EN 61747-2:1999

SLOVENSKI STANDARD
01-september-2002
Liquid crystal and solid-state display devices - Part 2: Liquid crystal display
modules - Sectional specification (IEC 61747-2:1998)
Liquid crystal and solid-state display devices -- Part 2: Liquid crystal display modules -
Sectional specification
Flüssigkristall- und Halbleiter-Anzeige-Bauelemente -- Teil 2: Flüssigkristall-
Anzeigemodule (LCD-Module) - Rahmenspezifikation
Dispositifs d'affichage à cristaux liquides et à semiconducteurs -- Partie 2: Modules
d'affichage à cristaux liquides - Spécification intermédiaire
Ta slovenski standard je istoveten z: EN 61747-2:1999
ICS:
31.120 Elektronske prikazovalne Electronic display devices
naprave
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME
CEI
INTERNATIONALE
IEC
61747-2
INTERNATIONAL
QC 720300
STANDARD
Première édition
First edition
1998-10
Dispositifs d’affichage à cristaux liquides et à
semiconducteurs –
Partie 2:
Modules d’affichage à cristaux liquides –
Spécification intermédiaire
Liquid crystal and solid-state display devices –
Part 2:
Liquid crystal display modules –
Sectional specification
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For price, see current catalogue

61747-2 © IEC:1998 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 Scope. 7
2 Normative reference. 7
3 Definitions. 7
4 Quality assessment procedure. 9
4.1 Primary stage of manufacture. 9
4.2 Manufacturing process. 11
4.3 Subcontracting. 11
4.4 Structural similarity procedures . 11
4.5 Qualification approval procedure . 13
4.6 Quality conformance inspection. 15
4.7 Capability approval procedure . 17
4.8 Screening. 17
4.9 Delayed deliveries. 17
5 Test and measurement procedures . 17
Tables . 19

61747-2 © IEC:1998 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
_________
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –
Part 2: Liquid crystal display modules –
Sectional specification
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61747-2 has been prepared by subcommittee 47C: Optoelectronic,
display and imaging devices, of IEC technical committee 47: Semiconductor devices.
It forms part 2 of the specifications in the IEC Quality Assessment System for Electronic
Components (IECQ) for liquid crystal and solid-state display devices: Qualification approval.
It should be read in conjunction with IEC 61747-1.
The text of this standard is based on the following documents:
FDIS Report on voting
47C/215/FDIS 47C/223/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The QC number that appears on the front cover of this publication is the specification number
in the IECQ Quality Assessment System for Electronic Components (IECQ).

61747-2 © IEC:1998 – 7 –
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –
Part 2: Liquid crystal display modules –
Sectional specification
1 Scope
This sectional specification applies to liquid crystal and solid-state display modules such as the
following:
– static / segment type liquid crystal display modules;
– passive matrix monochrome liquid crystal display modules;
– passive matrix colour liquid crystal display modules;
– active matrix monochrome liquid crystal display modules;
– active matrix colour liquid crystal display modules.
It gives details of the Quality Assessment Procedures, the inspection requirements, screening
sequences, sampling requirements, and test and measurement procedures required for the
assessment of liquid crystal display modules.
NOTE 1 – Instead of the Qualification Approval Procedure, the Capability Approval Procedure (see Rules of
Procedure QC 001002, subclause 11.7), which is at present under consideration, may be used for all products
manufactured in a defined process.
NOTE 2 – All the requirements of this specification remain valid, unless modified by the requirements set out by the
new clause: Capability Approval Procedure (under consideration).
2 Normative reference
The following normative document contains provisions which, through reference in this text,
constitute provisions of this part of IEC 61747. At the time of publication, the edition indicated
was valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 61747 are encouraged to investigate the possibility of applying the most
recent edition of the normative document indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 61747-1:1998, Liquid crystal and solid-state display devices – Part 1: Generic specification
3 Definitions
3.1
production line
a single set of process operations including one or several of the following manufacturing
phases:
a) connection of external electronic circuit devices to cell;
b) finishing and final electrical and optical measurements;
c) screening (if applicable).
NOTE – Quality assessment procedures are not included in these phases.

