IEC 61300-2-14:2021

IEC 61300-2-14 ®
Edition 4.0 2021-02
REDLINE VERSION
INTERNATIONAL
STANDARD
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inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 2-14: Tests – High optical power

IEC 61300-2-14:2021-02 RLV(en)

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IEC 61300-2-14 ®
Edition 4.0 2021-02
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and

measurement procedures –
Part 2-14: Tests – High optical power

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.180.20 ISBN 978-2-8322-9433-8

– 2 – IEC 61300-2-14:2021 RLV © IEC 2021
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 6
4 Apparatus . 6
4.1 Source (S) . 6
4.2 Optical detector (D) . 6
4.3 Environmental chamber . 7
4.4 Data acquisition system (DAS) . 7
4.5 Branching device (BD) . 7
4.6 Temporary joints (TJ) . 7
4.7 Safety devices . 7
4.8 Test set-up . 7
5 Procedure . 8
5.1 Preconditioning . 8
5.2 Initial examinations and measurements . 8
5.3 Conditioning . 8
5.4 Recovery . 9
5.5 Final examinations and measurements . 9
6 Severity . 9
6.1 General . 9
6.2 Optical power . 9
6.3 Wavelengths . 9
6.4 Temperature . 10
6.5 Humidity . 10
6.6 Exposure time . 10
7 Details to be specified . 10
Annex A (normative) Examples of test set-up . 11
A.1 WDM devices . 11
A.2 Input optical power from both ends . 11
A.3 Series connection set-up . 12
Annex B (informative) Examples of pass/fail criteria during exposure time . 14
B.1 General . 14
B.2 Attenuation limitation of monitoring . 14
B.3 Return loss limitation . 15
B.4 Judgment based on the change . 15
Bibliography . 16

Figure 1 – Typical optical power test set-up . 8
Figure A.1 – Example of optical power test set-up for a 2 x 1 WDM device . 11
Figure A.2 – Example of test set-up of both direction input test . 12
Figure A.3 – Example of optical power test set-up in series connection . 13

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 2-14: Tests – High optical power

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
This redline version of the official IEC Standard allows the user to identify the changes made to
the previous edition IEC 61300-2-14:2012. A vertical bar appears in the margin wherever a change
has been made. Additions are in green text, deletions are in strikethrough red text.

– 4 – IEC 61300-2-14:2021 RLV © IEC 2021
International Standard IEC 61300-2-14 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This fourth edition cancels and replaces the third edition published in 2012. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) harmonizing IEC 61300-1:2016 and IEC 61300-3-4:2012;
b) addition of abbreviated terms;
c) addition of Clause A.2 regarding input optical power from both ends.
The text of this International Standard is based on the following documents:
CDV Report on voting
86B/4299/CDV 86B/4362A/RVC
Full information on the voting for the approval of this International Standard can be found in the
report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61300 series, published under the general title Fibre optic
interconnecting devices and passive components – Basic test and measurement procedures,
can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 2-14: Tests – High optical power

1 Scope
This part of IEC 61300 describes a procedure for determining the suitability of a fibre optic
interconnecting device or a passive component to withstand the exposure to the optical power
which may occur occurs during its operation.
NOTE General information and guidance concerning relevant test and measurement procedures is contained in
IEC 61300-1.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60825-1, Safety of laser products – Part 1: Equipment classification and requirements
IEC 61300-1, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 1: General and guidance
IEC 61300-3-1, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 3-1: Examinations and measurements – Visual examination
IEC 61300-3-3, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 3-3: Examinations and measurements – Active monitoring of
changes in attenuation and return loss
IEC 61300-3-35, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 3-35: Examinations and measurements – Fibre optic connector
endface visual and automated inspection Visual inspection of fibre optic connectors and fibre-
stub transceivers
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
No terms and definitions are listed in this document.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp

– 6 – IEC 61300-2-14:2021 RLV © IEC 2021
3.2 Abbreviated terms
CWDM course wavelength division multiplexing
DAS data acquisition system
DUT device under test
DWDM dense wavelength division multiplexing
IL insertion loss
ISO optical isolator
LD laser diode
OSA optical spectrum analyzer
PDL polarization dependent loss
RL return loss
TLS tunable light source
WDL wavelength dependent loss
WDM wavelength division multiplexing
WWDM wide wavelength division multiplexing
4 Apparatus
4.1 Source (S)
The source unit consists of an optical emitter, the means to connect to it and the associated
drive electronics. A tunable light source (TLS) in which a specific output wavelength can be
tuned may be chosen as the optical emitter. A TLS may consist of a tunable LD and an optical
amplifier or a fibre ring laser in order to get an efficient power to test. Generally, the power and
stability requirements of the test will necessitate that the means to connect to the optical emitter
be has a fibre pigtail. It shall be have a stable in output power and wavelength/frequency over
the measurement period. For DWDM devices, the frequency uncertainty stability (instead of the
wavelength uncertainty stability) shall be less than half of the channel bandwidth. Unless
otherwise stated in the relevant specification, the source shall have the following
characteristics:
a) centre wavelength uncertainty including stability:
– nominal centre wavelength ±5 nm (for WWDM and CWDM devices);
b) centre frequency uncertainty stability:
– nominal centre frequency ±6,3 GHz (for DWDM devices of 25 GHz channel bandwidth);
– nominal centre frequency ±12,5 GHz (for DWDM devices of 50 GHz channel bandwidth);
– nominal centre frequency ±25 GHz (for DWDM devices of 100 GHz channel bandwidth);
c) output power uncertainty and stability:
– nominal output power ±0,05 dB.
4.2 Optical detector (D)
The optical detector unit is an optical power meter and consists of an optical detector, the
means to connect to it and the associated electronics. The detectors shall have sufficient
dynamic range to make the necessary measurements and shall be linear over the measurement
range. The detectors shall be stable over the measurement period and shall have an operational
wavelength range consistent with the DUT. The connection to the detectors shall be an adaptor
that accepts a connector plug of the appropriate design. The detectors shall be capable of
capturing all light emitted by the connector plug. Unless otherwise stated in the relevant
specification, the detectors shall have the following characteristics:
– linearity: ≤ ±0,1 dB;
– uncertainty including polarization dependency: ≤ ±0,05 dB;
– resolution: ≤ ±0,01 dB.
– maximum nonlinearity: ≤ ±0,1 dB;
– accuracy including polarization dependency: ≤ ±0,05 dB;
– resolution: ≤ 0,01 dB.
4.3 Environmental chamber
The test set-up shall include an environmental chamber capable of producing and maintaining
the specified temperature and/or humidity.
4.4 Data acquisition system (DAS)
Recording the optical power readings of the optical power readings at the optical detector may
be done either manually or automatically. An appropriate DAS shall be used where
measurements are performed automatically.
4.5 Branching device (BD)
The splitting ratio of the branching device shall be stable over the optical powers and
wavelengths chosen for the test. It shall also be insensitive to polarization. The branching
devices shall be stable during the test. The splitting ratio of 1:99 for branching devices is
recommended in order to input high power to the DUT and low power to the optical detector. A
splitting ratio of 1:99 is recommended for the branching device in order to input high power to
the DUT and low power to the optical detector.
4.6 Temporary joints (TJ)
These are typically used in connecting the device under test to the test apparatus. Generally,
For the test requirements of optical power and stability requirements of a test will necessitate
that, the temporary joints shall be fusion splices.
4.7 Safety devices
All necessary safety devices, including laser safety glasses, signs and other safety materials,
shall be provided in order to protect individuals from possible hazards during testing.
4.8 Test set-up
For two-port optical components, a typical layout for the test apparatus is shown in Figure 1.
This test procedure involves the use of optical powers which constitute a potential ocular and
skin hazard to test personnel. All necessary safety procedures shall be adopted in accordance
with IEC 60825-1. In particular, the DUT shall be unpowered (that is, with no power propagating
in the fibre) when conducting a visual examination.
Optical connectors shall not be used. Fusion splices shall be used for all connecting points as
described in 4.6.
– 8 – IEC 61300-2-14:2021 RLV © IEC 2021

