ISO/TS 15338
(Main)Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
This document gives procedures for the operation and use of glow discharge mass spectrometry (GD-MS). There are several GD-MS systems from different manufacturers in use and this document describes the differences in their operating procedures when appropriate. NOTE This document is intended to be read in conjunction with the instrument manufacturers' manuals and recommendations.
Analyse chimique des surfaces — Spectrométrie de masse à décharge luminescente (GD-MS) — Introduction à l'utilisation
General Information
Relations
Buy Standard
Standards Content (Sample)
FINAL DRAFT
Technical
Specification
ISO/DTS 15338
ISO/TC 201/SC 8
Surface chemical analysis — Glow
Secretariat: JISC
discharge mass spectrometry —
Voting begins on:
Operating procedures
2024-12-09
Analyse chimique des surfaces — Spectrométrie de masse à
Voting terminates on:
décharge luminescente (GD-MS) — Introduction à l'utilisation
2025-02-03
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
Reference number
ISO/DTS 15338:2024(en) © ISO 2024
FINAL DRAFT
ISO/DTS 15338:2024(en)
Technical
Specification
ISO/DTS 15338
ISO/TC 201/SC 8
Surface chemical analysis — Glow
Secretariat: JISC
discharge mass spectrometry —
Voting begins on:
Operating procedures
Analyse chimique des surfaces — Spectrométrie de masse à
Voting terminates on:
décharge luminescente (GD-MS) — Introduction à l'utilisation
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
© ISO 2024
IN ADDITION TO THEIR EVALUATION AS
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
or ISO’s member body in the country of the requester.
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland Reference number
ISO/DTS 15338:2024(en) © ISO 2024
ii
ISO/DTS 15338:2024(en)
Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
5 Apparatus . 1
5.1 Ion source .1
5.2 Mass analyser .5
5.3 Detector system.5
6 Routine operations . 6
6.1 Cleaning the system .6
6.2 Support gas handling .6
7 Calibration . 7
7.1 Mass calibration .7
7.2 Detector calibration .7
7.3 Routine checks .8
8 Data acquisition . 9
8.1 Sample preparation .9
8.2 Procedure setup .9
8.3 Data acquiring .10
9 Quantification .10
9.1 Element integral calculation .10
9.2 Ion beam ratios.11
9.3 Fully quantitative analysis .11
9.4 Semi quantitative analysis . 12
9.5 Combination of semi quantitative and quantitative analysis . 12
Bibliography .13
iii
ISO/DTS 15338:2024(en)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 201, Surface chemical analysis, Subcommittee
SC 8, Glow discharge spectroscopy.
This third edition cancels and replaces the second edition (ISO/TS 15338:2020), which has been technically
revised.
The main changes are as follows:
— additional technical information have been added to the principle, apparatus and routine operations
— minor editorial changes.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
FINAL DRAFT Technical Specification ISO/DTS 15338:2024(en)
Surface chemical analysis — Glow discharge mass
spectrometry — Operating procedures
1 Scope
This document specifies procedures for the operation and use of glow discharge mass spectrometry (GD-
MS). There are several GD-MS systems from different manufacturers in use and this document describes the
differences in their operating procedures when appropriate.
NOTE This document is intended to be read in conjunction with the instrument manufacturers’ manuals and
recommendations.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
No terms and definitions are listed in this document.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
4 Principle
In a glow discharge source, a potential difference is applied between the cathode (the sample to be analysed)
and the anode, and a plasma is supported by the introduction of an inert gas, normally argon, but other inert
gases can be used. This potential difference can be either direct current (DC) or radio frequency (RF), the
advantage of RF being that electrically insulating materials can be analysed directly. The impacts of inert
gas ions and fast neutrals formed within the plasma on the surface of the sample result in the production of
neutrals by sputtering from surface.
These neutrals diffuse into the plasma where they are subsequently ionised within the equipotential area of
the plasma and can then be extracted to a mass spectrometer for analysis. Both magnetic sector and time of
flight spectrometers are available.
