ISO 16845-2:2014

DRAFT INTERNATIONAL STANDARD ISO/DIS 16845-2
ISO/TC 22/SC 3 Secretariat: DIN
Voting begins on Voting terminates on

2013-04-19 2013-07-19
INTERNATIONAL ORGANIZATION FOR STANDARDIZATION  •  МЕЖДУНАРОДНАЯ ОРГАНИЗАЦИЯ ПО СТАНДАРТИЗАЦИИ  •  ORGANISATION INTERNATIONALE DE NORMALISATION


Road vehicles — Controller area network (CAN) — Conformance
test plan —
Part 2:
High-speed medium access unit with selective wake-up
functionality — Conformance test plan
Véhicules routiers — Gestionnaire de réseau de communication (CAN) — Plan d'essai de conformité —
Partie 2

ICS 43.045.15









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©  International Organization for Standardization, 2013

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ISO/DIS 16845-2

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ISO/DIS 16845-2
Contents Page
Foreword . iv
Introduction . v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms . 2
5 OSI conformance test method . 2
6 Organization . 6
6.1 General organization . 6
6.2 Test case organization . 6
6.3 Hierarchical structure of tests . 9
7 Test cases . 11
7.1 Transceiver physical layer part . 11
7.2 Normal CAN communication acceptance . 37
7.3 Wake-up frame evaluation . 63
7.4 Frame error counter management . 84
7.5 Wake-up pattern class . 103
7.6 Low-power mode operation class . 109

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ISO/DIS 16845-2
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 16845-2 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3,
Electrical and electronic equipment.
This second/third/. edition cancels and replaces the first/second/. edition (), [clause(s) / subclause(s) /
table(s) / figure(s) / annex(es)] of which [has / have] been technically revised.
ISO 16845 consists of the following parts, under the general title Road vehicles — Controller area network
(CAN):
 Part 1: Conformance test plan (in preparation)
 Part 2: High-speed medium access unit with selective wake-up functionality - Conformance test plan
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ISO/DIS 16845-2
Introduction
ISO 16845 was first published in 2004 to provide the methodology and abstract test suite necessary for
checking the conformance of any CAN implementation of the CAN specified in ISO 11898-1. The new
restructured ISO 11898 contains among other series the ISO 11898-6, defining the physical layer
requirements for partial networking.
ISO 16845-2 provides the methodology and abstract test suite necessary for checking the conformance of any
CAN implementation of the specified ISO 11898-6.

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DRAFT INTERNATIONAL STANDARD ISO/DIS 16845-2

Road vehicles — Controller area network (CAN) — Part 2: High-speed medium access unit with
selective wake-up functionality - Conformance test plan
1 Scope
Standards always imply a certain expectation regarding the interoperability of devices produced by different
manufacturers. In fact a standard describes what we want and expect to see, but it is hard to guarantee each
feature without deep and thorough testing of the functionality described and demanded by the chosen
standard.
Scope of this document is to establish test cases and test requirements to realize a test plan verifying if the
CAN transceiver with implemented selective wake-up functions are conform the specified functionalities
referenced in clause 2. This kind of testing defined in this document is named as conformance testing.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments and technical corrigenda) applies.
ISO 7498-1, Information technology — Open systems interconnection — Basic reference model — Part 1:
The basic model
ISO 9641-1, Information technology — Open Systems Interconnection — Conformance testing methodology
and framework — Part 1: General concepts
ISO 9641-1, Information technology — Open Systems Interconnection — Conformance testing methodology
and framework — Part 2: Abstract Test Suite specification
ISO 11898-1, Road vehicles — Controller area network (CAN) — Part 1: Data link layer and physical
signalling
ISO 11898-2:2003, Road vehicles — Controller area network (CAN) — Part 2: High-speed medium access
unit
ISO 11898-5:2007, Road vehicles — Controller area network (CAN) — Part 5: High-speed medium access
unit with low-power mode
ISO 11898-6:2012, Road vehicles — Controller area network (CAN) — Part 6: High-speed medium access
unit with selective wake-up functionality
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 11898-2:2003, ISO 11898-5:2007
and the following apply.
3.1
Implementation under test
IUT
The device (e.g. standalone transceiver, SBC) which will be tested according this conformance test plan . An
IUT can be part of a SUT
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ISO/DIS 16845-2
3.2
Lower tester
LT
Part of the test system which emulates the interfaces of the underlying OSI layer from sight of the IUT
3.3
System under test
SUT
If the IUT is part of a system or cannot operate as a standalone device, the system under test is the system
where the IUT is implemented
3.4
Test system
TS
A system which fulfils in this case all requirements to perform the tests defined in this specification
3.5
Upper tester
UT
Part of the test system which emulates the interfaces of the overlying OSI layer from sight of the IUT
4 Symbols and abbreviated terms
ACK Acknowledge
ASP Abstract service primitives
CAN Controller Area Network
CRC Cyclic Redundancy Check
DLC Data Length Code
EOF End of Frame
ID Identifier
MAC Medium Access Control
OSI Open System Interconnection
PCO Point of control and observation
PHS Physical Signalling
PL Physical Layer
PMA Physical Medium Attachment
FEC Frame Error Counter
SOF Start of Frame
WUF Wake-up frame
WUP Wake-up pattern
IMF Intermission field

