IEC 62363:2008

IEC 62363
Edition 1.0 2008-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Radiation protection instrumentation – Portable photon contamination meters
and monitors
Instrumentation pour la radioprotection – Appareils portables de mesure et de
surveillance de la contamination par des photons
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IEC 62363
Edition 1.0 2008-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Radiation protection instrumentation – Portable photon contamination meters
and monitors
Instrumentation pour la radioprotection – Appareils portables de mesure et de
surveillance de la contamination par des photons

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
V
CODE PRIX
ICS 13.280 ISBN 2-8318-9733-5
– 2 – 62363 © IEC:2008
CONTENTS
FOREWORD.0H5

1 Scope and object.1H7
2 Normative references .2H7
3 Terms and definitions .3H8
4 Units .4H12
5 General characteristics.5H12
5.1 Classification.6H12
5.2 Detection assemblies .7H12
5.3 Ease of decontamination .8H12
5.4 Sealing.9H13
5.5 Alarm threshold .10H13
5.6 Pulse height thresholds .11H13
5.7 Measurement assembly indications .12H13
5.7.1 Meter display.13H13
5.7.2 Audible indication .14H14
5.7.3 Additional indication .15H14
5.7.4 Monitors .16H14
5.8 Effective range of measurement .17H14
5.9 Mechanical shocks .18H14
5.10 Setting up and maintenance facilities for electronic equipment .19H14
6 General test procedures .20H15
6.1 Nature of tests.21H15
6.2 Test conditions.22H15
6.2.1 Reference and standard test conditions .23H15
6.2.2 Tests performed under standard test conditions .24H15
6.2.3 Tests performed with variation of influence quantities.25H15
6.3 Reference radionuclides.26H15
6.4 Background .27H15
6.5 Statistical fluctuations .28H16
6.6 Test source .29H16
7 Electrical characteristics.30H16
7.1 Statistical fluctuations .31H16
7.1.1 Requirements .32H16
7.1.2 Method of test .33H16
7.2 Response time .34H17
7.2.1 Requirements .35H17
7.2.2 Method of test .36H17
7.3 Interrelationship between response time and statistical fluctuations .37H17
7.4 Warm-up time test .38H18
7.4.1 Requirements .39H18
7.4.2 Method of test .40H18
7.5 Overload protection .41H18
7.5.1 Requirements .42H18
7.5.2 Method of test .43H18
7.6 Power supplies – battery operation.44H18

62363 © IEC:2008 – 3 –
7.6.1 General .45H18
7.6.2 Requirements – primary batteries (non-rechargeable) .46H18
7.6.3 Requirements – secondary batteries (rechargeable) .47H19
7.6.4 Method of test .48H19
8 Radiation characteristics .49H20
8.1 General .50H20
8.2 Detector profile.51H20
8.2.1 Requirements .52H20
8.2.2 Method of test .53H20
8.3 Surface emission rate response .54H20
8.3.1 General .55H20
8.3.2 Type test .56H20
8.3.3 Method of test .57H21
8.3.4 Routine test.58H22
8.4 Relative intrinsic error .59H22
8.4.1 Requirements .60H22
8.4.2 Method of test .61H22
8.5 Variation of surface emission rate response with photon radiation energy .62H22
8.5.1 Requirements .63H22
8.5.2 Method of test .64H23
8.6 Variation of response with absorption.65H23
8.6.1 Requirement.66H23
8.6.2 Method of test .67H24
8.7 Response to beta radiation.68H24
8.7.1 Requirement.69H24
8.7.2 Method of test .70H24
8.8 Response to background photon radiation.71H24
8.8.1 Requirement.72H24
8.8.2 Method of test .73H25
8.9 Neutrons .74H25
8.10 Detection limit (minimum detectable surface emission rate per unit area) .75H25
8.10.1 Requirement.76H25
8.10.2 Method of test .77H25
9 Environmental characteristics .78H25
9.1 Ambient temperature .79H25
9.1.1 Requirements .80H25
9.1.2 Methods of test.81H26
9.2 Relative humidity.82H26
9.2.1 Requirements .83H26
9.2.2 Method of test .84H26
9.3 Electromagnetic compatibility .85H26
10 Storage .86H27
10.1 General .87H27
10.2 Mechanical shock.88H27
11 Documentation .89H27
11.1 Identification certificate .90H27
11.2 Operation and maintenance manual .91H27

