Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)

ISO 17526:2003 covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers.
It defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.

Optik und optische Instrumente - Laser und Laseranlagen - Lebensdauer von Lasern (ISO 17526:2003)

Die vorliegende Internationale Norm definiert Begriffe für die Lebensdauer von Lasern und legt Prüfverfahren und grundlegende Aspekte für die Ermittlung der Lebensdauer fest. Sie gilt für alle Lasertypen, für die die Lebensdauer ein kritischer Faktor ist, einschließlich Diodenlasern. Ausgenommen sind Diodenlaser, welche in der Telekommuni-kation Verwendung finden.

Optique et instruments d'optique - Lasers et équipements associés aux lasers - Durée de vie des lasers (ISO 17526:2003)

L'ISO 17526:2003 couvre les termes et définitions ainsi que les méthodes d'essai et les procédures d'évaluation permettant de caractériser, d'estimer et de prévoir le comportement à long terme des divers types de lasers.
Elle définit les termes relatifs à la durée de vie des lasers et spécifie les modes opératoires d'essai ainsi que les aspects fondamentaux permettant de déterminer la durée de vie. Elle s'applique à tous les types de lasers pour lesquels la durée de vie constitue un élément déterminant, en incluant les diodes laser, à l'exception de celles utilisées dans les télécommunications.

Optika in optični instrumenti - Laserji in laserska oprema – Življenjska doba laserjev (ISO 17526:2003)

General Information

Status
Published
Publication Date
14-Jun-2003
Withdrawal Date
30-Dec-2003
Current Stage
6060 - Definitive text made available (DAV) - Publishing
Start Date
15-Jun-2003
Completion Date
15-Jun-2003

Overview

EN ISO 17526:2003 (ISO 17526:2003) - "Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers" defines terminology, test methods and evaluation procedures to characterize, estimate and predict the long‑term behaviour and lifetime of lasers. It applies to all laser types for which lifetime is a critical attribute, including diode lasers (except those used in telecommunications). The standard provides a common framework for lifetime testing, reporting and extrapolation to support reliable product specification and quality assurance.

Key Topics

  • Terms and definitions for lifetime-related concepts (e.g., time to failure, meantime to failure) and operational modes (cw, repetitive-cw, pulsed, pulse-train, single-pulse, burst-pulse, quasi-cw).
  • Modes of operation and how they affect lifetime testing: cw, repetitive cw, pulsed and quasi‑cw are explicitly defined to ensure consistent test conditions.
  • Operating conditions and control modes used during tests: APPC (automatic pump power control), ACC (automatic current control), APC (automatic power control) and user‑selected modes.
  • Test methods covering selection of lasers for testing, lifetime tests in APPC/ACC/APC modes, and special tests (e.g., limited aperture testing).
  • Evaluation and extrapolation procedures to interpret test data and predict long‑term performance.
  • Test reporting requirements to ensure transparent, reproducible documentation of test conditions, results and statistical assumptions.

Practical applications

EN ISO 17526:2003 is intended for practical use by:

  • Laser manufacturers - to develop consistent lifetime specifications and support warranty claims.
  • Test laboratories and QA teams - to design and execute lifetime tests and produce standardized test reports.
  • R&D and reliability engineers - to assess component degradation, compare designs, and plan maintenance or repair strategies.
  • Procurement and product managers - to evaluate vendor claims and select lasers based on standardized lifetime data.
  • Regulatory and certification bodies - as part of conformity assessment and safety/reliability documentation.

Typical uses include lifetime specification in datasheets, lifetime prediction and extrapolation for long‑lived systems, distinguishing "lifetime" (sealed, non‑repairable devices) from "mean time to failure" (repairable systems), and establishing statistically meaningful test programs (note: very high‑volume diode tests may use alternative statistical approaches referenced in the standard).

