IEC 61300-3-35:2009

IEC 61300-3-35 ®
Edition 1.0 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-35: Examinations and measurements – Fibre optic connector endface
visual and automated inspection

Dispositifs d’interconnexion et composants passifs à fibres optiques –
Méthodes fondamentales d’essais et de mesures –
Partie 3-35: Examens et mesures – Inspection automatique et visuelle de
l'extrémité des connecteurs à fibres optiques

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
 Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
 IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
 Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
 Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: csc@iec.ch
Tel.: +41 22 919 02 11
Fax: +41 22 919 03 00
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
 Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
 Just Published CEI: www.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
 Electropedia: www.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
 Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: csc@iec.ch
Tél.: +41 22 919 02 11
Fax: +41 22 919 03 00
IEC 61300-3-35 ®
Edition 1.0 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 3-35: Examinations and measurements – Fibre optic connector endface
visual and automated inspection

Dispositifs d’interconnexion et composants passifs à fibres optiques –
Méthodes fondamentales d’essais et de mesures –
Partie 3-35: Examens et mesures – Inspection automatique et visuelle de
l'extrémité des connecteurs à fibres optiques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX S
ICS 33.180.20 ISBN 978-2-88912-749-8

– 2 – 61300-3-35  IEC:2009
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references. 5
3 Measurement . 5
3.1 General . 5
3.2 Measurement conditions . 6
3.3 Pre-conditioning . 6
3.4 Recovery . 6
4 Apparatus . 6
4.1 Method A: direct view optical microscopy . 6
4.2 Method B: video microscopy . 6
4.3 Method C: automated analysis microscopy . 7
4.4 Calibration requirements for low and high resolution systems . 7
5 Procedure . 8
5.1 Measurement regions . 8
5.2 Calibration procedure . 8
5.3 Inspection procedure . 9
5.4 Visual requirements . 10
Annex A (informative) Examples of inspected end-faces with defects . 12
Annex B (normative) Diagram of calibration artefact and method of manufacture . 18
Bibliography . 21

Figure 1 – Inspection procedure flow . 9

Table 1 – Measurement regions for single fibre connectors . 8
Table 2 – Measurement regions for multiple fibre rectangular ferruled connectors . 8
Table 3 – Visual requirements for PC polished connectors, single mode fibre, RL ≥ 45 dB . 10
Table 4 – Visual requirements for angle polished connectors (APC), single mode fibre . 10
Table 5 – Visual requirements for PC polished connectors, single mode fibre, RL ≥ 26 dB . 11
Table 6 – Visual requirements for PC polished connectors, multimode fibres . 11

61300-3-35  IEC:2009 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 3-35: Examinations and measurements –
Fibre optic connector endface visual and automated inspection

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-35 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This standard replaces IEC/PAS 61300-3-35 which was published in 2002.
This bilingual version corresponds to the monolingual English version published in 2009-11.

– 4 – 61300-3-35  IEC:2009
The text of this standard is based on the following documents:
FDIS Report on voting
86B/2909/FDIS 86B/2947/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of IEC 61300 series, published under the general title, Fibre optic
interconnecting devices and passive components – Basic test and measurement procedures
can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under “http://webstore.iec.ch” in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of June 2010 have been included in this copy.

IMPORTANT – The “colour inside” logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this publication using a colour printer.

61300-3-35  IEC:2009 – 5 –
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 3-35: Examinations and measurements –
Fibre optic connector endface visual and automated inspection