– 4 – 62363 © IEC:2008
Annex A (informative) Limit distances for typical detector volumes .92H31

Figure 1 – Detector profile .93H29
Figure 2 – Contiguous portions area for testing.94H30

Table 1 – Reference conditions and standard test conditions .95H28
Table 2 – Test performed under standard test conditions .96H28
Table 3 – Test performed with variation of influence quantities .97H29
Table A.1 – Limit distance for various detector volumes and window types .98H31

62363 © IEC:2008 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
RADIATION PROTECTION INSTRUMENTATION –
PORTABLE PHOTON CONTAMINATION METERS AND MONITORS

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62363 has been prepared by subcommittee 45B: Radiation
protection instrumentation, of IEC technical committee 45: Nuclear instrumentation.
This standard should be regarded as a complementary standard to IEC 60325, which is
applicable to alpha and beta contamination monitoring assemblies.
The text of this standard is based on the following documents:
FDIS Report on voting
45B/579/FDIS 45B/590/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 6 – 62363 © IEC:2008
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
62363 © IEC:2008 – 7 –
RADIATION PROTECTION INSTRUMENTATION –
PORTABLE PHOTON CONTAMINATION METERS AND MONITORS

1 Scope and object
This International Standard is applicable to portable and transportable contamination meters
and monitors designed for the direct measurement or the direct detection of surface
contamination by photon radiation emitting radionuclides and which comprise at least:
– a detection assembly (comprising counter tube, scintillation detector or semiconductor
detector, etc.), which may be connected either rigidly or by means of a flexible cable or
incorporated into a single assembly;
– a measurement assembly.
The standard is applicable to:
– photon surface contamination meters;
– photon surface contamination monitors.
The standard is applicable to detection assemblies that are designed to measure photon
contamination from radionuclides which emit photons with energy in excess of 5 keV. In
particular, this standard should be used to assess the performance of assemblies used to
demonstrate that material is free from surface contamination by photon emitting radionuclides.
This standard is also applicable to special purpose assemblies and to assemblies specifically
designed to provide limited spectroscopic information to the user.
NOTE These detection assemblies may be used to measure photon emissions from radionuclides that also emit
alpha and beta radiations, where the alpha and beta emissions may be shielded due to the nature of the
contamination. If shielding of the radioactive emissions occurs, then strictly speaking, the contamination is near to
rather than on the surface of the article being monitored.
The object of this standard is to lay down standard requirements and to give examples of
acceptable methods, and also to specify general characteristics, general test conditions,
radiation characteristics, electrical safety, environmental characteristics, and the requirements
of the identification certificate for photon contamination meters and monitors.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-393:2003, International Electrotechnical Vocabulary (IEV) – Part 393: Nuclear
Instrumentation – Physical phenomena and basic concepts
IEC 60050(394):2007, International Electrotechnical Vocabulary (IEV) – Part 394: Nuclear
instrumentation: Instruments, systems, equipment and detectors

IEC 60068-2-27, Environmental testing – Part 2: Tests – Test Ea and guidance: Shock
IEC 60086 (all parts), Primary batteries

