SIST-TS 102 694-1 V10.1.0:2015

SLOVENSKI STANDARD
SIST-TS 102 694-1 V10.1.0:2015
01-julij-2015
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Smart Cards;Test specification for the Single Wire Protocol (SWP) interface;Part 1:
Terminal features (Release 10)
Ta slovenski standard je istoveten z: TS 102 694-1 V10.1.0
ICS:
35.240.15 Identifikacijske kartice in Identification cards and
sorodne naprave related devices
SIST-TS 102 694-1 V10.1.0:2015 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST-TS 102 694-1 V10.1.0:2015

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SIST-TS 102 694-1 V10.1.0:2015
ETSI TS 102 694-1 V10.1.0 (2015-02)






TECHNICAL SPECIFICATION
Smart Cards;
Test specification for the
Single Wire Protocol (SWP) interface;
Part 1: Terminal features
(Release 10)

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SIST-TS 102 694-1 V10.1.0:2015
Release 10 2 ETSI TS 102 694-1 V10.1.0 (2015-02)



Reference
RTS/SCP-00SWPTva10
Keywords
smart card, terminal
ETSI
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SIST-TS 102 694-1 V10.1.0:2015
Release 10 3 ETSI TS 102 694-1 V10.1.0 (2015-02)
Contents
Intellectual Property Rights . 9
Foreword . 9
Modal verbs terminology . 9
Introduction . 10
1 Scope . 11
2 References . 11
2.1 Normative references . 11
2.2 Informative references . 12
3 Definitions, symbols and abbreviations . 12
3.1 Definitions . 12
3.2 Symbols . 13
3.3 Abbreviations . 13
3.4 Formats . 14
3.4.1 Format of the table of optional features . 14
3.4.2 Format of the applicability table . 14
3.4.3 Status and Notations . 15
4 Test environment . 16
4.1 Table of optional features . 16
4.2 Applicability table . 17
4.3 Information provided by the device supplier . 21
4.4 Test equipment . 21
4.4.1 Measurement/setting uncertainties . 22
4.4.2 Default conditions for DUT operation . 22
4.4.2.1 Temperature . 23
4.4.2.2 ETSI TS 102 221 interface contacts (CLK, RST, I/O) and contact Vcc . 23
4.4.2.3 ETSI TS 102 600 interface contacts (IC_DP, IC_DM) . 23
4.4.2.4 ETSI TS 102 613 interface contact (SWIO). 23
4.4.2.5 Status of UICC interfaces . 23
4.4.2.6 Characteristics of LLC's . 23
4.4.2.6.1 ACT LLC . 23
4.4.2.6.2 SHDLC LLC . 24
4.4.2.6.3 CLT LLC . 24
4.4.3 Minimum/maximum conditions for DUT operation . 24
4.4.4 Execution requirements . 24
4.4.4.1 Definition of TR1 . 24
4.4.4.2 Definition of TR2 . 24
4.5 Test execution . 25
4.5.1 Parameter variations . 25
4.5.2 Execution requirements . 25
4.6 Pass criterion . 26
5 Test cases . 26
5.1 Principle of the Single Wire Protocol . 26
5.2 System architecture . 26
5.2.1 General overview . 26
5.2.2 ETSI TS 102 221 support . 26
5.2.2.1 Conformance requirements . 26
5.2.3 Configurations . 27
5.2.3.1 Conformance requirements . 27
5.2.4 Interaction with other interfaces . 27
5.2.4.1 Conformance requirements . 27
5.3 Physical characteristic s . 27
5.3.1 Temperature range for card operations . 27
ETSI

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SIST-TS 102 694-1 V10.1.0:2015
Release 10 4 ETSI TS 102 694-1 V10.1.0 (2015-02)
5.3.1.1 Conformance requirements . 27
5.3.2 Contacts . 27
5.3.2.1 Provision of contacts . 27
5.3.2.1.1 Conformance requirements . 27
5.3.2.2 Contact activation and deactivation . 28
5.3.2.2.1 Conformance requirements . 28
5.3.2.2.2 Test case 1: activation of SWP additionally to other interfaces . 28
5.3.2.2.3 Test case 2: activation of SWP in low power mode . 29
5.3.2.3 Interface activation . 29
5.3.2.3.1 Conformance requirements . 29
5.3.2.3.2 Test case 1: SWP initial activation in full power mode - normal procedure . 32
5.3.2.3.3 Test case 2: SWP Initial activation - no resume . 32
5.3.2.3.4 Test case 3: SWP initial activation in full power mode - corrupted ACT_SYNC frame (repeat
the last frame) . 32
5.3.2.3.5 Test case 4: SWP initial activation in full power mode - no ACT_SYNC frame (repeat the
last frame) . 33
5.3.2.3.6 Test case 5: SWP initial activation failed in full power mode - corrupted ACT_SYNC frame
(multiple) . 33
5.3.2.3.7 Test case 6: SWP initial activation failed in full power mode - no ACT_SYNC frame
(multiple) . 34
5.3.2.3.8 Test case 7: SWP Initial activation in full power mode - corrupted ACT_READY frame
(repeat last frame) . 35
5.3.2.3.9 Void . 35
5.3.2.3.9a Test case 8a: SWP Initial activation in full power mode - no ACT_READY frame (repeat last
frame) . 35
5.3.2.3.10 Test case 9: SWP initial activation failed in full power mode - corrupted ACT_READY
frame (multiple) . 36
5.3.2.3.11 Test case 10: SWP initial activation failed in full power mode - no ACT_READY frame
(multiple) . 37
5.3.2.3.12 Test case 11: SWP initial activation in low power mode . 37
5.3.2.3.13 Test case 12:SWP initial activation in low power mode - corrupted ACT_SYNC frame
(repeat the last frame) . 38
5.3.2.3.14 Test case 13: SWP initial activation in low power mode - no ACT_SYNC frame (repeat the
last frame) . 38
5.3.2.3.15 Test case 14: SWP initial activation failed in low power mode - corrupted ACT_SYNC frame
(multiple) . 39
5.3.2.3.16 Test case 15: SWP initial activation failed in low power mode - no ACT_SYNC frame
(multiple) . 40
5.3.2.3.17 Test case 16: SWP subsequent activation in full power mode . 40
5.3.2.3.18 Void . 41
5.3.2.3.19 Test case 18: SWP initial activation in full power mode - send ACT frames in wrong order,
ACT_READY frame after activation (repeat the last frame) . 41
5.3.2.4 Behavior of a UICC in a terminal not supporting SWP . 41
5.3.2.4.1 Conformance requirements . 41
5.3.2.5 Behavior of terminal connected to a UICC not supporting SWP . 42
5.3.2.5.1 Conformance requirements . 42
5.3.2.5.2 Void . 42
5.3.2.6 Inactive contacts . 42
5.3.2.6.1 Conformance requirements . 42
5.4 Electrical characteristics . 42
5.4.1 Operating conditions and sub-clauses . 42
5.4.1.1 Operating conditions . 42
5.4.1.2 Supply voltage classes. 42
5.4.1.3 V (C1) low power mode definition . 42
CC
5.4.1.3.1 Conformance requirements . 42
5.4.1.3.2 Test case 1: current provided in low power mode, no spikes . 43
5.4.1.3.3 Test case 2: current provided in low power mode, with spikes . 43
5.4.1.4 Signal S1 . 45
5.4.1.4.1 Conformance requirements . 45
5.4.1.4.2 Test case 1: communication with S2 variation in full power mode . 45
5.4.1.4.3 Test case 2: communication with S2 variation in low power mode . 46
5.4.1.5 Signal S2 and subclauses . 46
ETSI