Related standards

  • ISO 11145:2001 - Vocabulary and symbols for lasers
  • ISO 11554:2003 - Test methods for laser beam power, energy and temporal characteristics
  • IEC 60050-191 - Dependability and quality of service (vocabulary)
  • IEC 61703 - Reliability, availability and maintainability terms

Keywords: EN ISO 17526:2003, ISO 17526, laser lifetime, lifetime testing, laser reliability, APPC, ACC, APC, diode lasers, lifetime prediction, test methods.

Frequently Asked Questions

EN ISO 17526:2003 is a standard published by the European Committee for Standardization (CEN). Its full title is "Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers (ISO 17526:2003)". This standard covers: ISO 17526:2003 covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers. It defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.

ISO 17526:2003 covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers. It defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.

EN ISO 17526:2003 is classified under the following ICS (International Classification for Standards) categories: 31.260 - Optoelectronics. Laser equipment. The ICS classification helps identify the subject area and facilitates finding related standards.

You can purchase EN ISO 17526:2003 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of CEN standards.

Standards Content (Sample)


SLOVENSKI STANDARD
01-november-2003
2SWLNDLQRSWLþQLLQVWUXPHQWL/DVHUMLLQODVHUVNDRSUHPD±äLYOMHQMVNDGRED
ODVHUMHY ,62
Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers
(ISO 17526:2003)
Optik und optische Instrumente - Laser und Laseranlagen - Lebensdauer von Lasern
(ISO 17526:2003)
Optique et instruments d'optique - Lasers et équipements associés aux lasers - Durée de
vie des lasers (ISO 17526:2003)
Ta slovenski standard je istoveten z: EN ISO 17526:2003
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN ISO 17526
NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2003
ICS 31.260
English version
Optics and optical instruments - Lasers and laser-related
equipment - Lifetime of lasers (ISO 17526:2003)
Optique et instruments d'optique - Lasers et équipements Laser und Laseranlagen - Lebensdauer von Lasern (ISO
associés aux lasers - Durée de vie des lasers (ISO 17526:2003)
17526:2003)
This European Standard was approved by CEN on 20 May 2003.
CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national
standards may be obtained on application to the Management Centre or to any CEN member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN member into its own language and notified to the Management Centre has the same status as the official
versions.
CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece,
Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United
Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
Management Centre: rue de Stassart, 36  B-1050 Brussels
© 2003 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 17526:2003 E
worldwide for CEN national Members.

CORRECTED  2003-07-16
Foreword
This document (EN ISO 17526:2003) has been prepared by Technical Committee ISO/TC 176
"Quality management and quality assurance" in collaboration with Technical Committee CEN/TC
123 "Lasers and laser-related equipment", the secretariat of which is held by DIN.
This European Standard shall be given the status of a national standard, either by publication of
an identical text or by endorsement, at the latest by December 2003, and conflicting national
standards shall be withdrawn at the latest by December 2003.
According to the CEN/CENELEC Internal Regulations, the national standards organizations of
the following countries are bound to implement this European Standard: Austria, Belgium, Czech
Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and
the United Kingdom.
Endorsement notice
The text of ISO 17526:2003 has been approved by CEN as EN ISO 17526:2003 without any
modifications.
NOTE Normative references to International Standards are listed in Annex ZA (normative).
Annex ZA
(normative)
Normative references to international publications
with their relevant European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of
any of these publications apply to this European Standard only when incorporated in it by
amendment or revision. For undated references the latest edition of the publication referred to
applies (including amendments).
NOTE Where an International Publication has been modified by common modifications, indicated
by (mod.), the relevant EN/HD applies.
Publication Year Title EN Year
ISO 11145 2001 Optics and optical instruments - Lasers EN ISO 11145 2001
and laser-related equipment -
Vocabulary and symbols
ISO 11554 2003 Optics and optical instruments - Lasers EN ISO 11554 2003
and laser-related equipment - Test
methods for laser beam power, energy
and temporal characteristics
INTERNATIONAL ISO
STANDARD 17526
First edition
2003-06-15
Optics and optical instruments — Lasers
and laser-related equipment — Lifetime
of lasers
Optique et instruments d'optique — Lasers et équipements associés
aux lasers — Durée de vie des lasers

