prEN ISO 13695

SLOVENSKI STANDARD
01-oktober-2024
Optika in fotonska tehnologija – Preskusne metode za spektralne lastnosti laserjev
(ISO/FDIS 13695:2024)
Optics and photonics - Lasers and laser-related equipment - Test methods for the
spectral characteristics of lasers (ISO/FDIS 13695:2024)
Optik und Photonik - Laser und Laseranlagen - Prüfverfahren für die spektralen
Kenngrößen von Lasern (ISO/FDIS 13695:2024)
Optique et photonique - Lasers et équipement associé aux lasers - Méthodes d'essai des
caractéristiques spectrales des lasers (ISO/FDIS 13695:2024)
Ta slovenski standard je istoveten z: prEN ISO 13695
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

FINAL DRAFT
International
Standard
ISO/FDIS 13695
ISO/TC 172/SC 9
Optics and photonics — Lasers
Secretariat: DIN
and laser-related equipment —
Voting begins on:
Test methods for the spectral
2024-08-06
characteristics of lasers
Voting terminates on:
2024-10-29
Optique et photonique — Lasers et équipement associé aux lasers
— Méthodes d'essai des caractéristiques spectrales des lasers
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO­
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INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
Reference number
ISO/FDIS 13695:2024(en) © ISO 2024

FINAL DRAFT
ISO/FDIS 13695:2024(en)
International
Standard
ISO/FDIS 13695
ISO/TC 172/SC 9
Optics and photonics — Lasers
Secretariat: DIN
and laser-related equipment —
Voting begins on:
Test methods for the spectral
characteristics of lasers
Voting terminates on:
Optique et photonique — Lasers et équipement associé aux lasers
— Méthodes d'essai des caractéristiques spectrales des lasers
RECIPIENTS OF THIS DRAFT ARE INVITED TO SUBMIT,
WITH THEIR COMMENTS, NOTIFICATION OF ANY
RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE
AND TO PROVIDE SUPPOR TING DOCUMENTATION.
© ISO 2024
IN ADDITION TO THEIR EVALUATION AS
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO­
ISO/CEN PARALLEL PROCESSING
LOGICAL, COMMERCIAL AND USER PURPOSES, DRAFT
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
INTERNATIONAL STANDARDS MAY ON OCCASION HAVE
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
TO BE CONSIDERED IN THE LIGHT OF THEIR POTENTIAL
or ISO’s member body in the country of the requester.
TO BECOME STAN DARDS TO WHICH REFERENCE MAY BE
MADE IN NATIONAL REGULATIONS.
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Published in Switzerland Reference number
ISO/FDIS 13695:2024(en) © ISO 2024

ii
ISO/FDIS 13695:2024(en)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms. 7
5 Traceability . 8
6 Measurement of wavelength and bandwidth . 9
6.1 General .9
6.1.1 Preparations .9
6.1.2 Common laser types .9
6.2 Types of measurements .9
6.2.1 General .9
6.2.2 Low accuracy measurements .10
6.2.3 Medium accuracy measurements .10
6.2.4 High accuracy measurements .10
6.3 Equipment selection .10
6.4 Measurements in air .11
6.5 Measurements at low resolution . 12
6.5.1 Principle . 12
6.5.2 Measurement procedure . 12
6.5.3 Analysis . 13
6.6 Measurement at higher resolution . . 13
6.6.1 General . 13
6.6.2 Preliminary test . 13
6.6.3 Measurement with a grating spectrometer .14
6.6.4 Measurement with an interferometer .14
6.6.5 Measurement with photoelectric mixing methods . 15
−5 −4
6.6.6 Analysis for medium accuracy U /λ = U /ν in the range 10 to 10 .17
λ ν
−5
6.6.7 Analysis for high accuracy U /λ = U /ν < 10 .17
λ ν
7 Measurement of wavelength stability. 17
7.1 Dependence of the wavelength on operating conditions .17
7.2 Wavelength stability of a single frequency laser .18
8 Test report .18
Annex A (informative) Refractive index of air .20
Annex B (informative) Criteria for the choice of a grating monochromatorand its
accessories — Calibration .21
Annex C (informative) Criteria for the choice of a Fabry-Perot interferometer .24
Bibliography .25

iii
ISO/FDIS 13695:2024(en)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely
with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO [had/had not] received notice of
(a) patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee 172 Optics and Photonics, Subcommittee SC 9, Laser
and electro-optical systems.
This second edition cancels and replaces the first edition (ISO 13595:2004) of which it constitutes a minor
revision.
The main changes are as follows:
— editorial changes related to the new format
— the symbol for side-mode suppression ratio was adapted from SMS to R
SMS
— lg was changed to log in 3.15.
— the title of the SC 9 was updated.
— intensity was adapted to irradiance.
— in the Bibliography Reference 2 was updated and replaced by References 2 and 3.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.

iv
ISO/FDIS 13695:2024(en)
Introduction
The spectral characteristics of a laser, such as its peak wavelength or spectral linewidth, are important for
potential applications. Examples are the specific application requirements of interferometry and lithography.
This document gives definitions of key parameters describing the spectral characteristics of a laser, and
provides guidance on performing measurements to determine these parameters for common laser types.
The accept
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