PT 62704-4 - TC 106/PT 62704-4
TC 106/PT 62704-4
General Information
Frequently Asked Questions
PT 62704-4 is a Technical Committee within the International Electrotechnical Commission (IEC). It is named "TC 106/PT 62704-4". This committee has published 1 standards.
PT 62704-4 develops IEC standards in the area of Information technology. Currently, there are 1 published standards from this technical committee.
The International Electrotechnical Commission (IEC) is the world's leading organization for the preparation and publication of international standards for electrical, electronic, and related technologies. Founded in 1906, the IEC provides a global platform for companies, industries, and governments to meet, discuss, and develop the international standards they require.
A Technical Committee (TC) in IEC is a group of experts responsible for developing international standards in a specific technical area. TCs are composed of national member body delegates and work through consensus to create standards that meet global industry needs. Each TC may have subcommittees (SCs) and working groups (WGs) for specialized topics.
IEC/IEEE 62704-4:2020 describes the concepts, techniques, and limitations of the finite element method (FEM) and specifies models and procedures for verification, validation and uncertainty assessment for the FEM when used for determining the peak spatial-average specific absorption rate (psSAR) in phantoms or anatomical models. It recommends and provides guidance on the modelling of wireless communication devices, and provides benchmark data for simulating the SAR in such phantoms or models.
This document does not recommend specific SAR limits because these are found elsewhere (e.g. in IEEE Std C95.1 or in the guidelines published by the International Commission on Non-Ionizing Radiation Protection (ICNIRP)).
This publication is published as an IEC/IEEE Dual Logo standard.
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