1 Scope
This part of IEC 61300 describes methods for quantitatively assessing the endface quality of a
polished fibre optic connector. The information is intended for use with other standards which
set requirements for allowable surface defects such as scratches, pits and debris which may
affect optical performance. In general, the methods described in this standard apply to 125 µm
cladding fibres contained within a ferrule and intended for use with sources of ≤2 W of input
power. However, portions are applicable to non-ferruled connectors and other fibre types.
Those portions are identified where appropriate.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
None.
3 Measurement
3.1 General
The objective of this standard is to prescribe methods for quantitatively inspecting fibre optic
endfaces to determine if they are suitable for use. Three methods are described: A: direct view
optical microscopy, B: video microscopy, C: automated analysis microscopy. Within each
method, there are hardware requirements and procedures for both low resolution and high
resolution systems. High resolution systems are to be utilized for critical examination of the
glass fibre after polishing and upon incoming quality assurance. High resolution systems are
typically not used during field polishing or in conjunction with multimode connectors. Low
resolution systems are to be utilized prior to mating connectors for any purpose. All methods
require a means for measuring and quantifying defects.
There are many types of defects. Commonly used terminology would include: particles, pits,
chips, scratches, embedded debris, loose debris, cracks, etc. For practical purposes, all
defects will be categorized in one of two groups. They are defined as follows:
scratches: permanent linear surface features;
defects: all non-linear features detectable on the fibre. This includes particulates, other debris,
pits, chips, edge chipping, etc.
All defects and scratches are surface anomalies. Sub-surface cracks and fractures are not
reliably detectable with a light microscope in all situations and are therefore not covered within
this standard. Cracks and fractures to the fibre may be detected with a light microscope and
are generally considered a catastrophic failure.

– 6 – 61300-3-35  IEC:2009
Differentiating between a scratch and all other defects is generally intuitive to a human being.
However, to provide clarity, and for automated systems, scratches are defined as being less
than 4 µm wide, linear in nature, and with a length that is at least 30 times their width. As the
width dimension is not practical to visually measure below 3 µm, these figures can be grossly
estimated.
Defects size is defined for methods A and B as the diameter of the smallest circle that can
encompass the entire defect. Defect size for method C can be either the actual measured
surface area or the diameter of the smallest circle than can encompass the entire defect.
Some fibre types have structural features potentially visible on the fibre endface. Fibres that
use microstructures to contain the light signal, such as photonic band-gap and hole-assisted
fibres, can have an engineered or random pattern of structures surrounding the core. These
features are not defects.
For methods A and B below, it is recommended that visual gauge tools be developed to
facilitate the measurement procedure. For method A, an eyepiece reticule is recommended.
For method B, an overlay is recommended.
3.2 Measurement conditions
No restrictions are placed on the range of atmospheric conditions under which the test can be
conducted. It may be performed in controlled or uncontrolled environments
3.3 Pre-conditioning
No minimum pre-conditioning time is required.
3.4 Recovery
Since measurements are to be made at standard test conditions, no minimum recovery time is
required.
4 Apparatus
4.1 Method A: direct view optical microscopy
This method utilizes a light microscope in which a primary objective lens forms a first image
that is then magnified by an eyepiece that projects the image directly to the user’s eye. It shall
have the following features and capabilities:
• a suitable ferrule or connector adapter;
• a light source and focusing mechanism;
• a means to measure defects observed in the image.
4.2 Method B: video microscopy
This method utilizes a light microscope in which a lens system forms an image on a sensor that,
in turn, transfers the image to a display. The user views the image on the display. It shall have
the following features and capabilities:
• a suitable ferrule or connector adapter;
• a light source and focusing mechanism;
• a means to measure defects observed in the image.