Key
BD branching device
D detector
DAS data acquisition system
DUT device under test
S light source
TJ temporary joint
Figure 1 – Typical optical power test set-up
For multiport devices such as branching devices, all combinations of input and output ports
shall be tested, unless otherwise stated in the relevant specification.
For WDM devices, multi-wavelength multiple wavelengths shall be input at the same time
according to the application. Clause A.1 describes an example of the test set-up for WDM
devices.
To minimize test equipments, the DUTs can be connected as a series. To minimize test
equipment, the DUTs may be connected in series. Clause A.2 describes an example of the test
set-up for a series connection of series-connected DUTs.
5 Procedure
5.1 Preconditioning
The chosen test samples shall be representative of a standard product.
Prepare and clean the DUTs according to the manufacturer’s instructions. Visual examination
shall be undertaken in accordance with IEC 61300-3-1 and IEC 61300-3-35. Debris or the
presence of contamination is one of the primary causes of failure in high optical power
connector applications.
NOTE IEC TR 62627-01 describes fibre optic connector cleaning methods.
Precondition the DUTs for 2 h or more at the standard atmospheric conditions as defined in
IEC 61300-1, unless otherwise specified in the relevant specification.
5.2 Initial examinations and measurements
Complete Perform initial examinations and measurements on the DUTs as required by the
relevant specification. The results of the initial measurements shall be within the limits
established in the relevant specification.
5.3 Conditioning
a) Set the chamber and the DUT to the standard atmospheric conditions. Place the DUT in the
chamber in its normal operating position. The hook-ups of the DUT to the peripheral
equipment shall also be placed in their normal operating position, where required.

b) Adjust Set the chamber temperature and humidity to the specified severity severities (see
6.4 and 6.5). The rate of change of temperature shall not exceed 1 °C/min, averaged over
a maximum period of 5 min. Allow the DUT to reach the set stable temperature and maintain
the temperature for the exposure time.
c) Set the wavelength and optical power to be input to the DUT and turn on the optical source
and input optical power to the DUT.
d) Continue to input the optical power to the DUT for the exposure time specified in severity
(see 6.6). Monitor the changes in attenuation and return loss of the DUT according to
IEC 61300-3-3 during the exposure time. The changes shall be within the pass criteria
specified in the relevant specification (see Annexe B).
NOTE Optical power absorption within the DUT can cause its internal temperature to rise leading to a change
in attenuation. The duration of changing attenuation depends on the absorption rate and the thermal capacity of
the DUT. Examples of the high power test results are described in IEC TR 62627-03-02 and IEC TR 62627-03-
03.
e) At the completion of the exposure time, stop inputting the optical power and change the
temperature in the chamber to the standard atmospheric condition. Continue to maintain the
DUT in the chamber while the temperature is gradually changed.
5.4 Recovery
Allow the DUT to remain under the standard atmospheric condition for 2 h or more, as defined
in IEC 61300-1, unless otherwise specified in the relevant specification.
5.5 Final examinations and measurements
On completion of the test, remove all fixtures and make final examinations and measurements
on the DUT, as required by the relevant specification, to ensure that there is no permanent
damage to the DUT. Clean the DUT according to the manufacturer’s instructions. The results
of the final measurement shall be within the limit established in the relevant specification.
Unless otherwise specified in the relevant specification, visually examine the DUT in
accordance with IEC 61300-3-1. Check for evidence of any degradation in the DUT. This may
These include, for example:
a) broken, loose or damaged parts or accessories;
b) breaking or damage to the cable jacket, seals, strain relief or fibres;
c) displaced, bent, or broken parts.
6 Severity
6.1 General
Severity is a combination of an optical power, a wavelength, a temperature, humidity and an
exposure time. The severity shall be specified in the relevant specification.
NOTE IEC TR 62627-03-04 gives guidelines for high optical power testing.
6.2 Optical power
The optical power of the test shall be decided in consideration of the application, unless
otherwise stated in the relevant specification. The following optical powers are examples The
recommended power levels for testing are:
10 mW, 30 mW, 50 mW, 100 mW, 300 mW and 500 mW.
6.3 Wavelengths
The test wavelength shall be the centre or typical wavelength of all operating wavelength ranges
specified in the relevant specification. The following wavelengths are examples The
recommended wavelengths for testing are:

