EN 61747-6-3:2011
(Main)Liquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules
Liquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules
IEC 61747-6-3:2011 applies to transmissive type active matrix liquid crystal displays. This standard defines general procedures for quality assessment related to the motion performance of LCDs. It defines artifacts in the motion contents and methods for motion artifact measurement. NOTE: Motion blur measurement methods and analysis methods introduced in this standard could not be universal tools for all different LCD motion enhancement technologies due to its complexity. Users shall be notified of these circumstances.
Flüssigkristall-Anzeige-Bauelemente - Teil 6-3: Messverfahren für Bewegungsartefakte bei Aktiv-Matrix-LCD-Modulen
Dispositifs d'affichage à cristaux liquides - Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux liquides - Mesure de l'artefact de mouvement dans les modules d'affichage à cristaux liquides à matrice active
La CEI 61747-6-3:2011 s'applique aux afficheurs à cristaux liquides à matrice active de type transmissifs. Cette norme définit les procédures générales pour l'évaluation de la qualité en ce qui concerne les performances du mouvement des afficheurs LCD. Elle définit les artefacts dans les contenus en mouvement et les méthodes de mesure de l'artefact de mouvement. NOTE: Les méthodes de mesure du flou de mouvement et les méthodes d'analyse introduites dans la présente norme ne sauraient être des outils universels pour toutes les différentes technologies de mesure de l'amélioration du mouvement LCD en raison de sa complexité. Les utilisateurs doivent être informés de ces circonstances.
Prikazovalniki s tekočimi kristali - 6-3. del: Merilne metode za module prikazovalnikov s tekočimi kristali - Merjenje artefaktov gibanja modulov aktivnih matričnih prikazovalnikov s tekočimi kristali
Ta del IEC 61747 velja za presevne vrste aktivnih matričnih prikazovalnikov s tekočimi kristali. Ta standard opredeljuje splošne postopke za oceno kakovosti, povezano z zmogljivostjo posnemanja gibanja zaslonov LCD. Opredeljuje artefakte pri gibanju in metode za merjenje artefaktov pri gibanju.
OPOMBA: Metode za merjenje in analizo zameglitve gibanja, ki jih uvaja ta standard, zaradi kompleksnosti ne morejo biti univerzalna orodja za vse različne tehnologije ojačitve gibanja pri zaslonih LCD. Uporabniki morajo biti o teh okoliščinah obveščeni.
General Information
Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.PRGXOHFlüssigkristall-Anzeige-Bauelemente -- Teil 6-3: Messverfahren für Bewegungsartefakte bei Aktiv-Matrix-LCD-ModulenDispositifs d’affichage à cristaux liquides - Partie 6-3: Méthodes de mesure pour les modules d’affichage à cristaux liquides - Mesure de l'artefact de mouvement dans les modules d'affichage à cristaux liquides à matrice activeLiquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules31.120Elektronske prikazovalne napraveElectronic display devicesICS:Ta slovenski standard je istoveten z:EN 61747-6-3:2011SIST EN 61747-6-3:2011en01-december-2011SIST EN 61747-6-3:2011SLOVENSKI
STANDARD
EUROPEAN STANDARD EN 61747-6-3 NORME EUROPÉENNE
EUROPÄISCHE NORM September 2011
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2011 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61747-6-3:2011 E
ICS 31.120
English version
Liquid crystal display devices -
Part 6-3: Measuring methods for liquid crystal display modules -
Motion artifact measurement of active matrix liquid
crystal display modules (IEC 61747-6-3:2011)
Dispositifs d'affichage à cristaux liquides - Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux liquides -
Mesure de l'artefact de mouvement dans les modules d'affichage à cristaux liquides à matrice active (CEI 61747-6-3:2011)
Flüssigkristall-Anzeige-Bauelemente -
Teil 6-3: Messverfahren für Bewegungsartefakte bei Aktiv-Matrix-LCD-Modulen (IEC 61747-6-3:2011)
This European Standard was approved by CENELEC on 2011-08-17. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
Foreword The text of document 110/296/FDIS, future edition 1 of IEC 61747-6-3, prepared by IEC TC 110, Flat panel display devices, was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61747-6-3:2011.