61300-3-35  IEC:2009 – 7 –
4.3 Method C: automated analysis microscopy
This method utilizes a light microscope in which a digital image is acquired or created and
subsequently analyzed via an algorithmic process. The purpose of such a system is to reduce
the effects of human subjectivity in the analysis process and, in some cases, to improve cycle
times. It shall have the following features and capabilities:
• a suitable ferrule or connector adapter;
• a means for acquiring or creating a digital image;
• algorithmic analysis of the digital image.
A means to compare the analyzed image to programmable acceptance criteria in such a
manner that a result of “pass” or “fail” is provided.
4.4 Calibration requirements for low and high resolution systems
4.4.1 General
Microscope systems for any of the methods above shall be calibrated for use in either low or
high resolution applications. It is suggested that this calibration be conducted with a purpose-
built calibration artefact that can serve to validate a system’s ability to detect defects of
relevant size. Such an artefact shall be provided with instructions on its use and shall be
manufactured in a method such that it can be measured in a traceable manner. Details on the
manufacture of such artefacts can be found in Annex B.
For reference, a system’s optical resolution may be calculated using the formula below. Optical
resolution is not equivalent to the system’s detection capability. In most cases, the system will
be able to detect defects smaller than its optical resolution.
Optical resolution = (0,61 × wavelength of illumination source) / system’s numerical aperture
4.4.2 Requirements for low resolution microscope systems
Minimum total magnification offering a field of view of at least 250 µm (for methods B and C,
this dimension is to be measured in the vertical, or most constrained, axis) capable of detecting
low-contrast defects of 2 µm in diameter or width.
4.4.3 Requirements for high resolution microscope systems
Minimum total magnification offering a field of view of at least 120 µm (for methods B and C,
this dimension shall be measured in the vertical, or most constrained, axis) capable of
detecting low contrast scratches of 0,2 µm in width and 0,003 µm in depth.

– 8 – 61300-3-35  IEC:2009
5 Procedure
5.1 Measurement regions
For the purposes of setting requirements on endface quality, the polished endface of a
connector is divided into measurement regions defined as follows (see Table 1 and Table 2).
Table 1 – Measurement regions for single fibre connectors
Zone Diameter for single mode Diameter for multimode
A: core
0 µm to 25 µm 0 µm to 65 µm
B: cladding
25 µm to 120 µm 65 µm to 120 µm
C: adhesive 120 µm to 130 µm 120 µm to 130 µm
D: contact 130 µm to 250 µm 130 µm to 250 µm
NOTE 1 All data above assumes a 125 µm cladding diameter.
NOTE 2 Multimode core zone diameter is set at 65 µm to accommodate all
common core sizes in a practical manner.
NOTE 3 A defect is defined as existing entirely within the inner-most zone which
it touches.
Table 2 – Measurement regions for multiple fibre rectangular ferruled connectors
Zone Diameter for single mode Diameter for multimode
A: Core
0 µm to 25 µm 0 µm to 65 µm
B: Cladding
25 µm to 115 µm 65 µm to 115 µm
NOTE 1 All data above assumes a 125 µm cladding diameter.
NOTE 2 Multimode core zone diameter is set at 65 µm to accommodate all
common core sizes in a practical manner.
NOTE 3 A defect is defined as existing entirely within the inner-most zone which
it touches.
NOTE 4 Criteria should be applied to all fibres in the array for functionality of
any fibres in the array.
5.2 Calibration procedure
On commissioning, and periodically during its life, the microscope system shall be calibrated.
Fix the artefact(s) on the microscope system, focus the image.
Follow manufacturer’s instructions on how to calibrate the system using the artefact. Generally,
this should entail viewing the artefact and verifying that the small features and contrast targets
are “reliably detectable”; and that the region of interest can be fully viewed or scanned. Reliably
detectable is defined as sufficient clear and visible so that a typical technician of average
training would recognize the feature at least 98 % of the time.
For automated systems, software utilities to perform this calibration shall be provided. In any
event, those systems shall be able to perform the same calibration to validate that they can
reliably detect the features of the artefact.

61300-3-35  IEC:2009 – 9 –
5.3 Inspection procedure
Focus the microscope so that a crisp image can be seen.
Locate all defects and scratches within the zones prescribed in the acceptance criteria. Count
and measure defects and count scratches within each zone. Scratches that are extremely wide
may be judged to be too large, per the acceptance criteria and result in immediate failure of the
DUT.
Once all defects and scratches have been quantified, the results should be totalled by zone
and compared to the appropriate acceptance criteria. Such criteria can be found in 5.4.
Any endface with quantified defects or scratches in excess of the values shown in any given
zone on the table are determined to have failed.
If the fibre fails inspection for defects, the user shall clean the fibre and repeat the inspection
process. In this way, loose debris can be removed and the fibre may be able to pass a
subsequent inspection without rework or scrap. Cleaning shall be repeated a number of times
consistent with the cleaning procedure being used.

