-2

SLOVENSKI STANDARD
oSIST prEN ISO 14880-2:2023
01-junij-2023
Optika in fotonska tehnologija - Vrste mikroleč - 2. del: Preskusne metode za
ugotavljanje odstopanja valovne fronte (ISO/DIS 14880-2:2023)
Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
(ISO/DIS 14880-2:2023)
Optik und Photonik - Mikrolinsenarrays - Teil 2: Prüfverfahren für
Wellenfrontaberrationen (ISO/DIS 14880-2:2023)
Optique et photonique - Réseaux de microlentilles - Partie 2: Méthodes d'essai pour les
aberrations du front d'onde (ISO/DIS 14880-2:2023)
Ta slovenski standard je istoveten z: prEN ISO 14880-2
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
oSIST prEN ISO 14880-2:2023 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

oSIST prEN ISO 14880-2:2023
oSIST prEN ISO 14880-2:2023
DRAFT INTERNATIONAL STANDARD
ISO/DIS 14880-2
ISO/TC 172/SC 9 Secretariat: DIN
Voting begins on: Voting terminates on:
2023-04-12 2023-07-05
Optics and photonics — Microlens arrays —
Part 2:
Test methods for wavefront aberrations
Optique et photonique — Réseaux de microlentilles —
Partie 2: Méthodes d'essai pour les aberrations du front d'onde
ICS: 31.260
This document is circulated as received from the committee secretariat.
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENT AND APPROVAL. IT IS
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NATIONAL REGULATIONS.
ISO/DIS 14880-2:2023(E)
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PROVIDE SUPPORTING DOCUMENTATION. © ISO 2023

oSIST prEN ISO 14880-2:2023
ISO/DIS 14880-2:2023(E)
DRAFT INTERNATIONAL STANDARD
ISO/DIS 14880-2
ISO/TC 172/SC 9 Secretariat: DIN
Voting begins on: Voting terminates on:

Optics and photonics — Microlens arrays —
Part 2:
Test methods for wavefront aberrations
Optique et photonique — Réseaux de microlentilles —
Partie 2: Méthodes d'essai pour les aberrations du front d'onde
ICS: 31.260
This document is circulated as received from the committee secretariat.
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENT AND APPROVAL. IT IS
© ISO 2023
ISO/CEN PARALLEL PROCESSING
THEREFORE SUBJECT TO CHANGE AND MAY
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
NOT BE REFERRED TO AS AN INTERNATIONAL
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NATIONAL REGULATIONS.
Website: www.iso.org ISO/DIS 14880-2:2023(E)
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NOTIFICATION OF ANY RELEVANT PATENT
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ii
PROVIDE SUPPORTING DOCUMENTATION. © ISO 2023

oSIST prEN ISO 14880-2:2023
ISO/DIS 14880-2:2023(E)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms.1
5 Apparatus . 2
5.1 General . 2
5.2 Standard optical radiation source. 2
5.3 Standard lens . 2
5.4 Collimator . 2
5.5 Beam reduction optical system . 2
5.6 Aperture stop . 3
6 Test principle .3
7 Measurement arrangements . 3
7.1 Measurement arrangement for single microlenses . 3
7.2 Measurement arrangements for microlens arrays . 3
7.3 Geometrical alignment of the sample . 4
7.4 Preparation . 4
8 Procedure .4
9 Evaluation . 4
10 Accuracy . 5
11 Test report . 5
Annex A (normative) Measurement requirements for test methods for microlenses .7
Annex B (normative) Microlens test Methods 1 and 2 usingMach-Zehnder interferometer
systems . 9
Annex C (normative) Microlens test Methods 3 and 4 usinga lateral shearing interferometer
system.15
Annex D (normative) Microlens test Method 5 using a Shack-Hartmann sensor system .20
Annex E (normative) Microlens array test Method 1 using a Twyman-Green interferometer
system.22
Annex F (normative) Measurement of uniformity of microlens arraydetermined by test
Method 2 .24
Bibliography .27
iii
oSIST prEN ISO 14880-2:2023
ISO/DIS 14880-2:2023(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to
the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 172, Optics and Photonics, Subcommittee
SC 09, Laser and electro-optical systems.
This second edition cancels and replaces the first edition (ISO 14880-2:2006), which has been
technically revised.
The main changes are as follows:
— Text for Annex E revised
— Figure E.1 replaced
— References and numbering confirmed
A list of all parts in the ISO 14880 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
oSIST prEN ISO 14880-2:2023
ISO/DIS 14880-2:2023(E)
Introduction
This document specifies methods of testing wavefront aberrations for microlens arrays. Examples of
applications of microlens arrays include three-dimensional displays, coupling optics associated with
arrayed optical radiation sources and photo-detectors, enhanced optics for liquid crystal displays, and
optical parallel processor elements.
The market in microlens arrays has generated a need for agreement on basic terminology and test
methods for defining microlens arrays. Standard terminology and clear definitions are needed not
only to promote applications but also to encourage scientists and engineers to exchange ideas and new
concepts based on common understanding.
Microlenses are used as single lenses and also in arrays of two or more lenses. The characteristics
of the lenses are fundamentally evaluated with a single lens. Therefore, it is important that the basic
characteristic of a single lens can be evaluated. However, if a large number of lenses is formed on a
single substrate, the measurement of the whole array will incur a lot of time and cost. Furthermore,
methods for measuring lens shapes are essential as a production tool.
Characteristic parameters are defined and examples of applications given in ISO 14880-1, Vocabulary.
It has been completed by a set of three other International Standards, i.e. Part 2, Test methods for
wavefront aberrations, Part 3, Test methods for optical properties other than w
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