Q3 interface at the Local Exchange (LE) for line and circuit testing of analogue and Integrated Services Digital Network (ISDN) subscriber lines; Part 1: Q3 interface specification

REN/SPS-03030-1c

Vmesnik Q3 pri krajevni centrali za preskušanje linij in vezij analognih in ISDN naročniških priključkov - 1. del: Specifikacija za vmesnik Q3

General Information

Status
Published
Publication Date
27-Oct-1998
Technical Committee
Current Stage
12 - Completion
Due Date
27-Oct-1998
Completion Date
28-Oct-1998
Standard
P EN 301 006-1:1999
English language
62 pages
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Standards Content (Sample)


SLOVENSKI STANDARD
3SIST EN 301 006-1:
01-jXOLM-
9PHVQLN4SULNUDMHYQLFHQWUDOL]DSUHVNXãDQMHOLQLMLQYH]LMDQDORJQLKLQ,6'1
QDURþQLãNLKSULNOMXþNRYGHO6SHFLILNDFLMD]DYPHVQLN4
Q3 interface at the Local Exchange (LE) for line and circuit testing of analogue and
Integrated Services Digital Network (ISDN) subscriber lines; Part 1: Q3 interface
specification
Ta slovenski standard je istoveten z: EN 301 006-1 V1.2.3
ICS:
33.080 Digitalno omrežje z Integrated Services Digital
integriranimi storitvami Network (ISDN)
(ISDN)
3SIST EN 301 006-1: en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EN 301 006-1 V1.2.3 (1998-10)
European Standard (Telecommunications series)
Q3 interface at the Local Exchange (LE)
for line and circuit testing of analogue
and Integrated Services Digital network (ISDN)
subscriber lines;
Part 1: Q3 interface specification

2 EN 301 006-1 V1.2.3 (1998-10)
Reference
REN/SPS-03030-1c (9bc90iq0.PDF)
Keywords
TMN, information model, Q3 interface, LE, fault,
testing, management, PSTN, ISDN
ETSI
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Internet
secretariat@etsi.fr
http://www.etsi.org
Copyright Notification
No part may be reproduced except as authorized by written permission.
The copyright and the foregoing restriction extend to reproduction in all media.
© European Telecommunications Standards Institute 1998.
All rights reserved.
ETSI
3 EN 301 006-1 V1.2.3 (1998-10)
Contents
Intellectual Property Rights.7
Foreword .7
Introduction .7
1 Scope.9
2 References.9
3 Definitions and abbreviations .10
3.1 Definitions . 10
3.2 Abbreviations. 11
4 Information model diagrams .12
4.1 Entity relationship diagram. 12
4.1.1 Line testing and line circuit testing. 13
4.1.2 The testResultNotifications of the tests . 13
4.2 Inheritance hierarchy . 14
4.3 Naming hierarchy. 14
5 Information model description.15
5.1 Description of object classes. 15
5.1.1 Access port fragment. 15
5.1.2 Support fragment. 15
5.1.2.1 Event report management . 15
5.1.2.2 Log control function . 15
5.1.3 Test fragment . 16
5.1.3.1 Access test (accessTest). 16
5.1.3.2 Dialled digit test (dialledDigitTest) . 16
5.1.3.3 Dial tone test (dialToneTest) . 16
5.1.3.4 Electrical measurement test (electricalMeasurementTest). 17
5.1.3.5 Subscriber Private Meter (SPM) pulses (spmPulses) . 17
5.1.3.6 Cable pair identification tone (cablePairIdTone). 17
5.1.3.7 Ringing (ringing) . 17
5.1.3.8 Test to line circuit (testToLineCircuit) . 17
5.1.3.9 Dry Loop (dryLoop) . 17
5.1.3.10 Loop test (loopTest) . 18
5.1.3.11 Pattern test (patternTest). 18
5.1.3.12 Voice access test (voiceAccessTest). 18
5.1.3.13 Metallic test access (metallicTestAccess). 19
5.1.3.14 Test threshold class administration (testThresholdClass) . 19
5.1.3.15 ISDN quick test (isdnQuickTest). 20
5.2 Definition of attributes. 20
5.2.1 Relative distinguished name. 20
5.2.2 State attributes. 20
5.2.2.1 Operational state (operationalState) . 20
5.2.2.2 Administrative state (administrativeState). 21
5.2.2.3 Availability status (availabilityStatus) . 21
5.2.3 Relationship attributes. 21
5.3 Actions description . 21
5.4 Notifications description. 21
6 Formal object class definitions .22
6.1 Definitions of object classes . 22
6.1.1 Access port fragment. 22
6.1.2 Support fragment. 22
6.1.3 Test fragment . 22
6.1.3.1 ISDN quick test . 23
6.1.3.2 Metallic test access . 23
ETSI
4 EN 301 006-1 V1.2.3 (1998-10)
6.1.3.3 Test threshold class. 24
6.2 Name bindings . 24
6.2.1 Test fragment . 24
6.2.1.1 ISDN quick test . 24
6.2.1.2 Metallic test access . 24
6.2.1.3 Test threshold class. 24
6.3 Definition of packages . 25
6.3.1 Metallic test access line package. 25
6.4 Definition of attributes. 25
6.4.1 AC voltage threshold. 25
6.4.2 Capacitance threshold . 25
6.4.3 DC voltage threshold. 25
6.4.4 Dial speed threshold. 25
6.4.5 ISDN quick test. 26
6.4.6 Metallic test access message . 26
6.4.7 Metallic test access timeout period. 26
6.4.8 Proposed metallic test access . 27
6.4.9 Pulse no pulse ratio . 27
6.4.10 Resistance threshold. 27
6.4.11 Test threshold class ID . 27
6.4.12 Type of line . 27
6.5 Definition of actions . 27
6.6 Definition of notifications. 27
6.7 Definition of parameters . 27
6.8 ASN.1 defined types module . 29
7 Protocol requirements .31
Annex A (normative): Requirements and specification of parameters for access port tests.32
A.1 General test requirements .32
A.1.1 Scheduled testing . 32
A.1.2 Test capability. 32
A.2 Access port test requirements .32
A.2.1 Access port test management functions . 32
A.2.2 Test scheduling . 33
A.2.3 Test result management . 33
A.2.4 Test threshold management. 34
A.2.5 Test requirements description . 34
A.2.5.1 PSTN line testing . 34
