MT 62702-1-2 - TC 100/TA 6/MT 62702-1-2
TC 100/TA 6/MT 62702-1-2
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MT 62702-1-2 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 100/TA 6/MT 62702-1-2". This committee has published 1 standards.
MT 62702-1-2 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.
The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.
A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.
IEC 62702-1-2:2022 specifies a method of data-quality assurance for writable BD disks (hereafter referred to as "disks") which are specified for long-term data storage, and a data migration method which can sustain the recorded data on disks for long-term audio data preservation. The writable disks include BD recordable disk and BD rewritable disk. IEC 62702-1-2:2022 cancels and replaces the first edition published in 2016. This edition constitutes a technical revision. In order to reflect the updates to ISO/IEC 29121:2021, this edition includes the following significant technical changes with respect to the previous edition:
a) ISO/IEC 16963 has been identified as the referee test method for the estimation of lifetime;
b) the ambient conditions for the measurement of maximum data error have been added;
c) the requirements for test drives have been changed considering the use condition of users;
d) the requirements for the estimated lifetime have been defined more clearly;
e) the requirements for the periodic performance test have been defined more clearly.
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