Reference number
ISO 17526:2003(E)
©
ISO 2003
ISO 17526:2003(E)
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Published in Switzerland
ii © ISO 2003 — All rights reserved

ISO 17526:2003(E)
Contents Page
Foreword. iv
Introduction . v
1 Scope. 1
2 Normative references . 1
3 Terms and definitions. 1
3.1 Modes of operation . 1
3.2 Operating conditions . 2
3.3 Lifetime related terms. 3
3.4 Types and classification. 5
3.5 Others. 5
4 Symbols and abbreviated terms. 6
4.1 Symbols . 6
4.2 Abbreviated terms. 6
5 Test methods. 6
5.1 General. 6
5.2 Selection of lasers for lifetime testing . 7
5.3 Lifetime test in APPC- and ACC-mode . 7
5.4 Lifetime test at APC-mode . 7
5.5 Lifetime tests at limited aperture. 8
6 Evaluation and extrapolation. 8
7 Test report. 10
Bibliography . 12

ISO 17526:2003(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 17526 was prepared by Technical Committee ISO/TC 172, Optics and optical instruments, Subcommittee
SC 9, Electro-optical systems.
iv © ISO 2003 — All rights reserved

ISO 17526:2003(E)
Introduction
There are many different types of lasers with very different attributes and very different areas of application;
not all types of lasers can be treated by the same means and measures to characterize and specify their
longterm behaviour and lifetime.
This International Standard covers many types of laser, but not all methods and procedures can be applied to
all types.
There are lasers, primarily laser diodes in the lower power range, which are produced in large quantities and
which allow the performance of lifetime tests on large quantities to gain results on a statistically significant
level. In this case and if more than approximately 50 lasers are used for testing, lifetime predictions using
informative annex B of IEC 61751:1998, may be applied alternatively to this International Standard.
High-power lasers are manufactured in low quantities and lifetime tests cannot be carried out on statistically
significant sample sizes.
There are types of laser of which the main components cannot be repaired, e.g. sealed-tube gas lasers or
semiconductor lasers. There are others that can easily be repaired, e.g. CO lasers. The former class may be
characterized by “lifetime”, the latter more appropriately characterized by “meantime to failure”.
INTERNATIONAL STANDARD ISO 17526:2003(E)

Optics and optical instruments — Lasers and laser-related
equipment — Lifetime of lasers
1 Scope
This International Standard covers terms and definitions as well as test methods and evaluation procedures to
characterize, estimate and predict the longterm behaviour of various types of lasers.
This International Standard defines terms for the lifetime of lasers and specifies test procedures and
fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a
critical issue, including diode lasers except those used in telecommunications.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO 11145:2001, Optics and optical instruments — Lasers and laser-related equipment — Vocabulary and
symbols
ISO 11554:2003, Optics and optical instruments — Lasers and laser-related equipment — Test methods for
laser beam power, energy and temporal characteristics
IEC 60050-191:1990, International Electrotechnical Vocabulary. Chapter 191: Dependability and quality of
service
IEC 61703:2001, Mathematical expressions for reliability, availability, maintainability and maintenance support
terms
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 11145 and the following apply.
NOTE For simplicity, in all following parts of this International Standard the term “power” refers to cw or repetitive-cw
mode, whereas “energy“ refers to pulse and quasi-cw mode.
3.1 Modes of operation
NOTE 1 The following modes of operation define the temporal and pulsed characteristics of the laser.
NOTE 2 There might be modes of operation that are not covered by the subsequent classification. These modes
should be described in detail in the test report.
3.1.1
cw-mode
mode where the laser emits radiation continuously over periods of time longer than or equal to 0,25 s
ISO 17526:2003(E)
3.1.2
repetitive cw-mode
mode in which the laser is operated in cw-mode but repetitively switched on and off more than once per
minute
3.1.3
pulsed mode
mode in which the laser delivers its energy in the form of a single pulse or a train of pulses
NOTE 1 The duration of a pulse is shorter than 0,25 s.
NOTE 2 The subsequently defined modes of operation (3.1.4 to 3.1.7) are special cases of pulsed mode.
3.1.4
pulse train mode
mode in which the laser emits at least 100 subsequent radiation pulses (pulse duration < 0,25 s) at a
continuous pulse repetition rate
3.1.5
single pulse mode
mode in which the laser emits single pulses at low repetition rate, i.e. the laser medium has reached its
equilibrium state between subsequent pulses
NOTE The laser is considered to be in its state of equilibrium, if each pulse is identical to the first pulse after switch-
on of the laser in all characteristics that are relevant for the intended application.
3.1.6
burst pulse mode
mode in which a pulsed laser beam emitting at a fixed pulse repetition rate f is repetitively switched on and
P
off, where each burst contains at least two pulses and the time interval between two bursts is at least 2 × the
inverse of the pulse repetition rate
3.1.7
quasi-cw-mode
mode in which the duration of the laser radiation is so long that the laser active material has reached its
optical but not its thermal equilibrium
NOTE For some laser types (especially diode lasers and diode laser based devices) this operation mode is relevant.
3.2 Operating conditions
NOTE 1 In the following definitions different modes of long-term operation are defined under which a lifetime test is
performed.
NOTE 2 For simplicity, in the subsequent clauses, only the term “laser” is used, although the respective definitions and
methods might also refer to laser devices, laser units, laser modules, etc. in accordance with 3.4.
3.2.1
automatic pump power control mode
APPC-mode
mode in which the laser is operated at a constant, automatically controlled pump power (energy) with all other
operating conditions (e.g. temperature) being kept constant
NOTE For optically pumped lasers, e.g. solid-state lasers, the operating current for the arc lamps or pump diodes is
adjusted to compensate for degradation of the pump source.
2 © ISO 2003 — All rights reserved