5 Apparatus
5.1 Ion source
There are two fundamental types of ion source used for the GD-MS, a low flow or “static” source, and a
fast flow source. Both types can accept pin samples or samples with a flat surface. A typical pin would be
20 mm long with a diameter of 3 mm, and a typical flat sample would be 20 mm to 40 mm diameter. It must
be big enough to cover the hole in the chosen anode plate and provide a good gas seal. More details of these
dimensions can be found later.
In the low flow source, the plasma cell is effectively a sealed unit held within a high vacuum chamber, with
a small exit slit or hole to allow the ions to exit the cell and enter the mass spectrometer. The cell body is
at anode potential, the acceleration potential of the mass spectrometer, and the sample is held at cathode
ISO/DTS 15338:2024(en)
potential, typically 1 kV below anode potential. In this type of source, the argon flow is typically one sccm
(standard atmosphere cubic centimetres per minute) or less, and the gas used, normally argon, should be of
very high purity, six nines five or better. The power of the plasma is relatively low, typically 2 W or 3 W; the
potential difference is typically 1 kV and the current 2 mA or 3 mA.
Key
1 insulator
2 sample (cathode)
3 anode (GD cell)
a
Gas inlet (0,3 sccm to 0,6 sccm).
b
To mass spectrometer.
Figure 1 — Low flow source pin geometry
A schematic diagram of the low flow source in pin geometry is shown in Figure 1. The gas is introduced
into the cell through a metal pipe which forms a metal to metal seal with the cell body. On some systems an
alternative of a PEEK tube with a ferrule seal to the cell body is used. If a metal pipe is used, then an insulating
material must be included in the gas line as the cell is at anode potential. This is normally a piece of quartz
with a very small diameter hole through which the gas passes. T
...
ISO TC201 SC8 N348
ISO /DTS 15338(Ed.3): xxxx(E)
ISO /TC 201/SC 8
Secretariat: JISC
Date: 2024-11-25
Surface chemical analysis — Glow discharge mass
spectrometry — Operating procedures
DTS stage
Warning for WDs and CDs
This document is not an ISO International Standard. It is distributed for review and comment. It is subject to
change without notice and may not be referred to as an International Standard.
Recipients of this draft are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
Analyse chimique des surfaces — Spectrométrie de masse à décharge luminescente (GD-MS) — Introduction à
l'utilisation
ISO TS 15338:20xx(E)
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this
publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical,
including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can
be requested from either ISO at the address below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: + 41 22 749 01 11
Fax: +41 22 749 09 47
EmailE-mail: copyright@iso.org
Website: www.iso.orgwww.iso.org
Published in Switzerland.
ISO TS 15338:xxxx(E)
Contents
Foreword . v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Apparatus . 1
5 Routine operations. 7
6 Calibration . 8
7 Data acquisition . 10
8 Quantification . 12
Bibliography . 15
Foreword . iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Principle . 1
5 Apparatus . 1
6 Routine operations. 5
6.1 Cleaning the system . 5
6.2 Support gas handling . 6
7 Calibration . 7
7.1 Mass calibration . 7
7.2 Detector calibration . 7
7.3 Routine checks . 8
8 Data acquisition . 9
8.1 Sample preparation . 9
8.2 Procedure setup . 9
8.3 Data acquiring . 10
9 Quantification . 10
9.1 Element integral calculation . 10
9.2 Ion beam ratios . 11
9.3 Fully quantitative analysis . 11
9.4 Semi quantitative analysis . 12
9.5 Combination of semi quantitative and quantitative analysis . 12
Bibliography . 13
iv © ISO 2024 – All rights reserved
ISO TS 15338:20xx(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents document should be noted. This document was drafted in accordance
with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Field Code Changed
Attention is drawnISO draws attention to the possibility that some of the elementsimplementation of this
document may beinvolve the subjectuse of (a) patent(s). ISO takes no position concerning the evidence,
validity or applicability of any claimed patent rights. ISO in respect thereof. As of the date of publication
of this document, ISO had not received notice of (a) patent(s) which may be required to implement this
document. However, implementers are cautioned that this may not represent the latest information,
which may be obtained from the patent database available at www.iso.org/patents. ISO shall not be held
responsible for identifying any or all such patent rights. Details of any patent rights identified during the
development of the document will be in the Introduction and/or on the ISO list of patent declarations
received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the World
Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www.iso.org/iso/foreword.html www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 201, Surface chemical analysis,
Subcommittee SC 8, Glow discharge spectroscopy.
