SIST EN 60384-21:2012

SLOVENSKI STANDARD
SIST EN 60384-21:2012
01-junij-2012
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SIST EN 60384-21:2005
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Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed
surface mount multilayer capacitors of ceramic dielectric, Class 1
Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 21:
Rahmenspezifikation - Oberflächenmontierbare Vielschichtkeramik-Festkondensatoren,
Klasse 1
Condensateurs fixes utilisés dans les équipements électroniques - Partie 21:
Spécification intermédiaire: Condensateurs multicouches fixes à diélectriques en
céramique pour montage en surface, de classe 1
Ta slovenski standard je istoveten z: EN 60384-21:2012
ICS:
31.060.10 Fiksni kondenzatorji Fixed capacitors
SIST EN 60384-21:2012 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60384-21:2012

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SIST EN 60384-21:2012

EUROPEAN STANDARD
EN 60384-21

NORME EUROPÉENNE
March 2012
EUROPÄISCHE NORM

ICS 31.060.10 Supersedes EN 60384-21:2004


English version


Fixed capacitors for use in electronic equipment -
Part 21: Sectional specification -
Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
(IEC 60384-21:2011)


Condensateurs fixes utilisés dans les Festkondensatoren zur Verwendung in
équipements électroniques - Geräten der Elektronik -
Partie 21: Spécification intermédiaire: Teil 21: Rahmenspezifikation -
Condensateurs multicouches fixes à Oberflächenmontierbare
diélectriques en céramique pour montage Vielschichtkeramik-Festkondensatoren,
en surface, de classe 1 Klasse 1
(CEI 60384-21:2011) (IEC 60384-21:2011)





This European Standard was approved by CENELEC on 2012-01-13. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60384-21:2012 E

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SIST EN 60384-21:2012
EN 60384-21:2012 - 2 -

Foreword
The text of document 40/2127/FDIS, future edition 2 of IEC 60384-21, prepared by IEC TC 40,
"Capacitors and resistors for electronic equipment" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 60384-21:2012.

The following dates are fixed:
(dop) 2012-10-13
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2015-01-13
standards conflicting with the
document have to be withdrawn

This document supersedes EN 60384-21:2004.
EN 60384-21:2012 includes the following significant technical changes with respect to
EN 60384-21:2004:
— The test voltage of 1,2 U at U ≥ 1 000 V has been added in 4.5.4 Voltage proof.
R R
— Detail test conditions have been added in 4.7 Shear test and 4.8 Substrate bending test.
— Test conditions applying lead free solder alloy (Sn-Ag-Cu) have been included in 4.9 Resistance to
soldering heat and 4.10 Solderability.
— A selection of the test conditions according to marketing needs have been stated in 4.13 Damp heat,
steady state.
— The dimensions of 0402 M in Annex A have been added.
— The code of the temperature coefficient and the tolerance of capacitance for the reference
temperature of 25 °C have been added, see Annex B.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent
rights.

Endorsement notice
The text of the International Standard IEC 60384-21:2011 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 60384-14 NOTE  Harmonized as EN 60384-14.

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SIST EN 60384-21:2012
- 3 - EN 60384-21:2012
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC 60063 1963 Preferred number series for resistors and - -
+ A1 1967 capacitors
+ A2 1977



IEC 60068-1 1988 Environmental testing - EN 60068-1 1994
+ corr. October 1988 Part 1: General and guidance


IEC 60068-2-58 2004 Environmental testing - EN 60068-2-58 2004
Part 2-58: Tests - Test Td: Test methods for + corr. December 2004
solderability, resistance to dissolution of
metallization and to soldering heat of surface
mounting devices (SMD)


IEC 60384-1 2008 Fixed capacitors for use in electronic EN 60384-1 2009
+ corr. November 2008 equipment -
Part 1: Generic specification


IEC 61193-2 2007 Quality assessment systems - EN 61193-2 2007
Part 2: Selection and use of sampling plans
for inspection of electronic components and
packages


ISO 3 1973 Preferred numbers - Series of preferred - -
numbers

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SIST EN 60384-21:2012

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SIST EN 60384-21:2012
IEC 60384-21
®