– 8 – 62363 © IEC:2008
IEC 60325:2002, Radiation protection instrumentation – Alpha, beta and alpha/beta (beta
energy >60 keV) contamination meters and monitors
IEC 61187:1993, Electrical and electronic measuring equipment – Documentation
ISO 7503-1:1988, Evaluation of surface contamination – Part 1: Beta-emitters (maximum beta
energy greater than 0,15 MeV) and alpha-emitters
ISO 7503-3:1996, Evaluation of surface contamination – Part 3: Isomeric transition and
electron capture emitters, low energy beta-emitters (E Beta max less than 0,15 MeV)
ISO 8769-2:1996, Reference sources for the calibration of surface contamination monitors –
Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV
ISO 11929-1:2000, Determination of the detection limit and decision threshold for ionizing
radiation measurements – Part 1: Fundamentals and application to counting measurements
without the influence of sample treatment
th
BIPM, The international system of units (SI), 7 edition, 1998
3 Terms and definitions
For the purposes of this document, the general terminology concerning the detection and
measurement of ionizing radiation and nuclear instrumentation given in IEC 60050-393 and
IEC 60050-394 applies. Also, the terms and definitions specific to this standard given in
ISO 7503-1, ISO 7503-3, ISO 8769-2 and ISO 11929-1, as well as the following, apply.
3.1
particle
very small portion of matter or energy
[IEV 393-11-01]
3.2
photon
quantum of electromagnetic radiation considered as an elementary particle of energy hv,
where h is the Planck constant and v the frequency of the radiation
[IEV 393-11-06]
3.3
surface emission rate (for a radioactive source)
number of particles of a given type, whose energies are above a given value, emerging from
the face of the radioactive source or its window per unit time
[IEV 393-14-87]
NOTE In the context of this standard, a particle refers to a photon.
3.4
calibrated source activity
activity of a test source in Becquerels, as stated by the source manufacturer at the time of
purchase, or an appropriately accredited calibration laboratory. The calibrated activity shall
always have a correction applied to take into account radioactive decay
3.5
effective range of measurement
absolute value of the difference between the two limits of a nominal range

62363 © IEC:2008 – 9 –
[IEV 394-40-16]
3.6
response time (of a measuring assembly)
duration between the instant of a step change in the measured quantity and the instant when
the output signal reaches for the first time a specified percentage of its final value, that
percentage being usually taken as 90 %
[IEV 394-39-09]
NOTE For integrating measuring assemblies, the response time is 90 % of the equilibrium value of the first
derivative or slope of the indication.
3.7
source efficiency
ε
s
ratio between the surface emission rate and the number of particles of the same type created
or released within the source per unit time
[ISO 8769-2, 3.3, modified]
NOTE Source efficiency will be affected by self-absorption and backscatter.
3.8
decay efficiency of a radionuclide with respect to photons
ε
d
ratio of the number of photons of a given energy, created per unit time by a given
radionuclide, to the number of decays of this radionuclide per unit time
[ISO 7503-3, 3.1, modified]
3.9
small area source
source where the largest dimension of the active surface does not exceed 1 cm
3.10
surface emission rate response
S
ratio of the number of detected photons per unit time (for example the net count rate) to the
conventionally true surface emission rate of photons of the same type per unit area, under
stated conditions specified by the manufacturer
3.11
surface activity response
ratio of the number of detected photons per unit time (for example the net count rate) to the
activity (in Becquerels) of the radioactive source per unit area, under stated conditions
specified by the manufacturer
3.12
effective sensitive area
area under the detector, where the efficiency to a small area source located within that area is
always greater than 1 % of the maximum efficiency to the same source within that area
NOTE The plane of the sensitive surface of the detection assembly is maintained 10 mm above the plane of the
source.
3.13
sensitive volume (of a detector)
part of the detector which is sensitive to a radiation and is used for detection
[IEV 394-38-22]
– 10 – 62363 © IEC:2008
3.14
sensitivity (of a measuring assembly)
K
for a given value of the measured quantity, ratio of the variation of the observed variable to
the corresponding variation of the measured quantity
[IEV 394-39-07]
NOTE For example in this standard, the sensitivity is used to relate the indicated net count rate (observed
variable) to the air kerma rate (measured quantity) from photon radiation.
3.15
normalised relative intrinsic error (surface emission rate response)
ratio (I ) of the deviation of the surface emission rate response from the reference surface
S
emission rate response (S – S ) to the reference surface emission rate response S . It may be
i r r
expressed as a percentage
S − S
i r
I = 100 ×
S
S
r
3.16
normalised relative intrinsic error (sensitivity)
ratio (I ) of the deviation of the sensitivity from the reference sensitivity (K − K ) to the
K i r
reference sensitivity, K . It may be expressed as a percentage
r
K − K
i r
I = 100 ×
K
K
r
3.17
coefficient of variation
ratio of the standard deviation s to the value of the arithmetic mean x of a set of n
measurements x given by the following formula:
i
n
s 1 1
V = = ()x − x
∑ i
x x n − 1
[IEV 394-40-14]
3.18
detection limit (minimum detectable surface emission rate per unit area)
surface emission rate per unit area derived according to the procedure given in ISO 11929-1
NOTE With values of counting rates and counting times of adequate size, a simplified formula for the counting
rate at the lower limit of detection is used. In the case of time preselection and known background counting rate,
the following simplified formula applies:
⎛
1 1⎞
⎜
⎟
R = (k + k ) R +
n 1−α 1−β o
⎟
⎜
t t
o b⎠
⎝
where
R  is the counting rate at the lower limit of detection;
n
R is the background counting rate;