A.2.5.1.1 Foreign voltage or current . 34
A.2.5.1.2 Capacitance measurement. 34
A.2.5.1.3 Insulation resistance measurement. 34
A.2.5.1.4 Loop resistance measurement. 35
A.2.5.1.5 Dial pulse test . 35
A.2.5.1.6 DTMF dialling test . 35
A.2.5.1.7 Subscriber private meter testing . 35
A.2.5.1.8 Ring subscriber. 35
A.2.5.1.9 Monitoring of the line. 35
A.2.5.1.10 Cable pair identification tone. 35
A.2.5.1.11 Dry loop. 35
A.2.5.1.12 Register recall button test . 36
A.2.5.1.13 Ring back procedure. 36
A.2.5.2 PSTN inward tests. 36
A.2.5.2.1 Line circuit testing . 36
A.2.5.2.1.1 Feeding voltage. 36
A.2.5.2.1.2 Feeding current . 36
A.2.5.2.1.3 Loop and ring trip detection. 36
A.2.5.2.1.4 Ringing current sending . 36
A.2.5.2.1.5 Private meter pulses . 36
A.2.5.2.1.6 Codec testing. 37
ETSI
5 EN 301 006-1 V1.2.3 (1998-10)
A.2.5.2.1.7 Digit reception . 37
A.2.5.2.2 Other inward tests. 37
A.2.5.2.2.1 Dial tone test . 37
A.2.5.3 ISDN BA testing . 37
A.2.5.3.1 ISDN BA line testing. 37
A.2.5.3.2 ISDN BA line termination testing. 37
A.2.5.3.2.1 Loopbacks. 37
A.2.5.3.2.2 Activation and deactivation of lines. 38
A.2.5.3.3 ISDN BA line circuit testing. 38
A.2.5.3.3.1 Power feed . 38
A.2.5.4 ISDN PRA testing . 38
A.2.5.4.1 ISDN PRA line testing. 38
A.2.5.4.2 ISDN PRA line termination testing . 38
A.2.5.5 ISDN BA and PRA quick tests. 38
A.2.5.6 Connection of external test systems . 38
Annex B (normative): Test categories.39
B.1 Electrical measurement tests.39
B.2 Dialled digit test.40
B.3 Dial tone test .41
B.4 Subscriber private meter pulses test.42
B.5 Ringing test .42
B.6 Test to line circuit .43
B.7 ISDN loopback test .44
B.8 ISDN quick test.45
Annex C (normative): Test termination.47
C.1 Termination of uncontrolled tests .47
C.2 Termination of controlled tests .47
Annex D (normative): Test result notification .49
Annex E (normative): Additional requirements on the test action performer.50
E.1 Indication of supported tests .50
E.2 Indication of unsuccessful test requests.50
Annex F (informative): Task Information Base (TIB) .51
F.1 Description of the service .51
F.2 Components of service (TIB A).51
F.3 Management function list (TIB B).52
Annex G (informative): Description of management functions .53
G.1 Model for the test function.53
G.1.1 Environment. 53
G.1.2 Uncontrolled tests . 53
G.1.3 Controlled tests . 54
G.2 Functional model.55
G.2.1 Test initiation. 55
G.2.2 Test scheduling . 55
G.2.3 Reporting of test results . 56
G.2.4 Test suspension and resumption. 57
ETSI
6 EN 301 006-1 V1.2.3 (1998-10)
G.2.5 Test termination . 57
Annex H (informative): Message flows.58
Annex J (informative): Bibliography.61
History.62
ETSI
7 EN 301 006-1 V1.2.3 (1998-10)
Intellectual Property Rights
IPRs essential or potentially essential to the present document may have been declared to ETSI. The information
pertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be found
in SR 000 314: "Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in respect
of ETSI standards", which is available free of charge from the ETSI Secretariat. Latest updates are available on the
ETSI Web server (http://www.etsi.org/ipr).
Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guarantee
can be given as to the existence of other IPRs not referenced in SR 000 314 (or the updates on the ETSI Web server)
which are, or may be, or may become, essential to the present document.
Foreword
This European Standard (Telecommunications series) has been produced by ETSI Technical Committee Signalling
Protocols and Switching (SPS).
The present document is part 1 of a multi-part document covering the Q3 interface at the Local Exchange (LE) for line
and circuit testing of analogue and ISDN subscriber lines, as identified below:
Part 1: "Q3 interface specification";
NOTE: The production of other parts is for further study.
Proposed national transposition dates
Date of adoption of this EN: 7 August 1998
Date of latest announcement of this EN (doa): 30 November 1998
Date of latest publication of new National Standard
or endorsement of this EN (dop/e): 31 May 1999
Date of withdrawal of any conflicting National Standard (dow): 31 May 1999
Introduction
Line and circuit testing of analogue and ISDN lines is part of a management activity which is performed by the operator
in order to detect failure conditions and to bring the customer access back to its normal state of operation whenever a
deviation occurs.
A customer access is considered as being that part of the local network which extends from the network termination
equipment up to and including the exchange termination.
Here, only these parts of the activity are covered which are related directly to that part of the customer access which
extends from the LE to the network termination equipment. An ISDN access extends to but does not include the
T reference point. An analogue access extends to and may include the Customer Premise Equipment (CPE)
(see figure 1).
ETSI
8 EN 301 006-1 V1.2.3 (1998-10)
Q(LE)
Z
LE
PSTN PSTN
TE UP
T
ISDN
ISDN
NT1
TE
UP
T
ISDN
ISDN
TE
UP
NOTE: Shaded areas are subject to line and circuit testing. User ports represent the different configurations for
Line Circuit (LC), Line Termination (LT), Exchange Termination (ET) and Network Termination (NT). The
option of ISDN access without remote NT1 is valid for ISDN BA only.
