IEC TS 62433-1:2011

IEC/TS 62433-1 ®
Edition 1.0 2011-04
TECHNICAL
SPECIFICATION
SPÉCIFICATION
TECHNIQUE
EMC IC modelling –
Part 1: General modelling framework

Modèles de circuits intégrés pour la CEM –
Partie 1: Cadre de modèle général

IEC/TS 62433-1:2011
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IEC/TS 62433-1 ®
Edition 1.0 2011-04
TECHNICAL
SPECIFICATION
SPÉCIFICATION
TECHNIQUE
EMC IC modelling –
Part 1: General modelling framework

Modèles de circuits intégrés pour la CEM –
Partie 1: Cadre de modèle général

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX L
ICS 31.200 ISBN 978-2-88912-473-2

– 2 – TS 62433-1  IEC:2011
CONTENTS
1 Scope . 6

2 Normative references . 6

3 Terms and definitions . 6

4 Definition of models . 7

4.1 General . 7

4.2 Conducted emission model . 7

4.3 Radiated emission model . 7

4.4 Conducted immunity model . 7
4.5 Radiated immunity model . 8
5 Modelling approaches. 8
5.1 General . 8
5.2 Black box modelling approach . 8
5.3 Equivalent circuit modelling approach . 9
5.4 Other modelling approaches . 9
5.4.1 Electromagnetic modelling approach . 9
5.4.2 Statistical modelling approach . 9
6 Requirements of model description . 9
Annex A (normative) Requirements for EMC IC models . 11

Table A.1 − Requirements for model description . 11

TS 62433-1  IEC:2011 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
EMC IC MODELLING –
Part 1: General modelling framework

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
The main task of IEC technical committees is to prepare International Standards. In

exceptional circumstances, a technical committee may propose the publication of a technical
specification when
• the required support cannot be obtained for the publication of an International Standard,
despite repeated efforts, or
• the subject is still under technical development or where, for any other reason, there is the
future but no immediate possibility of an agreement on an International Standard.
Technical specifications are subject to review within three years of publication to decide
whether they can be transformed into International Standards.
IEC 62433-1, which is a technical specification, has been prepared by subcommittee 47A:
Integrated circuits, of IEC technical committee 47: Semiconductor devices.

– 4 – TS 62433-1  IEC:2011
The text of this specification is based on the following documents:

Enquiry draft Report on voting

47A/840/DTS 47A/850A/RVC
Full information on the voting for the approval of this technical specification can be found in

the report on voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of the IEC 62433 series, under the general title EMC IC modelling, can be
found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• transformed into an International standard,
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
TS 62433-1  IEC:2011 – 5 –
INTRODUCTION
The International Standards of IEC 62433 series provide specifications for EMC IC modelling.

EMC IC model is the model of integrated circuits for electro-magnetic compatibility.

IC models that are built in conformity with these International Standards can be applied to

simulations for EMC and/or evaluations of EMI (electro-magnetic interference) as well as EMS

(electro-magnetic susceptibility) of electronic systems.

– 6 – TS 62433-1  IEC:2011
EMC IC MODELLING –
Part 1: General modelling framework

1 Scope
This part of the IEC 62433 series provides specifications for model-categories of EMC IC

modelling, definitions of terms that are commonly used in IEC 62433 series, modelling
approaches that can be used, and requirements for each modelling that is standardized in this
series.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-131, International Electrotechnical Vocabulary (IEV) – Chapter 131: Circuit theory
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-131,
IEC 60050-161 and the following apply.
3.1
reference node
node of a network where the voltages of other nodes, which belong to the network, are
determined by reference to the node
NOTE In many cases the voltage of the reference node is set as zero for descriptiv
...