5 OSI conformance test method
OSI conformance testing was mainly introduced by the ISO 9646, ISO 9641-1 and ISO 9641-2, for the
purpose of regulating and harmonizing impartial tests. In general information about the internal structure of the
implementation as well as source code is not available to the party performing the tests. This explains why the
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ISO/DIS 16845-2
preferred OSI conformance testing methodology is black box testing and consequently does not take into
account any implementation details.
Figure 1 depicts the OSI coordinated test method.
TS
UT
ASPs
PCO Tester Supervisor
SUT
TCP logger
IUT
PCO
ASPs
LT

Key
SUT System Under Test
UT Upper Tester
IUT Implementation Under Test
LT Lower Tester
TCP Test Coordination Procedure
TS Test System
Figure 1 — The OSI coordinated test method

OSI conformance testing proposes many test methods suitable for different sorts of Implementation Under
Test (IUT), providing different points of control and observation.
The coordinated test method, is the most suitable for CAN devices, it provides a simple interface to the
Implementation Under Test, i.e. the CAN-Bus itself, and a flexible test coordination protocol using CAN
messages between the Lower Tester (LT) as part of the Test System and the Upper Tester (UT) in the
System Under Test. The Lower Tester controls and observes the Implementations Under Test lower service
boundary indirectly via the underlying service provider, using the Abstract Service Primitives (ASPs) of the
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ISO/DIS 16845-2
CAN protocol. The Upper Tester controls and observes the Implementations Under Test upper service
boundary. The Test Coordination Procedures (TCPs) ensure the cooperation between the Lower Tester and
the Upper Tester.
In case of CAN Transceiver with partial networking functionalities influencing variables from the upper tester
side are the digital CAN signals (RxD and TxD), host interface signals and I/O signals like INH or Wake. The
lower tester influencing variables are the analogue bus interface with the signals CAN_H and CAN_L and the
supply power. Figure 2 depicts the influencing variables on the IUT.
Host interface; CAN Rx Tx;
Wake; INH
(Host Interface, I/O)
IUT
CAN_H CAN_L; V ; V
BAT CC
(Bus Interface, Power)

Figure 2 — Influencing variables on IUT

To realise all services stimulating the IUT and recording the responses of the IUT regarding all influencing
variables, abstract logical devices are defined as followed.
Figure 3 depicts abstract logical devices of upper and lower tester.
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ISO/DIS 16845-2
CAN Recording
I/O device
digital device
ASPs
Host
UT
Interface
IUT TCP
LT
ASPs
CAN Recording
Supply
analog device
device