Figure 1: Scope of line and circuit testing
The present document details only those functions and management information model components which are required
for line and circuit testing. However, the use of other components which may be applicable from other specifications is
not precluded. In this case, combined applications incorporating line and circuit test specific and more generic aspects
would result.
ETSI
9 EN 301 006-1 V1.2.3 (1998-10)
1 Scope
The present document specifies the Q3 interface between an Local Exchange (LE) and the Telecommunications
Management Network (TMN) for the support of line and circuit test functions for analogue and ISDN lines which are
connected directly to a LE.
The focus of the present document is on defining an object model based on the existing standards ETS 300 378-1 [3]
and ITU-T Recommendation X.745 [20]. The add-ons, modifications and restrictions to these standards are specified
which are necessary to adapt the object model to a LE. Existing protocols are used where possible. The definition of
Operations System (OS) functionality is outside the scope of the present document.
2 References
The following documents contain provisions which, through reference in this text, constitute provisions of the present
document.
• References are either specific (identified by date of publication, edition number, version number, etc.) or
non-specific.
• For a specific reference, subsequent revisions do not apply.
• For a non-specific reference, subsequent revisions do apply.
• A non-specific reference to an ETS shall also be taken to refer to later versions published as an EN with the same
number.
[1] I-ETS 300 291 (1995): "Network Aspects (NA); Functional specification of Customer
Administration (CA) on the Operations System/Network Element (OS/NE) interface".
[2] ETS 300 324-1: "Signalling Protocols and Switching (SPS); V interfaces at the digital Local
Exchange (LE); V5.1 interface for the support of Access Network (AN); Part 1: V5.1 interface
specification".
[3] ETS 300 378-1 (1995): "Signalling Protocols and Switching (SPS); Q3 interface at the Access
Network (AN) for fault and performance management of V5 interfaces and associated customer
profiles; Part 1: Q3 interface specification".
[4] CCITT Recommendation M.3010 (1992): "Principles for a telecommunications management
network".
[5] CCITT Recommendation M.3100 (1992): "Generic network information model".
[6] ITU-T Recommendation M.3603: "Application of maintenance principles to ISDN basic rate
access".
[7] ITU-T Recommendation M.3604: "Application of maintenance principles to ISDN primary rate
access".
[8] ITU-T Recommendation Q.543 (1993): "Digital exchange performance design objectives".
[9] ITU-T Recommendation Q.811 (1993): "Lower layer protocol profiles for the Q3 interface".
[10] ITU-T Recommendation Q.812 (1993): "Upper layer protocol profiles for the Q3 interface".
[11] CCITT Recommendation X.208 (1988): "Specification of Abstract Syntax Notation One
(ASN.1)".
[12] CCITT Recommendation X.720 | ISO/IEC 10165-1: "Information technology - Open systems
interconnection - Structure of management information: Management information model".
[13] CCITT Recommendation X.721 | ISO/IEC 10165-2: "Information technology - Open systems
interconnection - Structure of management information: Definition of management information".
ETSI
10 EN 301 006-1 V1.2.3 (1998-10)
[14] CCITT Recommendation X.730 | ISO/IEC 10164-1: "Information technology - Open systems
interconnection - Systems management: Object management function".
[15] CCITT Recommendation X.731 | ISO/IEC 10164-2: "Information technology - Open systems
interconnection - Systems management: State management function".
[16] CCITT Recommendation X.732 | ISO/IEC 10164-3: "Information technology - Open systems
interconnection - Systems management: Attributes for representing relationships".
[17] CCITT Recommendation X.734 | ISO/IEC 10164-5: "Information technology - Open systems
interconnection - Systems management: Event report management function".
[18] CCITT Recommendation X.735 | ISO/IEC 10164-6: "Information technology - Open systems
interconnection - Systems management: Log control functions".
[19] ITU-T Recommendation X.737 | ISO/IEC 10164-14: "Information technology - Open systems
interconnection - Systems management: Confidence and diagnostic test function".
[20] ITU-T Recommendation X.745 | ISO/IEC 10164-12: "Information technology - Open systems
interconnection - Systems management: Test management function".
[21] ITU-T Recommendation X.746 | ISO/IEC 10164-15: "Information technology - Open systems
interconnection - Systems management: Scheduling function".
3 Definitions and abbreviations
3.1 Definitions
For the purposes of the present document, the following definitions apply:
Access Network (AN): See ETS 300 324-1 [2].
activation-deactivation of the line: See subclause A.2.5.
cable pair identification tone: See subclause A.2.5.
capacitance measurement: See subclause A.2.5.
Codec testing: See subclause A.2.5.
dial pulse test: See subclause A.2.5.
dial tone test: See subclause A.2.5.
digit reception: See subclause A.2.5.
dry loop: See subclause A.2.5.
Dual Tone Multi-Frequency (DTMF) dialling test: See subclause A.2.5.
feeding current: See subclause A.2.5.
feeding voltage: See subclause A.2.5.
foreign voltage: See subclause A.2.5.
insulation resistance measurement: See subclause A.2.5.
line circuit testing: See subclause A.2.5.
line testing: See subclause A.2.5.
Local Exchange (LE): See ETS 300 324-1 [2].
ETSI
11 EN 301 006-1 V1.2.3 (1998-10)
loop and ring trip detection: See subclause A.2.5.
loop resistance measurement: See subclause A.2.5.
loopback 1 (line termination loopback): See subclause A.2.5.
loopback 2, 2 and 1A (NT1 loopbacks): See subclause A.2.5.
monitoring of the line with mark tone: See subclause A.2.5.
monitoring of the line: See subclause A.2.5.
Operations System (OS): See CCITT Recommendation M.3010 [4].
power feed: See subclause A.2.5.
private meter pulses: See subclause A.2.5.
register recall button test: See subclause A.2.5.
subscriber private metering: See subclause A.2.5.