ISO 17526:2003(E)
3.2.2
automatic current control mode
ACC-mode
mode in which the laser is operated at constant, automatically controlled operation current with all other
operating conditions (e.g. temperature) being kept constant
NOTE ACC-mode is only applicable for lasers with current-controlled output power, e.g. arc lamp pumped solid-state-
lasers, some types of gas lasers or diode lasers. For certain types of lasers, an automatic voltage control mode (AVC-
mode) may also be applied.
3.2.3
automatic power control mode
APC-mode
mode in which the laser is operated at constant automatic controlled optical output power (energy) by
adjusting the pump power (energy) (e.g. operation current or optical pump power) with all other operating
conditions (e.g. temperature) being kept constant
3.2.4
user selected mode
mode in which the laser is operated at constant user-accessible settings
NOTE Examples of the parameters to be held on a constant level are: the current of the exciting discharge of a gas
laser, the current of the flashlamp of a solid state laser, the current of a diode laser, pump power or pump energy.
3.3 Lifetime related terms
3.3.1
time to failure
TTF
total time duration of operating time of an item, from the instant it is first put in an up state, until failure or from
the instant of restoration until next failure
[IEC 60050-191-10-02:1990]
NOTE If time to failure refers to a significant component or subsystem of the laser, this should be stated with the
TTF-statement.
3.3.2
mean time to failure
MTTF
expectation of the time to failure
[IEC 60050-191-12-07:1990]
3.3.3
availability
ability of an item to be in a state to perform a required function under given conditions at a given instant of
time or over a given time interval, assuming that the required external resources are provided
NOTE 1 This ability depends on the combined aspects of the reliability performance, the maintainability performance
and the maintenance support performance.
NOTE 2 Required external resources, other than maintenance resources do not affect the availability performance of
the item.
NOTE 3 In French, the term "disponibilité" is also used in the sense of "instantaneous availability".
[IEC 60050-191-02-05:1990]
NOTE 4 See also IEC 6
...

