SIST EN ISO 12179:2000

SLOVENSKI STANDARD
SIST EN ISO 12179:2000
01-december-2000
Geometrical Product Specifications (GPS) - Surface texture: Profile method -
Calibration of contact (stylus) instruments (ISO 12179:2000)
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration
of contact (stylus) instruments (ISO 12179:2000)
Geometrische Produktspezifikation (GPS) -Oberflächenbeschaffenheit:
Tastschnittverfahren - Kalibrierung von Tastschnittgeräten (ISO 12179:2000)
Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil -
Etalonnage des instruments a contact (palpeur) (ISO 12179:2000)
Ta slovenski standard je istoveten z: EN ISO 12179:2000
ICS:
17.040.30 Merila Measuring instruments
17.040.40 6SHFLILNDFLMDJHRPHWULMVNLK Geometrical Product
YHOLþLQL]GHOND*36 Specification (GPS)
SIST EN ISO 12179:2000 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN ISO 12179:2000

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SIST EN ISO 12179:2000

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SIST EN ISO 12179:2000

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SIST EN ISO 12179:2000
INTERNATIONAL ISO
STANDARD 12179
First edition
2000-03-15
Geometrical Product Specifications
(GPS) — Surface texture: Profile method —
Calibration of contact (stylus) instruments
Spécification géométrique des produits (GPS) — État de surface: Méthode
du profil — Étalonnage des instruments à contact (palpeur)
Reference number
ISO 12179:2000(E)
©
ISO 2000

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SIST EN ISO 12179:2000
ISO 12179:2000(E)
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ii © ISO 2000 – All rights reserved

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SIST EN ISO 12179:2000
ISO 12179:2000(E)
Contents Page
Foreword.iv
Introduction.v
1 Scope .1
2 Normative references .1
3 Terms and definitions .2
4 Conditions of use.2
5 Measurement standards .3
6 Contact (stylus) instrument metrological characteristics.3
7 Calibration .6
8 Uncertainty of measurement .8
9 Contact (stylus) instrument calibration certificate.9
Annex A (normative) Calibration of instruments measuring the motifs method parameters.10
Annex B (normative) Calibration of simplified operator instruments for the measurements of surface
texture .12
Annex C (informative) Example: roughness measurement standard parameter Ra .13
Annex D (informative) Relation to the GPS matrix model.16
Bibliography.17
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SIST EN ISO 12179:2000
ISO 12179:2000(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO
member bodies). The work of preparing International Standards is normally carried out through ISO technical
committees. Each member body interested in a subject for which a technical committee has been established has
the right to be represented on that committee. International organizations, governmental and non-governmental, in
liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical
Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.
Draft International Standards adopted by the technical committees are circulated to the member bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights.
International Standard ISO 12179 was prepared by Technical Committee ISO/TC 213, Dimensional and
geometrical product specifications and verification.
Annexes A and B form a normative part of this International Standard. Annexes C and D are for information only.
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SIST EN ISO 12179:2000
ISO 12179:2000(E)
Introduction
This International Standard is a geometrical product specification (GPS) standard and is to be regarded as a
general GPS standard (see ISO/TR 14638). It influences the chain link 6 of the chain of standards on roughness,
waviness and primary profile.
For more detailed information on the relationship of this standard to the GPS matrix model, see annex D.
This International Standard introduces calibration of contact (stylus) instruments as defined in ISO 3274. The
calibration is to be carried out with the aid of measurement standards.
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SIST EN ISO 12179:2000