3.2 Abbreviations
For the purpose of the present document, the following abbreviations apply:
AC Alternating Current
AN Access Network
ASN.1 Abstract Syntax Notation One (see CCITT Recommendation X.208 [11])
BA Basic Access
CMIP Common Management Information Protocol
CPE Customer Premise Equipment
DC Direct Current
DTMF Dual Tone Multi-Frequency
ET Exchange Termination
ID Identity, identifier
ISDN Integrated Services Digital Network
LC Line Circuit
LE Local Exchange
LT Line Termination
M/C Mandatory/Conditional
MORT Managed Object Referring to Test
NE Network Element
NT Network Termination
OS Operations System
PRA Primary Rate Access
PSTN Public Switched Telephone Network
RDN Relative Distinguished Name
REG Regenerator
SPM Subscriber Private Meter
TARR Test Action Request Receiver
TIB Task Information Base
TMN Telecommunication Management Network
TO Test Object
ETSI
12 EN 301 006-1 V1.2.3 (1998-10)
4 Information model diagrams
The entity relationship diagram is given in subclause 4.1 and the inheritance hierarchy (is-a relationships) and naming
hierarchy (containment relationships) are given in subclauses 4.2 and 4.3, respectively.
4.1 Entity relationship diagram
Figure 2 shows the various entities related to line and circuit testing at the LE. They extend the information model
described in I-ETS 300 291 [1], which specifies management information describing the various user port aspects.
managed
Element
test
fragment
1 1
C C
N
test
testAction
Threshold
Performer
Class
a
1 1 1
C C C
N
N N N
metallic
access loop access access
a
Test a
Port Test Test Port
1 1 Access
1 M
a
1 1
1 1 1
C C C
N
N N
pattern isdn
(note)
Test QuickTest
NOTE: Other specific test object classes are defined in ETS 300 378-1 [3].
Figure 2: Entity relationship diagram - test fragment
ETSI
13 EN 301 006-1 V1.2.3 (1998-10)
4.1.1 Line testing and line circuit testing
Test requests from the OS are sent as Common Management Information Protocol (CMIP) testRequestControlled or
testRequestUncontrolled action to an instance of testActionPerformer. In this model, all controlled tests are delegated by
instances of testActionPerformer to instances of subclasses of testObject, i.e. when receiving a test request the
testActionPerformer automatically creates the required instances of these classes. Further instances of subclasses of
testObject are created if further delegation of the performance of the test is required. This creation is achieved by
sending additional testRequestControlled actions, the testSessionId parameter is used to identify in which access test
instance the new tests should be contained. All instances of these subclasses of testObject exist only for the duration of
their delegated operations. Details of the mechanism how to transmit test requests to testActionPerformer and how test
results are generated are described in ITU-T Recommendation X.745 [20].
Management information related to uncontrolled tests can be found in annex B.
Controlled testing is initially delegated to an instance of accessTest or to an instance of loopTest or to an instance of
metallicTestAccess. Each instance of loopTest or accessTest or metallicTestAccess is contained in an instance of
testActionPerformer.
The object class loopTest is used to set up loopbacks for the user port to which it is associated by an attribute. If patterns
are to be injected and compared within the LE as part of the loopback test, then this is delegated to an instance of
patternTest which is contained in the delegating instance of loopTest.
The object class accessTest has all specific non-loopback tests allocated to it. It has an attribute which specifies one or a
list of user ports which are to be tested.
If external test systems are used for line testing, the metallicTestAccess allows to connect it to each subscriber line
(outbound or bridged) and to each line circuit (inbound) of the LE. The implementation of the metallic test access is
outside the scope of this standard.
The creation of an instance of accessTest represents a test session and permits test access to lines or line circuits during
which a number of different tests can be performed. These delegated tests are handled by specific contained test objects.
Each contained test object triggers the specific test on one or more user ports which are specified in accessTest.
Electrical measurements, such as voltage, capacitance and resistance, are delegated to instances of
electricalMeasurementTest. Dialled digit tests, dial tone tests and other tests (in particular those involving sending meter
pulses to the line, cable pair identification tone and ringing) are triggered by the creation of instances of
dialledDigitTest, dialToneTest, spmPulses, cablePairIdTone and ringing, respectively. The dry loop condition is set up
by instances of dryLoopTest. The inward line circuit tests are delegated to instances of testToLineCircuit. The
voiceAccessTest allows for the provision of those test which involve the establishment of a voice connection with the
line under test. A quick check of an ISDN access is represented by a isdnQuickTest object.
The object class testThresholdClass can be used to modify predefined test thresholds via the Q3 interface.
4.1.2 The testResultNotifications of the tests
The sending time, the information contents and the number of testResultNotifications sent per test request are not
restricted. It is a matter up to the LE implementation. If the testResultNotification contains results whose testing time has
importance, they shall be ordered in the ASN.1 sequence oldest first.
ETSI
14 EN 301 006-1 V1.2.3 (1998-10)
4.2 Inheritance hierarchy
Figure 3 traces the inheritance from the highest level object "CCITT Recommendation X.721:1992":top to the managed
objects defined in the present document.
"X.721": "X.745":
top testActionPerformer
testThresholdClass
"X.745":
metallicTestAccess
testObject
isdnQuickTest
other specific
test objects
as specified in
ETS 300 378-1
NOTE: Only classes which are underlined may be instantiated.
Figure 3: Inheritance hierarchy
4.3 Naming hierarchy
Figure 4 shows the naming (i.e. containment) relationships for the LE's managed objects associated with line and circuit
testing.
"M.3100":
managedElement
"X.745":
testThresholdClass
testActionPerformer
accessTest
metallicTestAccess
loopTest
isdnQuickTest other specific test objects
patternTest
as specified in ETS 300 378-1
Figure 4: Naming hierarchy
ETSI
15 EN 301 006-1 V1.2.3 (1998-10)
5 Information model description
This clause provides a high-level informal description of the management information model for line and circuit testing
in the LE.
Subclause 5.1 contains a brief description for each object class or package used in the model as far as it is not described
in the reference documents. The description covers:
- the purpose of the object class or package;
- the attributes defined for the object class or package;
- the contents of the event reports defined in the present document;
- the relationship of the object class to other object classes;
- the applicability of these packages.
Attributes which are common to several object classes are described in subclause 5.2. Subclause 5.3 describes actions
which are common to several object classes in the information model. Subclause 5.4 describes the common aspects of
the notifications used in the information model.