Figure 3 — Abstract logical devices of upper and lower tester
The OSI model divides a communication interface in seven logical layers which contain defined interfaces
from / to the upper or lower layer. Following the OSI coordinated test method the test system realises the
upper layer with help of the upper tester and the lower layer with help of the lower tester. For transceivers
without partial networking capability, the transceiver is implemented inside the logical layer 1 – the physical
layer with the lower interface as the CAN bus and the upper interface to the 2nd layer, known as the data link-
or protocol layer, with logical signals TxD and RxD. In case of a high speed CAN transceiver supporting partial
networking the IUT itself contains functionalities appropriate to the data link layer (partial networking
functionalities) and physical layer (typical transceiver functionalities). To follow the OSI coordinated test
method this test specification is split in a physical layer part, verifying the transceiver characteristics
appropriated to the OSI physical layer and a data link layer part, verifying the protocol implementation
necessary for partial networking functionalities.
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ISO/DIS 16845-2
6 Organization
6.1 General organization
The abstract test suites of the TS are independent to one another. Each abstract test suite checks the
behaviour of the IUT for a particular parameter of the CAN specification ISO 11898-1. Each test case may be
executed one after another in any order or alone.
Test cases requiring variations of individual parameters have to be repeated for each value of the parameter.
Each repetition is named elementary test. A test case including different elementary tests is valid only if all
tests pass.
The result of executing a test case on an IUT should be the same whenever it is performed. To realize such
reproducibility of test results this specification is designed in the way to minimize the possibility that a test
case produces different test outcomes on different occasions. Therefore, test requirements which have to be
met and how the verdicts are to be assigned are defined in an unambiguous way.
6.2 Test case organization
6.2.1 Overview
Each elementary test is made of three states:
 Setup state;
 Test state;
 Verification state.
Before the first elementary test is started the IUT has to be initialised into the default state.
6.2.2 Setup state
The Setup state is a defined and explicitly entered and verified state in which the IUT has to be before
entering the test state. The IUT, unless otherwise specified, is configured with data determined by the test
frame that is being used (the test frame will cause a wake-up). The ID mask, unless otherwise specified, is
configured with must-care fields.
6.2.2.1 Default setup
Figure 4 describes the default setup for test which shall be applied unless otherwise specified in Setup of the
test case description. Furthermore, the setup information of the related device documentation shall be
followed.
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ISO/DIS 16845-2
R = 60Ω
Test
CAN CAN analog
RXD CAN_L
digital
Generation / Reception
TXD
CAN_H
IUT
Supply device
V
Bat
V / V
I/O CC
V V
Gnd

Figure 4 — Default setup for test
6.2.2.2 Default state
The Default state is characterised by the following default value:
 IUT power supply on;
 IUT configured to test bit rate;
 IUT set to Normal mode.
After the end of each Elementary test, the default state must be re-applied.
6.2.3 Test state
The time between two frames on the bus shall be, unless otherwise specified, at least 2 bits of idle after IMF.
The idle phase shall not be longer than t .
SILENCE(min)
6.2.4 Test frame definition for protocol related test cases
6.2.4.1 Elements of test frames
In the protocol related test cases the focus is on correct frame reception and handling. Therefore, test frames
or test pattern will be sent to the IUT. The test frames with 11-bit identifiers are structured as depicted in
Figure 5. The elements of the test frame are described below.
SOF ID RTR IDE r0 DLC Data CRC CRC_DEL ACK ACK_DEL EOF INTERM_#

Figure 5 — 11-bit CAN-ID format frame elements

Figure 6 depicts the structure of the test frames in extended frame format. The elements of the test frame are
described below.
SOF ID_1 SRR IDE ID_2 RTR r1 r0 DLC Data CRC CRC_DEL ACK ACK_DEL EOF INTERM_#

Figure 6 — 29-bit CAN-ID format frame elements

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ISO/DIS 16845-2
The elements and the default values are defined in Table 1:
Table 1 — Elements of test frames
Element Meaning Bit size Default value
SOF Start of frame 1 0
ID 11 bit Identifier 11 refer to sub-clause 6.2.4.2
RTR Remote transmission request 1 0 = data frame = default
1 = remote frame
SRR Substitute Remote Request 1 1
IDE Identifier extended bit 1 0 = 11 bit ID frame (default)
1 = 29 bit ID frame
r0 Reserved bit 0 1 0
DLC Data length code 4 refer to sub-clause 6.2.4.2
Data Data field 0 … 8 [Byte] refer to sub-clause 6.2.4.2
CRC Cyclic redundancy check 15 Correspond to data
CRC_DEL Cyclic redundancy check 1 1
delimiter
ACK Acknowledgement slot 1 refer to sub-clause 6.2.4.2
ACK_DEL ACK delimiter 1 1
EOF End of frame 7 1
IMF Intermission field 3 1
ID 11 or 29 bit identifier 11 or 29 refer to sub-clause 6.2.4.2
r1 Reserved bit 1 1 0

