ETSI ETS 300 297/A1 ed.1 (1996-03)

SLOVENSKI STANDARD
SIST ETS 300 297/A1 E1:2003
01-december-2003
Digitalno omrežje z integriranimi storitvami (ISDN) – Digitalni dostopovni odsek za
osnovni dostop v sistemu ISDN
Integrated Services Digital Network (ISDN); Access digital section for ISDN basic rate
Ta slovenski standard je istoveten z: ETS 300 297/A1 Edition 1
ICS:
33.080 Digitalno omrežje z Integrated Services Digital
integriranimi storitvami Network (ISDN)
(ISDN)
SIST ETS 300 297/A1 E1:2003 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST ETS 300 297/A1 E1:2003

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SIST ETS 300 297/A1 E1:2003
ETS 300 297
AMENDMENT A1
March 1996
Source: ETSI TC-TM Reference: RE/TM-03049
ICS: 33.080
ISDN, digital, access, basic rate
Key words:
This amendment A1 modifies
the European Telecommunication Standard ETS 300 297 (1995)
Integrated Services Digital Network (ISDN);
Access digital section for ISDN basic rate
ETSI
European Telecommunications Standards Institute
ETSI Secretariat
F-06921 Sophia Antipolis CEDEX - FRANCE
Postal address:
650 Route des Lucioles - Sophia Antipolis - Valbonne - FRANCE
Office address:
c=fr, a=atlas, p=etsi, s=secretariat - secretariat@etsi.fr
X.400: Internet:
Tel.: +33 92 94 42 00 - Fax: +33 93 65 47 16
*
Copyright Notification: No part may be reproduced except as authorized by written permission. The copyright and the
foregoing restriction extend to reproduction in all media.
© European Telecommunications Standards Institute 1996. All rights reserved.

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Whilst every care has been taken in the preparation and publication of this document, errors in content,
typographical or otherwise, may occur. If you have comments concerning its accuracy, please write to
"ETSI Editing and Committee Support Dept." at the address shown on the title page.

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Foreword
This amendment provides a new normative annex C, which defines the conformance test principles for
the ISDN basic rate access digital section for ETS 300 297 (1995).
The current informative annex C is reallocated as informative annex D.
Transposition dates
Date of adoption of this amendment: 25 August 1995
Date of latest announcement of this amendment (doa): 30 June 1996
Date of latest publication or endorsement of this amendment (dop/e): 31 September 1996
Date of withdrawal of any conflicting National Standard (dow): 31 September 1996

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Amendments
Page 10, subclause 3.1
Add the following definitions to subclause 3.1:
access digital section: The whole of the means of digital transmission of a digital signal of specified rate
between two consecutive reference points. The term should be qualified by the type of access supported,
or by a prefix denoting the V interface at the digital section boundaries. For example:
- basic access digital section;
- primary rate access digital section;
- Vx digital section.
Conformance Test Adaptor (CTA): A device which is either a local exchange with adaption functions
providing access to the required functions or an adaptor able to provide these functions and to simulate
the required functionality of the local exchange.
simulator (terminal equipment, exchange): A device generating a stimulus signal conforming to this
ETS to bring the Implementation Under Test (IUT) into the required operational state and monitoring the
receive signal from the IUT. It can either be a simulator for the user side at the T reference point or the
exchange side of the V1 reference point.
Page 10, subclause 3.2
Add the following abbreviations to subclause 3.2:
CTA Conformance Test Adaptor
DLL Digital Line Loop
IUT Implementation Under Test
PRBS Pseudo Random Bit Sequence
Rx signal Receiver
Tx signal Transmitter

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Page 39, new annex C
Add the following annex C:
Annex C (normative): Conformance test principles for the ISDN basic rate
access digital section
This annex provides the test principles for the requirements of this ETS used to determine the compliance
of an item under test to this ETS.
This ETS does not specify:
- safety requirements;
- interface or equipment overvoltage protection requirements;
- immunity requirements against electromagnetic interferences;
- emission limitation requirements.
Detailed test equipment accuracy and the specification tolerance of the test devices are not a subject of
this annex. Where such details are provided, they are considered as being an "informative" addition to the
test description.
The test configurations given do not imply a specific realization of test equipment or arrangement or the
use of specific test devices for conformance testing. However, any test configuration used shall provide
those test conditions specified under "system state", "stimulus" and "monitor" for each individual test.
Functions described in annex A are implemented in the local exchange. They are defined to ensure the
correct interworking between the local exchange and the access digital section. Testing of these functions
is outside the scope of this ETS.
C.1 General
For conformance test of the access digital section, two relevant test points have to be identified:
- the T reference point covered by ETS 300 012 [6];
- the V1 reference point.
This document is applicable to interface points T and V1 as appropriate. The field of application is given at
the beginning of each test.
As the transmission system is not part of this ETS, only relevant signals inside the basic rate stream have
to be checked. The coding and the frame organization of this bit stream is outside the scope of this ETS.