o
t is the preselected time for background counting;
b
t is the preselected time for measurement;
o
k is the quantile of the standard deviation of errors of the first kind;
α
1 –
62363 © IEC:2008 – 11 –
k is the quantile of the standard deviation of errors of the second kind.
β
1 –
For instance for α = β = 0,05, (k ) = (k ) = 1,645
α β
1 – 1 –
⎛ ⎞
1 1
⎜ ⎟
R = ()1,645 + 1,645 R +
n o
⎜ ⎟
t t
o b
⎝ ⎠
The detection limit of the surface emission rate per unit area for a specified radionuclide becomes
R
n
DL =
S
where S is the surface emission rate response (see 3.10). The surface emission rate per unit area is expressed in
–1 –2
s cm .
3.19
conventionally true value of a quantity
value attributed to a particular quantity and accepted, sometimes by convention, as having an
uncertainty appropriate for a given purpose
[IEV 394-40-10]
NOTE A conventionally true value is, in general, regarded as sufficiently close to the true value for the difference
to be insignificant for the given purpose. For example, a value determined from a primary or secondary standard or
by a reference instrument may be taken as the conventionally true value.
3.20
detection assembly
assembly containing at least the detector
3.21
measurement assembly
assembly processing the signals received from the detection assembly and displaying the
level of contamination detected
3.22
photon surface contamination meter
assembly including one or more radiation detectors, that is designed to measure photon
surface emissions from the surface under examination
3.23
limit distance
lateral distance of a small area test source emitting photons of a given photon energy from
the central axis of the detection assembly where the reading of the measurement assembly is
1 % of the maximum reading. The plane of the sensitive surface of the detection assembly is
maintained 10 mm above the plane of the source
3.24
influence quantity
quantity that is not the measurand but that affects the result of the measurement
[IEV 394-40-27]
3.25
test
technical operation that consists of the determination of one or more characteristics of a given
product, process of service according to a specified procedure
[IEV 394-40-01]
– 12 – 62363 © IEC:2008
NOTE 1 A test is carried out to measure or classify a characteristic or a property of an item by applying to the
item a set of environmental and operating conditions and/or requirements.
NOTE 2 Tests are subdivided into type tests and routine tests and are identified as such in this standard.
3.26
type test
conformity test made on one or more items representative of the production
[IEV 394-40-02]
3.27
routine test
conformity test made on each individual item during or after manufacture
[IEV 394-40-03]
3.28
acceptance test
contractual test to prove to the customer that the device fulfils certain specifications