Edition 2.0 2011-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 1

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 21: Spécification intermédiaire – Condensateurs multicouches fixes à
diélectriques en céramique pour montage en surface, de Classe 1

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX W
ICS 31.060.10 ISBN 978-2-88912-822-8

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 60384-21:2012
– 2 – 60384-21 © IEC:2011
CONTENTS
FOREWORD . 5
1 General . 7
1.1 Scope . 7
1.2 Object . 7
1.3 Normative references . 7
1.4 Information to be given in a detail specification . 7
1.4.1 Outline drawing and dimensions . 8
1.4.2 Mounting . 8
1.4.3 Rating and characteristics . 8
1.4.4 Marking . 9
1.5 Terms and definitions . 9
1.6 Marking . 10
1.6.1 Information for marking . 10
1.6.2 Marking on the body . 10
1.6.3 Requirements for marking . 10
1.6.4 Marking of the packaging . 10
1.6.5 Additional marking . 10
2 Preferred ratings and characteristics . 10
2.1 Preferred characteristics . 10
2.1.1 Preferred climatic categories . 10
2.2 Preferred values of ratings . 11
2.2.1 Rated temperature (T ) . 11
R
2.2.2 Rated voltage (U ) . 11
R
2.2.3 Category voltage (U ) . 11
C
2.2.4 Preferred values of nominal capacitance and associated tolerance
values . 11
2.2.5 Temperature coefficient (α) . 12
2.2.6 Dimensions . 14
3 Quality assessment procedures . 14
3.1 Primary stage of manufacture . 14
3.2 Structurally similar components . 14
3.3 Certified records of released lots . 14
3.4 Qualification approval . 14
3.4.1 Qualification approval on the basis of the fixed sample size
procedures . 14
3.4.2 Tests . 15
3.5 Quality conformance inspection . 19
3.5.1 Formation of inspection lots . 19
3.5.2 Schedule . 20
3.5.3 Delayed delivery . 20
3.5.4 Assessment levels . 20
4 Test and measurement procedures . 21
4.1 Preliminary drying . 21
4.2 Measuring conditions . 22
4.3 Mounting . 22
4.4 Visual examination and check of dimensions . 22
4.4.1 Visual examination . 22

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SIST EN 60384-21:2012
60384-21 © IEC:2011 – 3 –
4.4.2 Requirements . 22
4.5 Electrical tests . 24
4.5.1 Capacitance . 24
4.5.2 Tangent of loss angle (tan δ) . 24
4.5.3 Insulation resistance . 24
4.5.4 Voltage proof . 25
4.6 Temperature coefficient (α) and temperature cycle drift . 26
4.6.1 Preliminary drying . 26
4.6.2 Measuring conditions . 26
4.6.3 Requirements . 26
4.7 Shear test . 26
4.8 Substrate bending test . 27
4.8.1 Initial measurement . 27
4.8.2 Final inspection . 27
4.9 Resistance to soldering heat . 27
4.9.1 Initial measurement . 27
4.9.2 Test conditions . 27
4.9.3 Recovery . 28
4.9.4 Final inspection, measurements and requirements . 28
4.10 Solderability . 29
4.10.1 Test conditions . 29
4.10.2 Recovery . 30
4.10.3 Final inspection, measurements and requirements . 30
4.11 Rapid change of temperature . 30
4.11.1 Initial measurement . 30
4.11.2 Number of cycles . 30
4.11.3 Recovery . 30
4.11.4 Final inspection, measurements and requirements . 30
4.12 Climatic sequence . 31
4.12.1 Initial measurement . 31
4.12.2 Dry heat . 31
4.12.3 Damp heat, cyclic, Test Db, first cycle . 31
4.12.4 Cold . 31
4.12.5 Damp heat, cyclic, Test Db, remaining cycles . 31
4.12.6 Final inspection, measurements and requirements . 31
4.13 Damp heat, steady state . 32
4.13.1 Initial measurement . 32
4.13.2 Conditions of test . 32
4.13.3 Recovery . 33
4.13.4 Final inspection, measurements and requirements . 33
4.14 Endurance . 33
4.14.1 Initial measurement . 33
4.14.2 Conditions of test . 33
4.14.3 Recovery . 34
4.14.4 Final inspection, measurements and requirements . 34
4.15 Robustness of terminations (only for capacitors with strip termination) . 34
4.15.1 Test conditions . 34
4.15.2 Final inspection and requirements . 34
4.16 Component solvent resistance (if required) . 35

