ISO/TC 201/SC 9/SG 1 - Effects of temperature and humidity on dimensional atomic force microscopy (AFM) measurements
Effets de la température et de l'humidité sur les mesures dimensionnelles de microscopie à force atomique (MFA)
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ISO/TC 201/SC 9/SG 1 is a Subcommittee within the International Organization for Standardization (ISO). It is named "Effects of temperature and humidity on dimensional atomic force microscopy (AFM) measurements". This committee has published 1 standards.
ISO/TC 201/SC 9/SG 1 develops ISO standards in the area of Information technology. Currently, there are 1 published standards from this subcommittee.
The International Organization for Standardization (ISO) is an independent, non-governmental international organization that develops and publishes international standards. Founded in 1947 and headquartered in Geneva, Switzerland, ISO brings together experts from 170+ member countries to share knowledge and develop voluntary, consensus-based standards that support innovation and provide solutions to global challenges.
A Subcommittee (SC) in ISO operates under a Technical Committee and focuses on a specific subset of the TC's scope. Subcommittees develop standards and technical specifications in their specialized area, reporting to their parent Technical Committee. They may also have working groups for detailed technical work.
ISO 11039:2012 defines terms and specifies measurement methods for characterizing the drift rates of scanning-probe microscopy (SPM) instruments in the X- and Y-directions and, for SPM instruments measuring topography, the drift rate in the Z-direction. Though the behaviour of the long-term drift rate might be nonlinear, both that and the behaviour of the short-term drift rate after a user-defined settling time can be characterized by either typical average or typical maximum drift rates. This International Standard is suitable for evaluating the drift rate based on SPM images. It is intended to help manufacturers quote drift figures in specifications in a meaningful and consistent manner and to aid users to characterize the drift behaviour so that effective experiments can be designed. These measurements are not designed for image correction.
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