WG 7 - TC 112/WG 7
TC 112/WG 7
General Information
Frequently Asked Questions
WG 7 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 112/WG 7". This committee has published 433 standards.
WG 7 develops IEC standards in the area of Information technology. Currently, there are 433 published standards from this technical committee.
The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.
A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.
IEC TR 60493-3:2017(E) clarifies how a statistical analysis can be done with a small number of samples. This document will be useful when the accelerated test method is difficult to carry out, for example in cases where the dimensions of test specimens (including test devices) are very large in scale or the cost of test specimens is high. Testing is facilitated by enabling users to reduce the number of test specimens.
- Technical report19 pagesEnglish languagesale 15% off
IEC 60493-1:2011 gives statistical methods which may be applied to the analysis and evaluation of the results of ageing tests. It covers numerical methods based on mean values of normally distributed test results. These methods are only valid under specific assumptions regarding the mathematical and physical laws obeyed by the test data. Statistical tests for the validity of some of these assumptions are also given. This standard deals with data from both complete test sets and censored test sets. This standard provides data treatment based on the concept of "data sub-group" as defined in Clause 3. The validity of the coefficients used in the calculation processes to derive statistical parameters of the data groups are described in IEC 60216-1. This second edition cancels and replaces the first edition, published in 1974, and constitutes a technical revision. The main changes with respect to the first edition are that, besides a complete editorial revision, censored data sub-group are considered.
- Standard69 pagesEnglish and French languagesale 15% off
Describes, with examples, statistical methods to analyze times to break down and breakdown voltage data obtained from electrical testing of solid insulating materials, for purposes including characterization of the system, comparison with another insulator system, and prediction of the probability of breakdown at given times or voltages.
- Standard49 pagesEnglish languagesale 15% off