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SIST EN ISO 12179:2000
INTERNATIONAL STANDARD ISO 12179:2000(E)
Geometrical Product Specifications (GPS) — Surface texture:
Profile method — Calibration of contact (stylus) instruments
1 Scope
This International Standard applies to the calibration of the metrological characteristics of contact (stylus)
instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration is
to be carried out with the aid of measurement standards.
Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus) instruments
which do not conform with ISO 3274.
2 Normative references
The following normative documents contain provisions which, through reference in this text, constitute provisions of
this International Standard. For dated references, subsequent amendments to, or revisions of, any of these
publications do not apply. However, parties to agreements based on this International Standard are encouraged to
investigate the possibility of applying the most recent editions of the normative documents indicated below. For
undated references, the latest edition of the normative document referred to applies. Members of ISO and IEC
maintain registers of currently valid International Standards.
ISO 3274:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal
characteristics of contact (stylus) instruments.
ISO 4287:1997, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions
and surface texture parameters.
ISO 5436-1:2000, Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement
standards — Part 1: Material measures.
ISO 10012-1:1992, Quality assurance requirements for measuring equipment — Part 1: Metrological confirmation
system for measuring equipment.
ISO 12085:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif
parameters.
ISO 14253-1:1998, Geometrical Product Specifications (GPS) — Inspection by measurement of workpieces and
measuring equipment — Part 1: Decision rules for proving conformance or non-conformance with specification.
ISO/TS 14253-2:1999, Geometrical Product Specifications (GPS) — Inspection by measurement of workpieces
and measuring equipment — Part 2: Guide to the estimation of uncertainty of measurement in GPS measurement,
in calibration of measuring equipment and in product verification.
Guide to the expression of uncertainty in measurement (GUM). BIPM,IEC,IFCC, ISO, IUPAC,IUPAP,OIML,
1st edition, 1995.
International vocabulary of basic and general terms used in metrology (VIM). BIPM, IEC, IFCC, ISO, IUPAC,
IUPAP, OIML, 2nd edition, 1993.
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SIST EN ISO 12179:2000
ISO 12179:2000(E)
3 Terms and definitions
For the purposes of this International Standard, the terms and definitions given in ISO 3274, ISO 4287,
ISO 14253-1, VIM [some of which are reproduced below (without their notes) for convenience], GUM, and term and
definition 3.2, apply.
3.1
calibration
set of operations that establish, under specified conditions, the relationship between values of quantities indicated
by a measuring instrument or measuring system, or values represented by a material measure or a reference
material, and the corresponding values realized by standards
[VIM 6.11]
3.2
task related calibration
set of operations which establish, under specified conditions, the relationship between values of quantities
indicated by a measuring instrument and the corresponding known values of a limited family of precisely defined
measurands which constitute a subset of the measuring capabilities of the measuring instrument
3.3
adjustment (of a measuring instrument)
operation of bringing a measuring instrument into a state of performance suitable for its use
[VIM 4.30]
3.4
(measurement) standard
etalon
material measure, measuring instrument, reference material or measuring system intended to define, realize,
conserve or reproduce a unit or one or more values of a quantity to serve as a reference
[VIM 6.1]
NOTE In ISO 5436:1985, "measurement standards" were referred to as "calibration specimens".
3.5
uncertainty of measurement
parameter, associated with the result of a measurement, that characterizes the dispersion of the values that could
reasonably be attributed to the measurand
[VIM 3.9]
3.6
traceability
property of the result of a measurement or the value of a standard whereby it can be related to stated references,
usually national or international standards, through an unbroken chain of comparisons all having stated
uncertainties
[VIM 6.10]
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
The contact (stylus) instrument is comprised of the basic equipment, a drive unit, a probe and a profile recorder
(see ISO 3274).
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SIST EN ISO 12179:2000
ISO 12179:2000(E)
If the basic equipment is used with several drive units and probes, each of these instrumental combinations
(configurations) shall be calibrated separately.
4.2 Calibration of a configuration
The contact (stylus) instrument shall be calibrated when a change is made to the basic elements of the system
which intentionally or unintentionally modifies the measured profile/measuring result. Each configuration of the
contact (stylus) instrument shall be calibrated separately.
EXAMPLE With a change of probe the contact (stylus) instrument shall be calibrated.