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C.2 Additional information to support the test
As the V1 reference point is specific to the system under test and is not a standardized electrical interface,
a suitable means such as either a local exchange or a Conformance Test Adaptor (CTA) enabling the
monitoring of the V1 reference point and giving access to the B-channels and D-channel need to be
provided by the manufacturers.
The following facilities need to be provided by the CTA:
- monitoring of the FEs sent to and from the ET across the V1 reference point;
- the ability to transmit and receive test patterns to and from B-channel and D-channel.
Stimuli are provided either:
- at the V1 reference point, by the means described in this subclause; or
- at the T reference point, by the simulator at the T reference point.
If the equipment to be tested does not provide access to the B-channels and D-channel, the apparatus
supplier needs to additionally provide a test equipment using the same chip set and interface components
as in the equipment to be tested. This test equipment shall provide either access to the B-channels and
D-channel to allow insertion of specific test patterns so that the necessary tests can be carried out or else
implementation of a test pattern generator providing the necessary test patterns and a monitor point for
monitoring the FEs sent to and from the ET across the V1 reference point.
C.3 Connection of the simulator to the IUT
For testing the characteristics of the IUT, the simulator at the T reference point, or its relevant part, is to
be connected to the IUT as described in ETS 300 012 [6]. Because the V1 reference point may be inside
the CTA as described in subclause C.2, the connection is dependent on the configuration of the test
equipment.
C.4 Allocation of test
One test definition may cover more than one requirement for one or both interface points (interface
T or V1). Requirements which do not need specific test definition are indicated by "not relevant" (N/R).
Requirements which are not relevant for this normative and which require to be tested as defined by other
ETSs are indicated by "not applicable" (N/A).
C.4.1 General
Table C.1
Functions Clause/ Relevant interface or reference point Test defined in
subclause T, V1, or T and V1
Scope 1 N/R
Normative references 2 N/R
Definitions and 3 N/R
abbreviations
Partial activation 3.1 N/R
Full activation 3.2 N/R

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C.4.2 Type of configuration and applications requirements
Table C.2
Functions Clause/ Relevant interface or reference point Test defined in
subclause T, V1, or T and V1
Configuration and 4 N/R
application
Configuration 4.1 N/R
Application 4.2 N/R
Modelling and 4.3 N/R
relationship between
the access digital
section and the ET
C.4.3 Functional characteristics requirements
Table C.3
Functions Clause/ Relevant interface or reference point Test defined in
subclause T, V1, or T and V1
Functions 5 N/R
B-channel 5.1 T, V1 C.5.1.1
D-channel 5.2 T, V1 C.5.1.2
Bit timing 5.3 T, V1 C.5.1.1, C.5.1.2
Octet timing 5.4 T, V1 C.5.3.1
Activation 5.5 T C.7.1
Activation from ET 5.5.1 V1 C.7.1
Request for activation 5.5.2 V1 C.7.1
from TE
Deactivation 5.6 T, V1 C.7.1
Power feeding 5.7 T C.5.6.1
Operation and 5.8 T, V1 C.8.1.1, C.8.1.2,
maintenance C.8.1.3, C.8.3.1
C.4.4 Signal transfer delay and jitter requirements
Table C.4
Functions Clause/ Relevant interface or reference point Test defined in
subclause T, V1, or T and V1
Signal transfer delay 6 T, V1 C.6.1
Jitter 7 N/R
Output/input jitter at T 7.1 T C.6.2.1.2,
reference point ETS 300 012 [6]
Jitter at V1 reference 7.2 N/A
point