61747-2 © IEC:1998 – 9 –
3.2
production lot
devices of the same type, manufactured in the same production lines and passing through the
same nominated process, normally within one month
3.3
changes in manufacturing operations
3.3.1
major changes
any change in the manufacturing process or technology which could affect the quality or
performance of a product supplied to an approved specification, or which could require a
product to be transferred from one structural similarity group to another (see 4.4.1) represents
a change considered as major. It is the responsibility of the Chief Inspector to decide whether
the change is major or not.
Any major change shall only be implemented with notification and demonstration by test
evidence of quality to the National Supervising Inspectorate (NSI).
Examples of major changes are:
a) driver attachment: from two bank to one bank arrangement;
b) integrated backlight system:
– lamp position from horizontal to vertical or from top to bottom arrangement;
– backlight-type change from electroluminescent to cold cathode fluorescent lamp;
– light guide change from wedge to flat type;
c) bezel material: from metal to plastic;
d) connector change and/or pin assignment change: from type A to type B connector.
NOTE – Not considered as a major change: equipment change without changing the technology.
4 Quality assessment procedure
Quality assessment procedure is defined as outlined below.
4.1 Primary stage of manufacture
For the purpose of this sectional specification, this stage is defined as the first process step
that connects external electronic circuit devices (including separate PWB and/or connection
cables) to a liquid crystal display cell, thus converting it to a liquid crystal module.

61747-2 © IEC:1998 – 11 –
4.2 Manufacturing process
The manufacturing process of liquid crystal display modules is classified as follows:
a) connection of electronic circuit devices (including separate PWB and/or connection cables):
this process is the set of manufacturing process operations from the primary stage to the
last step for electronic circuit device connections to the cell;
b) finishing process and final electrical and optical measurements: this process is the final set
of manufacturing process operations comprising the assembly of a bezel, external
connectors/pins and integrated backlight system to the cell if required, and marking for the
completion as a liquid crystal display module;
c) screening (if applicable): this phase may be part of the finishing operation(s).
4.3 Subcontracting
When the approved manufacturer invokes rules of procedure, in 11.1.2 of IEC QC 001002
concerning subcontracting, he shall ensure that the subcontracted manufacturing process is
either part of or a whole of the cell and/or module manufacturing process unconditionally,
including screening steps which are incorporated in them. Screening operations applied after
assembly process may also be independently subcontracted.
The NSI shall be satisfied that the Chief Inspector who is certifying the components under the
IECQ system
– has been provided with the full quality assessment and inspection documentation of any
operation outside the IECQ geographical area. The documentation shall include the
inspection records for each sample of the product which undergoes inspection;
– regularly verifies that the quality assessment and inspection is applied in accordance with
the agreed requirements.
The Chief Inspector shall be provided and shall agree with the procedures for the transfer of
the parts from the place of manufacture to the manufacturer within the IECQ geographical area
who is certifying the component. The NSI shall be informed and have access to the applicable
documents.
Any changes in inspection requirements and manufacturing procedures shall be reported back
to the Chief Inspector who is certifying the modules. The major changes shall be reported by
the approved Chief Inspector to the NSI (see 3.3).
The approved manufacturer shall perform the acceptance tests prescribed by the detail
specification for the components he is certifying. He can perform the acceptance tests in a
facility outside the IECQ geographical area, provided that this facility is supervised by the NSI.
Acceptance tests can be subcontracted to approved test laboratories within the IECQ
geographical area.
4.4 Structural similarity procedures
Structural similarity procedures are intended to permit a reduction in the number of inspection
lots for quality assessment that shall be tested. Therefore, in case of reassessment by the
extension of approval types or the change of the design, the testing data which was performed
within the same grouping products may be used.

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