5.1 Description of object classes
5.1.1 Access port fragment
In this fragment the following object classes are used. They are used in the test operations to identify the MORTs. They
are defined in I-ETS 300 291 [1]:
- "I-ETS 300 291":analogueAccess;
- "I-ETS 300 291":basicRateAccess;
- "I-ETS 300 291":primaryRateAccess.
5.1.2 Support fragment
5.1.2.1 Event report management
Event reporting management functions shall be used to establish and control the discrimination and the forwarding of
event reports to other open systems. The management information related to event reporting is defined in CCITT
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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Q3 interface at the Local Exchange (LE) for line and circuit testing of analogue and Integrated Services Digital Network (ISDN) subscriber lines; Part 1: Q3 interface specification33.080Digitalno omrežje z integriranimi storitvami (ISDN)Integrated Services Digital Network (ISDN)ICS:Ta slovenski standard je istoveten z:EN 301 006-1 Version 1.2.3SIST EN 301 006-1:2000en01-januar-2000SIST EN 301 006-1:2000SLOVENSKI
STANDARD
EN 301 006-1 V1.2.3 (1998-10)European Standard (Telecommunications series)Q3 interface at the Local Exchange (LE)for line and circuit testing of analogueand Integrated Services Digital network (ISDN) subscriber lines;Part 1: Q3 interface specificationSIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)2ReferenceREN/SPS-03030-1c (9bc90iq0.PDF)KeywordsTMN, information model, Q3 interface, LE, fault,testing, management, PSTN, ISDNETSIPostal addressF-06921 Sophia Antipolis Cedex - FRANCEOffice address650 Route des Lucioles - Sophia AntipolisValbonne - FRANCETel.: +33 4 92 94 42 00
Fax: +33 4 93 65 47 16Siret N° 348 623 562 00017 - NAF 742 CAssociation à but non lucratif enregistrée à laSous-Préfecture de Grasse (06) N° 7803/88Internetsecretariat@etsi.frhttp://www.etsi.orgCopyright NotificationNo part may be reproduced except as authorized by written permission.The copyright and the foregoing restriction extend to reproduction in all media.© European Telecommunications Standards Institute 1998.All rights reserved.SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)3ContentsIntellectual Property Rights.7Foreword.7Introduction.71Scope.92References.93Definitions and abbreviations.103.1Definitions.103.2Abbreviations.114Information model diagrams.124.1Entity relationship diagram.124.1.1Line testing and line circuit testing.134.1.2The testResultNotifications of the tests.134.2Inheritance hierarchy.144.3Naming hierarchy.145Information model description.155.1Description of object classes.155.1.1Access port fragment.155.1.2Support fragment.155.1.2.1Event report management.155.1.2.2Log control function.155.1.3Test fragment.165.1.3.1Access test (accessTest).165.1.3.2Dialled digit test (dialledDigitTest).165.1.3.3Dial tone test (dialToneTest).165.1.3.4Electrical measurement test (electricalMeasurementTest).175.1.3.5Subscriber Private Meter (SPM) pulses (spmPulses).175.1.3.6Cable pair identification tone (cablePairIdTone).175.1.3.7Ringing (ringing).175.1.3.8Test to line circuit (testToLineCircuit).175.1.3.9Dry Loop (dryLoop).175.1.3.10Loop test (loopTest).185.1.3.11Pattern test (patternTest).185.1.3.12Voice access test (voiceAccessTest).185.1.3.13Metallic test access (metallicTestAccess).195.1.3.14Test threshold class administration (testThresholdClass).195.1.3.15ISDN quick test (isdnQuickTest).205.2Definition of attributes.205.2.1Relative distinguished name.205.2.2State attributes.205.2.2.1Operational state (operationalState).205.2.2.2Administrative state (administrativeState).215.2.2.3Availability status (availabilityStatus).215.2.3Relationship attributes.215.3Actions description.215.4Notifications description.216Formal object class definitions.226.1Definitions of object classes.226.1.1Access port fragment.226.1.2Support fragment.226.1.3Test fragment.226.1.3.1ISDN quick test.236.1.3.2Metallic test access.23SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)46.1.3.3Test threshold class.246.2Name bindings.246.2.1Test fragment.246.2.1.1ISDN quick test.246.2.1.2Metallic test access.246.2.1.3Test threshold class.246.3Definition of packages.256.3.1Metallic test access line package.256.4Definition of attributes.256.4.1AC voltage threshold.256.4.2Capacitance threshold.256.4.3DC voltage threshold.256.4.4Dial speed threshold.256.4.5ISDN quick test.266.4.6Metallic test access message.266.4.7Metallic test access timeout period.266.4.8Proposed metallic test access.276.4.9Pulse no pulse ratio.276.4.10Resistance threshold.276.4.11Test threshold class ID.276.4.12Type of line.276.5Definition of actions.276.6Definition of notifications.276.7Definition of parameters.276.8ASN.1 defined types module.297Protocol requirements.31Annex A (normative):Requirements and specification of parameters for access port tests.32A.1General test requirements.32A.1.1Scheduled testing.32A.1.2Test capability.32A.2Access port test requirements.32A.2.1Access port test management functions.32A.2.2Test scheduling.33A.2.3Test result management.33A.2.4Test threshold management.34A.2.5Test requirements description.34A.2.5.1PSTN line testing.34A.2.5.1.1Foreign voltage or current.34A.2.5.1.2Capacitance measurement.34A.2.5.1.3Insulation resistance measurement.34A.2.5.1.4Loop resistance measurement.35A.2.5.1.5Dial pulse test.35A.2.5.1.6DTMF dialling test.35A.2.5.1.7Subscriber private meter testing.35A.2.5.1.8Ring subscriber.35A.2.5.1.9Monitoring of the line.35A.2.5.1.10Cable pair identification tone.35A.2.5.1.11Dry loop.35A.2.5.1.12Register recall button test.36A.2.5.1.13Ring back procedure.36A.2.5.2PSTN inward tests.36A.2.5.2.1Line circuit testing.36A.2.5.2.1.1Feeding voltage.36A.2.5.2.1.2Feeding current.36A.2.5.2.1.3Loop and ring trip detection.36A.2.5.2.1.4Ringing current sending.36A.2.5.2.1.5Private meter pulses.36A.2.5.2.1.6Codec testing.37SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)5A.2.5.2.1.7Digit reception.37A.2.5.2.2Other inward tests.37A.2.5.2.2.1Dial tone test.37A.2.5.3ISDN BA testing.37A.2.5.3.1ISDN BA line testing.37A.2.5.3.2ISDN BA line termination testing.37A.2.5.3.2.1Loopbacks.37A.2.5.3.2.2Activation and deactivation of lines.38A.2.5.3.3ISDN BA line circuit testing.38A.2.5.3.3.1Power feed.38A.2.5.4ISDN PRA testing.38A.2.5.4.1ISDN PRA line testing.38A.2.5.4.2ISDN PRA line termination testing.38A.2.5.5ISDN BA and PRA quick tests.38A.2.5.6Connection of external test systems.38Annex B (normative):Test categories.39B.1Electrical measurement tests.39B.2Dialled digit test.40B.3Dial tone