SIST EN 171000:2002

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Generic specification: Filters using waveguide type dielectric resonatorsFachgrundspezifikation: Filter mit dielektrischen Resonatoren vom WellenleitertypSpécification générique: Filtres utilisant des résonateurs diélectriques à modes guidésGeneric specification: Filters using waveguide type dielectric resonators31.160Electric filters31.140Piezoelectric and dielectric devicesICS:Ta slovenski standard je istoveten z:EN 171000:2001SIST EN 171000:2002en01-september-2002SIST EN 171000:2002SLOVENSKI
STANDARD



SIST EN 171000:2002



EUROPEAN STANDARDEN 171000NORME EUROPÉENNEEUROPÄISCHE NORMAugust 2001CENELECEuropean Committee for Electrotechnical StandardizationComité Européen de Normalisation ElectrotechniqueEuropäisches Komitee für Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B - 1050 Brussels© 2001 CENELEC -All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.Ref. No. EN 171000:2001 EICS 31.140; 31.160Supersedes EN 61337-1-1:1997English versionGeneric specification:Filters using waveguide type dielectric resonatorsSpécification générique:Filtres utilisant des résonateursdiélectriques à modes guidésFachgrundspezifikation:Filter mit dielektrischen Resonatorenvom WellenleitertypThis European Standard was approved by CENELEC on 2000-08-01. CENELEC members are bound tocomply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained onapplication to the Central Secretariat or to any CENELEC member.This European Standard exists in three official versions (English, French, German). A version in any otherlanguage made by translation under the responsibility of a CENELEC member into its own language andnotified to the Central Secretariat has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway,Portugal, Spain, Sweden, Switzerland and United Kingdom.SIST EN 171000:2002



EN 171000:2001- 2 -ForewordThis European Standard was prepared by the CENELEC Technical Committee TC 49,Piezoelectric devices for frequency control and selection.The text of the draft was submitted to the Unique Acceptance Procedure and was approved byCENELEC as EN 171000 on 2000-08-01.This European Standard supersedes EN 61337-1-1:1997.The following dates were fixed:-latest date by which the EN has to be implementedat national level by publication of an identicalnational standard or by endorsement(dop)2002-02-01-latest date by which the national standards conflictingwith the EN have to be withdrawn(dow)2003-08-01_____________SIST EN 171000:2002



- 3 -EN 171000:2001CONTENTS1General.41.1Scope.41.2Normative references.41.3Units, symbols and terminology .51.4Preferred ratings and characteristics .111.5Marking .121.6Order of precedence .122Quality Assessment Procedures .122.1Primary stage of manufacture .122.2Structurally similar components .122.3Sub-contracting .132.4Incorporated components .132.5Manufacturers approval .132.6Approval procedures .132.7Procedures for Capability Approval .142.8Procedures for Qualification Approval .142.9Test procedures .152.10Screening requirements .152.11Rework and repair work. .152.12Certified test records .152.13Validity of release .152.14Release for delivery .152.15Unchecked parameters .163Test and measurement procedures .163.1General .163.2Test and measurement conditions .163.3Visual inspection .173.4Dimension and gauging procedure .173.5Electrical test procedures .173.6Mechanical and environmental test procedures .21SIST EN 171000:2002



EN 171000:2001- 4 -1General1.1ScopeThis Generic Specification applies to filters using waveguide type dielectric resonators of assessedquality using either capability approval or qualification approval procedures.
It also lists the testand measurement procedures which may be selected for use in Detail Specifications for suchfilters.1.2Normative referencesThis European Standard incorporates by dated and undated reference, provisions from otherpublications.
These normative references are cited at the appropriate places in the text and thepublications are listed hereafter.
For dated references, subsequent amendments to or revisions ofany of these publications apply to this European Standard only when incorporated in it byamendment or revision.
For undated references the latest edition of the publication referred toapplies.CECC 00 1091974Rule of procedure 9: Certified Test RecordsCECC 00 111-31994Rule of procedure 11 - Part 3: Regulations for CECC specifications forcomponents for general and professional (civil and military) usageCECC 00 114-21994Rule of procedure 14 - Part 2: Qualification approval of electroniccomponentsCECC 00 114-31993Rule of procedure 14 - Part 3: Capability approval of an electroniccomponent manufacturing activityEN 100114-11996Rule of Procedure – Quality Assessment Procedures - Part 1: CECCrequirements for the approval of an organizationEN 60068-11994Environmental testing - Part 1: General and guidance(IEC 60068-1:1988 + corr. Oct 1988 + A1:1992)EN 60068-2-11993Part 2: Tests - Test A: Cold (IEC 60068-2-1:1990)EN 60068-2-21993Test B: Dry heat (IEC 60068-2-2:1974 + IEC 60068-2-2A:1976)EN 60068-2-61995Test Fc: Vibration (sinusoidal)(IEC 60068-2-6:1995 + corr. March 1995).EN 60068-2-71993Test Ga and guidance: Acceleration, steady state(IEC 60068-2-7:1983 + A1:1986)EN 60068-2-211983Test U: Robustness of terminations and integral mounting devices(IEC 60068-2-21:1983 + corr. Nov 1991 + A1:1985)+ A21997(IEC 60068-2-21:1983/A2:1991)+ A31997(IEC 60068-2-21:1983/A3:1992)EN 60068-2-271993Test Ea and guidance: Shock (IEC 60068-2-27:1987)EN 60068-2-291993Test Eb and guidance: Bump (IEC 60068-2-29:1987 + corr.)EN 60617SeriesGraphical symbols for diagrams (IEC 60617 series)HD 323.2.3 S21987Test Ca: Damp heat, steady state (IEC 60068-2-3: 1969 + A1:1984)HD 323.2.13 S11987Test M: Low air pressure (IEC 60068-2-13:1983)HD 323.2.14 S21987Test N: Change of temperature(IEC 60068-2-14:1984 + A1:1986)HD 323.2.20 S31988Test T: Soldering (IEC 60068-2-20:1979 + A2:1987)SIST EN 171000:2002