Begin
Quantify
scratches and
defects
Meets
No
Acceptance
Criteria?
Fail for
No
Fail for
Scratches?
defects
Yes
Clean fibre
Yes
endface
Quantify
scratches and
defects
No Decrease Yes
defects?
DUT passes DUT fails
End
IEC  2214/09
Figure 1 – Inspection procedure flow

– 10 – 61300-3-35  IEC:2009
5.4 Visual requirements
Visual requirements for each connector are shown in Table 3, Table 4, Table 5 and Table 6.
Table 3 – Visual requirements for PC polished connectors,
single mode fibre, RL ≥ 45 dB
Zone name Scratches Defects
A: core None None
No limit <2 µm
No limit ≤3 µm
B: cladding
5 from 2 µm to 5 µm
None >3 µm
None >5 µm
C: adhesive No limit No limit
D: contact No limit
None =>10 µm
NOTE 1 For scratches, the requirement refers to width.
NOTE 2 No visible subsurface cracks are allowed in the core or cladding
zones.
NOTE 3 All loose particles should be removed. If defect(s) are non-
removable, it should be within the criteria above to be acceptable for use.
NOTE 4 There are no requirements for the area outside the contact zone
since defects in this area have no influence on the performance. Cleaning
loose debris beyond this region is recommended good practice.
NOTE 5 Structural features that are part of the functional design of the
optical fibre, such as microstructures, are not considered defects.

Table 4 – Visual requirements for angle polished connectors (APC), single mode fibre
Zone name Scratches Defects
A: core None
≤4
No limit <2 µm
B: cladding No limit 5 from 2 µm to 5 µm
None >5 µm
C: adhesive No limit No limit
D: contact No limit
None ≥10 µm
NOTE 1 For scratches, the requirement refers to width.
NOTE 2 No visible subsurface cracks are allowed in the core or cladding
zones.
NOTE 3 All loose particles should be removed. If defect(s) are non-
removable, it should be within the criteria above to be acceptable for use.
NOTE 4 There are no requirements for the area outside the contact zone
since defects in this area have no influence on the performance. Cleaning
loose debris beyond this region is recommended good practice.
NOTE 5 Structural features that are part of the functional design of the
optical fibre, such as microstructures, are not considered defects.

61300-3-35  IEC:2009 – 11 –
Table 5 – Visual requirements for PC polished connectors, single mode fibre, RL ≥ 26 dB
Zone name Scratches Defects
2 ≤ 3 µm 2 ≤ 3 µm
A: core
None >3 µm None >3 µm
No limit <2 µm
No limit ≤3 µm
B: cladding 5 from 2 µm to 5 µm
3 > 3 µm
None >5 µm
C: adhesive No limit No limit
D: contact No limit No ≥10 µm
NOTE 1 For scratches, the requirement refers to width.
NOTE 2 No visible subsurface cracks are allowed in the core or cladding
zones.
NOTE 3 All loose particles should be removed. If defect(s) are non-
removable, it should be within the criteria above to be acceptable for use.
NOTE 4 There are no requirements for the area outside the contact zone
since defects in this area have no influence on the performance. Cleaning
loose debris beyond this region is recommended good practice.
NOTE 5 Criteria should be applied to all fibre pairs in the array for
functionality of any fibre pairs in the array.
NOTE 6 Structural features that are part of the functional design of the
optical fibre, such as microstructures, are not considered defects.

