IEC 61000-4-24:2015/AMD1:2023

IEC 61000-4-24 ®
Edition 2.0 2023-08
INTERNATIONAL
STANDARD
colour
inside
AMENDMENT 1
Electromagnetic compatibility (EMC) –
Part 4-24: Testing and measurement techniques – Test methods for protective
devices for HEMP conducted disturbance
IEC 61000-4-24:2015-11/AMD1:2023-08(en)

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IEC 61000-4-24 ®
Edition 2.0 2023-08
INTERNATIONAL
STANDARD
colour
inside
AMENDMENT 1
Electromagnetic compatibility (EMC) –

Part 4-24: Testing and measurement techniques – Test methods for protective

devices for HEMP conducted disturbance

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.01  ISBN 978-2-8322-7395-1

– 2 – IEC 61000-4-24:2015/AMD1:2023
© IEC 2023
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-24: Testing and measurement techniques – Test methods
for protective devices for HEMP conducted disturbance

AMENDMENT 1
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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Amendment 1 to IEC 61000-4-24:2015 has been prepared by subcommittee 77C: High power
transient phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this Amendment is based on the following documents:
Draft Report on voting
77C/330/FDIS 77C/331/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Amendment is English.

© IEC 2023
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
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• reconfirmed,
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• amended.
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___________
– 4 – IEC 61000-4-24:2015/AMD1:2023
© IEC 2023
2 Normative references
Replace the reference with the following new reference:
IEC 61000-2-10:2021, Electromagnetic compatibility (EMC) – Part 2-10: Environment –
Description of HEMP environment – Conducted disturbance
3 Terms, definitions and abbreviated terms
Replace the definition of 3.1.2 with the following new definition:
3.1.2
gas discharge tube
GDT
device with two or three metal electrodes hermetically sealed so that gas mixture and pressure
are under control and designed to protect apparatus or personnel from high transient voltages

Add, after Clause 5, the following new Clause 6:
6 Measurement method of HEMP protectors for RF antenna ports
6.1 General
For the early-time HEMP, the high-amplitude electric field couples efficiently to antennas which
are used within the frequency spectrum of HEMP. The HEMP coupling into the antenna is called
front-door coupling. The antenna coupling mechanism is extremely variable and dependent on
the details of the antenna design. The near worst-case peak response of a vertical electric
monopole to the HEMP early-time waveform is considered for the test level for RF antenna
ports. The waveforms for the conducted environments at antenna ports are damped sinusoids
with a frequency approximately equal to the designed dominant response frequency f of the
c
antenna.
6.2 Test level and injection waveform specification
Table 7 – Pulsed current injection test level for RF antenna ports
Type of Dominant Peak current Injection Rise time FWHM
a
Injection response waveform
injection test
frequency
level, A
f , MHz
ns ns
c
b
Double
≤ 30 1 200 Refer to Table 1 Refer to Table 1
exponential
Inner
conductor to
outer shield c
30 < f ≤ 1 000 36 000/f , in MHz
Damped sinusoidal
c c
± 2
± 20
a
The test level in the current is measured with the condition of short-circuit of the output of the generator.
b
Double exponential waveform of conducted early-time HEMP shown in Table 1.
c
Above 1 GHz, the HEMP requirement is under consideration.

The early-time HEMP double exponential waveform shall be used for antenna port testing at a
dominant response frequency ≤ 30 MHz. The double exponential generator is used because
most of the energy content of early time HEMP is below 30 MHz. The double exponential
generator specified in Table 1 is needed to reach the peak test level.

© IEC 2023
A damped sinusoidal waveform shall be used for antenna port testing when its dominant
response frequency is 30 MHz ≤ f ≤ 1 000 MHz. A recommended waveform is provided in
IEC 61000-2-10:2021, Annex E. If the required current injection level exceeds the damped
sinusoidal pulse generator capability, an early-time HEMP double exponential waveform shall
be used.
If the output voltage of a damped sinusoidal pulse generator is measured instead of short-circuit
current, the test level voltage shall be determined by multiplying the required current test level,
specified in Table 7, with the antenna load impedance (usually 50 Ω).
6.3 Verification of test level
The configuration for test level verification is shown in Figure 9.

(a) Configuration of verification for short-circuit current test level

(b) Configuration of verification for test level in voltage
Figure 9 – Typical verification setup
Parasitic coupling between the pulse generator and the oscilloscope shall be avoided. It is
recommended to use cables with multiple braided wire shields or solid shields. The cable and
connectors shall be capable of withstanding the high voltage pulse without a breakdown. The
shorting connection shall be as short as possible.
Perform the verification of the test level with 10 %, 25 %, 50 % and 100 % of the maximum test
current and record the verified levels, the charging voltage and settings of the pulse generator
required to achieve these test levels.
6.4 Measurement procedure
The measurement setup is shown in Figure 10.

– 6 – IEC 61000-4-24:2015/AMD1:2023
© IEC 2023
(a) Setup for current measurement at DUT output with a 50 Ω resistive load (R )
L
(b) Setup for voltage measurement at DUT output
Figure 10 – Typical measurement setup
The measurement procedures shall be as follows:
a) Set up the DUT and measurement instruments as shown in Figure 10.
b) Inject a pulse three times into the DUT with the generator charging voltages verified in 6.3.
c) Record the measurement results of the DUT output waveform. Either the current waveform
or voltage waveform shall be measured.
d) Compare the results to the performance criteria (see 6.5).
6.5 Evaluation of test results
The pass/fail results shall be classified in terms of the peak current or voltage at the output of
a HEMP protector for an RF antenna. The required performance criteria are given in Table 8
for the early-time HEMP test.
Table 8 – Performance criteria of filters against early-time HEMP – RF antenna ports
Peak residual norms
RF antenna port mode
I , A U , V
Load Load
For receive only systems < 0,5 I × R
Load L
The test shall be performed to ensure that the DUT is not damaged during the test. This shall
be checked by ensuring that the DUT operates normally after the test.
In general, the manufacturer of the DUT shall specify the peak residual voltage and the residual
energy into the nominal load. These values have to be compared with the immunity levels of
the device to be protected (receiver, transmitter, antenna matching unit etc). Refer to Annex C.

© IEC 2023
6.6 Test report
For each step in the testing sequence, the following parameters should be included in the test
report:
a) waveform, peak current and source impedance of verified pulses;
b) test mode;
c) test load resistance;
d) peak current or voltage of residual pulses;
e) measured waveforms of residual pulses;
f) comparison of results with immunity levels of equipment to be protected;
g) performance of additional tests with equipment to be protected as a load to verify proper
protection.
– 8 – IEC 61000-4-24:2015/AMD1:2023
© IEC 2023
Add the following new Annex C:
...