6.2.4.2 Default frame and parameter definition
Unless otherwise specified in the corresponding test case definition, the used test frame shall be as defined in
Table 2.
Table 2 — Definition of the default test frames
Frame format ID DLC Data ACK
11 bit ID 000h 1 01h 0
29 bit ID 00000000h 1 01h 0

Further default parameters which shall be used unless otherwise specified in the corresponding test case
definition:
 Used frame type: 11 bit identifier
 IUT configuration: corresponding to the used test frame (wake-up condition fulfilled)
 ID mask:  set all bits to care
 Data mask bit: if implemented, it shall be set to enable
 t :   8 recessive bits after intermission field
WAIT
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ISO/DIS 16845-2
6.2.4.3 Sync frame sequence
The sync frame sequence as it is used in several test cases shall be as defined in Table 3.
Table 3 — Definition of the sync frame sequence
Frame ID DLC Data
a 555h 1 FFh
1 to 5
a
9 in case of data rate > 500 kbit/s

The frame generator sends each sync frame without a dominant acknowledge field followed by an active error
flag.
6.3 Hierarchical structure of tests
6.3.1 Overview
All the Tests defined in the test plan are grouped into categories in order to aid planning, development,
understanding or execution of each test case. There are two levels of categories:
 the test groups;
 the test cases.
6.3.2 Test group structure
The test cases are grouped by different functional blocks of the IUT which will be verified separately. Each test
group consists of one or several test cases.
6.3.3 Test case structure
Each test case of a test group focuses one particular requirement which will be verified.
Each test case is defined by a specific number and a particular name in order to differentiate the test cases
and to easily summarise the goal of the test case.
Table 4 depicts the structure of the defined test cases.
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ISO/DIS 16845-2
Table 4 — Structure of the defined test cases
Number Test case number and short title of the test case
Short title
Purpose Short description of the purpose of the test case
Test The parameter definition of the test case
variables
[optional: elementary test case definition]
[optional: test frame sequence definition]
Setup Setup of the test case
Execution Test steps dealing with the setup being applied and what is observed and measured
Response Description about what is expected as the result
Reference Link to the requirement specification

6.3.4 Elementary tests
Some test cases may be subdivided into elementary tests which are repetitions of the test case for several
values of the focussed parameter to test. Each elementary test has its own parameter definition which is
defined in the Test variables of the test case definition.
6.3.5 Applicable test cases for devices with enhanced voltage biasing
It must be distinguished between devices which support the complete requirements or only the enhanced
biasing functionalities defined in ISO 11898-6. The following test cases are applicable for devices which
support only the enhanced voltage biasing compliant to ISO 11898-6.
Static test cases:  Test case 1 – Test case 25
Dynamic test cases: Test case 91 - Test case 98

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ISO/DIS 16845-2
7 Test cases
All defined test cases must be executed in accordance with the supported device specific bit rates defined in
the device datasheet.
In case the IUT supports other bit rates, the following scenarios are possible.
 If the IUT supports only one bit rate, then all test cases must be executed using this specific bit rate;
 If the IUT supports two bit rates, then all test cases must be executed with both bit rate;
 If the IUT supports more than two bit rates or a range of bit rates, then all test cases must be executed
considering the highest and the lowest bit rate, as well as a bit rate in-between.
If supported by the IUT, all test cases must be executed using a bit rate of 500 kbit/s.
7.1 Transceiver physical layer part
7.1.1 General
Due to the fact that the following test cases defined in sub-clause 7 will be checked by a static test, the
parameters given in the device data sheet shall be defined under the same conditions defined in the test case
definition and the corresponding references.
7.1.2 Static test cases
Table 5 — Test case 1
No. Requirement Min. Max. Unit
Test case 1 — There are two biasing conditions: Biasing to 2,5V or biasing to - - -
GND.

7.1.3 Maximum ratings
These test cases verify maximum ratings on V , V and optional split pins. Due to the potential
CAN_H CAN_L
damage after high loaded conditions; they should be executed first.