The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-05-17 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2014-08-17
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61747-6-3:2011 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 61747-1:2003 NOTE
Harmonized as EN 61747-1:1999 + A1:2003 (not modified). IEC 61747-5:1998 NOTE
Harmonized as EN 61747-5:1998 (not modified). ISO 9241-307 NOTE
Harmonized as EN ISO 9241-307. ISO 11664-4:2008 NOTE
Harmonized as EN ISO 11664-4:2011 (not modified).
- 3 - EN 61747-6-3:2011 Annex ZA (normative)
Normative references to international publications with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 61747-6 - Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type EN 61747-6 -
IEC 61747-6-3 Edition 1.0 2011-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Liquid crystal display devices –
Part 6-3: Measuring methods for liquid crystal display modules – Motion artifact measurement of active matrix liquid crystal display modules
Dispositifs d'affichage à cristaux liquides –
Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux
liquides – Mesure de l'artefact de mouvement dans les modules d'affichage
à cristaux liquides à matrice active
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE T ICS 31.120 PRICE CODE CODE PRIX ISBN 978-2-88912-586-9
– 2 – 61747-6-3 IEC:2011 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Abbreviations . 7 5 Standard measuring conditions . 7 5.1 Temperature, humidity and pressure conditions . 7 5.2 Illumination condition . 7 6 Standard motion-blur measuring methods . 8 6.1 General . 8 6.2 Direct measurement method . 8 6.2.1 Standard measuring process . 8 6.2.2 Test patterns . 8 6.2.3 Analysis method . 10 6.3 Indirect measurement method . 12 6.3.1 Temporal step response . 12 6.3.2 High speed camera . 15 7 Test report. 16 7.1 General . 16 7.2 Items to be reported . 16 7.2.1 Environmental conditions . 16 7.2.2 Display parameters . 16 7.2.3 Measuring method and conditions . 16 7.2.4 Analysis method . 16 Annex A (informative)
Subjective test method . 18 Annex B (informative)
Motion contrast degradation . 19 Annex C (informative)
Dynamic modulation transfer function . 21 Bibliography . 23
Figure 1 – Examples of edge blur test pattern . 8 Figure 2 – Example of a pivoting pursuit camera system . 9 Figure 3 – Example of a linear pursuit camera system . 9 Figure 4 – Example of luminance cross section profile of blurred edge . 11 Figure 5 – Example of luminance cross section profile of blurred edge . 11 Figure 6 – PBET calculation . 12 Figure 7 – Set-up to measure the temporal step response . 13 Figure 8 – Example of a LC response time measurement . 14 Figure 9 – Example of a motion picture response curve
derived from the response measurement presented in Figure 8,
and a convolution with a one frame wide window function. 15 Figure 10 – Example of measurement data reporting . 17 Figure B.1 – Example of motion contrast degradation test pattern . 19 Figure B.2 – Example of motion contrast degradation due to line spreading . 20 Figure C.1 – Example of motion contrast degradation . 21 SIST EN 61747-6-3:2011
61747-6-3 IEC:2011 – 3 – Figure C.2 – Example of DMTF properties for different motion speeds (V) . 22
Table 1 – Step response data for different luminance transitions . 10
– 4 – 61747-6-3 IEC:2011 INTERNATIONAL ELECTROTECHNICAL COMMISSION ___________
LIQUID CRYSTAL DISPLAY DEVICES –
Part 6-3: Measuring methods for liquid crystal display modules –
Motion artifact measurement of
active matrix liquid crystal display modules
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61747-6-3 has been prepared by IEC technical committee 110: Flat panel display devices. The text of this standard is based on the following documents: FDIS Report on voting 110/296/FDIS 110/313/RVD
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