[IEV 394-40-05]
NOTE These tests are, in general, selected from the tests specified, but this selection is a contractual matter and

does not form any part of this standard.
4 Units
In this standard, the units are the multiples and sub-multiples of units of the International
System of Units (SI). The following non-SI units are also used:
Time: years, days, hours (h), minutes (min).
–19
For energy: electron-volt (eV) (1eV = 1,602×10 J).
NOTE Definitions of the radiation quantities and dosimetric terms are given in IEC 60050-393 and IEC 60050-394.
5 General characteristics
5.1 Classification
The manufacturer shall classify the assembly according to the following photon energy range
or ranges for which it is designed:
Greater than 50 keV
Between 20 keV and 50 keV
Less than 10 keV
5.2 Detection assemblies
The dimensions of the sensitive volume of the detection assembly shall be stated. For
assemblies designed to measure low energy photons, the manufacturer shall also state the
area of the detection window.
5.3 Ease of decontamination
The assembly shall be constructed so as to permit easy decontamination. It is recommended
that it be provided, for example, with a smooth non-porous external surface which is free from
crevices. Alternatively, it shall be possible to use at least the measurement assembly when

62363 © IEC:2008 – 13 –
placed in a thin flexible envelope which is either disposable or easy to decontaminate and
which is provided with transparent parts to permit the instrument scale to be read.
5.4 Sealing
For assemblies intended for outdoor use, the manufacturer shall state the precautions that
have been taken to prevent the ingress of moisture.
5.5 Alarm threshold
This clause is applicable to monitors only.
A monitor shall include circuits necessary for activating an alarm at one or more thresholds.
The number of tripping levels shall be subject to agreement between manufacturer and
purchaser.
The values of alarm threshold shall be given either as percentages of the ranges or in terms
of units of the display.
Each alarm threshold shall be designed to allow convenient operational verification by means
of test signals, radioactive sources or signal input circuitry.
The range of adjustment shall be specified and the value of the alarm threshold shall be
capable of being adjusted to any point within this range. It shall not be possible to
incapacitate the alarm by any means such as setting the alarm thresholds beyond range
limits. If a mute facility is provided it shall automatically reset when the alarm condition
ceases.
Alarm threshold adjustments shall not be easily accessible to the operator (for example
keyswitch operated or protected password).
5.6 Pulse height thresholds
Measurement assemblies should have the facility to set pulse height thresholds, which
correspond to photon energy thresholds, in order to discriminate against interfering photon
and/or beta radiations. Thresholds should be secure and only changed through internal
controls or menus accessed by means of a password.
5.7 Measurement assembly indications
5.7.1 Meter display
The assembly should display the count rate.
Displays where the quantity displayed is derived from count rate such as activity should only
be used where the radionuclide mix has been characterised. In this situation, the
measurement assembly shall be programmed with the relationship between the surface
emission rate and total activity (or activity per unit area) of the mix, taking account of the
decay efficiency of the radionuclide(s), the surface emission rate response and the source
efficiency. The manufacturer shall state the method used to program the assembly with this
relationship. Where the assembly indicates activity, the manufacturer should indicate the
assumed surface area of the activity. The unit of activity shall be the Becquerel (Bq).
For digital displays, an additional pseudo-analogue graphical indication should be provided
which shows the count rate (or activity) in terms of the proportion of the maximum of the
range indication, for example a bargraph.
Where an instrument has a digital display, a feature shall be provided to check that all
segments of the display are operational.