test.41B.4Subscriber private meter pulses test.42B.5Ringing test.42B.6Test to line circuit.43B.7ISDN loopback test.44B.8ISDN quick test.45Annex C (normative):Test termination.47C.1Termination of uncontrolled tests.47C.2Termination of controlled tests.47Annex D (normative):Test result notification.49Annex E (normative):Additional requirements on the test action performer.50E.1Indication of supported tests.50E.2Indication of unsuccessful test requests.50Annex F (informative):Task Information Base (TIB).51F.1Description of the service.51F.2Components of service (TIB A).51F.3Management function list (TIB B).52Annex G (informative):Description of management functions.53G.1Model for the test function.53G.1.1Environment.53G.1.2Uncontrolled tests.53G.1.3Controlled tests.54G.2Functional model.55G.2.1Test initiation.55G.2.2Test scheduling.55G.2.3Reporting of test results.56G.2.4Test suspension and resumption.57SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)6G.2.5Test termination.57Annex H (informative):Message flows.58Annex J (informative):Bibliography.61History.62SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)7Intellectual Property RightsIPRs essential or potentially essential to the present document may have been declared to ETSI. The informationpertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be foundin SR 000 314: "Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in respectof ETSI standards", which is available free of charge from the ETSI Secretariat. Latest updates are available on theETSI Web server (http://www.etsi.org/ipr).Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guaranteecan be given as to the existence of other IPRs not referenced in SR 000 314 (or the updates on the ETSI Web server)which are, or may be, or may become, essential to the present document.ForewordThis European Standard (Telecommunications series) has been produced by ETSI Technical Committee SignallingProtocols and Switching (SPS).The present document is part 1 of a multi-part document covering the Q3 interface at the Local Exchange (LE) for lineand circuit testing of analogue and ISDN subscriber lines, as identified below:Part 1:"Q3 interface specification";NOTE:The production of other parts is for further study.Proposed national transposition datesDate of adoption of this EN:7 August 1998Date of latest announcement of this EN (doa):30 November 1998Date of latest publication of new National Standardor endorsement of this EN (dop/e):31 May 1999Date of withdrawal of any conflicting National Standard (dow):31 May 1999IntroductionLine and circuit testing of analogue and ISDN lines is part of a management activity which is performed by the operatorin order to detect failure conditions and to bring the customer access back to its normal state of operation whenever adeviation occurs.A customer access is considered as being that part of the local network which extends from the network terminationequipment up to and including the exchange termination.Here, only these parts of the activity are covered which are related directly to that part of the customer access whichextends from the LE to the network termination equipment. An ISDN access extends to but does not include theT reference point. An analogue access extends to and may include the Customer Premise Equipment (CPE)(see figure 1).SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)8Q(LE)LEZTPSTNTETNT1ISDNTEISDNTEPSTNUPISDNUPISDNUPNOTE:Shaded areas are subject to line and circuit testing. User ports represent the different configurations forLine Circuit (LC), Line Termination (LT), Exchange Termination (ET) and Network Termination (NT). Theoption of ISDN access without remote NT1 is valid for ISDN BA only.Figure 1: Scope of line and circuit testingThe present document details only those functions and management information model components which are requiredfor line and circuit testing. However, the use of other components which may be applicable from other specifications isnot precluded. In this case, combined applications incorporating line and circuit test specific and more generic aspectswould result.SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)91ScopeThe present document specifies the Q3 interface between an Local Exchange (LE) and the TelecommunicationsManagement Network (TMN) for the support of line and circuit test functions for analogue and ISDN lines which areconnected directly to a LE.The focus of the present document is on defining an object model based on the existing standards ETS 300 378-1 [3]and ITU-T Recommendation X.745 [20]. The add-ons, modifications and restrictions to these standards are specifiedwhich are necessary to adapt the object model to a LE. Existing protocols are used where possible. The definition ofOperations System (OS) functionality is outside the scope of the present document.2ReferencesThe following documents contain provisions which, through reference in this text, constitute provisions of the presentdocument.· References are either specific (identified by date of publication, edition number, version number, etc.) ornon-specific.· For a specific reference, subsequent revisions do not apply.· For a non-specific reference, subsequent revisions do apply.· A non-specific reference to an ETS shall also be taken to refer to later versions published as an EN with the samenumber.[1]I-ETS 300 291 (1995): "Network Aspects (NA); Functional specification of CustomerAdministration (CA) on the Operations System/Network Element (OS/NE) interface".[2]ETS 300 324-1: "Signalling Protocols and Switching (SPS); V interfaces at the digital LocalExchange (LE); V5.1 interface for the support of Access Network (AN); Part 1: V5.1 interfacespecification".[3]ETS 300 378-1 (1995): "Signalling Protocols and Switching (SPS); Q3 interface at the AccessNetwork (AN) for fault and performance management of V5 interfaces and associated customerprofiles; Part 1: Q3 interface specification".[4]CCITT Recommendation M.3010 (1992): "Principles for a telecommunications managementnetwork".[5]CCITT Recommendation M.3100 (1992): "Generic network information model".[6]ITU-T Recommendation M.3603: "Application of maintenance principles to ISDN basic rateaccess".[7]ITU-T Recommendation M.3604: "Application of maintenance principles to ISDN primary rateaccess".[8]ITU-T Recommendation Q.543 (1993): "Digital exchange performance design objectives".[9]ITU-T Recommendation Q.811 (1993): "Lower layer protocol profiles for the Q3 interface".[10]ITU-T Recommendation Q.812 (1993): "Upper layer protocol profiles for the Q3 interface".