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C.4.5 Activation/deactivation
Table C.5
Functions Clause/ Relevant interface or reference point Test defined in
subclause T, V1, or T and V1
Activation/ 8 N/R
deactivation
Functional capabilities 8.1 N/R
Customer installation 8.1.1 N/R
at the user side of
reference point T
Installation at the 8.1.2 N/R
network side of V1
reference point
Modelling 8.2 N/R
General 8.2.1 N/R
Partitioning of 8.2.2 N/R
functions
Location of timer T2 8.2.3 N/R
Activation/deactivation 8.3 T, V1 C.7.1
procedure
Basic characteristics 8.3.1 T, V1 C.7.1
of the procedures
Priority 8.3.1.1 N/A
System management 8.3.1.2 N/R
Loopbacks 8.3.1.3 T, V1 C.7.1, C.8.1.1,
C.8.1.2, C.8.1.3
Protection of 8.3.1.4 N/R
layer 2 frames
Structure of the tables 8.3.1.5 N/R
Description of the 8.4 N/R
state transition table
Access digital section 8.4.1 N/R
state
(DS states)
State DS 1.0 (Access 8.4.1.1 N/R
deactivated)
State DS 1.1 (Access 8.4.1.2 N/R
activation initiated )
State DS 1.2 8.4.1.3 N/R
(Access activation: DS
synchronized
LT → NT
State DS 1.3 8.4.1.4 N/R
(Access activation: DS
activated)
State DS 1.4 8.4.1.5 N/R
(Access activated)
State DS 1.5 8.4.1.6 N/R
(LOS/LFA at T)
State DS 1.6 8.4.1.7 N/R
(Access deactivation
initiated)
State DS 1.7 8.4.1.8 N/R
(Defect condition)
State DS 2.0 8.4.1.9 N/R
(Loopback 1 or 1a
initiated)
State DS 2.1 8.4.1.10 N/R
(Loopback 1 or 1a
activated)
State DS 2.2 8.4.1.11 N/R
(Loopback 2 initiated)
State DS 2.3 8.4.1.12 N/R
(DS synchronized LT
→ NT)
State DS 2.4 8.4.1.13 N/R
(DS activated)
State DS 2.5 8.4.1.14 N/R
(Loopback 2 activated)
(continued)

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Table C.5 (concluded)
Functions Clause/ Relevant interface or reference point Test defined in
subclause T, V1, or T and V1
Repertoire of signals 8.4.2 N/R
sent across the T
reference point
Repertoire of function 8.4.3 N/R
elements sent across
the V1 reference point
Assumptions made in 8.4.4 N/R
specifying the
procedures in table 2
Activation time 8.5 T, V1 C.7.2
Warm start time 8.5.1 T, V1 C.7.2.1, C.7.2.3
Cold start time 8.5.2 T, V1 C.7.2.2
C.4.6 Operation and maintenance
Table C.6
Functions Clause/ Relevant interface or reference point Test defined in
subclause T, V1, or T and V1
Operation and 9 N/R
maintenance
Control facilities 9.1 N/R
Loopbacks 9.1.1 V1 C.5.1
Loopback 9.1.1.1 N/R
implementation
Loopback procedure 9.1.1.2 V1 C.8.1.1, C.8.1.2,
C.8.1.3, C.7.1
Information request 9.1.2 N/R
Power switch on/off 9.1.3 N/R
the line
Continuity test 9.1.4 T, V1 C.7.1
Monitoring 9.2 N/R
Functions 9.2.1 N/R
Defect conditions and 9.2.2 T, V1 C.8.3.1
consequent actions
Detection of defect 9.2.2.1 N/R
conditions
Consequent actions 9.2.2.2 T, V1 C.8.3.1
Error detection and 9.2.3 N/R
reporting
Status report functions 9.2.4 N/R
System dependent 9.2.5 N/R
status report functions

