IEC 62271-101:2012/AMD1:2017

IEC 62271-101 ®
Edition 2.0 2017-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
A MENDMENT 1
AM ENDEMENT 1
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques

IEC 62271-101:2012-10/AMD1:2017-11(en-fr)

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IEC 62271-101 ®
Edition 2.0 2017-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
A MENDMENT 1
AM ENDEMENT 1
High-voltage switchgear and controlgear –

Part 101: Synthetic testing
Appareillage à haute tension –

Partie 101: Essais synthétiques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.130.10 ISBN 978-2-8322-4811-9

– 2 – IEC 62271-101:2012/AMD1:2017
© IEC 2017
FOREWORD
This amendment has been prepared by subcommittee 17A: Switching devices, of IEC
technical committee 17: High-voltage switchgear and controlgear.
The text of this amendment is based on the following documents:
FDIS Report on voting
17A/1149/FDIS 17A/1154/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of January 2018 have been included in this copy.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
_____________
INTRODUCTION to the Amendment
This amendment includes the following significant technical changes:
– the test procedure for test-duty T100a has been aligned with IEC 62271-100;
– Annexes A through D have been transferred to IEC 62271-306;
– Annex I has been revised and now includes Annex P of IEC 62271-100;
– Annexes K, L and N have been revised.

_____________
2 Normative references
Replace the existing reference to IEC 62271-100:2008 by the following new reference:
IEC 62271-100:2008, High-voltage switchgear and controlgear – Part 100: Alternating current
circuit-breakers
© IEC 2017
IEC 62271-100:2008/AMD 1:2012
IEC 62271-100:2008/AMD 2:2017
3.17
minimum clearing time
Replace the entire term, definition, note and source as follows:
3.17
(void)
Add, after the definition 3.18, a new term and definition as follows:
3.19
intermediate asymmetry
level of asymmetry in the other two phases having a reduced (intermediate) level of
asymmetry when in a three-phase system the short-circuit current is initiated simultaneously
in all phases and maximum asymmetry is obtained in one of the phases
4.1.2 High-current interval
Replace the entire subclause by the following:
The tolerance on the amplitude and the power frequency of the prospective breaking current
is given in 6.103.2 and 6.104.3 of IEC 62271-100:2008. Therefore, the following conditions
concerning the actual current through the test circuit-breaker shall be met:
– for symmetrical testing the current amplitude and final loop duration shall not be less than
90 % of the required values based on the current of the test-duty considered;
– for SLF test-duties and T100s and T100a when tested with ITRV, the product of the
current amplitude and the duration of the final loop shall not be less than 95 % of the
required values based on the current of the test-duty considered;
– for asymmetrical testing, both the current amplitude and final loop duration shall be
between 90 % and 110 % of the required values, based on the current of the test-duty
considered and time constant (see Tables L.12 to L.17).
In rare cases, where the applied voltage from the high current source is of the same
magnitude as the required test voltage in a direct test circuit, a higher deviation of the last
current loop is accepted provided that the prospective current loop with the auxiliary circuit-
breaker arcing is within the specified tolerances.
4.1.4 High-voltage interval
Replace the first sentence of the first hyphen by the following:
The initial value of the power-frequency recovery voltage, excluding the transient oscillations,
shall not be less than the equivalent initial value of the power-frequency recovery voltage
specified in 6.104.7 of IEC 62271-100:2008 which, for a test with symmetrical current, starts
with a minimum peak value of 0,95×k ×U √(2/3).
pp r
4.2.1 Current injection methods
Replace, in the first sentence, "(see Annex B)" by "(see IEC 62271-306)".
Add, after the second indent, the following new sentences:
Current injection method is mandatory for:
– short-line fault test duties;

– 4 – IEC 62271-101:2012/AMD1:2017
© IEC 2017
– T100s and T100a when tested with ITRV.
The time during which the arc is fed only by the injected current shall be treated as part of the
length of the final current loop.
Replace the paragraph below the second hyphen by the following:
If any device with breaking capability interrupts the current through the test circuit-breaker at
the same time as the test circuit-breaker, the method is not a valid current injection method.
Replace, in item c), "(see Annex B)" by "(see IEC 62271-306)".
4.2.2 Voltage injection method
Replace, in the first sentence, "(see also Annex C)" by "(see IEC 62271-306)".
Delete the sentence below the third hyphen of the first list.
4.2.3 Duplicate circuit method (transformer or Skeats circuit)
Replace, in the first sentence, "(see also Annex D)" by "(see IEC 62271-306)".
Delete the penultimate paragraph.
Replace, in the last paragraph, "See Annex D" by "See IEC 62271-306".
4.2.4 Other synthetic test methods
Remove the last two paragraphs.
Table 3 – Test parameters during three-phase interruption for test-duties T10, T30, T60
and T100s, k = 1,3
pp
Replace "98" by "97" (3 instances).
5.2.2 Test circuit
Replace the second sentence of the first paragraph by the following:
Examples of circuits showing voltage and current wave shapes are given in Figures 5 and 6
for single-phase and Figure 7 for three-phase.
6 Specific requirements for synthetic tests for making and breaking
performance related to the requirements of 6.102 through 6.111 of
IEC 62271-100:2008
Replace the existing title by the following new title:
6 Type tests
Add, before the existing text of this clause, the following new title:
6.1 General
Replace the second paragraph by the following new paragraphs and new table:

© IEC 2017
Requirements concerning testing of metal enclosed and dead tank circuit-breakers are given
in Annex N.
General requirements for circuit-breakers with opening resistors are given in Annex R of
IEC 62271-100:2008/AMD1:2012. A method available for testing circuit-breakers having
opening resistors is reported in Annex F.
The abbreviations given in Table 6 are used to specify the operations to be performed.
Table 6 – Abbreviations used for operation during synthetic tests
Cd Closing operation in a direct circuit at the voltage of the current source which can be less than the
voltage specified in 6.104.1 of IEC 62271-100:2008
(Cd) Closing operation as Cd, which may be carried out under no-load conditions
Cd Closing operation against the rated short-circuit making current according to 6.104.2 of
asy
IEC 62271-100:2008/AMD2:2017 in a direct circuit at conditions described under Cd
Cs Closing operation against a symmetrical current equal to the rated short-circuit breaking current,
sym
carried out at the required applied voltage in a synthetic circuit
Od Breaking operation at the voltage of the current source only and with the specified breaking current
Os Breaking operation with specified parameters in a synthetic circuit
t Time interval between operations (0,3 s or 3 min depending on the rated operating sequence)
t' Time interval between operations (3 min)
t" Time interval between operations (15 s)
SP Single-phase test as defined in 6.108 of IEC 62271-100:2008/AMD2:2017
DEF Double-earth fault test as defined in 6.108 of IEC 62271-100:2008/AMD2:2017
NOTE Due to the characteristics of synthetic testing it may be difficult to comply with the specified time intervals
of the rated operating sequence. See 6.105.1 of IEC 62271-100:2008/AMD1:2008.

In order to comply with all test requirements, it may be necessary to make more operations
than specified
...