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ISO/DIS 16845-2
Table 6 — Test case 2
Number Test case 2 — Maximum ratings V for V , V and optional V
.
max CAN_H CAN_L Split
Short title
Purpose The purpose of this test is to measure that the IUT shall not be damaged after
stressed with V on V , V and optional split pin (if implemented).
.
max CAN_H CAN_L
Test  Battery Voltage: refer to elementary test definition
variables
 t :  = 30 s
WAIT
Elementary tests are defined as follows:
Test V V
Bat max
#1 14 V 40 V
#2 28 V 58 V
#3 42 V 58 V

Setup Figure 7 depicts the measurement setup for test case 2
CAN_L
Supply
CAN_H
Split
V
Bat
(optional)
V
max.
=
=
Gnd

Figure 7 — Measurement setup for test case 2
Execution 1) Setup according to 'Test variables' and 'Setup' as shown above.
2) The test system holds the Voltage of V for a duration of t
.
max WAIT.
3) After test step 2, the IUT shall not be damaged due to the Voltage V .
max
4) After test step 2, the test system stimulates the IUT to drive recessive and
dominant output voltage.
Response The IUT shall be able to transmit and receive in conformance with ISO 11898-6.
The IUT shall be able to drive the split output voltage (if available) in conformance
with ISO 11898-6.
Reference ISO 11898-5, Table 7
Notes: This is a static test case.

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Table 7 — Test case 3
Number Test case 3 — Maximum ratings V for V , V and optional V
.
min CAN_H CAN_L Split
Short title
Purpose The purpose of this test is to measure that the IUT shall not be damaged after
stressed with V on V , V and optional split pin (if implemented).
.
min CAN_H CAN_L
Test  Battery Voltage: refer to elementary test definition
variables
 t :  = 30 s
WAIT
Elementary tests are defined as follows:
Test V V
Bat min
#1 14 V -27 V
#2 28 V -58 V
#3 42 V -58 V

Setup Figure 8 depicts the measurement setup for test case 3
CAN_L
Supply
CAN_H
Split
V
Bat
(optional)
V
min.
=
=
Gnd

Figure 8 — Measurement setup for test case 3
Execution 1) Setup according to 'Test variables' and 'Setup' as shown above.
2) The test system holds the Voltage of V for a duration of t .
.
min WAIT
3) After test step 2, the IUT shall not be damaged due to the voltage V
.
max
4) After test step 2, the test system stimulates the IUT to drive recessive and
dominant output voltage.
Response
 The IUT shall be able to transmit and receive in conformance with ISO 11898-6.
 The IUT shall be able to drive the split output voltage (if available) in
conformance with ISO 11898-6.
Reference ISO 11898-5, Table 7
Notes: This is a static test case.
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ISO/DIS 16845-2
7.1.4 Transmitter part
7.1.4.1 Output bus voltages of CAN node
Table 8 — Test case 4
Number Test case 4 — Recessive output bus voltage V
CAN_H
Short title
Purpose The purpose of this test is to measure the CAN bus output voltage level of V in
CAN_H
recessive state.
Test  System state: refer to elementary test definition
variables
Elementary tests are defined as follows:
Test System state Value [V]
 min. max.
#1 Normal mode 2 3
#2 Low-power mode after t -0,1 0,1
SILENCE
expired

Setup Figure 9 depicts the measurement setup for test case 4
CAN_H
TxD
CAN_L
5 V =
V V V
V
CAN_L CAN_H
Gnd

Figure 9 — Measurement setup for test case 4
Execution The IUT is setup according to ‘Setup’ as shown above. The voltage of V is
CAN_H
measured.
Response The voltage shall conform to the values depicted in Test variables.
Reference ISO 11898-5, Table 8

Notes: This is a static test case.

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Table 9 — Test case 5
Number Test case 5 — Recessive output bus voltage V
CAN_L
Short title
Purpose The purpose of this test is to measure the CAN bus output voltage level of V in
CAN_L
recessive state.
Test  System state: refer to elementary test definition
variables
Elementary tests are defined as follows:
Test System state Value [V]
 min. max.
#1 Normal mode 2 3
#2 Low-power mode after t -0,1 0,1
SILENCE
expired

Setup Figure 10 depicts the measurement setup for test case 5
CAN_H
TxD
CAN_L
5 V =
V V V
V
CAN_L CAN_H
Gnd

Figure 10 — Measurement setup for test case 5
Execution The IUT is setup according to ‘Setup’ as shown above. The voltage of V is
CAN_L
measured.
Response The voltage shall conform to the values depicted in Test variables.
Reference ISO 11898-5, Table 8
Notes: This is a static test case.

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ISO/DIS 16845-2
Table 10 — Test case 6
Number Test case 6 — Recessive differ
...