[11]CCITT Recommendation X.208 (1988): "Specification of Abstract Syntax Notation One(ASN.1)".[12]CCITT Recommendation X.720 | ISO/IEC 10165-1: "Information technology - Open systemsinterconnection - Structure of management information: Management information model".[13]CCITT Recommendation X.721 | ISO/IEC 10165-2: "Information technology - Open systemsinterconnection - Structure of management information: Definition of management information".SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)10[14]CCITT Recommendation X.730 | ISO/IEC 10164-1: "Information technology - Open systemsinterconnection - Systems management: Object management function".[15]CCITT Recommendation X.731 | ISO/IEC 10164-2: "Information technology - Open systemsinterconnection - Systems management: State management function".[16]CCITT Recommendation X.732 | ISO/IEC 10164-3: "Information technology - Open systemsinterconnection - Systems management: Attributes for representing relationships".[17]CCITT Recommendation X.734 | ISO/IEC 10164-5: "Information technology - Open systemsinterconnection - Systems management: Event report management function".[18]CCITT Recommendation X.735 | ISO/IEC 10164-6: "Information technology - Open systemsinterconnection - Systems management: Log control functions".[19]ITU-T Recommendation X.737 | ISO/IEC 10164-14: "Information technology - Open systemsinterconnection - Systems management: Confidence and diagnostic test function".[20]ITU-T Recommendation X.745 | ISO/IEC 10164-12: "Information technology - Open systemsinterconnection - Systems management: Test management function".[21]ITU-T Recommendation X.746 | ISO/IEC 10164-15: "Information technology - Open systemsinterconnection - Systems management: Scheduling function".3Definitions and abbreviations3.1DefinitionsFor the purposes of the present document, the following definitions apply:Access Network (AN): See ETS 300 324-1 [2].activation-deactivation of the line: See subclause A.2.5.cable pair identification tone: See subclause A.2.5.capacitance measurement: See subclause A.2.5.Codec testing: See subclause A.2.5.dial pulse test: See subclause A.2.5.dial tone test: See subclause A.2.5.digit reception: See subclause A.2.5.dry loop: See subclause A.2.5.Dual Tone Multi-Frequency (DTMF) dialling test: See subclause A.2.5.feeding current: See subclause A.2.5.feeding voltage: See subclause A.2.5.foreign voltage: See subclause A.2.5.insulation resistance measurement: See subclause A.2.5.line circuit testing: See subclause A.2.5.line testing: See subclause A.2.5.Local Exchange (LE): See ETS 300 324-1 [2].SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)11loop and ring trip detection: See subclause A.2.5.loop resistance measurement: See subclause A.2.5.loopback 1 (line termination loopback): See subclause A.2.5.loopback 2, 21 and 1A (NT1 loopbacks): See subclause A.2.5.monitoring of the line with mark tone: See subclause A.2.5.monitoring of the line: See subclause A.2.5.Operations System (OS): See CCITT Recommendation M.3010 [4].power feed: See subclause A.2.5.private meter pulses: See subclause A.2.5.register recall button test: See subclause A.2.5.subscriber private metering: See subclause A.2.5.3.2AbbreviationsFor the purpose of the present document, the following abbreviations apply:ACAlternating CurrentANAccess NetworkASN.1Abstract Syntax Notation One (see CCITT Recommendation X.208 [11])BABasic AccessCMIPCommon Management Information ProtocolCPECustomer Premise EquipmentDCDirect CurrentDTMFDual Tone Multi-FrequencyETExchange TerminationIDIdentity, identifierISDNIntegrated Services Digital NetworkLCLine CircuitLELocal ExchangeLTLine TerminationM/CMandatory/ConditionalMORTManaged Object Referring to TestNENetwork ElementNTNetwork TerminationOSOperations SystemPRAPrimary Rate AccessPSTNPublic Switched Telephone NetworkRDNRelative Distinguished NameREGRegeneratorSPMSubscriber Private MeterTARRTest Action Request ReceiverTIBTask Information BaseTMNTelecommunication Management NetworkTOTest ObjectSIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)124Information model diagramsThe entity relationship diagram is given in subclause 4.1 and the inheritance hierarchy (is-a relationships) and naminghierarchy (containment relationships) are given in subclauses 4.2 and 4.3, respectively.4.1Entity relationship diagramFigure 2 shows the various entities related to line and circuit testing at the LE. They extend the information modeldescribed in I-ETS 300 291 [1], which specifies management information describing the various user port aspects.1 1 1 N 1 N C 1 N 1 N 1 1 1 M C managedElement test
fragmentaccess
Testloop
Testpattern TesttestAction
Performer accessPort C C C a a (note)metallicTestAccess1 C testThresholdClass accessPort a 1 N N C 1 N 1 1 a 1 N C isdnQuickTestNOTE:Other specific test object classes are defined in ETS 300 378-1 [3].Figure 2: Entity relationship diagram - test fragmentSIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)134.1.1Line testing and line circuit testingTest requests from the OS are sent as Common Management Information Protocol (CMIP) testRequestControlled ortestRequestUncontrolled action to an instance of testActionPerformer. In this model, all controlled tests are delegated byinstances of testActionPerformer to instances of subclasses of testObject, i.e. when receiving a test request thetestActionPerformer automatically creates the required instances of these classes. Further instances of subclasses oftestObject are created if further delegation of the performance of the test is required. This creation is achieved bysending additional testRequestControlled actions, the testSessionId parameter is used to identify in which access testinstance the new tests should be contained. All instances of these subclasses of testObject exist only for the duration oftheir delegated operations. Details of the mechanism how to transmit test requests to testActionPerformer and how testresults are generated are described in ITU-T Recommendation X.745 [20].Management information related to uncontrolled tests can be found in annex B.Controlled testing is initially delegated to an instance of accessTest or to an instance of loopTest or to an instance ofmetallicTestAccess. Each instance of loopTest or accessTest or metallicTestAccess is contained in an instance oftestActionPerformer.The object class loopTest is used to set up loopbacks for the user port to which it is associated by an attribute. If patternsare to be injected and compared within the LE as part of the loopback test, then this is delegated