ETSI TR 103 380 V1.0.0 (2015-11)

ETSI TR 103 380 V1.0.0 (2015-11)






TECHNICAL REPORT
Smart Cards;
Technical Report to improve test equipment integrity;
(Release Independent)

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(Release Independent) 2 ETSI TR 103 380 V1.0.0 (2015-11)





Reference
DTR/SCP-00103380
Keywords
smart card, testing
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Important notice
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Contents
Intellectual Property Rights . 4
Foreword . 4
Modal verbs terminology . 4
1 Scope . 5
2 References . 5
2.1 Normative references . 5
2.2 Informative references . 5
3 Definitions, symbols and abbreviations . 6
3.1 Definitions . 6
3.2 Symbols . 6
3.3 Abbreviations . 7
4 Optimization of the test environment for terminal testing using the Single Wire Protocol . 7
4.1 Noise issues when using the Single Wire Protocol . 7
4.2 Limiting the noise impacts . 9
4.3 Derived guidelines to set up a test environment . 9
4.4 Checking the integrity of the test environment. 11
4.4.1 Objective . 11
4.4.2 Example of a Test Case for Integrity check: . 11
4.4.2.1 Test execution . 11
4.4.2.2 Initial conditions . 11
4.4.2.3 Test procedure . 11
Annex A: Change History . 12
Annex B: Bibliography . 13
History . 14


ETSI

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Intellectual Property Rights
IPRs essential or potentially essential to the present document may have been declared to ETSI. The information
pertaining to these essential IPRs, if any, is publicly available for ETSI members and non-members, and can be found
in ETSI SR 000 314: "Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in
respect of ETSI standards", which is available from the ETSI Secretariat. Latest updates are available on the ETSI Web
server (http://ipr.etsi.org).
Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guarantee
can be given as to the existence of other IPRs not referenced in ETSI SR 000 314 (or the updates on the ETSI Web
server) which are, or may be, or may become, essential to the present document.
Foreword
This Technical Report (TR) has been produced by ETSI Technical Committee Smart Card Platform (SCP).
The contents of the present document are subject to continuing work within TC SCP and may change following formal
TC SCP approval. If TC SCP decides to modify the contents of the present document, it will be re-released by TC SCP
with an identifying change of release date and an increase in version number as follows:
Version x.y.z
where:
x: the first digit:
1 presented to TC SCP for information;
2 presented to TC SCP for approval;
3 or greater indicates TC SCP approved document under change control.
y: the second digit is incremented for all changes of substance, i.e. technical enhancements, corrections,
updates, etc.
z: the third digit is incremented when editorial only changes have been incorporated in the document.
The aim was to develop a technical report (TR) that defines how to optimally set up the test environment to execute test
case implementations based on ETSI TC SCP test specifications.
Modal verbs terminology
In the present document "shall", "shall not", "should", "should not", "may", "need not", "will", "will not", "can" and
"cannot" are to be interpreted as described in clause 3.2 of the ETSI Drafting Rules (Verbal forms for the expression of
provisions).
"must" and "must not" are NOT allowed in ETSI deliverables except when used in direct citation.

ETSI

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1 Scope
The present document provides how to optimally set up the test environment to execute test case implementations based
on ETSI TC SCP test specifications.
This includes (but is not limited to):
• Derived guidelines to set up a test environment;
• Test equipment behaviour in case of additional activity triggered by test sequences;
• Optimization of the test environment;
- Noise issues when using the Single Wire Protocol;
- Limiting the noise impacts;
• Checking the integrity of the test environment;
• Example of a Test Case for Integrity check.
The targeted audience for the present document is users of test case implementations based on ETSI TC SCP test
specifications as well as test equipment manufacture.
2 References
2.1 Normative references
References are either specific (identified by date of publication and/or edition number or version number) or
non-specific. For specific references, only the cited version applies. For non-specific references, the latest version of the
reference document (including any amendments) applies.
Referenced documents which are not found to be publicly available in the expected location might be found at
http://docbox.etsi.org/Reference.
• In the case of a reference to a TC SCP document, a non-specific reference implicitly refers to the latest version
of that document in the same Release as the present document.
NOTE: While any hyperlinks included in this clause were valid at the time of publication, ETSI cannot guarantee
their long term validity.
The following referenced documents are necessary for the application of the present document.
Not applicable.
2.2 Informative references
References are either specific (identified by date of publication and/or edition number or version number) or
non-specific. For specific references, only the cited version applies. For non-specific references, the latest version of the
reference document (including any amendments) applies.
NOTE: While any hyperlinks included in this clause were valid at the time of publication, ETSI cannot guarantee
their long term validity.
The following referenced documents are not necessary for the application of the present document but they assist the
user with regard to a particular subject area.
[i.1] ETSI TS 102 613: "Smart Cards; UICC - Contactless Front-end (CLF) Interface; Part 1: Physical
and data link layer characteristics".
[i.2] ETSI TS 102 694-1: "Smart Cards; Test specification for the Single Wire Protocol (SWP)
interface; Part 1: Terminal features".
ETSI

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[i.3] ETSI TS 102 221: "Smart Cards; UICC-Terminal interface; Physical and logical characteristics".
[i.4] ISO/IEC 14443-4: "Identification cards - Contactless integrated circuit(s) cards - Proximity cards -
Part 4: Transmission protocol".
3 Definitions, symbols and abb
...