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C.5 Functional characteristics tests
When the access digital section is implemented using a copper transmission system as defined in
ETR 080 [8], then the test loop 1 given in ETR 080 [8] shall be used for carrying out the functional
characteristics tests.
C.5.1 Digital section transparent signal transfer
Test applicable at the T and the V1 reference points.
C.5.1.1 B-channels
Purpose: To test the transparency and independence of the B-channels.
Test configuration:
T V1
C T A
TX RX
SIMULATOR
B-channels
T-REFERENCE
POINT
B-channels
(note 2)
RX I U T
TX
Power sink Power source
(note 1)
V1
T PRBS
Insert/
Monitor
Monitor
(note 2)
NOTE 1: If remote power feeding is provided; in practical realizations power feeding may be done by a
phantom mode (ITU-T Recommendation I.430 [9]).
NOTE 2: If test signals provided by the ET:
- monitor downstream.
Figure C.1
System state: Access activated. DS 1.4.
Stimulus 1: Different PRBSs in the B1-channel and the B2-channel applied to the T
reference point.
Monitor 1: The PRBSs at the V1 reference point.
Result: No bit errors.
Stimulus 2: Different PRBSs in the B1-channel and the B2-channel applied to the T
reference point.
Monitor 2: The PRBSs at the V1 reference point.
Result: No bit errors.

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C.5.1.2 D-channel
Purpose: To test the transparency of the D-channel.
Test configuration:
T V1
C T A
TX RX
SIMULATOR
T-REFERENCE
D-channel
POINT
I U T
RX
TX
(note)
Power sink Power source
V1
T
D-message
Insert Monitor
NOTE: If remote power feeding is provided; in practical realizations power feeding may be done by a
phantom mode (ITU-T Recommendation I.430 [9]).
Figure C.2
System state: Access activated. DS 1.4.
Stimulus 1: Message in the D-channel applied to the T reference point.
Monitor 1: The message at the V1 reference point.
Result: No bit errors.
Stimulus 2: Message in the D-channel applied to the V1 reference point.
Monitor 2: The message at the T reference point.
Result: No bit errors.
C.5.2 Bit timing
This test is not relevant, because the bit timing is tested by testing the transparency of the B-channels as
described in subclause C.5.1.1.

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C.5.3 Octet timing
C.5.3.1 B-channel octet transparency
Purpose: To test the octet organization and transparency.
Test configuration:
T V1
C T A
TX RX
SIMULATOR
B-channels
T-REFERENCE
POINT
B-channels
(note 2)
I U T
RX
TX
Power sink (note 1) Power source
V1
T
Octet timing
Two different words
in the B1 and the B2 channel
Insert/
Monitor
Monitor
(note 2)
NOTE 1: If remote power feeding is provided; in practical realizations power feeding may be done by a
phantom mode (ITU-T Recommendation I.430 [9]).
NOTE 2: If test signals provided by the ET:
- monitor downstream.
Figure C.3
Stimulus 1: Different words in the B1-channel and the B2-channel applied to the T
reference point.
EXAMPLE 1: B1 00001111, B2 11110000.
The words used for this test must allow the observation of octets and the phase
relationship between the signals in the B-channels.
Monitor 1: The words in the B-channels at the V1 reference point.
Result: No bit errors.
Stimulus 2: Different words in the B1-channel and the B2-channel applied to the V1
reference point.
EXAMPLE 2: B1-channel 00001111, B2-channel 11110000.
The words used for this test must allow the observation of octets and the phase
relationship between the signals in the B-channels.
Monitor 2: The words in the B-channels at the T reference point.
Result: No bit errors.

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C.5.4 Activation
The test of the activation procedure is covered by the tests as described in clause C.7.
C.5.5 Deactivation
The test of the deactivation procedure is covered by the tests as described in clause C.7.
C.5.6 Power feeding
This function is provided for remote power feeding of the NT1 and one TE in restricted power condition as
described in ETS 300 012 [6]. The function is dependent on the transmission medium used.
If remote power feeding is provided, the power feeding through the interface at the T reference point has
to be tested in restricted power condition.
C.5.6.1 Restricted power condition
Purpose: To ensure that the access digital section is feeding enough power through the
interface at the T reference point to the S bus in restricted power condition and
to test the open circuit voltage.
Test configuration:
RX
A
SIMULATOR
V
T-REFERENCE R IUT
POINT
TX
Figure C.4
System state: Any state.
Stimulus: Drawing zero power and maximum power provided by power source 1 as
declared by the supplier of the NT. Reduce the resistance from infinity W to a
value such that the maximum power is available.
Monitor: DC voltage and current.
Results: The voltage at the output of the source shall be 40 V (+5 / -15 %), reversed
polarity.
C.5.7 Operation and maintenance
The test of these functions is covered by the tests as described in clause C.8.

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C.6 Signal transfer and jitter tests
C.6.1 Signal transfer delay
Test applicable to the V1 and the T reference points.
Purpose: T
...