to an instance ofpatternTest which is contained in the delegating instance of loopTest.The object class accessTest has all specific non-loopback tests allocated to it. It has an attribute which specifies one or alist of user ports which are to be tested.If external test systems are used for line testing, the metallicTestAccess allows to connect it to each subscriber line(outbound or bridged) and to each line circuit (inbound) of the LE. The implementation of the metallic test access isoutside the scope of this standard.The creation of an instance of accessTest represents a test session and permits test access to lines or line circuits duringwhich a number of different tests can be performed. These delegated tests are handled by specific contained test objects.Each contained test object triggers the specific test on one or more user ports which are specified in accessTest.Electrical measurements, such as voltage, capacitance and resistance, are delegated to instances ofelectricalMeasurementTest. Dialled digit tests, dial tone tests and other tests (in particular those involving sending meterpulses to the line, cable pair identification tone and ringing) are triggered by the creation of instances ofdialledDigitTest, dialToneTest, spmPulses, cablePairIdTone and ringing, respectively. The dry loop condition is set upby instances of dryLoopTest. The inward line circuit tests are delegated to instances of testToLineCircuit. ThevoiceAccessTest allows for the provision of those test which involve the establishment of a voice connection with theline under test. A quick check of an ISDN access is represented by a isdnQuickTest object.The object class testThresholdClass can be used to modify predefined test thresholds via the Q3 interface.4.1.2The testResultNotifications of the testsThe sending time, the information contents and the number of testResultNotifications sent per test request are notrestricted. It is a matter up to the LE implementation. If the testResultNotification contains results whose testing time hasimportance, they shall be ordered in the ASN.1 sequence oldest first.SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)144.2Inheritance hierarchyFigure 3 traces the inheritance from the highest level object "CCITT Recommendation X.721:1992":top to the managedobjects defined in the present document."X.721":top"X.745":testObject"X.745":testActionPerformerother specifictest objectsas specified inETS 300 378-1testThresholdClassmetallicTestAccessisdnQuickTestNOTE:Only classes which are underlined may be instantiated.Figure 3: Inheritance hierarchy4.3Naming hierarchyFigure 4 shows the naming (i.e. containment) relationships for the LE's managed objects associated with line and circuittesting."X.745":testActionPerformerloopTestpatternTestaccessTest"M.3100":managedElementtestThresholdClassother specifictest objectsas specified in ETS 300 378-1metallicTestAccessisdnQuickTestFigure 4: Naming hierarchySIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)155Information model descriptionThis clause provides a high-level informal description of the management information model for line and circuit testingin the LE.Subclause 5.1 contains a brief description for each object class or package used in the model as far as it is not describedin the reference documents. The description covers:-the purpose of the object class or package;-the attributes defined for the object class or package;-the contents of the event reports defined in the present document;-the relationship of the object class to other object classes;-the applicability of these packages.Attributes which are common to several object classes are described in subclause 5.2. Subclause 5.3 describes actionswhich are common to several object classes in the information model. Subclause 5.4 describes the common aspects ofthe notifications used in the information model.5.1Description of object classes5.1.1Access port fragmentIn this fragment the following object classes are used. They are used in the test operations to identify the MORTs. Theyare defined in I-ETS 300 291 [1]:-"I-ETS 300 291":analogueAccess;-"I-ETS 300 291":basicRateAccess;-"I-ETS 300 291":primaryRateAccess.5.1.2Support fragment5.1.2.1Event report managementEvent reporting management functions shall be used to establish and control the discrimination and the forwarding ofevent reports to other open systems. The management information related to event reporting is defined in CCITTRecommendation X.734 [17].5.1.2.2Log control functionLog control functions may be used to store event reports and local system notifications into logs and to control this logprocess. The management information related to log control is defined in CCITT Recommendation X.735 [18].SIST EN 301 006-1:2000

ETSIEN 301 006-1 V1.2.3 (1998-10)165.1.3Test fragmentThe following classes are used for controlled testing. Management information related to uncontrolled tests can be foundin annex C of the present document.5.1.3.1Access test (accessTest)Instances of the class accessTest represent configurations and conditions for testing the line and line circuit. The class isa specialization of the testObject class defined in ITU-T Recommendation X.745 [20].In addition to the inherited attributes, it has the attributes given in table 1.Table 1NameM/CValue set"X.737":testConditionsMsinglewaitTimeMsingle"X.745":mORTsMset"X.737":testConditions:indicates the action to be taken if the port is busy and if a call is attempted duringtesting.waitTime:indicates the wait time if the testConditions attribute indicates a wait if busy.5.1.3.2Dialled digit test (dialledDigitTest)Instances of the class dialledDigitTest represent a dialled digit tests. The class is a specialization of the testObject classdefined in ITU-T Recommendation X.745 [20].In addition to the inherited attributes, it has the attributes given in table 2.Table 2NameM/CValue setnumberOfDigitsMsinglenumberOfDigits:indicates the number of digits for the test.5.1.3.3Dial tone test (dialToneTest)Instances of the class dialToneTest represent a dial tone tests. The class is a specialization of the testObject class definedin ITU-T Recommendation X.745 [20].In addition to the inherited attributes, it has the attributes given in table 3.Table 3NameM/CValue setoffHookSimulationMsinglerequestedResultTypeMsingleiterationsMsingleoffHookSimulation:indicates how off-hook is to be simulated i.e. loop calling or earth calling.requestedResultType:indicates whether a test result should be a pass or a fail.iteration
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