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SIST-TS 102 694-1 V10.1.0:2015
Release 10 5 ETSI TS 102 694-1 V10.1.0 (2015-02)
5.4.1.5.1 Signal S2. 46
5.4.1.5.2 Operating current for S2 . 46
5.5 Physical transmission layer . 48
5.5.1 S1 Bit coding and sampling time . 48
5.5.1.1 Conformance requirements . 48
5.5.1.2 Test case 1: S1 waveforms, default bit duration. 48
5.5.1.2.1 Test execution . 48
5.5.1.2.2 Initial conditions . 49
5.5.1.2.3 Test procedure . 49
5.5.1.3 Test case 2: S1 waveforms, extended bit durations . 49
5.5.1.3.1 Test execution . 49
5.5.1.3.2 Initial conditions . 49
5.5.1.3.3 Test procedure . 50
5.5.2 S2 switching management . 50
5.5.2.1 Conformance requirements . 50
5.5.3 SWP interface states management . 51
5.5.3.1 Conformance requirements . 51
5.5.3.2 Test case 1: SWP states and transitions, communication . 51
5.5.3.2.1 Test execution . 51
5.5.3.2.2 Initial conditions . 52
5.5.3.2.3 Test procedure . 52
5.5.3.3 Test Case 2: SWP resume after upper layer indication that the UICC requires no more activity on
this interface . 52
5.5.3.3.1 Test execution . 52
5.5.3.3.2 Initial Conditions . 52
5.5.3.3.3 Test procedure . 53
5.5.4 Power mode states/transitions and Power saving mode . 53
5.5.4.1 Conformance requirements . 53
5.5.4.2 Test case 1: power provided in full power mode . 53
5.5.4.2.1 Test execution . 53
5.5.4.2.2 Initial conditions . 53
5.5.4.2.3 Test procedure . 54
5.5.4.3 Test case 2: switching from full to low power mode . 54
5.5.4.3.1 Test execution . 54
5.5.4.3.2 Initial conditions . 54
5.5.4.3.3 Test procedure . 54
5.5.4.4 Test case 3: switching from low to full power mode . 54
5.5.4.4.1 Test execution . 54
5.5.4.4.2 Initial conditions . 54
5.5.4.4.3 Test procedure . 55
5.6 Data link layer . 55
5.6.1 Overview . 55
5.6.2 Medium Access Control (MAC) layer . 55
5.6.2.1 Bit order . 55
5.6.2.1.1 Conformance requirements . 55
5.6.2.2 Structure . 55
5.6.2.2.1 Conformance requirements . 55
5.6.2.2.2 Test case 1: interpretation of incorrectly formed frames - SHDLC RSET frames . 56
5.6.2.2.3 Test case 2: interpretation of incorrectly formed frames - SHDLC I-frames . 56
5.6.2.3 Bit stuffing . 57
5.6.2.3.1 Conformance requirements . 57
5.6.2.3.2 Test case 1: behavior of CLF with bit stuffing in frame . 57
5.6.2.4 Error detection . 57
5.6.2.4.1 Conformance requirements . 57
5.6.3 Supported LLC layers and sub clauses . 58
5.6.3.1 Supported LLC layers . 58
5.6.3.1.1 Conformance requirements . 58
5.6.3.2 Interworking of the LLC layers . 58
5.6.3.2.1 Conformance requirements . 58
5.6.3.2.2 Test case 1: ignore ACT LLC frame reception after the SHDLC link establishment . 58
5.6.3.2.3 Test case 2: ignore ACT LLC frame reception in CLT session. 59
5.6.3.2.4 Test case 3: CLT session during SHDLC communication . 59
ETSI

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