SIST EN 62271-101:2006

SLOVENSKI STANDARD
SIST EN 62271-101:2006
01-december-2006
1DGRPHãþD
SIST EN 60427:2000
9LVRNRQDSHWRVWQHVWLNDOQHLQNUPLOQHQDSUDYHGHO6LQWHWLþQRSUHVNXãDQMH
,(&
High-voltage switchgear and controlgear - Part 101: Synthetic testing (IEC 62271-
101:2006)
Hochspannungs-Schaltgeräte und -Schaltanlagen - Teil 101: Synthetische Prüfung (IEC
62271-101:2006)
Appareillage a haute tension - Partie 101: Essais synthétiques (CEI 62271-101:2006)
Ta slovenski standard je istoveten z: EN 62271-101:2006
ICS:
29.130.10 Visokonapetostne stikalne in High voltage switchgear and
krmilne naprave controlgear
SIST EN 62271-101:2006 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 62271-101:2006

---------------------- Page: 2 ----------------------

SIST EN 62271-101:2006


EUROPEAN STANDARD
EN 62271-101

NORME EUROPÉENNE
July 2006
EUROPÄISCHE NORM

ICS 29.130.10 Supersedes EN 60427:2000


English version


High-voltage switchgear and controlgear
Part 101: Synthetic testing
(IEC 62271-101:2006)


Appareillage à haute tension  Hochspannungs-Schaltgeräte
Partie 101: Essais synthétiques und -Schaltanlagen
(CEI 62271-101:2006) Teil 101: Synthetische Prüfung
(IEC 62271-101:2006)




This European Standard was approved by CENELEC on 2006-07-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62271-101:2006 E

---------------------- Page: 3 ----------------------

SIST EN 62271-101:2006
EN 62271-101:2006 - 2 -
Foreword
The text of document 17A/753/FDIS, future edition 1 of IEC 62271-101, prepared by SC 17A,
High-voltage switchgear and controlgear, of IEC TC 17, Switchgear and controlgear, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 62271-101 on 2006-07-01.
This European Standard supersedes EN 60427:2000.
This standard shall be read in conjunction with EN 62271-100:2001. The numbering of the subclauses of
Clause 6 is the same as in EN 62271-100. However, not all subclauses of EN 62271-100 are addressed;
merely those where synthetic testing has introduced changes.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-04-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-07-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62271-101:2006 was approved by CENELEC as a European
Standard without any modification.
__________

---------------------- Page: 4 ----------------------

SIST EN 62271-101:2006
- 3 - EN 62271-101:2006
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC/TS 61633 1995 High-voltage alternating current circuit-- -
breakers - Guide for short-circuit and
switching test procedures for metal-enclosed
and dead tank circuit-breakers


IEC 62271-100 2001 High-voltage switchgear and controlgear EN 62271-100 2001
Part 100: High-voltage alternating-current
circuit-breakers


IEC/TR 62271-308 2002 High-voltage switchgear and controlgear - -
Part 308: Guide for asymmetrical short-circuit
breaking test duty T100a

---------------------- Page: 5 ----------------------

SIST EN 62271-101:2006

---------------------- Page: 6 ----------------------

SIST EN 62271-101:2006
NORME CEI
INTERNATIONALE
IEC



62271-101
INTERNATIONAL


Première édition
STANDARD

First edition

2006-05


Appareillage à haute tension –
Partie 101:
Essais synthétiques

High-voltage switchgear and controlgear –
Part 101:
Synthetic testing

 IEC 2006 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
CODE PRIX
XG
PRICE CODE
Commission Electrotechnique Internationale
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue

---------------------- Page: 7 ----------------------

SIST EN 62271-101:2006
62271-101  IEC:2006 – 3 –
CONTENTS
FOREWORD.11

1 Scope.15
2 Normative references .15
3 Terms and definitions .15
4 Synthetic testing techniques and methods for short-circuit breaking tests.19
4.1 Basic principles and general requirements for synthetic breaking test
methods .19
4.2 Synthetic test circuits and related specific requirements for breaking tests .25
4.3 Three-phase synthetic test methods .31
5 Synthetic testing techniques and methods for short-circuit making tests .35
5.1 Basic principles and general requirements for synthetic making test methods .35
5.2 Synthetic test circuit and related specific requirements for making tests .37
6 Specific requirements for synthetic tests for making and breaking performance
related to the requirements of 6.102 through 6.111 of IEC 62271-100 .39

Annex A (informative) Current distortion .79
Annex B (informative) Current injection methods.111
Annex C (informative) Voltage injection methods .121
Annex D (informative) Duplicate circuit (transformer or Skeats circuit) .127
Annex E (normative) Information to be given and results to be recorded for synthetic tests . 133
Annex F (informative) Special procedures for testing circuit-breakers having parallel
breaking resistors .135
Annex G (informative) Synthetic methods for capacitive-current switching .141
Annex H (informative) Re-ignition methods to prolong arcing .165
Annex I (normative) Reduction in di/dt and TRV for test duty T100a .173
Annex J (informative) Three-phase synthetic test circuits.201
Annex K (normative) Test procedure using a three-phase current circuit and one
voltage circuit .217
Annex L (normative) Splitting of test duties in test series taking into account the
associated TRV for each pole-to-clear .255
Annex M (normative) Tolerances on test quantities for type tests.275

Bibliography.281

Figure 1 – Interrupting process – Basic time intervals .63
Figure 2 – Example of recovery voltage .65
Figure 3 – Equivalent surge impedance of the voltage circuit for the current injection
method .67
Figure 4 – Making process – Basic time intervals.69

---------------------- Page: 8 ----------------------

SIST EN 62271-101:2006
62271-101  IEC:2006 – 5 –
Figure 5 – Typical synthetic make circuit for single-phase tests .71
Figure 6 – Typical synthetic make circuit for three-phase tests (k = 1,5).73
pp
Figure 7 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100s with k = 1,5 .75
pp
Figure 8 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100a with k = 1,5.77
pp
Figure A.1 – Direct circuit, simplified diagram .93
Figure A.2 – Prospective short-circuit current .93
Figure A.3 – Distortion current .93
Figure A.4 – Distortion current .95
Figure A.5 – Simplified circuit diagram.97
Figure A.6 – Current and arc voltage characteristics for symmetrical current .99
Figure A.7 – Current and arc voltage characteristics for asymmetrical current .101
Figure A.8 – Reduction of amplitude and duration of final current loop of arcing .103
Figure A.9 – Reduction of amplitude and duration of final current loop of arcing .105
Figure A.10 – Reduction of amplitude and duration of final current loop of arcing .107
Figure A.11 – Reduction of amplitude and duration of final current loop of arcing .109
Figure B.1 – Typical current injection circuit with voltage circuit in parallel with the test
circuit-breaker.115
Figure B.2 – Injection timing for current injection scheme with circuit B.1.115
Figure B.3 – Typical current injection circuit with voltage circuit in parallel with the
auxiliary circuit-breaker.117
Figure B.4 – Injection timing for current injection scheme with circuit B.3.117
Figure B.5 – Examples of the determination of the interval of significant change of arc
voltage from the oscillograms .119
Figure C.1 – Typical voltage injection circuit diagram with voltage circuit in parallel
with the auxiliary circuit-breaker (simplified diagram) .123
Figure C.2 – TRV waveshapes in a voltage injection circuit with the voltage circuit in
parallel with the auxiliary circuit-breaker .125
Figure D.1 – Transformer or Skeats circuit.129
Figure D.2 – Triggered transformer or Skeats circuit .131
Figure G.1 – Capacitive current circuits (parallel mode) .147
Figure G.2 – Current injection circuit.149
Figure G.3 – LC oscillating circuit .151
Figure G.4 – Inductive current circuit in parallel with LC oscillating circuit.153
Figure G.5 – Current injection circuit, normal recovery voltage applied to both
terminals of the circuit-breaker.155
Figure G.6 – Synthetic test circuit (series circuit), normal recovery voltage applied to
both sides of the test circuit breaker .157
Figure G.7 – Current injection circuit, recovery voltage applied to both sides of the
circuit-breaker.159
Figure G.8 – Making test circuit .161
Figure G.9 – Inrush making current test circuit.163

