25.020 - Manufacturing forming processes
ICS 25.020 Details
Manufacturing forming processes
Bearbeitungsverfahren
Procedes de formage
Izdelavni obdelovalni postopki
General Information
Frequently Asked Questions
ICS 25.020 is a classification code in the International Classification for Standards (ICS) system. It covers "Manufacturing forming processes". The ICS is a hierarchical classification system used to organize international, regional, and national standards, facilitating the search and identification of standards across different fields.
There are 16 standards classified under ICS 25.020 (Manufacturing forming processes). These standards are published by international and regional standardization bodies including ISO, IEC, CEN, CENELEC, and ETSI.
The International Classification for Standards (ICS) is a hierarchical classification system maintained by ISO to organize standards and related documents. It uses a three-level structure with field (2 digits), group (3 digits), and sub-group (2 digits) codes. The ICS helps users find standards by subject area and enables statistical analysis of standards development activities.
This document specifies the requirements for bodies operating training programmes for personnel who perform machinery condition monitoring, identify machine faults, and recommend corrective action. This document specifies procedures for training of condition monitoring and diagnostics personnel.
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SIGNIFICANCE AND USE
4.1 Due to variables unique to each AM process and piece of equipment, it is critical to standardize descriptions used to report the preparation, processing, and post processing of specimens produced for tests or evaluation. The intent of this practice is to consistently document the materials and processing history associated with specimens undergoing test or evaluation. The level of detail for the documentation will match the application.
4.2 This practice establishes minimum data element requirements for reporting of material and process data for the purpose of:
4.2.1 Standardizing test specimen descriptions and test reports,
4.2.2 Assisting designers by standardizing AM materials databases,
4.2.3 Aiding material traceability through testing and evaluation,
4.2.4 Capturing property-parameter-performance relationships of AM specimens to enable predictive modeling and other computational approaches.
SCOPE
1.1 This practice describes a standard procedure for reporting results by testing or evaluation of specimens produced by additive manufacturing (AM). This practice provides a common format for presenting data for AM specimens, for two purposes: (1) to establish further data reporting requirements, and (2) to provide information for the design of material property databases.
1.2 The values stated in SI units are required for all additive manufacturing related standards. However, when this standard is used in combination with any test method or equipment specified in inch-pound units the results should be reported with mathematical conversions to SI units immediately following in parentheses. The conversions shall be provided for information only and are not considered standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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IEC/IEEE 62659:2015(E) provides a framework for introducing nanoelectronics into large scale, high volume production in semiconductor manufacturing facilities through the incorporation of nanomaterials (e.g. carbon nanotubes, graphene, quantum dots, etc.). Since semiconductor manufacturing facilities need to incorporate practices that maintain high yields, there are very strict requirements for how manufacturing is performed. Nanomaterials represent a potential contaminant in semiconductor manufacturing facilities and need to be introduced in a structured and methodical way.
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SIGNIFICANCE AND USE
5.1 This practice is designed to evaluate a machine or process isolated from its normal operating environment. In its normal operating environment, there would be many sources of variation that may not exist at a machine/process builder's facility; or put another way, this study is usually conducted under ideal conditions. Therefore, it should be recognized that the results of this practice are usually a “best case” analysis, and allowances need to be made for sources of variations that may exist at the purchaser's facility.
SCOPE
1.1 This practice covers provision of a proper method for determining process capability for new or existing machine processes. It is recommended that available statistical software be used for the calculation of the descriptive statistics required for decision making when using this practice. Where software is not available, Section 8 and Tables 1 and 2 are provided for manual calculations.TABLE 1 Machine/Process Average and Range
Calculate the average Range (R) and the Process Average X For the study period, calculate:
where: k = the number of subgroups, R1 = the range and average of the first subgroup, X1 = the range and average of the first subgroup, R2 = from the second subgroup, and X2 = from the second subgroup, etc.
TABLE 2 Machine/Process Standard Deviation
Estimate the process standard deviation (the estimate is shown as σ^ “sigma hat”).
Using the existing sample size calculate:
σ^ = R/d2
Where R is the average of the subgroup ranges (for periods with the ranges in control) and d 2 is a constant varying by sample size, as shown in the table below:
n
2
3
4
5
6
7
8
9
10
d2
1.13
1.69
2.06
2.33
2.53
2.70
2.85
2.97
3.08
WITHDRAWN RATIONALE
This practice covers provision of a proper method for determining process capability for new or existing machine processes. It is recommended that available statistical software be used for the calculation of the descriptive statistics required for decision making when using this practice.
Formerly under the jurisdiction of Committee F16 on Fasteners, this practice was withdrawn in June 2018. This standard is being withdrawn without replacement due to its limited use by industry.
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SIGNIFICANCE AND USE
The definitions of the terms presented in this standard were created by this subcommittee. This standard does not purport to address safety concerns associated with the use of AM technologies. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use of additive manufacturing.
SCOPE
1.1 This terminology includes terms, definitions of terms, descriptions of terms, nomenclature, and acronyms associated with additive-manufacturing (AM) technologies in an effort to standardize terminology used by AM users, producers, researchers, educators, press/media and others.
Note 1—The subcommittee responsible for this standard will review definitions on a three-year basis to determine if the definition is still accurate as stated. Revisions will be made when determined to be necessary.
WITHDRAWN RATIONALE
This terminology includes terms, definitions of terms, descriptions of terms, nomenclature, and acronyms associated with additive-manufacturing (AM) technologies in an effort to standardize terminology used by AM users, producers, researchers, educators, press/media and others.
Formerly under the jurisdiction of Committee F42 on Additive Manufacturing Technologies, this terminology was withdrawn in December 2015.
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