Table 6 – Visual requirements for PC polished connectors, multimode fibres
Zone name Scratches Defects
No limit ≤ 3 µm
4 ≤ 5 µm
A: core
None > 5 µm
0 > 3 µm
No limit < 2 µm
No limit ≤ 5 µm
B: cladding
5 from 2 µm to 5 µm
0 > 5 µm
None > 5 µm
C: adhesive No limit No limit
D: contact No limit
None ≥ 10 µm
NOTE 1 For scratches, the requirement refers to width.
NOTE 2 No visible subsurface cracks are allowed in the core or cladding
zones.
NOTE 3 All loose particles should be removed. If defect(s) are non-
removable, it should be within the criteria above to be acceptable for use.
NOTE 4 There are no requirements for the area outside the contact zone
since defects in this area have no influence on the performance. Cleaning
loose debris beyond this region is recommended good practice.
NOTE 5 The zone size for multimode fibres has been set at 65 µm to
accommodate both 50 µm and 62,5 µm core size fibres. This is done to
simplify the grading process.
NOTE 6 Structural features that are part of the functional design of the
optical fiber, such as microstructures, are not considered defects.

– 12 – 61300-3-35  IEC:2009
Annex A
(informative)
Examples of inspected end-faces with defects
Images below are shown on the left with a computer overlay highlighting where the scratch or
defect was found, and then at right without the overlay.
Examples of low resolution graded images:
Image 1
Fibre/connector type: SM, RL ≥ 45 dB (Table 3).
Result: rejected.
Reason: 3 defects in the cladding zone. Those highlighted in red are over 5 µm in diameter
and a failure condition per Table 3.

Image 2
Fibre/connector type: SM, RL ≥ 45 dB (Table 3).
Result: rejected.
Reason: 1 defect touching the core zone. Per Table 1, since it touches the core zone, it is
judged to exist entirely in the core zone. Per Table 3, no defects are allowed in the core zone.

61300-3-35  IEC:2009 – 13 –
Image 3
Fibre/connector type: SM, RL ≥ 45 dB (Table 3)
Result: accepted.
Reason: 1 fine scratch and 2 particles < 5 µm in the cladding zone. Per Table 3, acceptable.

Image 4
Fibre/connector type: SM, RL ≥ 45 dB (Table 3).
Result: accepted.
Reason: observed defects: 6 defects in the cladding zone. One defect is < 2 µm and can be
ignored; the other 5 are below 5 µm in diameter. In the contact zone, 1 defect < 10 µm. Per
Table 3, acceptable.
– 14 – 61300-3-35  IEC:2009
Image 5
Fibre/connector type: MM, (Table 6).
Result: accepted.
Reason: 2 defects < 5 µm in the cladding zone (1 defect of 4,8 µm and 1 defect of 4,9 µm); 1
defect in the contact zone. Per Table 6; acceptable.

Image 6
Fibre/connector type: MM (Table 6).
Result: rejected.
Reason: 3 defects in the core zone, 1 of which measures 6,0µm (highlighted in red); 7 defects
in the cladding zone, 1 of which measures 7,0 µm. Both red particles exceed thresholds
established in Table 6.
61300-3-35  IEC:2009 – 15 –
Examples of high resolution graded images:

Image 7
Fibre/connector type: SM, RL ≥ 45 dB (Table 3).
Result: rejected.
Reason: 1 scratch in the core zone (highlighted in red, failure), 2 small defects in the cladding
zone that are both < 2 µm and can be ignored. Several small defects in the adhesive zone.

Image 8
Fibre/connector type: SM, RL ≥ 45 dB (Table 3).
Result: accepted.
Reason: several defects < 2 µm which can be ignored, 3 scratches in the cladding zone.

– 16 – 61300-3-35  IEC:2009
Image 9
Fibre/connector type: SM, RL ≥ 45 dB (Table 3).
Result: accepted.
Reason: multiple defects in the cladding zone that are <2 µm and can be ignored (per
procedure in this standard, assumes cleaning attempts did not remove and these are fixed
particles). 2 defects in the cladding zone that are <5 µm diameter. 1 scratch in the cladding
zone.
Image 10
Fibre/connector type: MM (Table 6).
Result: accepted.
Reason: 1 fine scratch (less than 2 µm wide), and 2 defects <5 µm in core zone; 2 fine
scratches and 4 defects <5 µm in the cladding zone; multiple defects in the contact zone that
fall below the 10 µm failure threshold, per Table 6.

