Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters

IEC 62129-2:2011 is applicable to instruments measuring the vacuum wavelength or optical frequency emitted from sources that are typical for the fibre-optic communications industry. These sources include Distributed Feedback (DFB) laser diodes, External Cavity lasers and single longitudinal mode fibre-type sources. This standard is part of the IEC 62129 series on the calibration of wavelength/optical frequency measurement instruments. Refer to IEC 62129 for the calibration of optical spectrum analyzers.

Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 2: Appareils de mesure de longueur d'onde unique à interféromètre de Michelson

La CEI 62129-2:2011 est applicable aux instruments mesurant la longueur d'onde ou la fréquence optique dans le vide émise par des sources types de l'industrie des communications par fibres optiques. Ces sources comportent des diodes laser DFB (à rétroaction répartie, Distributed Feedback), des lasers à cavité externe et des sources du type à fibres unimodales longitudinales. La présente norme fait partie de la série CEI 62129 relative à l'étalonnage des appareils de mesure de longueur d'onde/appareils de mesure de fréquence optique. Se référer à la CEI 62129 pour l'étalonnage des analyseurs de spectre optique.

General Information

Status
Published
Publication Date
25-May-2011
Technical Committee
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
30-Jun-2011
Completion Date
26-May-2011
Ref Project

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IEC 62129-2:2011 - Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
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IEC 62129-2 ®
Edition 1.0 2011-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Calibration of wavelength/optical frequency measurement instruments –
Part 2: Michelson interferometer single wavelength meters

Étalonnage des appareils de mesure de longueur d’onde/appareil de mesure
de la fréquence optique –
Partie 2: Appareils de mesure de longueur d'onde unique à interféromètre de
Michelson
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IEC 62129-2 ®
Edition 1.0 2011-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Calibration of wavelength/optical frequency measurement instruments –
Part 2: Michelson interferometer single wavelength meters

Étalonnage des appareils de mesure de longueur d’onde/appareil de mesure
de la fréquence optique –
Partie 2: Appareils de mesure de longueur d'onde unique à interféromètre de
Michelson
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX X
ICS 33.180.30 ISBN 978-2-88912-523-4

– 2 – 62129-2  IEC:2011
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references. 7
3 Terms and definitions . 7
4 Preparation for calibration . 11
4.1 Organization . 11
4.2 Traceability . 11
4.3 Advice for measurements and calibrations . 11
4.4 Recommendations to customers . 12
5 Single wavelength calibration . 12
5.1 General . 12
5.2 Establishing calibration conditions. 12
5.3 Calibration procedure . 13
5.3.1 General . 13
5.3.2 Measurement configuration . 13
5.3.3 Detailed procedure. 15
5.3.4 Stability test (if necessary) . 15
5.3.5 "On/Off repeatability" measurement (optional if a specification is
available) . 16
5.3.6 Wavelength dependence measurement (optional) . 18
5.3.7 Connector repeatability measurement (optional) . 19
5.4 Calibration uncertainty . 20
5.5 Reporting the results . 21
6 Absolute power calibration . 21
Annex A (normative) Mathematical basis . 22
Annex B (informative) Rejection of outliers . 25
Annex C (informative) Example of a single wavelength calibration . 27
Annex D (informative) ITU wavelength bands . 30
Annex E (informative) Atomic and molecular reference transitions . 31
Annex F (informative) Reference locked laser example . 42
Annex G (informative) Balance between accuracy and calibration time. 44
Bibliography . 46

Figure 1 – Example of a traceability chain. 10
Figure 2 – Wavelength meter measurement using a lock quality monitor signal . 14
Figure 3 – Wavelength meter measurement using a reference wavelength meter . 14
Figure F.1 – Typical measurement arrangement to lock laser to gas absorption line . 43

Table 1 – Typical parameters to calculate the "On/Off repeatability" measurement
duration . 17
Table B.1 – Critical values Z as a function of sample size N . 26
c
Table C.1 – Type A uncertainty contributions for a stability measurement . 27
Table C.2 – Uncertainty contributions for a "On/Off repeatability" measurement . 28

62129-2  IEC:2011 – 3 –
Table C.3 – Uncertainty budget for wavelength dependence . 28
Table C.4 – Uncertainty budget for the wavelength meter calibration . 29
Table D.1 – The ITU-T bands in different units . 30
Table E.1 – Helium-neon laser lines . 32
Table E.2 – Centre vacuum wavelengths for Acetylene C H . 33
2 2
Table E.3 – Frequency and vacuum wavelength values for the v + v and v + v + v +
1 3 1 2 4
v bands of C H . 35
5 2 2
Table E.4 – List of H CN transitions . 38
12 16
Table E.5 – List of C O transitions. 40
Table E.6 – Excited state optogalvanic transitions . 41
Table G.1 – Summary of choices . 45

– 4 – 62129-2  IEC:2011
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY
MEASUREMENT INSTRUMENTS –
Part 2: Michelson interferometer single wavelength meters

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