IEC 60352-7:2002

INTERNATIONAL IEC
STANDARD
60352-7
First edition
2002-08
Solderless connections –
Part 7:
Spring clamp connections –
General requirements, test methods
and practical guidance
Connexions sans soudure –
Partie 7:
Connexions à ressort –
Règles générales, méthodes d'essai
et guide pratique
Reference number
Publication numbering
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60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.

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base publication incorporating amendment 1 and the base publication incorporating

amendments 1 and 2.
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INTERNATIONAL IEC
STANDARD
60352-7
First edition
2002-08
Solderless connections –
Part 7:
Spring clamp connections –
General requirements, test methods
and practical guidance
Connexions sans soudure –
Partie 7:
Connexions à ressort –
Règles générales, méthodes d'essai
et guide pratique
 IEC 2002  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale
T
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

– 2 – 60352-7  IEC:2002(E)
CONTENTS
FOREWORD . 3

INTRODUCTION .4

1 Scope and object . 5

2 Normative references. 5

3 Definitions. 6

4 Requirements . 8
4.1 Workmanship. 8
4.2 Tools . 8
4.3 Spring-clamp terminations. 8
4.4 Design features. 8
4.5 Wires. 8
4.6 Spring-clamp connections . 9
5 Tests . 9
5.1 Testing . 9
5.2 Test methods and test requirements .10
5.3 Test schedules .17
6 Practical guidance.22
6.1 Current-carrying capacity .22
6.2 Tool information.22
6.3 Termination information .22
6.4 Wire information .23
6.5 Connection information .25
Figure 1 – Examples of spring-clamp connections. 7
Figure 2 – Example of a spring-clamp terminal . 7
Figure 3 – Information for the wire deflection test.13
Figure 4 – Test arrangement, vibration .13
Figure 5 – Test arrangement, current method .15
Figure 6 – Basic test schedule (see 5.3.2) .20

Figure 7 – Full test schedule (see 5.3.3) .21
Figure 8 – Correctly stripped wire .24
Figure 9 – Examples of stripping faults .24
Table 1 – Values of tensile strength .11
Table 2 – Values for wire deflection test.12
Table 3 – Vibration, test severities .14
Table 4 – Rated current of the wires, initial and final contact resistance .15
Table 5 – Number of specimens required.17

60352-7  IEC:2002(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
SOLDERLESS CONNECTIONS –
Part 7: Spring clamp connections – General requirements,

test methods and practical guidance

FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60352-7 has been prepared by subcommittee 48B: Connectors, of
IEC technical committee 48: Electromechanical components and mechanical structures for
electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
48B/1228/FDIS 48B/1243/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
The committee has decided that the contents of this publication will remain unchanged until 2007.
At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
– 4 – 60352-7  IEC:2002(E)
INTRODUCTION
This part of IEC 60352 includes requirements, tests and practical guidance information.

Two test schedules are provided.

a) The basic test schedule applies to spring-clamp connections which conform to all require-

ments of clause 4. These requirements are derived from experience with successful

applications of such spring-clamp connections.

b) The full test schedule applies to spring-clamp connections which do not fully conform to all

requirements of clause 4, for example which are manufactured using materials or finishes

not included in clause 4. This approach permits cost and time effective performance
verification using a limited basic test schedule for established spring-clamp connections
and an expanded full test schedule for spring-clamp connections requiring more extensive
performance validation.
The values given in this specification are minimum values, which are harmonized with other
IEC documents. Other standards may specify other values.

60352-7  IEC:2002(E) – 5 –
SOLDERLESS CONNECTIONS –
Part 7: Spring clamp connections – General requirements,

test methods and practical guidance

1 Scope and object
This part of IEC 60352 is applicable to spring-clamp connections made with stripped wire

without further preparation:
2 2
– solid conductors of 0,32 mm to 3,7 mm nominal diameter (0,08 mm to 10 mm cross-
section), or
2 2
– stranded conductors of 0,08 mm to 10 mm cross-section, or
2 2
– flexible conductors of 0,08 mm to 10 mm cross-section
according to IEC 60228 or IEC 60189-3 for use in telecommunication equipment and in
electronic devices employing similar techniques.
Information on materials and data from industrial experience is included in addition to the test
procedures to provide electrically stable connections under prescribed environmental conditions.
The object of this part of IEC 60352 is to determine the suitability of spring-clamp connections
under specified mechanical, electrical and atmospheric conditions.
NOTE IEC Guide 109 advocates the need to minimize the impact of a product on the natural environment
throughout the product life cycle. It is understood that some of the materials permitted in this standard may have a
negative environmental impact. As technological advances lead to acceptable alternatives for these materials, they
will be eliminated from this standard.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60050(581):1978, International Electrotechnical Vocabulary (IEV) – Chapter 581: Electro-
mechanical components for electronic equipment
Amendment 1 (1998)
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
Amendment 1 (1992)
IEC 60189-3:1988, Low frequency cables and wires with PVC insulation and PVC sheath –
Part 3: Equipment wires with solid or stranded conductor, PVC insulated, in singles,
pairs and triples
IEC 60228:1978, Conductors of insulated cables
Amendment 1 (1993)
IEC 60512 (all parts), Connectors for electronic equipment – Tests and measurements
IEC 60512-1-100, Connectors for electronic equipment – Tests and measurements – Part 1-100:
General – Applicable publications
IEC 60884-1:1994, Plug and socket-outlets for household and similar purposes – Part 1:
General requirements.
– 6 – 60352-7  IEC:2002(E)
3 Definitions
For the purpose of this part of IEC 60352, the terms and definitions of IEC 60050(581) and

IEC 60512-1 and the following additional terms and definitions apply:

3.1
spring-clamp termination
part of the conta
...