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STANDART SCOPE: EN ISO 17526:2003은 레이저 및 레이저 관련 장비의 수명을 다루는 중요한 문서로, 다양한 레이저 유형의 장기 거동을 특성화, 추정 및 예측하기 위한 용어 및 정의, 테스트 방법 및 평가 절차를 포괄하고 있습니다. 이 표준은 레이저의 수명과 관련된 용어를 정의하고, 수명을 결정하기 위한 테스트 절차와 기본 측면을 명시합니다. 특히, 통신에서 사용되지 않는 다이오드 레이저를 포함하여 수명이 중요한 모든 유형의 레이저에 적용됩니다. STRONG POINTS: EN ISO 17526:2003의 주요 강점은 레이저의 수명을 측정하고 예측하는 명확한 기준을 제공한다는 점입니다. 이 표준은 레이저 장비의 신뢰성과 효율성을 향상시키는 데 기여하며, 다양한 분야에서 레이저를 사용하는 기업과 연구 기관들에게 필수적인 지침을 제공합니다. 특히, 레이저 수명이 중요한 산업 어플리케이션에서 이 표준은 안전성과 제품 품질을 보장하기 위한 기반을 마련합니다. RELEVANCE: EN ISO 17526:2003는 레이저 기술이 발전함에 따라 점점 더 중요해지고 있는 표준입니다. 레이저는 의료, 산업, 통신 등 다양한 분야에서 널리 사용되며, 이 표준이 제공하는 체계적인 접근 방식은 레이저 장비의 신뢰성을 높이고, 사용자에게 장기적으로 안정적인 성능을 보장합니다. 따라서, 레이저와 관련된 모든 기업과 연구자들에게 EN ISO 17526:2003는 시급하고 필수적인 기준이 될 것입니다.

The standard EN ISO 17526:2003 provides a comprehensive framework for understanding and assessing the lifespan of lasers and laser-related equipment. It establishes clear terms and definitions that are essential for consistent communication within the industry regarding the lifetime of lasers, which is a significant concern for manufacturers, users, and regulatory bodies alike. One of the strengths of EN ISO 17526:2003 is its structured approach to test methods and evaluation procedures. This standard encapsulates robust methodologies that enable stakeholders to accurately characterize, estimate, and predict the long-term behavior of various types of lasers, ensuring reliability and performance in practical applications. By encompassing all types of lasers, except those utilized specifically in telecommunications, the standard presents a holistic perspective that caters to diverse fields of laser use, including industrial, medical, and scientific applications. Furthermore, the relevance of EN ISO 17526:2003 cannot be overstated in the current landscape of optical technology. As lasers become increasingly integral to advancements in various sectors, having a standardized approach to lifetime evaluation becomes crucial. This standard informs design and manufacturing processes, helping to mitigate risks associated with laser failures and ensuring compliance with safety regulations. Overall, EN ISO 17526:2003 stands out as an essential document for professionals involved in the optics and optical instruments sector, providing invaluable guidelines that enhance the understanding of laser lifetimes while promoting best practices across the industry.

SIST EN ISO 17526:2003の標準は、レーザー及びレーザー関連機器の寿命に関する包括的な文書であり、その重要性は高いと言えます。この標準は、レーザーの寿命に関連する用語と定義、試験方法、および評価手続きを網羅しており、さまざまなタイプのレーザーの長期的挙動を特徴づけ、推定し、予測するための基盤を提供します。 特に、ISO 17526:2003は、レーザーの寿命が重要な要素となるすべてのタイプのレーザーに適用され、通信に使用されるダイオードレーザーを除く、それ以外の用途のレーザーを対象としています。この包括的なアプローチにより、レーザーの寿命に関する理解が深まり、適切な試験手順に従うことで、より信頼性の高い結果を得ることが可能です。 さらに、この標準は、レーザー技術の進展に対応するために必要な基本的な側面も明確に定義しています。これにより、さまざまな業界におけるレーザーの利用を効果的に促進し、性能の最適化に寄与します。 SIST EN ISO 17526:2003の適用範囲は、光学機器や精密機器に携わる専門家にとって非常に重要であり、レーザーのパフォーマンスを追跡し、評価するための共通言語と基準を提供します。そのため、この標準は、レーザーの寿命に関心を持つすべてのステークホルダーにとって必須の文書となるでしょう。