4.3 Place of calibration
The contact (stylus) instrument should be calibrated at the place of use with environmental conditions similar to
those present when in use for measurement to take into account external influence factors.
EXAMPLE Noise, temperature, vibration, air movement, etc.
5 Measurement standards
The following measuring standards are applicable to the calibrations given in clause 6:
� optical flat;
� depth measurement standard (Figure 1): type A according to ISO 5436-1;
� spacing measurement standard (Figure 2): type C according to ISO 5436-1;
� inclined optical flat (Figure 3);
� profile co-ordinate measurement standard (consisting of a sphere or prism): type E according to ISO 5436-1;
� roughness measurement standard (Figure 4): type D according to ISO 5436-1.
NOTE It is recommended that a profile co-ordinate measurement standard be used on contact (stylus) instruments where
the stylus rotates plus and minus one half of a degree when moving through its full range.
6 Contact (stylus) instrument metrological characteristics
Only those task-related contact (stylus) instrument metrological characteristics which are relevant for the intended
measurements should be selected for calibration. For example, for the measurement of spacing parameters, the
vertical profile component need not be calibrated.
6.1 Residual profile calibration
The scratch-free optical flat reproduces the residual profile. For task-related calibrations use the appropriate profile
and parameters (for example: the roughness profile with Ra, Rq or Rt; the waviness profile with Wq or Wt).
NOTE By using this approach the effects of external guide straightness, environmental conditions and instrument noise
can be established.
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SIST EN ISO 12179:2000
ISO 12179:2000(E)
Dimension in millimetres
Figure 1 — Example of a depth measurement standard (type A2)
Figure 2 — Example of a spacing measurement standard (type C)
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SIST EN ISO 12179:2000
ISO 12179:2000(E)
Figure 3 — Example of an inclined optical flat and a measuring plan
Values in millimetres
Figure 4 — Example of a roughness measurement standard (type D) and measuring plan
6.2 Vertical profile component calibration
The depth measurement standard reproduces the profile depth in order to measure the error of indication of the
vertical profile component.
NOTE If no depth measurement standards are available gauge blocks may be used. Care must be taken concerning the
uncertainty of the height difference when using gauge blocks.
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SIST EN ISO 12179:2000
ISO 12179:2000(E)
6.3 Horizontal profile component calibration
The spacing measurement standard reproduces the mean width of profile element, PSm, in order to measure the
error of indication of the horizontal profile component.
6.4 Profile co-ordinate system calibration
The inclined optical flat reproduces:
� the least squares best fit angle in degrees;
� the total height of the primary profile, Pt, after removal of the least squares best fit straight line;
thus establishing the error of the linked horizontal and vertical co-ordinates (i.e. variation in traverse speed, non-
linearities in scales, etc.).
The profile co-ordinate measurement standard reproduces the total height of the primary profile, Pt,after removal of
the least squares best fit nominal form, thus establishing the co-ordinate system.
6.5 Calibration of the total contact (stylus) instrument
The roughness measurement standards reproduce the:
� arithmetical mean deviation, Ra;
� maximum height of profile Rz;
thus establishing an overall check of the total contact (stylus) instrument.
7 Calibration
7.1 Preparation for calibration
Before calibration, the contact (stylus) instrument shall be checked to determine if it operates correctly as described
in the manufacturer's operating instructions. The condition of the stylus tip shall also be checked according to the
manufacturer's instructions.
For contact (stylus) instruments the following shall be complied with.
� The residual profile is to be evaluated.
� The plane of the depth measurement standard shall be aligned to the reference surface in the best possible
way. All measurement standards shall be aligned properly, for example the plane of the roughness
measurement standard shall be aligned to within 10 % of the measuring gauge range but not more than 10 μm
over the evaluation length.
� In task related calibrations, roughness measurement standards shall be used with the appropriate roughness
comparable to the roughness of the surface to be measured.
� Measurements shall be taken in the middle of the vertical measuring range of the probe each time.
� A sufficient number of measurements shall be taken on each measurement standard for the required
measurement uncertainty, (see clause 8). Repeated measurements are usually necessary due to the
inhomogeneity of the measurement standard, the variability of the measurement procedure, and the
repeatability of the contact (stylus) instrument.
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SIST EN ISO 12179:2000
ISO 12179:20
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