– 10 – IEC 61300-2-14:2021 RLV © IEC 2021
980 nm, 1 310 nm, 1 490 nm, 1 510 nm, 1 550 nm, 1 580 nm, 1 610 nm, 1 625 nm and
1 650 nm.
For WDM devices, the combinations of multi-wavelengths which are input at the same time shall
be decided in consideration of the application, unless otherwise stated in the relevant
specification.
6.4 Temperature
Unless otherwise stated in the relevant specification, the test temperature shall be the maximum
temperature of the operating temperature range specified in the relevant specification.
6.5 Humidity
Unless otherwise stated in the relevant specification, the test humidity shall be controlled at the
maximum humidity of the operating humidity range specified in the relevant specification.
In case the DUT is hermetically seal-packaged, the test humidity does not need to be controlled.
6.6 Exposure time
The test exposure time shall be decided in consideration of the thermal capacity of the DUT.
For a small component whose weight is approximately less than 0,1 kg, a test exposure time of
30 min is recommended.
7 Details to be specified
The following details, as applicable, shall be specified in the relevant specification:
a) optical power;
b) wavelengths;
c) temperature;
d) humidity;
e) exposure time;
f) initial examinations, initial measurements and initial performance requirements;
g) examinations during test, measurements during test and performance requirements during
test;
h) final examinations, final measurements and final performance requirements;
i) deviations from test procedure;
j) additional pass/fail criteria;
k) number of ports and combinations of input and output ports;
l) combinations of multi-multiple wavelengths which are input at the same time for WDM
devices.
A.1 WDM devices
For WDM devices, multi-wavelength shall be multiple wavelengths are input at the same time
according to the application. For two inputs/one output WDM components, an example layout
for the test apparatus is shown in Figure A.1.
The optical power of the first wavelength is input from the source S1. In addition, the optical
power of the second wavelength is input from the source S2 at the same time. The optical power
ratio of the first wavelength and second wavelength shall be stated in the relevant specification,
based on the application. In Figure A.1, the attenuation changes for the first wavelength and
second wavelength are monitored at the wavelength tunable optical detector D1, respectively.
For the tunable optical detector D1, an OSA (optical spectrum analyzer), or a combination of a
tunable filter and an optical power meter, is recommended.

Key
BD branching device
D detector
DAS data acquisition system
DUT device under test
S light source
TJ temporary joint
Figure A.1 – Example of optical power test set-up for a 2 x 1 WDM device
A.2 Input optical power from both ends
When optical power input into both ends of the DUT is required, two light sources, two branching
devices and two detectors shall be used (see Figure A.2). To prevent optical power fluctuation,
it is recommended that optical isolators be used with each light source.
It is difficult to monitor the optical output power during the test. Therefore, the optical
performance, such as insertion loss (attenuation), return loss and isolation, shall be measured
before the test.
– 12 – IEC 61300-2-14:2021 RLV © IEC 2021
During the test, any input power changes of the light sources S1 and S2 are monitored by
detectors D1 and D2, respectively.
After the test, the DUT’s optical performance shall be measured. The performance changes
shall be calculated.
Key
BD branching device
D detector
DUT device under test
ISO optical isolator
S light source
T termination
Figure A.2 – Example of test set-up of both direction input test
A.3 Series connection set-up
To minimize test equipments, the DUT can be connected as a series. To minimize test
equipment, DUTs may be connected in series. To test three DUTs simultaneously, an example
layout for the test apparatus is shown in Figure A.3.
In this set-up, the optical power input to the last DUT, for example DUT3 in Figure A.3, shall be
equal or higher than the optical power specified in the relevant specification.