- 5 -EN 171000:2001HD 323.2.30 S31988Test Db and guidance: Damp heat, cyclic (12 + 12 hour cycle)(IEC 60068-2-30:1980 + A1:1985)HD 323.2.58 S11991Test Td: Solderability, resistance to dissolution of metalization and tosoldering heat of Surface Mounting Devices (SMD)(IEC 60068-2-58:1989)IEC 60027-11992Letter symbols to be used in electrical terminology - Part1: GeneralIEC 60050SeriesInternational Electrotechnical Vocabulary (IEV)ISO 10001973SI units and recommendation for the use of their multiples and ofcertain other units1.3Units, symbols and terminologyUnits, graphical symbols, letter symbols and terminology shall whenever possible, be taken fromthe following documents:EN 60617Graphical symbols for diagrams (IEC 60617)IEC 60027Letter symbols to be used in electrical technologyIEC 60050International Electrotechnical VocabularyISO 1000SI units and recommendations for the use of their multiples and of certain other unitsAny other units, symbols and terminology peculiar to one of the components covered by theGeneric Specification, shall be taken from the relevant IEC or ISO documents listed under 1.2,Normative references.The following paragraphs contain additional terminology applicable to filters using waveguide typedielectric resonators.1.3.1dielectric filterfilter in which one or more dielectric resonators are incorporated1.3.2dielectric mono-block filterfilter consisting of a metallized rectangular ceramic block with cylindrical holes, which functions asa TEM (Transverse-electromagnetic) mode filter with two or more stages1.3.3stripline filterfilter consisting of stripline resonators, which functions as a TEM mode filter with two or morestages1.3.4microstripline filterfilter consisting of microstripline resonators, which functions as a TEM mode filter with two or morestages1.3.5coplanar filterfilter consisting of coplanar line resonators, which functions as a TEM mode filter with two or morestagesSIST EN 171000:2002



EN 171000:2001- 6 -1.3.6coupling factor kcoupling factor of a band-pass filter is the degree of coupling between two resonators. The coupling between dielectric resonators is mainly done either magnetically or electrically. Accordingto each case, the equivalent circuit of coupling is expressed by inductive or capactive coupling,respectively
Inductive coupling
Capacitive couplingThe coupling factor by inductive or capactive coupling is defined by the following equation,respectively:
M
Cmk =
k =
L1 . L2
C1 . C2WhereL1, C1 and L2 C2 are the resonance circuit elementsM is the mutual inductanceCmis the coupling capacitancek
is the coupling factor.In the case of a symmetrical circuit of coupling, the coupling factor can be obtained from tworesonance frequencies calculated or measured for the coupled resonators: fo2 – fe2
k = fo2 + fe2 Wherefe is the resonance frequency in the case of even mode excitation (open-circuitedsymmetric plane).fo is the resonance frequency in the case of odd mode excitation (short-circuitedsymmetric plane).The coupling factor of a band-stop filter is the degree of coupling between the resonator and thetransmission line.
The coupling factor k is defined as the ratio of the external power loss (Pe) of theresonator system to the internal power loss (Pu) of the resonator and can be expressed by afunction of quality factor as follows:
Pe
Qu
Quk =
=
=
- 1
Pu
Qe
QLWhereQu is the unloaded quality factor of resonator.Qe is the external quality factor of resonator.QL is the loaded quality factor of resonator.SIST EN 171000:2002



- 7 -EN 171000:20011.3.7mid-band frequencyarithmetic mean of the cut-off frequencies (see Figures 1 and 2)1.3.8cut-off frequencyfrequency of the pass band at which the relative attenuation reaches a specified value (seeFigures 1 and 2)1.3.9trap frequencyfrequency of the trap at which the attenuation reaches a large peak value (see Figure 1)1.3.10pass-bandband of frequencies in which the relative attenuation is equal to or less than a specified value (seeFigures 1 and 2)1.3.11pass bandwidthseparation of the frequencies between which the attenuation is equal to or less than a specifiedvalue (see Figure 1)1.3.12stop bandband of frequencies in which the relative attenuation is equal to or greater than a specified value(see Figures 1 and 2)1.3.13stop bandwidthseparation of frequencies between which the attenuation is equal to or greater than a specifiedvalue (see Figures 1 and 2)1.3.14fractional bandwidth1)Ratio of the pass bandwidth to the mid-band frequency in case of band-pass filter2)Ratio of the stop bandwidth to the mid-band frequency in case of band-stop filter1.3.15insertion attenuationlogarithmic ratio of the power delivered directly to the load impedance before insertion of the filterto the power delivered to the load impedance after the insertion of the filterThe value is defined by:
Po10 log10
(dB)
PtWherePo is the power delivered to the load impedance before insertion of the filterPt is the power delivered to the load impedance after insertion of the filter.SIST EN 171000:2002