This third edition cancels and replaces the second edition (ISO/TS 15338:2020), which has been minor
technically revised.
The main changes compared to the previous edition are as follows:
— — Minor editorial changes to and additional technical information have been added to the principle,
apparatus and routine operations.
A list of all parts in the ISO/TS15338 series can be found on the ISO website.
— minor editorial changes.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
Field Code Changed
ISO TS /DTS 15338:xxxx(E:(en)
vi © ISO 2024 – All rights reserved
vi
TECHNICAL SPECIFICATION ISO TS 15338:20xx(E)
Surface chemical analysis — Glow discharge mass spectrometry —
Operating procedures
1 Scope
This document givesspecifies procedures for the operation and use of glow discharge mass spectrometry (GD-
MS). There are several GD-MS systems from different manufacturers in use and this document describes the
differences in their operating procedures when appropriate.
NOTE This document is intended to be read in conjunction with the instrument manufacturers’ manuals and
recommendations.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
No terms and definitions are listed in this document.
ISO and IEC maintain terminologicalterminology databases for use in standardization at the following
addresses:
— — ISO Online browsing platform: available at https://www.iso.org/obphttps://www.iso.org/obp
— — IEC Electropedia: available at http://www.electropedia.org/https://www.electropedia.org/
— 4 Principle
In a glow discharge source, a potential difference is applied between the cathode (the sample to be analysed)
and the anode, and a plasma is supported by the introduction of an inert gas, normally argon, but other inert
gases can be used. This potential difference can be either direct current (DC) or radio frequency (RF), the
advantage of RF being that electrically insulating materials can be analysed directly. The impacts of inert gas
ions and fast neutrals formed within the plasma on the surface of the sample result in the production of
neutrals by sputtering from surface.
These neutrals diffuse into the plasma where they are subsequently ionised within the equipotential area of
the plasma and can then be extracted to a mass spectrometer for analysis. Both magnetic sector and time of
flight spectrometers are available.
4 Apparatus
4.1 5.1 Ion source
There are two fundamental types of ion source used for the GD-MS, a low flow or “static” source, and a fast
flow source. Both types can accept pin samples or samples with a flat surface. A typical pin would be 20 mm
long with a diameter of 3 mm, and a typical flat sample would be 20 mm to 40 mm diameter. It must be big
enough to cover the hole in the chosen anode plate and provide a good gas seal. More details of these
dimensions can be found later.
In the low flow source, the plasma cell is effectively a sealed unit held within a high vacuum chamber, with a
small exit slit or hole to allow the ions to exit the cell and enter the mass spectrometer. The cell body is at
ISO/DTS 15338:(en)
anode potential, the acceleration potential of the mass spectrometer, and the sample is held at cathode
potential, typically 1 kV below anode potential. In this type of source, the argon flow is typically one sccm
(standard atmosphere cubic centimetres per minute) or less, and the gas used, normally argon, should be of
very high purity, six nines five or better. The power of the plasma is relatively low, typically 2 W or 3 W; the
potential difference is typically 1 kV and the current 2 mA or 3 mA.
Key
1 insulator
2 sample (cathode)
3 anode (GD cell)
a
Gas inlet (0,3 sccm to 0,6 sccm)).
b
To mass spectrometer.
Figure 1 — Low flow source pin geometry
A schematic diagram of the low flow source in pin geometry is shown in Figure 1.Figure 1. The gas is
introduced into the cell through a metal pipe which forms a metal to metal seal with the cell body. On some
systems an alternative of a PEEK tube with a ferrule seal to the cell body is used. If a metal pipe is used, then
an insulating material must be included in the gas line as the cell is at anode potential. This is normally a piece
of quartz with a very small diameter hole through which the gas passes. The pin sample is held in a chuck
which sits at cathode potential and the cell body is at anode potential, so the two are separated by an insulating
disc. The chuck is actually located against a metal (tantalum) plate which also sits at cathode potential (not
shown in the schematic diagram). The whole assembly forms a good gas seal while maintaining good electrical
insulation. The only escape for the gas and any ions formed in the plasma is through
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.