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SIST EN 60384-21:2012
– 4 – 60384-21 © IEC:2011
4.17 Solvent resistance of the marking (if required) . 35
4.18 Accelerated damp heat, steady state (if required) . 35
4.18.1 Initial measurement . 35
4.18.2 Conditioning . 35
4.18.3 Recovery . 36
4.18.4 Final measurements . 36
Annex A (normative) Guidance for the specification and coding of dimensions of fixed
surface mount multilayer capacitors of ceramic dielectric, Class 1 . 37
Annex B (informative) Combination of temperature coefficient and tolerance for the
reference temperature of 25 °C . 38
Bibliography . 39

Figure 1 – Fault: crack or fissure . 22
Figure 2 – Fault: crack or fissure . 22
Figure 3 – Separation or delamination . 23
Figure 4 – Exposed electrodes . 23
Figure 5 – Principal faces . 23
Figure 6 – Reflow temperature profile . 28
Figure A.1 – Dimensions . 37

Table 1 – Preferred tolerance on nominal capacitance . 11
Table 2 – Nominal temperature coefficient and tolerance . 12
Table 3 – Combination of temperature coefficient and tolerance . 13
Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ . 16
Table 5 – Tests schedule for qualification approval . 17
Table 6a – Lot-by-lot inspection . 21
Table 6b – Periodic tests . 21
Table 7 – Tangent of loss angle limits . 24
Table 8 – Test voltages. 26
Table 9 – Temperature cyclic drift limits . 26
Table 10 – Reflow temperature profiles for Sn-Ag-Cu alloy . 28
Table 11 – Maximum capacitance change . 29
Table 12 – Maximum capacitance change . 31
Table 13 – Number of damp heat cycles . 31
Table 14 – Final inspection measurements and requirements . 32
Table 15 – Test conditions for damp heat, steady state . 32
Table 16 – Final inspection measurements and requirements . 33
Table 17 – Endurance test conditions (U = U ) . 33
C R
Table 18 – Endurance test conditions (U ≠ U ) . 34
C R
Table 19 – Final inspection measurements and requirements . 34
Table 20 – Initial requirements . 35
Table 21 – Conditioning . 35
Table B.1 – Combination of temperature coefficient and tolerance for the reference
temperature of 25 °C . 38

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SIST EN 60384-21:2012
60384-21 © IEC:2011 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 21: Sectional specification –
Fixed surface mount multilayer capacitors
of ceramic dielectric, Class 1

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-21 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This second edition cancels and replaces the first edition published in 2004 and contains the
following significant technical changes with respect to the previous edition:
• The test voltage of 1,2 U at U ≥ 1 000 V has been added in 4.5.4 Voltage proof.
R R
• Detail test conditions have been added in 4.7 Shear test and 4.8 Substrate bending test.
• Test conditions applying lead free solder alloy (Sn-Ag-Cu) have been included in 4.9
Resistance to soldering heat and 4.10 Solderability.
• A selection of the test conditions according to marketing needs have been stated in 4.13
Damp heat, steady state.
• The dimensions of 0402 M in Annex A have been added.

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SIST EN 60384-21:2012
– 6 – 60384-21 © IEC:2011
• The code of the temperature coefficient and the tolerance of capacitance for the reference
temperature of 25 °C have been added, see Annex B.
The text of this standard is based on the following documents:
FDIS Report on voting
40/2127/FDIS 40/2140/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all parts of the IEC 60384 series, under the general title Fixed capacitors for use in
electronic equipment, can be found on the IEC web site.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

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SIST EN 60384-21:2012
60384-21 © IEC:2011 – 7 –
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 2
...