61300-3-35  IEC:2009 – 17 –
Image 11
Fibre/connector type: MM (Table 6).
Result: rejected.
Reason: one particle >5 µm diameter in the cladding zone produced failure. Other observed
defects that did not create a failure condition: 1 fine scratch (<2 µm wide) and 1 defect <5 µm
(2,6 µm) in the core zone; 3 fine scratches, 3 defects <5 µm in the cladding zone.

– 18 – 61300-3-35  IEC:2009
Annex B
(normative)
Diagram of calibration artefact and method of manufacture

B.1 High resolution artefact
The artefact is constructed by inducing a series of scratches into an otherwise pristine endface.
The scratches should be cut into a simple, but recognizable pattern to ensure the user can
differentiate them from scratches that may be created through normal use and cleaning during
the artefact’s life. This is done using a device commonly referred to as a nanoindentation test
system (ISO 14577-2). There are several manufacturers throughout the world that can supply
such a device.
A nano-indenter is similar to a hardness tester, but uses much smaller indentation tips with
less force. The operating principle of a nano-indenter is quite simple. A tip is brought into
contact with the sample, a small force is applied and the tip compresses the sample and
indents itself into the material. Based on the depth to which the tip indents, one can determine
the hardness of the sample.
To create the high resolution artefact, the device is used in a slightly different manner. The
sample is a pristine fibre end face. For practical purposes, a common 1,25 mm or 2,5 mm PC
polished ferrule with RL ≥ 45 dB is recommended. The tip shall be a 90° cone type with 1,0 µm
radius. The tip is brought into contact with the cladding and a force of 450 µN is applied. This
will allow the tip to indent approximately 4 nm into the surface of the cladding. Then the tip is
translated across the surface of the cladding so that it scratches the glass. The result will be a
scratch that is approximately 4 nm deep and 200 nm to 400 nm wide. Of key importance is that
the scratch is created with a means that does not produce a square “trench” type of scratch
that will be high contrast. This is the purpose of the radius shaped tip.
Each artefact shall be measured using a method traceable to a national standards body. Two
suitable means are by scanning electron microscope or atomic force microscope. The witdh of
the scratch shall be within 200 nm to 400 nm and the depth of the scratch shall be within 3 nm
to 6 nm. The edges of the scratch cannot be quantitatively measured, but they should be
viewed with a high resolution microscope to ensure the scratch is very low in contrast.

Example of nanoindentation test system

61300-3-35  IEC:2009 – 19 –
Example of high resolution artefact
Samples of pattern cut into a 125 µm cladding on the end of a polished SC connector

m
u
– 20 – 61300-3-35  IEC:2009
B.2 Low resolution artefact
This artefact can be constructed as either deposited chrome on glass, or by some other means.
The contrast level for this is less critical. Recommended construction is as follows:
– flat glass substrate with deposited chrome (<15 % transmittance);
– five detection targets (solid circles) near the center arranged in a star pattern as shown
below;
– each target measuring 2,0 µm in diameter;
– the outer 4 targets shall be 50 µm apart from one another;
– a large field-of-view circle measuring 250 µm in diameter and 5 µm in line width (unfilled
circle);
– field of view circle labelled with “FOV 250 µm”.

Example of low resolution artefact pattern

V
O
F
61300-3-35  IEC:2009 – 21 –
Bibliography
ISO 5807: Documentation symbols and conventions for data, program and system flowcharts,
program network charts and system resource charts
ISO 14577-2:2002, Metallic materials – Instrumented indebtation test for hardness and
materials parameters – Part 2: Verification and calibration of testing machines

