IEC 61300-3-35:2015

IEC 61300-3-35 ®
Edition 2.0 2015-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-35: Examinations and measurements –
Visual inspection of fibre optic connectors and fibre-stub transceivers

Dispositifs d'interconnexion et composants passifs à fibres optiques –
Procédures fondamentales d’essais et de mesures –
Partie 3-35: Examens et mesures – Examen visuel des connecteurs à fibres
optiques et des émetteurs-récepteurs à embase fibrée

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IEC 61300-3-35 ®
Edition 2.0 2015-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and

measurement procedures –
Part 3-35: Examinations and measurements –

Visual inspection of fibre optic connectors and fibre-stub transceivers

Dispositifs d'interconnexion et composants passifs à fibres optiques –

Procédures fondamentales d’essais et de mesures –

Partie 3-35: Examens et mesures – Examen visuel des connecteurs à fibres

optiques et des émetteurs-récepteurs à embase fibrée

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.180.20 ISBN 978-2-8322-2716-9

– 2 – IEC 61300-3-35:2015 © IEC 2015
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms, definitions and abbreviations . 6
3.1 Terms and definitions . 6
3.2 Abbreviations . 7
4 Measurement . 7
4.1 General . 7
4.2 Measurement conditions . 7
4.3 Pre-conditioning . 7
4.4 Recovery . 7
5 Apparatus . 8
5.1 Method A: Direct view optical microscopy . 8
5.2 Method B: Video microscopy . 8
5.3 Method C: Automated analysis microscopy . 8
5.4 Certification requirements for low and high resolution systems . 8
5.4.1 General . 8
5.4.2 Requirement for low resolution microscope systems . 8
5.4.3 Requirements for high resolution microscope systems . 9
6 Procedure . 9
6.1 Certification procedure . 9
6.2 Inspection procedure . 9
6.3 Visual requirements . 10
Annex A (informative) Examples of inspected end faces with surface anomalies . 13
Annex B (normative) Diagram of qualification artefact and method of manufacture . 18
B.1 High resolution artefact . 18
B.2 Low resolution artefact . 20
Bibliography . 21

Figure 1 – Inspection procedure flow . 10
Figure A.1 – Example 1 (low resolution system) . 13
Figure A.2 – Example 1 (high resolution system) . 13
Figure A.3 – Example 2 (low resolution system) . 14
Figure A.4 – Example 2 (high resolution system) . 14
Figure A.5 – Example 3 (low resolution system) . 14
Figure A.6 – Example 3 (high resolution system) . 15
Figure A.7 – Example 4 (low resolution system) . 15
Figure A.8 – Example 4 (high resolution system) . 16
Figure A.9 – Example 5 (low resolution system) . 16
Figure A.10 – Example 6 (low resolution system) . 17
Figure B.1 – Example of nano-indentation test system . 18
Figure B.2 – Example of high resolution artefacts . 19
Figure B.3 – Example of low resolution artefact pattern . 20

Table 1 – Visual requirements for single-mode PC polished connectors, RL ≥ 45 dB . 11
Table 2 – Visual requirements for single-mode angle polished (APC) connectors . 11
Table 3 – Visual requirements for single-mode PC polished connectors, RL ≥ 26 dB
and single-mode transceivers using a fibre-stub interface . 12
Table 4 – Visual requirements for multi-mode PC polished connectors . 12

– 4 – IEC 61300-3-35:2015 © IEC 2015
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 3-35: Examinations and measurements –
Visual inspection of fibre optic connectors and fibre-stub transceivers

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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...