VAMAS - Versailles Project on Advanced Materials and Standards
The Versailles Project on Advanced Materials and Standards was conceived in 1982. The main objective of VAMAS is to support trade in high technology products, through international collaborative projects aimed at providing the technical basis for drafting codes of practice and specifications for advanced materials. The scope of the collaboration embraces all agreed aspects of science and technology concerned with advanced materials, including materials technology, test methods, design methods and materials databases that are required as a precursor to the drafting of standards. VAMAS activity emphasises collaboration on prestandards measurement research, intercomparison of test results, and consolidation of existing views on priorities for standardization. As a result of these activities VAMAS provides an internationally harmonized methodology that may be taken as recommendations to the standards development organizations, thereby fostering the development of agreed and workable standards for advanced materials. ISO and VAMAS have concluded a Memorandum of Understanding under which ISO may publish Technology Trends Assessments (TTAs) based on the work of VAMAS. The ISO/TTA series of publications was established to respond to the need for global collaboration on standardization questions at early stages of technological innovation. ISO has decided to publish such documents to promote the harmonization of the objectives of ongoing prestandardization work with those of new initiatives in the research and development environment. It is intended that TTAs will contribute towards rationalization of technological choice prior to market entry. Further information on VAMAS can be found on the VAMAS Web site.
Versailles Project on Advanced Materials and Standards
Le Programme de Versailles sur les matériaux de pointe et les normes a été conçu en 1982. L'objectif principal de VAMAS est d'appuyer le commerce des produits de haute technologie par une collaboration internationale sur des projets qui visent à donner les bases techniques nécessaires à l'élaboration de codes de pratiques et de spécifications relatives aux matériaux de pointe. Le champ de la collaboration englobe tous les aspects approuvés des sciences et des technologies concernés par les matériaux de pointe, y compris les technologies des matériaux, les méthodes d'essai, les méthodes de conception et les bases de données de matériaux qui sont exigées comme préalables à la rédaction de normes. L'activité de VAMAS met l'accent sur la recherche métrologique prénormative, les comparaisons inter-laboratoires des résultats d'essais, et l'unification des points de vue sur les priorités de la normalisation. En conséquence de ces activités, VAMAS offre une méthodologie harmonisée sur le plan international qui peut être soumise sous forme de recommandations aux organisations élaboratrices de normes, encourageant par là l'élaboration de normes agréées et applicables relatives aux matériaux de pointe. L'ISO et VAMAS ont conclu un Protocole d'accord. Aux termes de cet accord, l'ISO peut publier des Évaluations des orientations technologiques (TTA) sur la base des travaux de VAMAS. La série de publications ISO/TTA a été créée pour répondre à la nécessité d'une collaboration mondiale sur les questions de normalisation à des stades précoces de l'innovation technologique. L'ISO a décidé de publier de tels documents pour promouvoir l'harmonisation des objectifs des travaux de normalisation en cours avec ceux d'initiatives nouvelles dans l'environnement de la recherche et du développement. Il est prévu que les TTA contribuent à la rationalisation des choix technologiques avant la phase de commercialisation. Pour de plus amples informations, se reporter au site Web de VAMAS.
General Information
ISO/TTA 5:2007 recommends and establishes standardized techniques for measuring and analysing Creep Crack Initiation (CCI), Creep Crack Growth (CCG), and Creep Fatigue Crack Growth (CFCG) characteristics, using a wide range of pre-cracked standard and non-standard "feature" geometries.
- Technical report78 pagesEnglish languagesale 15% off
This document is an outline procedure for the tensile testing of discontinuously reinforced metal matrix composites (MMC) and defines the mechanical properties which tan be determined at ambient temperature, such as Young's modulus, proportional limits, proof stress, tensile strength and elongation to failure. It follows the European Standard EN 10002 for the tensile testing of metals and its sister document for Aerospace materials EN 20024 Part 1. [refs 1 and 2 in annex C.]
- Technical report16 pagesEnglish languagesale 15% off
The scope of ISO/TTA 5:2006 is to recommend and establish standardized techniques for measuring and analysing Creep Crack Initiation (CCI), Creep Crack Growth (CCG), and Creep Fatigue Crack Growth (CFCG) characteristics using a wide range of pre-cracked standard and non-standard "feature" geometries.
- Technical report77 pagesEnglish languagesale 15% off
TTA 4:2002 proposes a standard procedure for the three-omega method for measuring the thermal conductivity of a thin, electrically insulating film, on a substrate having a thermal conductivity significantly greater than the thermal conductivity of the film.This method is applicable to a film on a silicon substrate with the following characteristics: a) the film is electrically insulating; b) the film has a thermal conductivity that is less than one tenth the thermal conductivity of silicon; c) the film is uniform in thickness and the thickness lies in the range 0,25 to 1 micrometres. d) the maximum dimensions of the film are limited by the sizes of the preparation and measurement apparatus; e) the minimum dimensions of the film are limited by the minimum size of the circuit element that can be placed on the film surface. NOTE A specimen approximately 15 mm by 25 mm is of an appropriate size although specimens as small as 10 mm by 10 mm are usable. The method is directly applicable to films of silicon dioxide on silicon wafer substrates. The method may be applicable to insulating films on other high-thermal conductivity substrates provided that the parameters of the substrate material are substituted for the parameters of silicon used in this method and the associated computer program. The method is applicable to measurements near room temperature.
- Technical report19 pagesEnglish languagesale 15% off
- Technical report48 pagesEnglish languagesale 15% off
- Technical report62 pagesEnglish languagesale 15% off