____________
– 22 – 61300-3-35  CEI:2009
SOMMAIRE
AVANT-PROPOS . 23
1 Domaine d'application . 25
2 Références normatives . 25
3 Mesure . 25
3.1 Généralités . 25
3.2 Conditions de mesure . 26
3.3 Préconditionnement . 26
3.4 Rétablissement . 26
4 Matériel . 26
4.1 Méthode A: microscopie optique à vision directe . 26
4.2 Méthode B: microscopie vidéo . 27
4.3 Méthode C: microscopie à analyse automatique . 27
4.4 Exigences d'étalonnage pour les systèmes de faible et haute résolutions . 27
5 Procédure . 28
5.1 Zones de mesure . 28
5.2 Procédure d’étalonnage . 28
5.3 Procédure d'inspection . 29
5.4 Exigences visuelles . 30
Annexe A (informative) Exemples d'extrémités examinées présentant des défauts . 33
Annexe B (normative) Schéma de l'artefact d'étalonnage et méthode de fabrication . 39
Bibliographie . 42

Figure 1 – Organigramme de procédure de contrôle . 30

Tableau 1 – Zones de mesure pour les connecteurs à fibres unitaires . 28
Tableau 2 – Zones de mesure pour les connecteurs rectangulaires pour fibres ruban . 28
Tableau 3 – Exigences visuelles pour connecteurs PC polis, à fibre unimodale, RL ≥
45 dB . 30
Tableau 4 – Exigences visuelles relatives aux connecteurs polis à angle (APC), fibre

unimodale . 31
Tableau 5 – Exigences visuelles pour connecteurs PC polis, à fibre unimodale,
RL ≥ 26 dB . 32
Tableau 6 – Exigences visuelles relatives aux connecteurs PC polis, fibres
multimodales. 32

61300-3-35  CEI:2009 – 23 –
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
DISPOSITIFS D’INTERCONNEXION
ET COMPOSANTS PASSIFS À FIBRES OPTIQUES –
MÉTHODES FONDAMENTALES D’ESSAIS ET DE MESURES –

Partie 3-35: Examens et mesures –
Inspection automatique et visuelle de l'extrémité
des connecteurs à fibres optiques

AVANT-PROPOS
1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation composée
de l'ensemble des comités électrotechniques nationaux (Comités nationaux de la CEI). La CEI a pour objet de
favoriser la coopération internationale pour toutes les questions de normalisation dans les domaines de
l'électricité et de l'électronique. A cet effet, la CEI – entre autres activités – publie des Normes internationales,
des Spécifications techniques, des Rapports techniques, des Spécifications accessibles au public (PAS) et des
Guides (ci-après dénommés "Publication(s) de la CEI"). Leur élaboration est confiée à des comités d'études,
aux travaux desquels tout Comité national intéressé par le sujet traité peut participer. Les organisations
internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent également aux
travaux. La CEI collabore étroitement avec l'Organisation Internationale de Normalisation (ISO), selon des
conditions fixées par accord entre les deux organisations.
2) Les décisions ou accords officiels de la CEI concernant les questions techniques représentent, dans la mesure
du possible, un accord international sur les sujets étudiés, étant donné que les Comités nationaux de la CEI
intéressés sont représentés dans chaque comité d’études.
3) Les Publications de la CEI se présentent sous la forme de recommandations internationales et sont agréées
comme telles par les Comités nationaux de la CEI. Tous les efforts raisonnables sont entrepris afin que la CEI
s'assure de l'exactitude du contenu technique de ses publications; la CEI ne peut pas être tenue responsable de
l'éventuelle mauvaise utilisation ou interprétation qui en est faite par un quelconque utilisateur final.
4) Dans le but d'encourager l'uniformité internationale, les Comités nationaux de la CEI s'engagent, dans toute la
mesure possible, à appliquer de façon transparente les Publications de la CEI dans leurs publications
nationales et régionales. Toutes divergences entre toutes Publications de la CEI et toutes publications
nationales ou régionales correspondantes doivent être indiquées en termes clairs dans ces dernières.
5) La CEI elle-même ne fournit aucune attestation de conformité. Des organismes de certification indépendants
fournissent des services d'évaluation de conformité et, dans certains secteurs, accèdent
...