– 14 – 62363 © IEC:2008
Where linearly scaled displays are used for this application, autoranging functionality should
also be provided.
5.7.2 Audible indication
An audible indication of count rate shall be provided. There shall be a facility for muting this
indication. Where the equipment has been designed for use where noise levels could be high,
provision shall be made for the use of a head set.
5.7.3 Additional indication
Indication shall be given of operational conditions in which the indication is not correct (within
the specifications of this standard), for example low battery or detector failure.
5.7.4 Monitors
All the characteristics described in 99H5.7.1, 100H5.7.2 and 101H5.7.3 are also required for monitors.
In addition to the audible indication of count rate (or activity) above, there shall be either an
audible indication of contamination above a certain preset value or visual indication. Although
the audible indication may be produced by the same transducer as the indication of count
rate, it shall be distinctly different from this indication.
5.8 Effective range of measurement
For logarithmically scaled assemblies, the effective range of measurement shall be from
below one third of the least significant decade to full scale.
For digitally scaled assemblies, the effective range of measurement shall be from the start of
the second least significant digit to the maximum of the rated range of measurement.
The manufacturer shall state the effective range of measurement of each scale range. For
assemblies with more than one scale range, the effective range of measurement for each
range shall overlap.
±2
For assemblies with digital and scientific display (e.g. x,y × 10 ) the mantissa shall have at
least two digits (for instance 1,0 to 9,9) and the manufacturer shall define the effective range
–2 4 –1
of measurement (for instance 1,0 × 10 to 9,9 × 10 with units counts·s ). For the purposes
of this standard, assemblies using this type of display shall conform to the requirements of
digital scaled assemblies.
Consideration should be given to providing the capability for the determination of low count
rates, possibly using an integration facility.
5.9 Mechanical shocks
Portable assemblies shall be able to withstand without damage mechanical shocks from all
–2
directions involving a peak acceleration of 300 m·s for a time interval of 18 ms, the shape of
the shock being semi-sinusoidal (see IEC 60068-2-27).
5.10 Setting up and maintenance facilities for electronic equipment
In addition to an adequate instruction and maintenance manual, all assemblies shall be
provided with sufficient easily accessible test points to facilitate setting up and fault location,
together with, where necessary, maintenance aids such as extension printed wiring boards,
extension leads and special maintenance tools. Facilities shall be provided to prevent the
unauthorised access to all the set-up functions of the equipment.

62363 © IEC:2008 – 15 –
6 General test procedures
6.1 Nature of tests
Qualification tests are performed in order to verify that the requirements of a specification are
fulfilled (see 3.25). Qualification tests are subdivided into type tests and routine tests (see
3.26 and 3.27).
All tests enumerated in the following clauses are to be considered as "type tests", with the
exception of the test described in 102H8.3.4.
Some of these tests may, by agreement between the manufacturer and purchaser, be
considered to be acceptance tests (see 3.28). Unless otherwise specified, the requirements
corresponding to the tests shall be met over the whole effective range of measurement of the
instrument.
Since the configuration of the measurement assembly is critical to the performance
characteristics of the instrument, then both the measurement and the detection assemblies
shall be tested together as a single unit. Tests on measurement assemblies are described
fully in IEC 60325.
6.2 Test conditions
6.2.1 Reference and standard test conditions
Reference conditions are given in the second column of Table 1. Except where otherwise
specified, the tests in this standard shall be carried out under the standard test conditions
given in the third column of Table 1.
6.2.2 Tests performed under standard test conditions
Tests which are performed under standard test conditions are listed in Table 2 which
indicates, for each characteristic, the requirement (permissible variation in indication) and the
subclause where the corresponding test method is described.
6.2.3 Tests performed with variation of influence quantities
These tests are intended to determine the effects of variations in influence quantities, and are
given in Table 3 with the range of variation of each influence quantity and limits of consequent
variation in the indication of an assembly.
In order to test the effect of variation in any one of the influence quantities listed in Table 3,
all other influence quantities shall be maintained within the limits for standard test conditions
given in Table 1, unless otherwise specified in the test procedure concerned.
6.3 Reference radionuclides
The reference radionuclide is dependent on the photon energy range stated by the
manufacturer. The reference radionuclides and associated photon energy ranges are:
Greater than 50 keV Cs
Between 20 keV and 50 keV I
Less than 10 keV  Fe
6.4 Background
The background indicated by the instrument shall be subtracted from the observed signal by a
suitable procedure which could include calculation.

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If the equipment has the capability to determine background rates for net rate determination,
the manufacturer shall clearly state the method used and the uncertainties involved.
6.5 Statistical fluctuations
For any test involving the use of radiation, if the magnitude of the statistical fluctuations of the
indications, arising from the random nature of the emission of radiation alone, is a significant
fraction of the variation of the indication
...