Key
BD branching device
D detector
DAS data acqusition system
DUT device under test
S light source
TJ temporary joint
Figure A.3 – Example of optical power test set-up in series connection

– 14 – IEC 61300-2-14:2021 RLV © IEC 2021
Annex B
(informative)
Examples of pass/fail criteria during exposure time
B.1 General
During the exposure time of the optical power, only the changes in attenuation and return loss
can be measured according to IEC 61300-3-3. It shall be noted that polarization dependent loss
(PDL) and wavelength dependent loss (WDL) are difficult to monitor and the measurement
uncertainty might be larger than the initial and final measurements according to IEC 61300-3-4
or some other standards in the IEC 61300 series.
During the exposure time of the optical power, only the changes in attenuation and return loss
can be measured according to IEC 61300-3-3. It is noted that the polarization dependent loss
(PDL) and the wavelength dependent loss (WDL) can affect the measurement uncertainty of
insertion loss (IL) change and the return loss (RL) change during the test, and PDL and WDL
are difficult to monitor during the test.
Therefore, the measurement uncertainties of the IL change and RL change during the test can
be larger than those of the differences of those measured before and after the test according
to IEC 61300-3-4 or some other standards in the IEC 61300 series.
B.2 Attenuation limitation of monitoring
The pass/fail criteria for attenuation limitation during the exposure shall should include a
consideration of uncertainties caused by PDL, WDL and the measurement system itself, in order
to prevent the misclassification of a DUT within the limitation being misjudged as a failure DUT.
This attenuation limitation of monitoring could pass over some DUTs, with slightly high
attenuation, from being classified as failure; however, some of those DUTs could be marked as
a failure in the final measurement.
An example of attenuation limitation of monitoring A (dB) is:
limit,mon
A = A + A + A + A
limit,mon limit,offline PDL WDL error
A = A + A + A + A
limit,mon limit,offline PDL WDL uncer
where
A is the original attenuation limitation of offline measurement for initial and final
limit,offline
measurement (dB);
A is the PDL of the DUT or a constant specified in the relevant specification (dB);
PDL
A is the WDL of the DUT or a constant specified in the relevant specification (dB);
WDL
A is the value based on the measurement uncertainty of the system including light
uncer
source stability, detector uncertainty including nonlinearity, accuracy,
polarization dependency and resolution, and losses of temporary joints (dB).
A is the value based on the measurement error of the system including light source
error
stability, detector uncertainty and losses of temporary joints (dB).

During monitoring, the change of attenuation ∆A (dB) should be is within the following formula:
∆A(t) ≤ A – A
limit,offline 0,ini
where
A is the attenuation of the DUT measured in the initial measurement according to
0,ini
IEC 61300-3-4;
∆A(t) is the change of attenuation calculated from the measured optical power change
as ∆A(t) = P(t) – P(t = 0);
P(t = 0) is the measured output optical power at the first measurement of monitoring;
P(t) is the measured output optical power at the time of t.
B.3 Return loss limitation
The pass/fail criteria for return loss during the exposure could be specified by a similar method.
Sometimes, the measurement system used for high optical power is not suitable for the
measurement of very high return loss limitation specified for initial and final measurement. In
such a case, another pass/fail criterion shall should be adopted. An example is described in
Clause B.4.
B.4 Judgment based on the change
These examples of pass/fail criteria could be adopted as additional or alternative requirements
for Clause B.1 and Clause B.2. During monitoring, the change of attenuation ∆A (dB) and the
change of return loss ∆RL (dB) shall should be within the following requirements
recommendations:
– for a component with an initial insertion loss of less than 1,0 dB, ∆A ≤ 0,3 dB;
– for a component with an initial insertion loss of less than 2,0 dB, ∆A ≤ 0,5 dB;
– for a component with an initial insertion loss of 2,0 dB or more, and less than 10,0 dB,
∆A ≤ 1,0 dB;
– for a component with an initial insertion loss of 10,0 dB or more, ∆A ≤ 2,0 dB;
– | ∆RL | ≤ 10,0 dB.
where the initial insertion loss is measured in the initial measurement.