EN 171000:2001- 8 -SIST EN 171000:2002



- 9 -EN 171000:2001SIST EN 171000:2002



EN 171000:2001- 10 -1.3.16relative attenuationdifference between the attenuation at a given frequency and the attenuation at the referencefrequency1.3.17minimum insertion attenuationthe minimum value of insertion attenuation in the pass band1.3.18maximum insertion attenuationthe maximum value of insertion attenuation in the pass band1.3.19pass-band ripplemaximum variation of attenuation within a defined portion of a pass band (see Figures 1 and 2)1.3.20spurious responsethe response of a filter other than that associated with the working frequency (see Figure 1)1.3.21spurious response rejectiondifference between the maximum level of spurious response and the minimum insertionattenuation1.3.22return attenuationlogarithmic ratio of the power Po to the power PrThe value is defined by:
Po10 log10
(dB)
PrwherePo is the power available from the oscillatorPr is the power reflected from the filter after insertion of the filter with the load impedance.NOTE
Alternative expression by VSWR (voltage standing wave ratio) is:
1 + ΓVSWR =
1 - Γwhere
PrΓ =
is the modulus of the reflection coefficient
PoSIST EN 171000:2002



- 11 -EN 171000:20011.3.23insertion phase shiftchange in phase caused by the insertion of the filter into a transmission system1.3.24group delaytime equal to the first derivative of the phase shift in radians with respect to the angular frequency1.3.25group delay distortiondifference between the lowest and highest value of group delay in a specified frequency band1.3.26maximum power levelpower level above which intolerable signal distortion or irreversible changes in a structure may takeplace1.3.27reference frequencyfrequency defined by the specification to which other frequencies may be referred1.3.28band-pass filter (BPF)filter having a signal pass band between two specified stop bands1.3.29band-stop filter (BSF)filter having a signal stop band between two specified pass bands1.4Preferred ratings and characteristicsValues should preferably be chosen from the following paragraphs.1.4.1Temperature ranges in degrees Celsius (°°°°C) for ambient operation- 20 to + 75
-30 to + 60
-35 to + 85
0 to + 55NOTE
Other temperature ranges may be used but the lowest temperature should not be lower than –60 °C and thehighest temperature should not exceed 125 °C.1.4.2Climatic category40/085/56For requirements where the operating temperature range of the filter is greater than –40 °C to+85 °C a climatic category consistent with the operating temperature range shall be specified.1.4.3Bump severity4000 ± 10 bumps at 40 gn peak acceleration in each direction along three mutually perpendicularaxis.Pulse duration 6 msSIST EN 171000:2002



EN 171000:2001- 12 -1.4.4Vibration severityFrequencyVibration severity10 to 500 Hz0,75 mm amplitude or 10 gn acceleration10 to 2000 Hz0,75 mm amplitude or 10 gn acceleration10 to 2000 Hz1,5 mm amplitude or 20 gn acceleration
1.4.5Shock severity6 ms duration, 100 gn acceleration.1.5MarkingEach filter shall be clearly and durably marked with the following minimum information:-Type designation as defined in the detail specification- Nominal frequency in MHz-Year and week of manufacture-Manufacturer’s name or trade mark.Each package of filters shall be marked with the following information.-Quantity (if applicable)-Type designation.-Number of the detail specification-Manufacturer’s factory identification code-Date code-Additional marking as required by the detail specification.
1.6Order of precedence
Where any discrepancies occur for any reason, documents shall rank in the following order ofauthority: -Detail Specification-Sectional Specification-Generic Specification-Any other international documents (for example, of the IEC) to which reference is made.The same order of precedence shall apply to equivalent national documents.2Quality Assessment Procedures2.1Primary stage of manufactureThe primary stage of manufacture for a filter using waveguide type dielectric resonators inaccordance with 2.2.6 of CECC 00 111-3, is the assembly of the filter.2.2Structurally similar componentsThe grouping of structurally similar filters for the purpose of qualification approval, capabilityapproval and quality conformance inspection shall be prescribed in the relevant sectionalspecification.SIST EN 171000:2002



- 13 -EN 171000:20012.3Sub-contractingThese procedures shall be in accordance with 1.2. of CECC 00 114 -2 or 2.2 or CECC 00 114 -3.2.4Incorporated componentsWhere incorporated components are used the requirements of 2.3 of CECC 00 114-3 shall apply.2.5Manufacturer’s approvalTo obtain manufacturer’s approval the manufacturer shall meet the requirements of EN 100114-1.2.6Approval procedures2.6.1GeneralTo qualify a filt
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