---------------------- Page: 9 ----------------------

SIST EN 62271-101:2006
62271-101  IEC:2006 – 7 –
Figure H.1 – Typical re-ignition circuit diagram for prolonging arc-duration .167
Figure H.2 – Combined Skeats and current injection circuits.169
Figure H.3 – Typical waveforms obtained during an asymmetrical test using the circuit
in Figure H.2.171
Figure J.1a – Three-phase synthetic combined circuit.205
Figure J.1b – Waveshapes of currents, phase-to-ground and phase-to phase voltages
during a three-phase synthetic test (T100s; k = 1,5 ) performed according to the
pp
three-phase synthetic combined circuit .207
Figure J.2a – Three-phase synthetic circuit with injection in all phases for k = 1,5 .209
pp
Figure J.2b – Waveshapes of currents and phase-to-ground voltages during a three-
phase synthetic test (T100s; k =1,5) performed according to the three-phase
pp
synthetic circuit with injection in all phases .211
Figure J.3a – Three-phase synthetic circuit for terminal fault tests with k = 1,3
pp
(current injection method) .213
Figure J.3b – Waveshapes of currents, phase-to-ground and phase-to-phase voltages
during a three-phase synthetic test (T100s; k =1,3 ) performed according to the
pp
three-phase synthetic circuit shown in Figure J.3a .213
Figure J.3c – TRV voltages waveshapes of the test circuit described in Figure J.3a.215
Figure K.1 – Example of a three-phase current circuit with single-phase synthetic injection . 237
Figure K.2 – Representation of the testing conditions of Table K.1a.239
Figure K.3 – Representation of the testing conditions of Table K.1b.241
Figure K.4 – Representation of the testing conditions of Table K.2a.243
Figure K.5 – Representation of the testing conditions of Table K.2b.245
Figure K.6 – Representation of the testing conditions of Table K.3a.247
Figure K.7 – Representation of the testing conditions of Table K.3b.249
Figure K.8 – Representation of the testing conditions of Table K.4a.251
Figure K.9 – Representation of the testing conditions of Table K.4b.253
Figure L.1 – Graphical representation of the test shown in Table L.1 .267
Figure L.2 – Graphical representation of the test shown in Table L.2 .269

Table 1 – Test circuits for test duties T100s and T100a .31
Table 2 – Test duties T10, T30, T60 and T100s .33
Table 2a – First-pole-to-clear factor: 1,5 – Test parameters during three-phase
interruption .33
Table 2b – First-pole-to-clear factor: 1,3 – Test parameters during three-phase
interruption .33
Table 3 – Synthetic test methods for test duties T10, T30, T60, T100s, T100a, SP,
DEF, OP and SLF .59
Table I.1a – Last current loop parameters for 50 Hz operation in relation to short-circuit
test duty T100a τ = 45 ms.175
Table I.1b – Last current loop parameters for 50 Hz operation in relation to short-circuit
test duty T100a τ = 60 ms.177
Table I.1c – Last current loop parameters for 50 Hz operation in relation to short-circuit
test duty T100a τ = 75 ms.179
Table I.1d – Last current loop parameters for 50 Hz operation in relation to short-circuit
test duty T100a τ = 120 ms.181