– 16 – IEC 61300-2-14:2021 RLV © IEC 2021
Bibliography
IEC 61300 (all parts), Fibre optic interconnecting devices and passive components
IEC 61300-3-4:2012, Fibre optic interconnecting devices and passive components – Basic test
and measurement procedures – Part 3‑4: Examinations and measurements – Attenuation
IEC 62005-9-4, Fibre optic interconnecting devices and passive components – Reliability –
Part 9-4: High power qualification of passive optical components for environmental category C
IEC TR 62627-01, Fibre optic interconnecting devices and passive components – Part 01: Fibre
optic connector cleaning methods
IEC TR 62627-03-02, Fiber optic interconnecting devices and passive components – Part 03-02:
Reliability – Report of high power transmission test of specified passive optical components
IEC TR 62627-03-03, Fibre optic interconnecting devices and passive components – Part 03-03:
Reliability – Report on high-power reliability for metal-doped optical fibre plug-style optical
attenuators
IEC TR 62627-03-04, Fibre optic interconnecting devices and passive components – Part 03-04:
Reliability – Guideline for high power reliability of passive optical components

___________
IEC 61300-2-14 ®
Edition 4.0 2021-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures –
Part 2-14: Tests – High optical power

Dispositifs d'interconnexion et composants passifs fibroniques – Procédures
fondamentales d'essais et de mesures –
Partie 2-14: Essais – Puissance optique élevée

– 2 – IEC 61300-2-14:2021 © IEC 2021
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 5
4 Apparatus . 6
4.1 Source (S) . 6
4.2 Optical detector (D) . 6
4.3 Environmental chamber . 7
4.4 Data acquisition system (DAS) . 7
4.5 Branching device (BD) . 7
4.6 Temporary joints (TJ) . 7
4.7 Safety devices . 7
4.8 Test set-up . 7
5 Procedure . 8
5.1 Preconditioning . 8
5.2 Initial examinations and measurements . 8
5.3 Conditioning . 8
5.4 Recovery . 8
5.5 Final examinations and measurements . 9
6 Severity . 9
6.1 General . 9
6.2 Optical power . 9
6.3 Wavelengths . 9
6.4 Temperature . 9
6.5 Humidity . 9
6.6 Exposure time . 9
7 Details to be specified . 10
Annex A (normative) Examples of test set-up . 11
A.1 WDM devices . 11
A.2 Input optical power from both ends . 11
A.3 Series connection set-up . 12
Annex B (informative) Examples of pass/fail criteria during exposure time . 14
B.1 General . 14
B.2 Attenuation limitation of monitoring . 14
B.3 Return loss limitation . 15
B.4 Judgment based on the change . 15
Bibliography . 16

Figure 1 – Typical optical power test set-up . 7
Figure A.1 – Example of optical power test set-up for a 2 x 1 WDM device . 11
Figure A.2 – Example of test set-up of both direction input test . 12
Figure A.3 – Example of optical power test set-up in series connection . 13

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –

Part 2-14: Tests – High optical power

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
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Standardization (ISO) in accordance with conditions determined by agreement between the two orga
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