---------------------- Page: 10 ----------------------

SIST EN 62271-101:2006
62271-101  IEC:2006 – 9 –
Table I.2a – Last current loop parameters for 60 Hz operation in relation to short-circuit
test duty T100a τ = 45 ms.183
Table I.2b – Last current loop parameters for 60 Hz operation in relation to short-circuit
test duty T100a τ = 60 ms.185
Table I.2c – Last current loop parameters for 60 Hz operation in relation to short-circuit
test duty T100a τ = 75 ms.187
Table I.2d – Last current loop parameters for 60 Hz operation in relation to short-circuit
test duty T100a τ = 120 ms.189
Table I.3a – Last loop di/dt reduction for 50 Hz under three-phase conditions with the
first pole to clear in phase A and the required asymmetry in phase C.191
Table I.3b – Last loop di/dt reduction for 60 Hz under three- phase conditions with the
first pole to clear in phase A and the required asymmetry in phase C.193
Table I.4a – Corrected TRV values for k = 1,3 and f = 50 Hz.195
pp r
Table I.4b – Corrected TRV values for k = 1,3 and f = 60 Hz.197
pp r
Table I.4c – Corrected TRV values for k = 1,5 and f = 50 Hz.199
pp r
Table I.4d – Corrected TRV values for k = 1,5 and f = 60 Hz.199
pp r
Table K.1a – Demonstration of arcing times for a first-pole-to-clear factor of 1,5.219
Table K.1b – Alternative demonstration of arcing times for a first-pole-to-clear factor
of 1,5 .221
Table K.2a – Demonstration of arcing times for a first-pole-to-clear factor of 1,3.223
Table K.2b – Alternative demonstration of arcing times for a first-pole-to-clear factor
of 1,3 .225
Table K.3a – Demonstration of arcing times for a first-pole-to-clear factor of 1,5.229
Table K.3b – Alternative demonstration of arcing times for a first-pole-to-clear factor
of 1,5 .231
Table K.4a – Demonstration of arcing times for a first-pole-to-clear factor of 1,3.233
Table K.4b – Alternative demonstration of arcing times for a first-pole-to-clear factor
of 1,3 .235
Table L.1 – Test procedure for a first-pole-to-clear factor of 1,5.257
Table L.2a – Alternative demonstration of arcing times for a first-pole-to-clear factor
of 1,3 .259
Table L.2b – Simplified test procedure for a first-pole-to-clear factor of 1,3.261
Table L.3 – Test procedure for asymmetrical currents in the case of a first-pole-to-
clear factor of 1,5.263
Table L.4 – Test procedure for asymmetrical currents in the case of a first-pole-to-
clear factor of 1,3.265
Table L.5 – Required arcing windows in ° for different asymmetrical conditions, f =
r
50 Hz.271
Table L.6 – Required arcing windows in ° for different asymmetrical conditions, f =
r
60 Hz.273
Table M.1 – Tolerances on test quantities for type tests.277

---------------------- Page: 11 ----------------------

SIST EN 62271-101:2006
62271-101  IEC:2006 – 11 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________

HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR –

Part 101: Synthetic testing


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62271-101 has been prepared by subcommittee 17A: High-voltage
switchgear and controlgear, of IEC technical committee 17: Switchgear and controlgear.
This first edition cancels and replaces the third edition of IEC 60427 published in 2000. This
first edition constitutes a technical revision.
The text of this standard is based on the third edition of IEC 60427 and the following
documents:
FDIS Report on voting
17A/753/FDIS 17A/755/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

---------------------- Page: 12 ----------------------

SIST EN 62271-101:2006
62271-101  IEC:2006 – 13 –
This publication shall be read in conjunction with IEC 62271-100. The numbering of the
subclauses of Clause 6 is the same as in IEC 62271-100. However, not all subclauses of IEC
62271-100 are addressed; merely those where synthetic testing has introduced changes.
The IEC 62271-100 series consists of the following parts, under the general title High-voltage
1
switchgear and controlgear:
Part 100: High-voltage alternating-current circuit-breakers
Part 101: Synthetic testing
Part 102: Alternating current disconnectors and earthing switches
Part 104: Alternating current switches for rated voltages of 52 kV and above
Part 105:
...